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1007 lines
583 KiB
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2 years ago
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<class-scheme publication-date="2023-02-01" scheme-type="cpc" publication-type="official">
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<classification-item breakdown-code="false" not-allocatable="true" level="5" additional-only="false" sort-key="G01R" definition-exists="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>MEASURING ELECTRIC VARIABLES</text></title-part><title-part><text>MEASURING MAGNETIC VARIABLES </text><reference><text>indicating correct tuning of resonant circuits <class-ref scheme="cpc">H03J3/12</class-ref></text></reference></title-part></class-title><notes-and-warnings date-revised="2013-01-01"><note type="note"><note-paragraph> This subclass <u>covers</u>: <subnote type="bullet"><note-paragraph>measuring all kinds of electric or magnetic variables directly or by derivation from other electric or magnetic variables; </note-paragraph><note-paragraph>measuring all kinds of electric or magnetic properties of materials; </note-paragraph><note-paragraph>testing electric or magnetic devices, apparatus or networks, (e.g. discharge tubes, amplifiers) or measuring their characteristics; </note-paragraph><note-paragraph>indicating presence or sign of current or voltage; </note-paragraph><note-paragraph>NMR, EPR or other spin-effect apparatus, not specially adapted for a particular application; </note-paragraph><note-paragraph>equipment for generating signals to be used for carrying out such tests and measurements.</note-paragraph></subnote></note-paragraph><note-paragraph> In this subclass, the following terms or expressions are used with the meanings indicated : <subnote type="bullet"><note-paragraph>"measuring" includes investigating; </note-paragraph><note-paragraph>"instruments" or "measuring instruments" means electro-mechanical measuring mechanisms; </note-paragraph><note-paragraph>"arrangements for measuring" means apparatus, circuits, or methods for measuring;</note-paragraph></subnote></note-paragraph><note-paragraph>Attention is drawn to the Notes following the title of class <class-ref scheme="cpc">G01</class-ref>.</note-paragraph><note-paragraph> In this subclass, instruments or arrangements for measuring electric variables are classified in the following way: <subnote type="bullet"><note-paragraph>Electromechanical instruments where the measured electric variables directly effect the indication of the measured value, including combined effects of two or more values, are classified in groups <class-ref scheme="cpc">G01R5/00</class-ref> - <class-ref scheme="cpc">G01R11/00</class-ref>. </note-paragraph><note-paragraph>Details common to different types of the instruments covered by groups <class-ref scheme="cpc">G01R5/00</class-ref> - <class-ref scheme="cpc">G01R11/00</class-ref> are classified in group <class-ref scheme="cpc">G01R1/00</class-ref>. </note-paragraph><note-paragraph>Arrangements involving circuitry to obtain an indication of a measured value by deriving, calculating or otherwise processing electric variables, e.g. by comparison with another value, are classified in groups <class-ref scheme="cpc">G01R17/00</class-ref> - <class-ref scheme="cpc">G01R29/00</class-ref>. </note-paragraph><note-paragraph>Details common to different types of arrangements covered by groups <class-ref scheme="cpc">G01R17/00</class-ref> - <class-ref scheme="cpc">G01R29/00</class-ref> are classified in group <class-ref scheme="cpc">G01R15/00</class-ref>.</note-paragraph></subnote></note-paragraph><note-paragraph>In this subclass, group <class-ref scheme="cpc">G01R17/00</class-ref> takes precedence over groups <class-ref scheme="cpc">G01R19/00</class-ref> - <class-ref scheme="cpc">G01R31/00</class-ref>.</note-paragraph></note><note type="warning"><note-paragraph>In this subclass non-limiting references (in the sense of paragraph 39 of the Guide to the IPC) may still be displayed in the scheme.</note-paragraph></note></notes-and-warnings>
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<classification-item breakdown-code="false" not-allocatable="true" level="6" additional-only="false" sort-key="G01R1/00" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/00</classification-symbol>
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<classification-item breakdown-code="false" not-allocatable="false" level="7" additional-only="false" sort-key="G01R1/00" definition-exists="false" ipc-concordant="G01R1/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-05-01" status="published"><classification-symbol>G01R1/00</classification-symbol><class-title date-revised="2016-05-01"><title-part><text>Details of instruments or arrangements of the types included in groups <class-ref scheme="cpc">G01R5/00</class-ref> - <class-ref scheme="cpc">G01R13/00</class-ref> and <class-ref scheme="cpc">G01R31/00</class-ref> </text><reference><text>constructional details particular to </text><CPC-specific-text><text>electromechanical</text></CPC-specific-text><text> arrangements for measuring the electric consumption <class-ref scheme="cpc">G01R11/02</class-ref></text></reference></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R1/02" definition-exists="true" ipc-concordant="G01R1/02" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R1/02</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>General constructional details</text></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R1/025" definition-exists="false" ipc-concordant="G01R1/02" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/025</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>concerning dedicated user interfaces, e.g. GUI, or dedicated keyboards </text><reference><text><class-ref scheme="cpc">G01R31/31912</class-ref> takes precedence</text></reference></CPC-specific-text></title-part></class-title></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R1/04" definition-exists="true" ipc-concordant="G01R1/04" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R1/04</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Housings</text></title-part><title-part><text>Supporting members</text></title-part><title-part><text>Arrangements of terminals</text></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R1/0408" definition-exists="false" ipc-concordant="G01R1/04" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2020-01-01" status="published"><classification-symbol>G01R1/0408</classification-symbol><class-title date-revised="2020-01-01"><title-part><CPC-specific-text><text>Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets </text><reference><text><class-ref scheme="cpc">G01R1/067</class-ref> takes precedence; mass production testing systems <class-ref scheme="cpc">G01R31/59</class-ref>; testing of connections <class-ref scheme="cpc">G01R31/66</class-ref>; for testing printed circuit boards <class-ref scheme="cpc">G01R31/2808</class-ref></text></reference></CPC-specific-text></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R1/0416" definition-exists="false" ipc-concordant="G01R1/04" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2019-01-01" status="published"><classification-symbol>G01R1/0416</classification-symbol><class-title date-revised="2019-01-01"><title-part><CPC-specific-text><text>Connectors, terminals </text><reference><text><class-ref scheme="cpc">G01R1/0425</class-ref> and <class-ref scheme="cpc">G01R1/0433</class-ref> take precedence; with measurement function for battery poles <class-ref scheme="cpc">G01R31/364</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R1/0425" definition-exists="true" ipc-concordant="G01R1/04" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/0425</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Test clips, e.g. for IC's</text></CPC-specific-text></title-part></class-title></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R1/0433" definition-exists="false" ipc-concordant="G01R1/04" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/0433</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Sockets for IC's or transistors</text></CPC-specific-text></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R1/0441" definition-exists="false" ipc-concordant="G01R1/04" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/0441</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Details</text></CPC-specific-text></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R1/045" definition-exists="false" ipc-concordant="G01R1/04" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/045</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Sockets or component fixtures for RF or HF testing</text></CPC-specific-text></title-part></class-title></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R1/0458" definition-exists="false" ipc-concordant="G01R1/04" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/0458</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>related to environmental aspects, e.g. temperature</text></CPC-specific-text></title-part></class-title></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R1/0466" definition-exists="false" ipc-concordant="G01R1/04" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/0466</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R1/0475" definition-exists="false" ipc-concordant="G01R1/04" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/0475</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>for TAB IC's</text></CPC-specific-text></title-part></class-title></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R1/0483" definition-exists="false" ipc-concordant="G01R1/04" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/0483</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Sockets for un-leaded IC's having matrix type contact fields, e.g. BGA or PGA devices; Sockets for unpackaged, naked chips </text><reference><text>for IC's with connecting points around the edges only <class-ref scheme="cpc">G01R1/0433</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R1/0491" definition-exists="false" ipc-concordant="G01R1/04" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/0491</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>for testing integrated circuits on wafers, e.g. wafer-level test cartridge</text></CPC-specific-text></title-part></class-title></classification-item></classification-item></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R1/06" definition-exists="true" ipc-concordant="G01R1/06" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R1/06</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Measuring leads</text></title-part><title-part><text>Measuring probes </text><reference><text><class-ref scheme="cpc">G01R19/145</class-ref>, <class-ref scheme="cpc">G01R19/165</class-ref> take precedence</text></reference></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R1/067" definition-exists="true" ipc-concordant="G01R1/067" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R1/067</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Measuring probes</text></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R1/06705" definition-exists="false" ipc-concordant="G01R1/067" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/06705</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Apparatus for holding or moving single probes </text><reference><text>for moving multiple probe heads or ICs under test <class-ref scheme="cpc">G01R31/2886</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R1/06711" definition-exists="true" ipc-concordant="G01R1/067" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/06711</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins</text></CPC-specific-text></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R1/06716" definition-exists="false" ipc-concordant="G01R1/067" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/06716</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Elastic</text></CPC-specific-text></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R1/06722" definition-exists="false" ipc-concordant="G01R1/067" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/06722</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Spring-loaded</text></CPC-specific-text></title-part></class-title></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R1/06727" definition-exists="false" ipc-concordant="G01R1/067" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/06727</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Cantilever beams</text></CPC-specific-text></title-part></class-title><notes-and-warnings date-revised="2013-01-01"><note type="warning"><note-paragraph warning-type="reclass-destination"> This group is not complete pending a reorganisation; see also other subgroups of <class-ref scheme="cpc">G01R1/06711</class-ref></note-paragraph></note></notes-and-warnings></classification-item></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R1/06733" definition-exists="false" ipc-concordant="G01R1/067" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/06733</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Geometry aspects </text><reference><text><class-ref scheme="cpc">G01R1/06727</class-ref> takes precedence</text></reference></CPC-specific-text></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R1/06738" definition-exists="false" ipc-concordant="G01R1/067" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/06738</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>related to tip portion</text></CPC-specific-text></title-part></class-title></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R1/06744" definition-exists="true" ipc-concordant="G01R1/067" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/06744</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Microprobes, i.e. having dimensions as IC details</text></CPC-specific-text></title-part></class-title></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R1/0675" definition-exists="false" ipc-concordant="G01R1/067" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/0675</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Needle-like</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R1/06755" definition-exists="true" ipc-concordant="G01R1/067" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/06755</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Material aspects</text></CPC-specific-text></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R1/06761" definition-exists="false" ipc-concordant="G01R1/067" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/06761</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>related to layers</text></CPC-specific-text></title-part></class-title></classification-item></classification-item></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R1/06766" definition-exists="true" ipc-concordant="G01R1/067" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/06766</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Input circuits therefor</text></CPC-specific-text></title-part></class-title></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R1/06772" definition-exists="true" ipc-concordant="G01R1/067" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/06772</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>High frequency probes</text></CPC-specific-text></title-part></class-title></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R1/06777" definition-exists="true" ipc-concordant="G01R1/067" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/06777</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>High voltage probes</text></CPC-specific-text></title-part></class-title></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R1/06783" definition-exists="false" ipc-concordant="G01R1/067" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/06783</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>containing liquids</text></CPC-specific-text></title-part></class-title></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R1/06788" definition-exists="false" ipc-concordant="G01R1/067" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/06788</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments </text><reference><text>end pieces terminating in a probe <class-ref scheme="cpc">H01R11/18</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R1/06794" definition-exists="false" ipc-concordant="G01R1/067" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/06794</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Devices for sensing when probes are in contact, or in position to contact, with measured object</text></CPC-specific-text></title-part></class-title></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R1/07" definition-exists="true" ipc-concordant="G01R1/07" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R1/07</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Non contact-making probes</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R1/071" definition-exists="false" ipc-concordant="G01R1/07" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/071</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>containing electro-optic elements</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R1/072" definition-exists="false" ipc-concordant="G01R1/07" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/072</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>containing ionised gas</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R1/073" definition-exists="true" ipc-concordant="G01R1/073" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R1/073</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Multiple probes</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R1/07307" definition-exists="false" ipc-concordant="G01R1/073" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/07307</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R1/07314" definition-exists="false" ipc-concordant="G01R1/073" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/07314</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support </text><reference><text>on an elastic support, e.g. a film, <class-ref scheme="cpc">G01R1/0735</class-ref></text></reference></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="14" additional-only="false" sort-key="G01R1/07321" definition-exists="false" ipc-concordant="G01R1/073" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/07321</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>the probes being of different lengths</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="14" additional-only="false" sort-key="G01R1/07328" definition-exists="false" ipc-concordant="G01R1/073" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/07328</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>for testing printed circuit boards</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="15" additional-only="false" sort-key="G01R1/07335" definition-exists="false" ipc-concordant="G01R1/073" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/07335</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>for double-sided contacting or for testing boards with surface-mounted devices (SMD's)</text></CPC-specific-text></title-part></class-title></classification-item></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R1/07342" definition-exists="false" ipc-concordant="G01R1/073" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/07342</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>the body of the probe being at an angle other than perpendicular to test object, e.g. probe card</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R1/0735" definition-exists="true" ipc-concordant="G01R1/073" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/0735</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>arranged on a flexible frame or film</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R1/07357" definition-exists="true" ipc-concordant="G01R1/073" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/07357</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>with flexible bodies, e.g. buckling beams</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R1/07364" definition-exists="true" ipc-concordant="G01R1/073" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/07364</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="14" additional-only="false" sort-key="G01R1/07371" definition-exists="false" ipc-concordant="G01R1/073" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/07371</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using an intermediate card or back card with apertures through which the probes pass</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="14" additional-only="false" sort-key="G01R1/07378" definition-exists="false" ipc-concordant="G01R1/073" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/07378</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using an intermediate adapter, e.g. space transformers </text><reference><text><class-ref scheme="cpc">G01R1/07371</class-ref> takes precedence</text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="14" additional-only="false" sort-key="G01R1/07385" definition-exists="false" ipc-concordant="G01R1/073" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/07385</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using switching of signals between probe tips and test bed, i.e. the standard contact matrix which in its turn connects to the tester</text></CPC-specific-text></title-part></class-title></classification-item></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R1/07392" definition-exists="true" ipc-concordant="G01R1/073" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/07392</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>manipulating each probe element or tip individually</text></CPC-specific-text></title-part></class-title></classification-item></classification-item></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R1/08" definition-exists="false" ipc-concordant="G01R1/08" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/08</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Pointers</text></title-part><title-part><text>Scales</text></title-part><title-part><text>Scale illumination</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R1/10" definition-exists="true" ipc-concordant="G01R1/10" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R1/10</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Arrangements of bearings</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R1/12" definition-exists="false" ipc-concordant="G01R1/12" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/12</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>of strip or wire bearings</text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R1/14" definition-exists="false" ipc-concordant="G01R1/14" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/14</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Braking arrangements</text></title-part><title-part><text>Damping arrangements</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R1/16" definition-exists="false" ipc-concordant="G01R1/16" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R1/16</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Magnets</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R1/18" definition-exists="true" ipc-concordant="G01R1/18" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R1/18</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Screening arrangements against electric or magnetic fields, e.g. against earth's field</text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R1/20" definition-exists="true" ipc-concordant="G01R1/20" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R1/20</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Modifications of basic electric elements for use in electric measuring instruments</text></title-part><title-part><text>Structural combinations of such elements with such instruments</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R1/203" definition-exists="false" ipc-concordant="G01R1/20" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-08-01" status="published"><classification-symbol>G01R1/203</classification-symbol><class-title date-revised="2016-08-01"><title-part><CPC-specific-text><text>Resistors used for electric measuring, e.g. decade resistors standards, resistors for comparators, series resistors, shunts </text><reference><text>resistors in general <class-ref scheme="cpc">H01C</class-ref>; microwave or radiowave terminations <class-ref scheme="cpc">H01P1/26</class-ref>; coupling devices <class-ref scheme="cpc">H01R</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R1/206" definition-exists="false" ipc-concordant="G01R1/20" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/206</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Switches for connection of measuring instruments or electric motors to measuring loads </text><reference><text>switches in general <class-ref scheme="cpc">H01H</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R1/22" definition-exists="true" ipc-concordant="G01R1/22" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R1/22</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Tong testers acting as secondary windings of current transformers</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R1/24" definition-exists="false" ipc-concordant="G01R1/24" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/24</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Transmission-line, e.g. waveguide, measuring sections, e.g. slotted section</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R1/26" definition-exists="false" ipc-concordant="G01R1/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/26</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>with linear movement of probe</text></title-part></class-title></classification-item></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R1/28" definition-exists="false" ipc-concordant="G01R1/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/28</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Provision in measuring instruments for reference values, e.g. standard voltage, standard waveform</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R1/30" definition-exists="false" ipc-concordant="G01R1/30" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/30</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Structural combination of electric measuring instruments with basic electronic circuits, e.g. with amplifier</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R1/36" definition-exists="false" ipc-concordant="G01R1/36" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R1/36</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Overload-protection arrangements or circuits for electric measuring instruments</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R1/38" definition-exists="true" ipc-concordant="G01R1/38" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R1/38</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Arrangements for altering the indicating characteristic, e.g. by modifying the air gap</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R1/40" definition-exists="false" ipc-concordant="G01R1/40" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/40</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Modifications of instruments to indicate the maximum or the minimum value reached in a time interval, e.g. by maximum indicator pointer</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R1/42" definition-exists="false" ipc-concordant="G01R1/42" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R1/42</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>thermally operated</text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R1/44" definition-exists="true" ipc-concordant="G01R1/44" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R1/44</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Modifications of instruments for temperature compensation</text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="7" additional-only="false" sort-key="G01R3/00" definition-exists="false" ipc-concordant="G01R3/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2017-08-01" status="published"><classification-symbol>G01R3/00</classification-symbol><class-title date-revised="2017-08-01"><title-part><text>Apparatus or processes specially adapted for the manufacture </text><CPC-specific-text><text>or maintenance</text></CPC-specific-text><text> of measuring instruments </text><CPC-specific-text><text>, e.g. of probe tips</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="7" additional-only="false" sort-key="G01R5/00" definition-exists="true" ipc-concordant="G01R5/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R5/00</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Instruments for converting a single current or a single voltage into a mechanical displacement</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R5/02" definition-exists="false" ipc-concordant="G01R5/02" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R5/02</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Moving-coil instruments</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R5/04" definition-exists="false" ipc-concordant="G01R5/04" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R5/04</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>with magnet external to the coil</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R5/06" definition-exists="false" ipc-concordant="G01R5/06" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R5/06</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>with core magnet</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R5/08" definition-exists="false" ipc-concordant="G01R5/08" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R5/08</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>specially adapted for wide angle deflection</text></title-part><title-part><text>with eccentrically-pivoted moving coil</text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R5/10" definition-exists="false" ipc-concordant="G01R5/10" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R5/10</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>String galvanometers</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R5/12" definition-exists="false" ipc-concordant="G01R5/12" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R5/12</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Loop galvanometers</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R5/14" definition-exists="false" ipc-concordant="G01R5/14" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R5/14</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Moving-iron instruments</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R5/16" definition-exists="false" ipc-concordant="G01R5/16" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R5/16</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>with pivoting magnet</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R5/18" definition-exists="false" ipc-concordant="G01R5/18" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R5/18</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>with pivoting soft iron, e.g. needle galvanometer</text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R5/20" definition-exists="false" ipc-concordant="G01R5/20" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-08-01" status="published"><classification-symbol>G01R5/20</classification-symbol><class-title date-revised="2016-08-01"><title-part><text>Induction instruments, e.g. Ferraris instruments</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R5/22" definition-exists="true" ipc-concordant="G01R5/22" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R5/22</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Thermoelectric instruments</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R5/24" definition-exists="false" ipc-concordant="G01R5/24" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R5/24</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>operated by elongation of a strip or wire or by expansion of a gas or fluid</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R5/26" definition-exists="false" ipc-concordant="G01R5/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R5/26</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>operated by deformation of a bimetallic element</text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R5/28" definition-exists="true" ipc-concordant="G01R5/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R5/28</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Electrostatic instruments</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R5/30" definition-exists="false" ipc-concordant="G01R5/30" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R5/30</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Leaf electrometers</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R5/32" definition-exists="false" ipc-concordant="G01R5/32" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R5/32</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Wire electrometers</text></title-part><title-part><text>Needle electrometers</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R5/34" definition-exists="false" ipc-concordant="G01R5/34" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R5/34</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Quadrant electrometers</text></title-part></class-title></classification-item></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="7" additional-only="false" sort-key="G01R7/00" definition-exists="true" ipc-concordant="G01R7/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R7/00</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Instruments capable of converting two or more currents or voltages into a single mechanical displacement </text><reference><text><class-ref scheme="cpc">G01R9/00</class-ref> takes precedence</text></reference></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R7/02" definition-exists="false" ipc-concordant="G01R7/02" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R7/02</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>for forming a sum or a difference</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R7/04" definition-exists="false" ipc-concordant="G01R7/04" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R7/04</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>for forming a quotient </text><reference><text>for measuring resistance <class-ref scheme="cpc">G01R27/08</class-ref></text></reference></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R7/06" definition-exists="false" ipc-concordant="G01R7/06" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R7/06</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>moving-iron type</text></title-part></class-title><notes-and-warnings date-revised="2013-01-01"><note type="note"><note-paragraph>This group <u>covers</u> all crossed-coil meters, i.e. logometers having a magnetic rotor</note-paragraph></note></notes-and-warnings></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R7/08" definition-exists="false" ipc-concordant="G01R7/08" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R7/08</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>moving-coil type, e.g. crossed-coil type</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R7/10" definition-exists="false" ipc-concordant="G01R7/10" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R7/10</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>having more than two moving coils</text></title-part></class-title></classification-item></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R7/12" definition-exists="false" ipc-concordant="G01R7/12" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R7/12</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>for forming product</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R7/14" definition-exists="false" ipc-concordant="G01R7/14" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R7/14</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>moving-iron type</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R7/16" definition-exists="false" ipc-concordant="G01R7/16" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R7/16</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>having both fixed and moving coils, i.e. dynamometers</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R7/18" definition-exists="false" ipc-concordant="G01R7/18" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R7/18</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>with iron core magnetically coupling fixed and moving coils</text></title-part></class-title></classification-item></classification-item></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="7" additional-only="false" sort-key="G01R9/00" definition-exists="false" ipc-concordant="G01R9/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R9/00</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Instruments employing mechanical resonance</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R9/02" definition-exists="false" ipc-concordant="G01R9/02" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R9/02</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Vibration galvanometers, e.g. for measuring current</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R9/04" definition-exists="false" ipc-concordant="G01R9/04" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R9/04</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>using vibrating reeds, e.g. for measuring frequency</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R9/06" definition-exists="false" ipc-concordant="G01R9/06" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R9/06</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>magnetically driven</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R9/08" definition-exists="false" ipc-concordant="G01R9/08" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R9/08</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>piezo-electrically driven</text></title-part></class-title></classification-item></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="7" additional-only="false" sort-key="G01R11/00" definition-exists="true" ipc-concordant="G01R11/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R11/00</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Electromechanical arrangements for measuring time integral of electric power or current, e.g. of consumption </text><reference><text>monitoring electric consumption of electrically-propelled vehicles <class-ref scheme="cpc">B60L3/00</class-ref></text></reference></title-part></class-title><notes-and-warnings date-revised="2013-01-01"><note type="note"><note-paragraph>Groups <class-ref scheme="cpc">G01R11/48</class-ref> - <class-ref scheme="cpc">G01R11/56</class-ref> take precedence over groups <class-ref scheme="cpc">G01R11/30</class-ref> - <class-ref scheme="cpc">G01R11/46</class-ref>. <br/><CPC-specific-note>This Note corresponds to IPC Note (1) relating to <class-ref scheme="cpc">G01R11/30</class-ref> - <class-ref scheme="cpc">G01R11/46</class-ref>.</CPC-specific-note></note-paragraph><note-paragraph>For the definition of "arrangement" <u>see</u> Note (2) under <class-ref scheme="cpc">G01R</class-ref></note-paragraph></note></notes-and-warnings>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R11/02" definition-exists="true" ipc-concordant="G01R11/02" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R11/02</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Constructional details</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R11/04" definition-exists="true" ipc-concordant="G01R11/04" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R11/04</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Housings</text></title-part><title-part><text>Supporting racks</text></title-part><title-part><text>Arrangements of terminals</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R11/06" definition-exists="false" ipc-concordant="G01R11/06" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R11/06</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Magnetic circuits of induction meters</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R11/067" definition-exists="false" ipc-concordant="G01R11/067" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R11/067</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Coils therefor</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R11/073" definition-exists="false" ipc-concordant="G01R11/073" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R11/073</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Armatures therefor</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R11/09" definition-exists="false" ipc-concordant="G01R11/09" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R11/09</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Disc armatures</text></title-part></class-title></classification-item></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R11/10" definition-exists="false" ipc-concordant="G01R11/10" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R11/10</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Braking magnets</text></title-part><title-part><text>Damping arrangements</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R11/12" definition-exists="true" ipc-concordant="G01R11/12" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R11/12</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Arrangements of bearings</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R11/14" definition-exists="false" ipc-concordant="G01R11/14" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R11/14</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>with magnetic relief</text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R11/16" definition-exists="false" ipc-concordant="G01R11/16" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R11/16</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Adaptations of counters to electricity meters</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R11/17" definition-exists="false" ipc-concordant="G01R11/17" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R11/17</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Compensating for errors</text></title-part><title-part><text>Adjusting or regulating means therefor</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R11/18" definition-exists="false" ipc-concordant="G01R11/18" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R11/18</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Compensating for variations in ambient conditions</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R11/185" definition-exists="false" ipc-concordant="G01R11/185" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R11/185</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Temperature compensation</text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R11/19" definition-exists="false" ipc-concordant="G01R11/19" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R11/19</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Compensating for errors caused by disturbing torque, e.g. rotating-field errors of polyphase meters</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R11/20" definition-exists="false" ipc-concordant="G01R11/20" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R11/20</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Compensating for phase errors in induction meters</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R11/21" definition-exists="false" ipc-concordant="G01R11/21" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R11/21</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Compensating for errors caused by damping effects of the current, e.g. adjustment in the overload range</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R11/22" definition-exists="false" ipc-concordant="G01R11/22" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R11/22</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Adjusting torque, e.g. adjusting starting torque, adjusting of polyphase meters for obtaining equal torques</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R11/23" definition-exists="false" ipc-concordant="G01R11/23" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R11/23</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Compensating for errors caused by friction, e.g. adjustment in the light load range</text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R11/24" definition-exists="true" ipc-concordant="G01R11/24" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R11/24</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Arrangements for avoiding or indicating fraudulent use</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R11/25" definition-exists="true" ipc-concordant="G01R11/25" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R11/25</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Arrangements for indicating or signalling faults</text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R11/30" definition-exists="false" ipc-concordant="G01R11/30" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R11/30</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Dynamo-electric motor meters</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R11/32" definition-exists="false" ipc-concordant="G01R11/32" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R11/32</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Watt-hour meters</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R11/34" definition-exists="false" ipc-concordant="G01R11/34" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R11/34</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Ampere-hour meters</text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R11/36" definition-exists="true" ipc-concordant="G01R11/36" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R11/36</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Induction meters, e.g. Ferraris meters</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R11/38" definition-exists="false" ipc-concordant="G01R11/38" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R11/38</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>for single-phase operation</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R11/40" definition-exists="false" ipc-concordant="G01R11/40" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R11/40</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>for polyphase operation</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R11/42" definition-exists="false" ipc-concordant="G01R11/42" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R11/42</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Circuitry therefor</text></title-part></class-title></classification-item></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R11/46" definition-exists="false" ipc-concordant="G01R11/46" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R11/46</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Electrically-operated clockwork meters</text></title-part><title-part><text>Oscillatory meters</text></title-part><title-part><text>Pendulum meters</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R11/465" definition-exists="false" ipc-concordant="G01R11/46" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R11/465</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Oscillatory meters</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R11/48" definition-exists="false" ipc-concordant="G01R11/48" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R11/48</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Meters specially adapted for measuring real or reactive components</text></title-part><title-part><text>Meters specially adapted for measuring apparent energy</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R11/50" definition-exists="false" ipc-concordant="G01R11/50" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R11/50</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>for measuring real component</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R11/52" definition-exists="false" ipc-concordant="G01R11/52" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R11/52</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>for measuring reactive component</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R11/54" definition-exists="false" ipc-concordant="G01R11/54" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R11/54</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>for measuring simultaneously at least two of the following three variables: real component, reactive component, apparent energy</text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R11/56" definition-exists="true" ipc-concordant="G01R11/56" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R11/56</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Special tariff meters</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R11/57" definition-exists="true" ipc-concordant="G01R11/57" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R11/57</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Multi-rate meters </text><reference><text><class-ref scheme="cpc">G01R11/63</class-ref> takes precedence</text></reference></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R11/58" definition-exists="false" ipc-concordant="G01R11/58" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R11/58</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Tariff-switching devices therefor</text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R11/60" definition-exists="false" ipc-concordant="G01R11/60" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R11/60</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Subtraction meters</text></title-part><title-part><text>Meters measuring maximum or minimum load hours</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R11/63" definition-exists="false" ipc-concordant="G01R11/63" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R11/63</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Over-consumption meters, e.g. measuring consumption while a predetermined level of power is exceeded</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R11/64" definition-exists="false" ipc-concordant="G01R11/64" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R11/64</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Maximum meters, e.g. tariff for a period is based on maximum demand within that period</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R11/66" definition-exists="false" ipc-concordant="G01R11/66" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R11/66</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Circuitry</text></title-part></class-title></classification-item></classification-item></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="7" additional-only="false" sort-key="G01R13/00" definition-exists="true" ipc-concordant="G01R13/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R13/00</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Arrangements for displaying electric variables or waveforms</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R13/02" definition-exists="true" ipc-concordant="G01R13/02" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R13/02</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>for displaying measured electric variables in digital form</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R13/0209" definition-exists="true" ipc-concordant="G01R13/02" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R13/0209</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>in numerical form</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R13/0218" definition-exists="false" ipc-concordant="G01R13/02" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R13/0218</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Circuits therefor</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R13/0227" definition-exists="false" ipc-concordant="G01R13/02" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R13/0227</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Controlling the intensity or colour of the display</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R13/0236" definition-exists="false" ipc-concordant="G01R13/02" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R13/0236</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>for presentation of more than one variable</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R13/0245" definition-exists="false" ipc-concordant="G01R13/02" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R13/0245</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>for inserting reference markers</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R13/0254" definition-exists="true" ipc-concordant="G01R13/02" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R13/0254</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>for triggering, synchronisation</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R13/0263" definition-exists="false" ipc-concordant="G01R13/02" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R13/0263</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>for non-recurrent functions, e.g. transients</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R13/0272" definition-exists="true" ipc-concordant="G01R13/02" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R13/0272</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>for sampling</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R13/0281" definition-exists="false" ipc-concordant="G01R13/02" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R13/0281</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using electro-optic elements</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R13/029" definition-exists="true" ipc-concordant="G01R13/02" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R13/029</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Software therefor</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R13/04" definition-exists="false" ipc-concordant="G01R13/04" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R13/04</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>for producing permanent records</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R13/06" definition-exists="false" ipc-concordant="G01R13/06" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-08-01" status="published"><classification-symbol>G01R13/06</classification-symbol><class-title date-revised="2016-08-01"><title-part><text>Modifications for recording transient disturbances, e.g. by starting or accelerating a recording medium</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R13/08" definition-exists="false" ipc-concordant="G01R13/08" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R13/08</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Electromechanical recording systems using a mechanical direct-writing method</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R13/10" definition-exists="false" ipc-concordant="G01R13/10" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R13/10</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>with intermittent recording by representing the variable by the length of a stroke or by the position of a dot</text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R13/12" definition-exists="false" ipc-concordant="G01R13/12" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R13/12</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Chemical recording, e.g. clydonographs </text><reference><text><class-ref scheme="cpc">G01R13/14</class-ref> takes precedence</text></reference></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R13/14" definition-exists="false" ipc-concordant="G01R13/14" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R13/14</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Recording on a light-sensitive material</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R13/16" definition-exists="false" ipc-concordant="G01R13/16" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R13/16</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Recording on a magnetic medium</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R13/18" definition-exists="false" ipc-concordant="G01R13/18" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R13/18</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>using boundary displacement</text></title-part></class-title></classification-item></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R13/20" definition-exists="true" ipc-concordant="G01R13/20" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R13/20</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Cathode-ray oscilloscopes</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R13/202" definition-exists="true" ipc-concordant="G01R13/20" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R13/202</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Non-electric appliances, e.g. scales, masks </text><reference><text>luminescent screens for CRT provided with permanent marks or references <class-ref scheme="cpc">H01J29/34</class-ref>; optical or photographic arrangements combined with CRT vessels <class-ref scheme="cpc">H01J29/89</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R13/204" definition-exists="true" ipc-concordant="G01R13/20" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R13/204</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Using means for generating permanent registrations, e.g. photographs </text><reference><text>optical or photographic arrangements combined with CRT vessel <class-ref scheme="cpc">H01J29/89</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R13/206" definition-exists="true" ipc-concordant="G01R13/20" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R13/206</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Arrangements for obtaining a 3- dimensional representation </text><reference><text>stereoscopic T.V. <class-ref scheme="cpc">H04N13/00</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R13/208" definition-exists="false" ipc-concordant="G01R13/20" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R13/208</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Arrangements for measuring with C.R. oscilloscopes, e.g. vectorscope</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R13/22" definition-exists="true" ipc-concordant="G01R13/22" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R13/22</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Circuits therefor</text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R13/225" definition-exists="true" ipc-concordant="G01R13/22" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R13/225</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>particularly adapted for storage oscilloscopes</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R13/24" definition-exists="false" ipc-concordant="G01R13/24" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R13/24</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Time-base deflection circuits</text></title-part></class-title>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R13/245" definition-exists="false" ipc-concordant="G01R13/24" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R13/245</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>for generating more than one, not overlapping time-intervals on the screen</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R13/26" definition-exists="true" ipc-concordant="G01R13/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R13/26</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Circuits for controlling the intensity of the electron beam </text><CPC-specific-text><text>or the colour of the display</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R13/28" definition-exists="true" ipc-concordant="G01R13/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R13/28</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Circuits for simultaneous or sequential presentation of more than one variable</text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R13/30" definition-exists="false" ipc-concordant="G01R13/30" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R13/30</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Circuits for inserting reference markers, e.g. for timing, for calibrating, for frequency marking</text></title-part></class-title>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R13/305" definition-exists="false" ipc-concordant="G01R13/30" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R13/305</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>for time marking</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R13/32" definition-exists="false" ipc-concordant="G01R13/32" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2017-08-01" status="published"><classification-symbol>G01R13/32</classification-symbol><class-title date-revised="2017-08-01"><title-part><text>Circuits for displaying non-recurrent functions such as transients</text></title-part><title-part><text>Circuits for triggering</text></title-part><title-part><text>Circuits for synchronisation</text></title-part><title-part><text>Circuits for time-base expansion</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R13/325" definition-exists="false" ipc-concordant="G01R13/32" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R13/325</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>for displaying non-recurrent functions such as transients</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R13/34" definition-exists="true" ipc-concordant="G01R13/34" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R13/34</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Circuits for representing a single waveform by sampling, e.g. for very high frequencies</text></title-part></class-title>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R13/342" definition-exists="true" ipc-concordant="G01R13/34" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R13/342</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>for displaying periodic H.F. signals </text><reference><text><class-ref scheme="cpc">G01R13/345</class-ref> takes precedence</text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R13/345" definition-exists="true" ipc-concordant="G01R13/34" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R13/345</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>for displaying sampled signals by using digital processors by intermediate A.D. and D.A. convertors (control circuits for CRT indicators)</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R13/347" definition-exists="true" ipc-concordant="G01R13/34" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R13/347</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using electro-optic elements</text></CPC-specific-text></title-part></class-title></classification-item></classification-item></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R13/36" definition-exists="true" ipc-concordant="G01R13/36" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R13/36</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>using length of glow discharge, e.g. glowlight oscilloscopes</text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R13/38" definition-exists="true" ipc-concordant="G01R13/38" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R13/38</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>using the steady or oscillatory displacement of a light beam by an electromechanical measuring system</text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R13/40" definition-exists="true" ipc-concordant="G01R13/40" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R13/40</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>using modulation of a light beam otherwise than by mechanical displacement, e.g. by Kerr effect </text><CPC-specific-text><reference><text>visual indication of correct tuning <class-ref scheme="cpc">H03J3/14</class-ref></text></reference></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R13/401" definition-exists="false" ipc-concordant="G01R13/40" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R13/401</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>for continuous analogue, or simulated analogue, display</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R13/402" definition-exists="true" ipc-concordant="G01R13/40" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R13/402</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using active, i.e. light-emitting display devices, e.g. electroluminescent display </text><reference><text><class-ref scheme="cpc">G01R13/36</class-ref> and <class-ref scheme="cpc">G01R13/42</class-ref> take precedence</text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R13/403" definition-exists="true" ipc-concordant="G01R13/40" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R13/403</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using passive display devices, e.g. liquid crystal display or Kerr effect display devices</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R13/404" definition-exists="true" ipc-concordant="G01R13/40" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R13/404</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>for discontinuous display, i.e. display of discrete values </text><reference><text>analogue/digital conversion <class-ref scheme="cpc">H03M1/00</class-ref></text></reference></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R13/405" definition-exists="false" ipc-concordant="G01R13/40" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R13/405</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using a plurality of active, i.e. light emitting, e.g. electro-luminescent elements, i.e. bar graphs</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R13/406" definition-exists="true" ipc-concordant="G01R13/40" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R13/406</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>representing measured value by a dot or a single line </text><reference><text><class-ref scheme="cpc">G01R13/408</class-ref> takes precedence</text></reference></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R13/407" definition-exists="true" ipc-concordant="G01R13/40" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R13/407</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using a plurality of passive display elements, e.g. liquid crystal or Kerr-effect display elements </text><reference><text><class-ref scheme="cpc">G01R13/408</class-ref> takes precedence</text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R13/408" definition-exists="false" ipc-concordant="G01R13/40" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R13/408</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Two or three dimensional representation of measured values</text></CPC-specific-text></title-part></class-title></classification-item></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R13/42" definition-exists="false" ipc-concordant="G01R13/42" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-08-01" status="published"><classification-symbol>G01R13/42</classification-symbol><class-title date-revised="2016-08-01"><title-part><text>Instruments using length of spark discharge, e.g. by measuring maximum separation of electrodes to produce spark</text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="7" additional-only="false" sort-key="G01R15/00" definition-exists="true" ipc-concordant="G01R15/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R15/00</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Details of measuring arrangements of the types provided for in groups <class-ref scheme="cpc">G01R17/00</class-ref> - <class-ref scheme="cpc">G01R29/00</class-ref>, <class-ref scheme="cpc">G01R33/00</class-ref> - <class-ref scheme="cpc">G01R33/26</class-ref> or <class-ref scheme="cpc">G01R35/00</class-ref></text></title-part></class-title>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R15/002" definition-exists="false" ipc-concordant="G01R15/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R15/002</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Switches for altering the measuring range or for multitesters</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R15/005" definition-exists="true" ipc-concordant="G01R15/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R15/005</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Circuits for altering the indicating characteristic, e.g. making it non-linear</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R15/007" definition-exists="false" ipc-concordant="G01R15/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R15/007</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>by zero-suppression</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R15/04" definition-exists="false" ipc-concordant="G01R15/04" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R15/04</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Voltage dividers</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R15/06" definition-exists="true" ipc-concordant="G01R15/06" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R15/06</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>having reactive components, e.g. capacitive transformer</text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R15/08" definition-exists="true" ipc-concordant="G01R15/08" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R15/08</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Circuits for altering the measuring range</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R15/09" definition-exists="false" ipc-concordant="G01R15/09" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R15/09</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Autoranging circuits</text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R15/12" definition-exists="false" ipc-concordant="G01R15/12" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2017-08-01" status="published"><classification-symbol>G01R15/12</classification-symbol><class-title date-revised="2017-08-01"><title-part><text>Circuits for multi-testers </text><CPC-specific-text><text>, i.e. multimeters</text></CPC-specific-text><text>, e.g. for measuring voltage, current, or impedance at will</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R15/125" definition-exists="false" ipc-concordant="G01R15/12" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R15/125</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>for digital multimeters</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R15/14" definition-exists="true" ipc-concordant="G01R15/14" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R15/14</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R15/142" definition-exists="false" ipc-concordant="G01R15/14" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-05-01" status="published"><classification-symbol>G01R15/142</classification-symbol><class-title date-revised="2016-05-01"><title-part><CPC-specific-text><text>Arrangements for simultaneous measurements of several parameters employing techniques covered by groups <class-ref scheme="cpc">G01R15/14</class-ref> - <class-ref scheme="cpc">G01R15/26</class-ref></text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R15/144" definition-exists="false" ipc-concordant="G01R15/14" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R15/144</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Measuring arrangements for voltage not covered by other subgroups of <class-ref scheme="cpc">G01R15/14</class-ref></text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R15/146" definition-exists="false" ipc-concordant="G01R15/14" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R15/146</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Measuring arrangements for current not covered by other subgroups of <class-ref scheme="cpc">G01R15/14</class-ref>, e.g. using current dividers, shunts, or measuring a voltage drop </text><reference><text>if no voltage isolation is involved <class-ref scheme="cpc">G01R1/203</class-ref> or <class-ref scheme="cpc">G01R19/0092</class-ref></text></reference></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R15/148" definition-exists="false" ipc-concordant="G01R15/14" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-11-01" status="published"><classification-symbol>G01R15/148</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>involving the measuring of a magnetic field or electric field </text><reference><text><class-ref scheme="cpc">G01R15/18</class-ref>, <class-ref scheme="cpc">G01R15/20</class-ref>, <class-ref scheme="cpc">G01R15/24</class-ref>, <class-ref scheme="cpc">G01R15/26</class-ref> take precedence</text></reference></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R15/16" definition-exists="true" ipc-concordant="G01R15/16" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R15/16</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>using capacitive devices</text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R15/165" definition-exists="false" ipc-concordant="G01R15/16" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R15/165</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>measuring electrostatic potential, e.g. with electrostatic voltmeters or electrometers, when the design of the sensor is essential </text><reference><text>electrometers with passively moving electrodes <class-ref scheme="cpc">G01R5/28</class-ref>; measuring electrostatic fields <class-ref scheme="cpc">G01R29/12</class-ref>; measuring charge <class-ref scheme="cpc">G01R29/24</class-ref>; measuring in circuits with high internal resistance <class-ref scheme="cpc">G01R19/0023</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R15/18" definition-exists="true" ipc-concordant="G01R15/18" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R15/18</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>using inductive devices, e.g. transformers</text></title-part></class-title>
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||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R15/181" definition-exists="false" ipc-concordant="G01R15/18" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R15/181</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using coils without a magnetic core, e.g. Rogowski coils</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R15/183" definition-exists="false" ipc-concordant="G01R15/18" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R15/183</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using transformers with a magnetic core</text></CPC-specific-text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R15/185" definition-exists="false" ipc-concordant="G01R15/18" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R15/185</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>with compensation or feedback windings or interacting coils, e.g. 0-flux sensors </text><reference><text>using galvano-magnetic field sensors <class-ref scheme="cpc">G01R15/20</class-ref>; conversion of DC into AC using transductors <class-ref scheme="cpc">G01R19/20</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R15/186" definition-exists="false" ipc-concordant="G01R15/18" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-05-01" status="published"><classification-symbol>G01R15/186</classification-symbol><class-title date-revised="2016-05-01"><title-part><CPC-specific-text><text>using current transformers with a core consisting of two or more parts, e.g. clamp-on type </text><reference><text><class-ref scheme="cpc">G01R15/142</class-ref> - <class-ref scheme="cpc">G01R15/16</class-ref> take precedence; tong testers <class-ref scheme="cpc">G01R1/22</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R15/188" definition-exists="false" ipc-concordant="G01R15/18" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R15/188</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>comprising rotatable parts, e.g. moving coils </text><reference><text>galvanometers <class-ref scheme="cpc">G01R5/02</class-ref>, <class-ref scheme="cpc">G01R5/14</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R15/20" definition-exists="true" ipc-concordant="G01R15/20" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R15/20</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>using galvano-magnetic devices, e.g. Hall-effect devices </text><CPC-specific-text><text>, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices</text></CPC-specific-text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R15/202" definition-exists="true" ipc-concordant="G01R15/20" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R15/202</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using Hall-effect devices </text><reference><text>Hall elements in arrangements for measuring electrical power <class-ref scheme="cpc">G01R21/08</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R15/205" definition-exists="false" ipc-concordant="G01R15/20" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R15/205</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using magneto-resistance devices, e.g. field plates</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R15/207" definition-exists="false" ipc-concordant="G01R15/20" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R15/207</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Constructional details independent of the type of device used</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R15/22" definition-exists="false" ipc-concordant="G01R15/22" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R15/22</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>using light-emitting devices, e.g. LED, optocouplers </text><CPC-specific-text><reference><text><class-ref scheme="cpc">G01R31/31901</class-ref> takes precedence</text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R15/24" definition-exists="false" ipc-concordant="G01R15/24" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R15/24</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>using light-modulating devices</text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R15/241" definition-exists="true" ipc-concordant="G01R15/24" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R15/241</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using electro-optical modulators, e.g. electro-absorption </text><reference><text>probes containing electro-optic elements <class-ref scheme="cpc">G01R1/071</class-ref></text></reference></CPC-specific-text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R15/242" definition-exists="false" ipc-concordant="G01R15/24" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R15/242</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>based on the Pockels effect, i.e. linear electro-optic effect</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R15/243" definition-exists="false" ipc-concordant="G01R15/24" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R15/243</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>based on the Kerr effect, i.e. quadratic electro-optic effect</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R15/245" definition-exists="false" ipc-concordant="G01R15/24" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R15/245</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using magneto-optical modulators, e.g. based on the Faraday or Cotton-Mouton effect</text></CPC-specific-text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R15/246" definition-exists="false" ipc-concordant="G01R15/24" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R15/246</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>based on the Faraday, i.e. linear magneto-optic, effect</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R15/247" definition-exists="false" ipc-concordant="G01R15/24" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-05-01" status="published"><classification-symbol>G01R15/247</classification-symbol><class-title date-revised="2016-05-01"><title-part><CPC-specific-text><text>Details of the circuitry or construction of devices covered by <class-ref scheme="cpc">G01R15/241</class-ref> - <class-ref scheme="cpc">G01R15/246</class-ref></text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R15/248" definition-exists="false" ipc-concordant="G01R15/24" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R15/248</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using a constant light source and electro-mechanically driven deflectors</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R15/26" definition-exists="false" ipc-concordant="G01R15/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R15/26</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>using modulation of waves other than light, e.g. radio or acoustic waves</text></title-part></class-title></classification-item></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="7" additional-only="false" sort-key="G01R17/00" definition-exists="false" ipc-concordant="G01R17/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R17/00</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Measuring arrangements involving comparison with a reference value, e.g. bridge</text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R17/02" definition-exists="false" ipc-concordant="G01R17/02" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R17/02</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Arrangements in which the value to be measured is automatically compared with a reference value</text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R17/04" definition-exists="false" ipc-concordant="G01R17/04" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R17/04</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>in which the reference value is continuously or periodically swept over the range of values to be measured</text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R17/06" definition-exists="false" ipc-concordant="G01R17/06" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R17/06</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Automatic balancing arrangements</text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R17/08" definition-exists="false" ipc-concordant="G01R17/08" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R17/08</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>in which a force or torque representing the measured value is balanced by a force or torque representing the reference value</text></title-part></class-title></classification-item></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R17/10" definition-exists="true" ipc-concordant="G01R17/10" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R17/10</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>AC or DC measuring bridges</text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R17/105" definition-exists="false" ipc-concordant="G01R17/10" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R17/105</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>for measuring impedance or resistance</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R17/12" definition-exists="false" ipc-concordant="G01R17/12" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R17/12</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>using comparison of currents, e.g. bridges with differential current output</text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R17/14" definition-exists="false" ipc-concordant="G01R17/14" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R17/14</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>with indication of measured value by calibrated null indicator, e.g. percent bridge, tolerance bridge </text><reference><text><class-ref scheme="cpc">G01R17/12</class-ref>, <class-ref scheme="cpc">G01R17/16</class-ref> take precedence</text></reference></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R17/16" definition-exists="false" ipc-concordant="G01R17/16" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R17/16</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>with discharge tubes or semiconductor devices in one or more arms of the bridge, e.g. voltmeter using a difference amplifier</text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R17/18" definition-exists="false" ipc-concordant="G01R17/18" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R17/18</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>with more than four branches</text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R17/20" definition-exists="true" ipc-concordant="G01R17/20" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R17/20</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>AC or DC potentiometric measuring arrangements</text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R17/22" definition-exists="false" ipc-concordant="G01R17/22" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R17/22</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>with indication of measured value by calibrated null indicator</text></title-part></class-title></classification-item></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="7" additional-only="false" sort-key="G01R19/00" definition-exists="true" ipc-concordant="G01R19/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R19/00</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Arrangements for measuring currents or voltages or for indicating presence or sign thereof </text><reference><text><class-ref scheme="cpc">G01R5/00</class-ref> takes precedence; for measuring bioelectric currents or voltages <class-ref scheme="cpc">A61B5/24</class-ref></text></reference></title-part></class-title><notes-and-warnings date-revised="2013-01-01"><note type="note"><note-paragraph> Within groups <class-ref scheme="cpc">G01R19/02</class-ref> - <class-ref scheme="cpc">G01R19/32</class-ref>, group <class-ref scheme="cpc">G01R19/28</class-ref> takes precedence. Groups <class-ref scheme="cpc">G01R19/18</class-ref> - <class-ref scheme="cpc">G01R19/257</class-ref> take precedence over groups <class-ref scheme="cpc">G01R19/02</class-ref> - <class-ref scheme="cpc">G01R19/17</class-ref> and <class-ref scheme="cpc">G01R19/30</class-ref>. </note-paragraph></note></notes-and-warnings>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R19/0007" definition-exists="false" ipc-concordant="G01R19/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R19/0007</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Frequency selective voltage or current level measuring </text><reference><text>measuring frequency <class-ref scheme="cpc">G01R23/00</class-ref>; testing attenuation in line transmission systems <class-ref scheme="cpc">H04B3/48</class-ref>; monitoring testing in transmission systems <class-ref scheme="cpc">H04B17/00</class-ref></text></reference></CPC-specific-text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R19/0015" definition-exists="false" ipc-concordant="G01R19/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R19/0015</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>separating AC and DC</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R19/0023" definition-exists="false" ipc-concordant="G01R19/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2017-08-01" status="published"><classification-symbol>G01R19/0023</classification-symbol><class-title date-revised="2017-08-01"><title-part><CPC-specific-text><text>Measuring currents or voltages from sources with high internal resistance by means of measuring circuits with high input impedance, e.g. OP-amplifiers </text><reference><text>electrostatic instruments <class-ref scheme="cpc">G01R5/28</class-ref>; measuring electrostatic potential <class-ref scheme="cpc">G01R15/165</class-ref>; measuring electrostatic fields <class-ref scheme="cpc">G01R29/12</class-ref>; amplifiers <u>per se</u> <class-ref scheme="cpc">H03F</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R19/003" definition-exists="true" ipc-concordant="G01R19/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R19/003</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Measuring mean values of current or voltage during a given time interval</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R19/0038" definition-exists="true" ipc-concordant="G01R19/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-08-01" status="published"><classification-symbol>G01R19/0038</classification-symbol><class-title date-revised="2016-08-01"><title-part><CPC-specific-text><text>Circuits for comparing several input signals and for indicating the result of this comparison, e.g. equal, different, greater, smaller (comparing pulses or pulse trains according to amplitude)</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R19/0046" definition-exists="false" ipc-concordant="G01R19/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2019-05-01" status="published"><classification-symbol>G01R19/0046</classification-symbol><class-title date-revised="2019-05-01"><title-part><CPC-specific-text><text>characterised by a specific application or detail not covered by any other subgroup of <class-ref scheme="cpc">G01R19/00</class-ref></text></CPC-specific-text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R19/0053" definition-exists="false" ipc-concordant="G01R19/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R19/0053</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Noise discrimination; Analog sampling; Measuring transients </text><reference><text>measuring characteristics of individual pulses <class-ref scheme="cpc">G01R29/02</class-ref>; digital sampling <class-ref scheme="cpc">G01R19/2509</class-ref>; measuring noise figure <class-ref scheme="cpc">G01R29/26</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R19/0061" definition-exists="false" ipc-concordant="G01R19/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R19/0061</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Measuring currents of particle-beams, currents from electron multipliers, photocurrents, ion currents; Measuring in plasmas</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R19/0069" definition-exists="false" ipc-concordant="G01R19/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R19/0069</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>measuring voltage or current standards</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R19/0076" definition-exists="false" ipc-concordant="G01R19/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R19/0076</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using thermionic valves</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R19/0084" definition-exists="false" ipc-concordant="G01R19/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R19/0084</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>measuring voltage only </text><reference><text>all subgroups of <class-ref scheme="cpc">G01R19/00</class-ref> take precedence</text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R19/0092" definition-exists="false" ipc-concordant="G01R19/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R19/0092</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>measuring current only </text><reference><text>all subgroups of <class-ref scheme="cpc">G01R19/00</class-ref> take precedence</text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R19/02" definition-exists="true" ipc-concordant="G01R19/02" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R19/02</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Measuring effective values, i.e. root-mean-square values</text></title-part></class-title>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R19/03" definition-exists="true" ipc-concordant="G01R19/03" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R19/03</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>using thermoconverters</text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R19/04" definition-exists="true" ipc-concordant="G01R19/04" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R19/04</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Measuring peak values </text><CPC-specific-text><text>or amplitude or envelope</text></CPC-specific-text><text> of ac or of pulses</text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R19/06" definition-exists="false" ipc-concordant="G01R19/06" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R19/06</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Measuring real component</text></title-part><title-part><text>Measuring reactive component</text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R19/08" definition-exists="false" ipc-concordant="G01R19/08" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R19/08</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Measuring current density</text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R19/10" definition-exists="false" ipc-concordant="G01R19/10" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R19/10</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Measuring sum, difference or ratio</text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R19/12" definition-exists="true" ipc-concordant="G01R19/12" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R19/12</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Measuring rate of change</text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R19/14" definition-exists="false" ipc-concordant="G01R19/14" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R19/14</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Indicating direction of current</text></title-part><title-part><text>Indicating polarity of voltage</text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R19/145" definition-exists="true" ipc-concordant="G01R19/145" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R19/145</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Indicating the presence of current or voltage</text></title-part></class-title>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R19/15" definition-exists="false" ipc-concordant="G01R19/15" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R19/15</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Indicating the presence of current</text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R19/155" definition-exists="false" ipc-concordant="G01R19/155" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R19/155</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Indicating the presence of voltage</text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R19/165" definition-exists="true" ipc-concordant="G01R19/165" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R19/165</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values</text></title-part></class-title>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R19/16504" definition-exists="false" ipc-concordant="G01R19/165" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2019-05-01" status="published"><classification-symbol>G01R19/16504</classification-symbol><class-title date-revised="2019-05-01"><title-part><CPC-specific-text><text>characterised by the components employed</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R19/16509" definition-exists="false" ipc-concordant="G01R19/165" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R19/16509</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using electromagnetic relays, e.g. reed relay </text><reference><text>magnetically driven reeds <class-ref scheme="cpc">G01R9/06</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R19/16514" definition-exists="false" ipc-concordant="G01R19/165" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R19/16514</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using electronic tubes</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R19/16519" definition-exists="false" ipc-concordant="G01R19/165" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R19/16519</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using FET's</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R19/16523" definition-exists="false" ipc-concordant="G01R19/165" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R19/16523</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using diodes, e.g. Zener diodes</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R19/16528" definition-exists="false" ipc-concordant="G01R19/165" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R19/16528</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using digital techniques or performing arithmetic operations </text><reference><text>using digital techniques to measure a voltage or a current, <u>see</u> <class-ref scheme="cpc">G01R19/25</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R19/16533" definition-exists="false" ipc-concordant="G01R19/165" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2019-05-01" status="published"><classification-symbol>G01R19/16533</classification-symbol><class-title date-revised="2019-05-01"><title-part><CPC-specific-text><text>characterised by the application</text></CPC-specific-text></title-part></class-title>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R19/16538" definition-exists="false" ipc-concordant="G01R19/165" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R19/16538</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>in AC or DC supplies </text><reference><text><class-ref scheme="cpc">G01R19/16519</class-ref> and <class-ref scheme="cpc">G01R19/16528</class-ref> take precedence</text></reference></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R19/16542" definition-exists="false" ipc-concordant="G01R19/165" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R19/16542</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>for batteries </text><reference><text>charge condition monitoring in <class-ref scheme="cpc">G01R31/36</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R19/16547" definition-exists="false" ipc-concordant="G01R19/165" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R19/16547</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>voltage or current in AC supplies </text><reference><text>switching for protection <class-ref scheme="cpc">H02H</class-ref>; circuits for emergency power supply <class-ref scheme="cpc">H02J9/00</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R19/16552" definition-exists="false" ipc-concordant="G01R19/165" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R19/16552</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>in I.C. power supplies</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R19/16557" definition-exists="false" ipc-concordant="G01R19/165" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R19/16557</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Logic probes, i.e. circuits indicating logic state (high, low, O); </text><reference><text>modifications of electronic switches or gates for indicating state of switch <class-ref scheme="cpc">H03K17/18</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R19/16561" definition-exists="false" ipc-concordant="G01R19/165" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R19/16561</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>in hand-held circuit testers </text><reference><text><u>see</u> also <class-ref scheme="cpc">G01R19/155</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R19/16566" definition-exists="false" ipc-concordant="G01R19/165" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2019-05-01" status="published"><classification-symbol>G01R19/16566</classification-symbol><class-title date-revised="2019-05-01"><title-part><CPC-specific-text><text>Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups <class-ref scheme="cpc">G01R19/16504</class-ref>, <class-ref scheme="cpc">G01R19/16528</class-ref>, <class-ref scheme="cpc">G01R19/16533</class-ref></text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R19/16571" definition-exists="false" ipc-concordant="G01R19/165" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2020-01-01" status="published"><classification-symbol>G01R19/16571</classification-symbol><class-title date-revised="2020-01-01"><title-part><CPC-specific-text><text>comparing AC or DC current with one threshold, e.g. load current, over-current, surge current or fault current </text><reference><text><class-ref scheme="cpc">G01R19/16514</class-ref>, <class-ref scheme="cpc">G01R19/16519</class-ref>, <class-ref scheme="cpc">G01R19/16528</class-ref>, <class-ref scheme="cpc">G01R19/16533</class-ref>, <class-ref scheme="cpc">G01R19/1659</class-ref> take precedence; measuring currents by using elements sensitive to the magnetic field generated <class-ref scheme="cpc">G01R15/14</class-ref>; measuring earth resistance <class-ref scheme="cpc">G01R27/18</class-ref>; testing for leakage or short circuits in electrical apparatus <class-ref scheme="cpc">G01R31/52</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R19/16576" definition-exists="false" ipc-concordant="G01R19/165" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R19/16576</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>comparing DC or AC voltage with one threshold </text><reference><text><class-ref scheme="cpc">G01R19/16514</class-ref>, <class-ref scheme="cpc">G01R19/16519</class-ref>, <class-ref scheme="cpc">G01R19/16528</class-ref>, <class-ref scheme="cpc">G01R19/16533</class-ref> and <class-ref scheme="cpc">G01R19/1659</class-ref> take precedence</text></reference></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R19/1658" definition-exists="false" ipc-concordant="G01R19/165" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R19/1658</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>AC voltage or recurrent signals</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R19/16585" definition-exists="false" ipc-concordant="G01R19/165" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R19/16585</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>for individual pulses, ripple or noise and other applications where timing or duration is of importance </text><reference><text><class-ref scheme="cpc">G01R19/16519</class-ref>, <class-ref scheme="cpc">G01R19/16538</class-ref> and <class-ref scheme="cpc">G01R19/16595</class-ref> take precedence; for pulse duration and rise time, <u>see</u> <class-ref scheme="cpc">G01R29/02</class-ref> and subgroups</text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R19/1659" definition-exists="false" ipc-concordant="G01R19/165" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R19/1659</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>to indicate that the value is within or outside a predetermined range of values (window) </text><reference><text><class-ref scheme="cpc">G01R19/16514</class-ref>, <class-ref scheme="cpc">G01R19/16519</class-ref>, <class-ref scheme="cpc">G01R19/16528</class-ref> and <class-ref scheme="cpc">G01R19/16533</class-ref> take precedence</text></reference></CPC-specific-text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R19/16595" definition-exists="false" ipc-concordant="G01R19/165" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R19/16595</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>with multi level indication </text><reference><text><class-ref scheme="cpc">G01R19/16519</class-ref> and <class-ref scheme="cpc">G01R19/16533</class-ref> take precedence</text></reference></CPC-specific-text></title-part></class-title></classification-item></classification-item></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R19/17" definition-exists="false" ipc-concordant="G01R19/17" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2017-08-01" status="published"><classification-symbol>G01R19/17</classification-symbol><class-title date-revised="2017-08-01"><title-part><text>giving an indication of the number of times this occurs </text><CPC-specific-text><text>, i.e. multi-channel analysers</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R19/175" definition-exists="true" ipc-concordant="G01R19/175" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R19/175</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Indicating the instants of passage of current or voltage through a given value, e.g. passage through zero</text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R19/18" definition-exists="true" ipc-concordant="G01R19/18" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R19/18</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>using conversion of DC into AC, e.g. with choppers</text></title-part></class-title>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R19/20" definition-exists="true" ipc-concordant="G01R19/20" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R19/20</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>using transductors </text><CPC-specific-text><text>, i.e. a magnetic core transducer the saturation of which is cyclically reversed by an AC source on the secondary side</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R19/22" definition-exists="false" ipc-concordant="G01R19/22" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R19/22</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>using conversion of ac into dc</text></title-part></class-title>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R19/225" definition-exists="false" ipc-concordant="G01R19/22" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R19/225</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>by means of thermocouples or other heat sensitive elements</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="true" not-allocatable="false" level="9" additional-only="true" sort-key="G01R19/24" definition-exists="false" ipc-concordant="G01R19/22" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R2019/24</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using thermocouples</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R19/25" definition-exists="true" ipc-concordant="G01R19/25" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R19/25</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>using digital measurement techniques</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R19/2503" definition-exists="false" ipc-concordant="G01R19/25" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-05-01" status="published"><classification-symbol>G01R19/2503</classification-symbol><class-title date-revised="2016-05-01"><title-part><CPC-specific-text><text>for measuring voltage only, e.g. digital volt meters (DVM's) </text><reference><text><class-ref scheme="cpc">G01R19/2506</class-ref> - <class-ref scheme="cpc">G01R19/257</class-ref> take precedence</text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R19/2506" definition-exists="false" ipc-concordant="G01R19/25" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R19/2506</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Arrangements for conditioning or analysing measured signals, e.g. for indicating peak values </text><reference><text><class-ref scheme="cpc">G01R19/003</class-ref> takes precedence</text></reference><text>; Details concerning sampling, digitizing or waveform capturing </text><reference><text>displaying waveforms <class-ref scheme="cpc">G01R13/00</class-ref>; analog sampling <class-ref scheme="cpc">G01R19/0053</class-ref></text></reference></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R19/2509" definition-exists="false" ipc-concordant="G01R19/25" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R19/2509</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Details concerning sampling, digitizing or waveform capturing</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R19/2513" definition-exists="false" ipc-concordant="G01R19/25" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R19/2513</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Arrangements for monitoring electric power systems, e.g. power lines or loads; Logging</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R19/2516" definition-exists="false" ipc-concordant="G01R19/25" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R19/2516</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Modular arrangements for computer based systems; using personal computers (PC's), e.g. "virtual instruments"</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R19/252" definition-exists="true" ipc-concordant="G01R19/252" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R19/252</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>using analogue/digital converters of the type with conversion of voltage or current into frequency and measuring of this frequency</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R19/255" definition-exists="true" ipc-concordant="G01R19/255" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R19/255</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>using analogue/digital converters of the type with counting of pulses during a period of time proportional to voltage or current, delivered by a pulse generator with fixed frequency</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R19/257" definition-exists="true" ipc-concordant="G01R19/257" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R19/257</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>using analogue/digital converters of the type with comparison of different reference values with the value of voltage or current, e.g. using step-by-step method</text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R19/28" definition-exists="true" ipc-concordant="G01R19/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R19/28</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>adapted for measuring in circuits having distributed constants</text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R19/30" definition-exists="true" ipc-concordant="G01R19/30" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R19/30</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Measuring the maximum or the minimum value of current or voltage reached in a time interval </text><reference><text><class-ref scheme="cpc">G01R19/04</class-ref> takes precedence</text></reference></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R19/32" definition-exists="true" ipc-concordant="G01R19/32" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R19/32</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Compensating for temperature change</text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="7" additional-only="false" sort-key="G01R21/00" definition-exists="true" ipc-concordant="G01R21/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R21/00</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Arrangements for measuring electric power or power factor </text><reference><text><class-ref scheme="cpc">G01R7/12</class-ref> takes precedence</text></reference></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R21/001" definition-exists="true" ipc-concordant="G01R21/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R21/001</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Measuring real or reactive component; Measuring apparent energy </text><reference><text><class-ref scheme="cpc">G01R21/01</class-ref>, <class-ref scheme="cpc">G01R21/02</class-ref>, <class-ref scheme="cpc">G01R21/08</class-ref>, <class-ref scheme="cpc">G01R21/10</class-ref> and <class-ref scheme="cpc">G01R21/127</class-ref> take precedence</text></reference></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R21/002" definition-exists="true" ipc-concordant="G01R21/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R21/002</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Measuring real component</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R21/003" definition-exists="true" ipc-concordant="G01R21/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R21/003</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Measuring reactive component</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R21/005" definition-exists="true" ipc-concordant="G01R21/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R21/005</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Measuring apparent power</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R21/006" definition-exists="false" ipc-concordant="G01R21/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R21/006</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Measuring power factor</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R21/007" definition-exists="true" ipc-concordant="G01R21/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R21/007</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Adapted for special tariff measuring </text><reference><text><class-ref scheme="cpc">G01R21/01</class-ref>, <class-ref scheme="cpc">G01R21/02</class-ref>, <class-ref scheme="cpc">G01R21/08</class-ref>, <class-ref scheme="cpc">G01R21/10</class-ref>, <class-ref scheme="cpc">G01R21/1278</class-ref> and <class-ref scheme="cpc">G01R21/1333</class-ref> take precedence</text></reference></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R21/008" definition-exists="true" ipc-concordant="G01R21/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R21/008</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Measuring maximum demand</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R21/01" definition-exists="true" ipc-concordant="G01R21/01" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R21/01</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>in circuits having distributed constants </text><reference><text><class-ref scheme="cpc">G01R21/04</class-ref>, <class-ref scheme="cpc">G01R21/07</class-ref>, <class-ref scheme="cpc">G01R21/09</class-ref>, <class-ref scheme="cpc">G01R21/12</class-ref> take precedence</text></reference></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R21/02" definition-exists="true" ipc-concordant="G01R21/02" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-08-01" status="published"><classification-symbol>G01R21/02</classification-symbol><class-title date-revised="2016-08-01"><title-part><text>by thermal methods </text><CPC-specific-text><text>, e.g. calorimetric</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R21/04" definition-exists="true" ipc-concordant="G01R21/04" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R21/04</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>in circuits having distributed constants</text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R21/06" definition-exists="true" ipc-concordant="G01R21/06" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-05-01" status="published"><classification-symbol>G01R21/06</classification-symbol><class-title date-revised="2016-05-01"><title-part><text>by measuring current and voltage </text><reference><text><class-ref scheme="cpc">G01R21/08</class-ref> - <class-ref scheme="cpc">G01R21/133</class-ref> take precedence</text></reference></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R21/07" definition-exists="true" ipc-concordant="G01R21/07" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R21/07</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>in circuits having distributed constants </text><reference><text><class-ref scheme="cpc">G01R21/09</class-ref> takes precedence</text></reference></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R21/08" definition-exists="true" ipc-concordant="G01R21/08" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R21/08</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>by using galvanomagnetic-effect devices, e.g. Hall-effect devices</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R21/09" definition-exists="true" ipc-concordant="G01R21/09" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R21/09</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>in circuits having distributed constants</text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R21/10" definition-exists="true" ipc-concordant="G01R21/10" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R21/10</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>by using square-law characteristics of circuit elements, e.g. diodes, to measure power absorbed by loads of known impedance </text><reference><text><class-ref scheme="cpc">G01R21/02</class-ref> takes precedence</text></reference></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R21/12" definition-exists="true" ipc-concordant="G01R21/12" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R21/12</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>in circuits having distributed constants</text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R21/127" definition-exists="true" ipc-concordant="G01R21/127" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R21/127</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>by using pulse modulation </text><reference><text><class-ref scheme="cpc">G01R21/133</class-ref> takes precedence</text></reference></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R21/1271" definition-exists="false" ipc-concordant="G01R21/127" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R21/1271</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Measuring real or reactive component, measuring apparent energy</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R21/1273" definition-exists="false" ipc-concordant="G01R21/127" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R21/1273</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Measuring real component</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R21/1275" definition-exists="false" ipc-concordant="G01R21/127" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R21/1275</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Measuring reactive component</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R21/1276" definition-exists="false" ipc-concordant="G01R21/127" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R21/1276</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Measuring apparent energy</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R21/1278" definition-exists="false" ipc-concordant="G01R21/127" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R21/1278</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Adapted for special tariff measuring</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R21/133" definition-exists="true" ipc-concordant="G01R21/133" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R21/133</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>by using digital technique</text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R21/1331" definition-exists="false" ipc-concordant="G01R21/133" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R21/1331</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Measuring real or reactive component, measuring apparent energy</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R21/1333" definition-exists="false" ipc-concordant="G01R21/133" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R21/1333</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>adapted for special tariff measuring</text></CPC-specific-text></title-part></class-title>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R21/1335" definition-exists="false" ipc-concordant="G01R21/133" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R21/1335</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Tariff switching circuits</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R21/1336" definition-exists="false" ipc-concordant="G01R21/133" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R21/1336</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Measuring overconsumption</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R21/1338" definition-exists="true" ipc-concordant="G01R21/133" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R21/1338</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Measuring maximum demand</text></CPC-specific-text></title-part></class-title></classification-item></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R21/14" definition-exists="false" ipc-concordant="G01R21/14" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R21/14</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Compensating for temperature change</text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="7" additional-only="false" sort-key="G01R22/00" definition-exists="true" ipc-concordant="G01R22/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R22/00</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Arrangements for measuring time integral of electric power or current, e.g. electricity meters</text></title-part></class-title><notes-and-warnings date-revised="2013-01-01"><note type="note"><note-paragraph> An arrangement for measuring time integral of electric power is classified in group <class-ref scheme="cpc">G01R21/00</class-ref> if the essential characteristic is the measuring of electric power. </note-paragraph></note></notes-and-warnings>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R22/02" definition-exists="false" ipc-concordant="G01R22/02" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R22/02</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>by electrolytic methods</text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R22/04" definition-exists="false" ipc-concordant="G01R22/04" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R22/04</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>by calorimetric methods</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R22/06" definition-exists="true" ipc-concordant="G01R22/06" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-11-01" status="published"><classification-symbol>G01R22/06</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>by electronic methods</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R22/061" definition-exists="false" ipc-concordant="G01R22/06" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R22/061</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Details of electronic electricity meters</text></CPC-specific-text></title-part></class-title>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R22/063" definition-exists="true" ipc-concordant="G01R22/06" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R22/063</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>related to remote communication</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R22/065" definition-exists="true" ipc-concordant="G01R22/06" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R22/065</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>related to mechanical aspects</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R22/066" definition-exists="true" ipc-concordant="G01R22/06" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-11-01" status="published"><classification-symbol>G01R22/066</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Arrangements for avoiding or indicating fraudulent use</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R22/068" definition-exists="false" ipc-concordant="G01R22/06" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-11-01" status="published"><classification-symbol>G01R22/068</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Arrangements for indicating or signaling faults</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R22/08" definition-exists="true" ipc-concordant="G01R22/08" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R22/08</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>using analogue techniques</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R22/10" definition-exists="true" ipc-concordant="G01R22/10" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R22/10</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>using digital techniques</text></title-part></class-title></classification-item></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="7" additional-only="false" sort-key="G01R23/00" definition-exists="true" ipc-concordant="G01R23/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R23/00</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Arrangements for measuring frequencies</text></title-part><title-part><text>Arrangements for analysing frequency spectra</text></title-part></class-title>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R23/005" definition-exists="true" ipc-concordant="G01R23/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R23/005</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Circuits for comparing several input signals and for indicating the result of this comparison, e.g. equal, different, greater, smaller (comparing phase or frequency of 2 mutually independent oscillations in demodulators)</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R23/02" definition-exists="true" ipc-concordant="G01R23/02" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R23/02</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Arrangements for measuring frequency, e.g. pulse repetition rate</text></title-part><title-part><text>Arrangements for measuring period of current or voltage</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R23/04" definition-exists="true" ipc-concordant="G01R23/04" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R23/04</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>adapted for measuring in circuits having distributed constants</text></title-part></class-title></classification-item>
|
||
|
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R23/06" definition-exists="false" ipc-concordant="G01R23/06" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R23/06</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>by converting frequency into an amplitude of current or voltage</text></title-part></class-title>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R23/07" definition-exists="true" ipc-concordant="G01R23/07" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R23/07</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>using response of circuits tuned on resonance, e.g. grid-drip meter</text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R23/08" definition-exists="false" ipc-concordant="G01R23/08" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R23/08</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>using response of circuits tuned off resonance</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R23/09" definition-exists="true" ipc-concordant="G01R23/09" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R23/09</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>using analogue integrators, e.g. capacitors establishing a mean value by balance of input signals and defined discharge signals or leakage</text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R23/10" definition-exists="false" ipc-concordant="G01R23/10" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2017-08-01" status="published"><classification-symbol>G01R23/10</classification-symbol><class-title date-revised="2017-08-01"><title-part><text>by converting frequency into a train of pulses, which are then counted </text><CPC-specific-text><text>, i.e. converting the signal into a square wave</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R23/12" definition-exists="false" ipc-concordant="G01R23/12" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R23/12</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>by converting frequency into phase shift</text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R23/14" definition-exists="true" ipc-concordant="G01R23/14" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R23/14</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>by heterodyning</text></title-part><title-part><text>by beat-frequency comparison</text></title-part></class-title>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R23/145" definition-exists="true" ipc-concordant="G01R23/14" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R23/145</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>by heterodyning or by beat-frequency comparison with the harmonic of an oscillator</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R23/15" definition-exists="false" ipc-concordant="G01R23/15" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R23/15</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Indicating that frequency of pulses is either above or below a predetermined value or within or outside a predetermined range of values, by making use of non-linear or digital elements </text><CPC-specific-text><text>(indicating that pulse width is above or below a certain limit)</text></CPC-specific-text></title-part></class-title>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R23/155" definition-exists="true" ipc-concordant="G01R23/15" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R23/155</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>giving an indication of the number of times this occurs, i.e. multi-channel analysers (for pulse characteristics)</text></CPC-specific-text></title-part></class-title></classification-item></classification-item></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R23/16" definition-exists="true" ipc-concordant="G01R23/16" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R23/16</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Spectrum analysis</text></title-part><title-part><text>Fourier analysis</text></title-part></class-title>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R23/163" definition-exists="true" ipc-concordant="G01R23/163" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R23/163</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>adapted for measuring in circuits having distributed constants</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R23/165" definition-exists="false" ipc-concordant="G01R23/165" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R23/165</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>using filters</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R23/167" definition-exists="true" ipc-concordant="G01R23/167" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R23/167</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>with digital filters</text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R23/17" definition-exists="false" ipc-concordant="G01R23/17" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R23/17</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>with optical </text><CPC-specific-text><text>or acoustical</text></CPC-specific-text><text> auxiliary devices</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R23/173" definition-exists="true" ipc-concordant="G01R23/173" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R23/173</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Wobbulating devices similar to swept panoramic receivers</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R23/175" definition-exists="false" ipc-concordant="G01R23/175" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R23/175</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>by delay means, e.g. tapped delay lines</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R23/177" definition-exists="false" ipc-concordant="G01R23/177" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R23/177</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Analysis of very low frequencies</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R23/18" definition-exists="true" ipc-concordant="G01R23/18" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R23/18</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>with provision for recording frequency spectrum</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R23/20" definition-exists="true" ipc-concordant="G01R23/20" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R23/20</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Measurement of non-linear distortion</text></title-part></class-title></classification-item></classification-item></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="7" additional-only="false" sort-key="G01R25/00" definition-exists="true" ipc-concordant="G01R25/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R25/00</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Arrangements for measuring phase angle between a voltage and a current or between voltages or currents</text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R25/005" definition-exists="true" ipc-concordant="G01R25/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-08-01" status="published"><classification-symbol>G01R25/005</classification-symbol><class-title date-revised="2016-08-01"><title-part><CPC-specific-text><text>Circuits for comparing several input signals and for indicating the result of this comparison, e.g. equal, different, greater, smaller, or for passing one of the input signals as output signal</text></CPC-specific-text></title-part></class-title></classification-item>
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||
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R25/02" definition-exists="true" ipc-concordant="G01R25/02" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R25/02</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>in circuits having distributed constants</text></title-part></class-title></classification-item>
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||
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R25/04" definition-exists="false" ipc-concordant="G01R25/04" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R25/04</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>involving adjustment of a phase shifter to produce a predetermined phase difference, e.g. zero difference</text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R25/06" definition-exists="false" ipc-concordant="G01R25/06" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R25/06</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>employing quotient instrument</text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R25/08" definition-exists="true" ipc-concordant="G01R25/08" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R25/08</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>by counting of standard pulses</text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="7" additional-only="false" sort-key="G01R27/00" definition-exists="true" ipc-concordant="G01R27/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R27/00</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom</text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R27/02" definition-exists="true" ipc-concordant="G01R27/02" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-05-01" status="published"><classification-symbol>G01R27/02</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant </text><reference><text>by measuring phase angle only <class-ref scheme="cpc">G01R25/00</class-ref></text></reference></title-part></class-title><notes-and-warnings date-revised="2013-01-01"><note type="note"><note-paragraph> Groups <class-ref scheme="cpc">G01R27/02</class-ref> - <class-ref scheme="cpc">G01R27/22</class-ref> cover variables that directly or indirectly can be measured over two poles of a component or a Thevenin two-pole equivalent. Subgroup <class-ref scheme="cpc">G01R27/26</class-ref> also covers other techniques, e.g. using electro magnetic waves or network analyzers </note-paragraph></note></notes-and-warnings>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R27/025" definition-exists="true" ipc-concordant="G01R27/02" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R27/025</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Measuring very high resistances, e.g. isolation resistances, i.e. megohm-meters</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R27/04" definition-exists="true" ipc-concordant="G01R27/04" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2017-08-01" status="published"><classification-symbol>G01R27/04</classification-symbol><class-title date-revised="2017-08-01"><title-part><text>in circuits having distributed constants </text><CPC-specific-text><text>, e.g. having very long conductors or involving high frequencies</text></CPC-specific-text></title-part></class-title>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R27/06" definition-exists="true" ipc-concordant="G01R27/06" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R27/06</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Measuring reflection coefficients</text></title-part><title-part><text>Measuring standing-wave ratio</text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R27/08" definition-exists="false" ipc-concordant="G01R27/08" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R27/08</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Measuring resistance by measuring both voltage and current</text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R27/10" definition-exists="false" ipc-concordant="G01R27/10" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R27/10</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>using two-coil or crossed-coil instruments forming quotient</text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R27/12" definition-exists="false" ipc-concordant="G01R27/12" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R27/12</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>using hand generators, e.g. meggers</text></title-part></class-title></classification-item></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R27/14" definition-exists="true" ipc-concordant="G01R27/14" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R27/14</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Measuring resistance by measuring current or voltage obtained from a reference source </text><reference><text><class-ref scheme="cpc">G01R27/16</class-ref>, <class-ref scheme="cpc">G01R27/20</class-ref>, <class-ref scheme="cpc">G01R27/22</class-ref> take precedence</text></reference></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R27/16" definition-exists="false" ipc-concordant="G01R27/16" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R27/16</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Measuring impedance of element or network through which a current is passing from another source, e.g. cable, power line</text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R27/18" definition-exists="true" ipc-concordant="G01R27/18" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2017-08-01" status="published"><classification-symbol>G01R27/18</classification-symbol><class-title date-revised="2017-08-01"><title-part><text>Measuring resistance to earth </text><CPC-specific-text><text>, i.e. line to ground</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R27/20" definition-exists="true" ipc-concordant="G01R27/20" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R27/20</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Measuring earth resistance</text></title-part><title-part><text>Measuring contact resistance, </text><CPC-specific-text><text>e.g.</text></CPC-specific-text><text> of earth connections, e.g. plates</text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R27/205" definition-exists="true" ipc-concordant="G01R27/20" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R27/205</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Measuring contact resistance of connections, e.g. of earth connections</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R27/22" definition-exists="true" ipc-concordant="G01R27/22" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R27/22</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Measuring resistance of fluids</text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R27/26" definition-exists="true" ipc-concordant="G01R27/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2017-08-01" status="published"><classification-symbol>G01R27/26</classification-symbol><class-title date-revised="2017-08-01"><title-part><text>Measuring inductance or capacitance</text></title-part><title-part><text>Measuring quality factor, e.g. by using the resonance method</text></title-part><title-part><text>Measuring loss factor</text></title-part><title-part><text>Measuring dielectric constants </text><CPC-specific-text><text>; Measuring impedance or related variables</text></CPC-specific-text></title-part></class-title>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R27/2605" definition-exists="true" ipc-concordant="G01R27/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R27/2605</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Measuring capacitance </text><reference><text>capacitive sensors <class-ref scheme="cpc">G01D5/24</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R27/2611" definition-exists="true" ipc-concordant="G01R27/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R27/2611</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Measuring inductance</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R27/2617" definition-exists="true" ipc-concordant="G01R27/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2020-01-01" status="published"><classification-symbol>G01R27/2617</classification-symbol><class-title date-revised="2020-01-01"><title-part><CPC-specific-text><text>Measuring dielectric properties, e.g. constants </text><reference><text>testing dielectric strength <class-ref scheme="cpc">G01R31/12</class-ref>; detecting insulation faults <class-ref scheme="cpc">G01R31/52</class-ref>; <class-ref scheme="cpc">G01R27/2688</class-ref> takes precedence</text></reference></CPC-specific-text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R27/2623" definition-exists="true" ipc-concordant="G01R27/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R27/2623</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Measuring-systems or electronic circuits </text><reference><text><class-ref scheme="cpc">G01R27/2635</class-ref>, <class-ref scheme="cpc">G01R27/2682</class-ref> take precedence</text></reference></CPC-specific-text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R27/2629" definition-exists="true" ipc-concordant="G01R27/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R27/2629</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Bridge circuits </text><reference><text>bridges for measuring loss angle <class-ref scheme="cpc">G01R27/2694</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R27/2635" definition-exists="false" ipc-concordant="G01R27/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R27/2635</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Sample holders, electrodes or excitation arrangements, e.g. sensors or measuring cells</text></CPC-specific-text></title-part></class-title>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R27/2641" definition-exists="false" ipc-concordant="G01R27/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R27/2641</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>of plate type, i.e. with the sample sandwiched in the middle</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R27/2647" definition-exists="false" ipc-concordant="G01R27/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R27/2647</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>of coaxial or concentric type, e.g. with the sample in a coaxial line</text></CPC-specific-text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R27/2652" definition-exists="false" ipc-concordant="G01R27/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R27/2652</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>open-ended type, e.g. abutting against the sample</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R27/2658" definition-exists="true" ipc-concordant="G01R27/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R27/2658</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Cavities, resonators, free space arrangements, reflexion or interference arrangements </text><reference><text><class-ref scheme="cpc">G01R27/2647</class-ref> takes precedence; optical methods <class-ref scheme="cpc">G01R27/2682</class-ref></text></reference></CPC-specific-text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R27/2664" definition-exists="false" ipc-concordant="G01R27/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R27/2664</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Transmission line, wave guide (closed or open-ended) or strip - or microstrip line arrangements</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R27/267" definition-exists="false" ipc-concordant="G01R27/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R27/267</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Coils or antennae arrangements, e.g. coils surrounding the sample or transmitter/receiver antennae</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R27/2676" definition-exists="false" ipc-concordant="G01R27/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R27/2676</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Probes</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R27/2682" definition-exists="false" ipc-concordant="G01R27/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R27/2682</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using optical methods or electron beams</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R27/2688" definition-exists="true" ipc-concordant="G01R27/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R27/2688</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Measuring quality factor or dielectric loss, e.g. loss angle, or power factor </text><reference><text>power factor related to power measurements <class-ref scheme="cpc">G01R21/006</class-ref>; testing capacitors <class-ref scheme="cpc">G01R31/016</class-ref></text></reference></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R27/2694" definition-exists="false" ipc-concordant="G01R27/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R27/2694</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Measuring dielectric loss, e.g. loss angle, loss factor or power factor</text></CPC-specific-text></title-part></class-title></classification-item></classification-item></classification-item></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R27/28" definition-exists="true" ipc-concordant="G01R27/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R27/28</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks</text></title-part><title-part><text>Measuring transient response </text><reference><text>in line transmission systems <class-ref scheme="cpc">H04B3/46</class-ref></text></reference></title-part></class-title>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R27/30" definition-exists="false" ipc-concordant="G01R27/30" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R27/30</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>with provision for recording characteristics, e.g. by plotting Nyquist diagram</text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R27/32" definition-exists="true" ipc-concordant="G01R27/32" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2017-08-01" status="published"><classification-symbol>G01R27/32</classification-symbol><class-title date-revised="2017-08-01"><title-part><text>in circuits having distributed constants </text><CPC-specific-text><text>, e.g. having very long conductors or involving high frequencies</text></CPC-specific-text></title-part></class-title></classification-item></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="7" additional-only="false" sort-key="G01R29/00" definition-exists="false" ipc-concordant="G01R29/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-05-01" status="published"><classification-symbol>G01R29/00</classification-symbol><class-title date-revised="2016-05-01"><title-part><text>Arrangements for measuring or indicating electric quantities not covered by groups <class-ref scheme="cpc">G01R19/00</class-ref> - <class-ref scheme="cpc">G01R27/00</class-ref></text></title-part></class-title>
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||
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R29/02" definition-exists="true" ipc-concordant="G01R29/02" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R29/02</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration</text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R29/023" definition-exists="false" ipc-concordant="G01R29/02" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-11-01" status="published"><classification-symbol>G01R29/023</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Measuring pulse width</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R29/027" definition-exists="false" ipc-concordant="G01R29/027" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R29/027</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Indicating that a pulse characteristic is either above or below a predetermined value or within or beyond a predetermined range of values</text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R29/0273" definition-exists="false" ipc-concordant="G01R29/027" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-08-01" status="published"><classification-symbol>G01R29/0273</classification-symbol><class-title date-revised="2016-08-01"><title-part><CPC-specific-text><text>the pulse characteristic being duration, i.e. width (indicating that frequency of pulses is above or below a certain limit)</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R29/0276" definition-exists="true" ipc-concordant="G01R29/027" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R29/0276</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>the pulse characteristic being rise time </text><reference><text>measuring rate of change <class-ref scheme="cpc">G01R19/12</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R29/033" definition-exists="false" ipc-concordant="G01R29/033" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2017-08-01" status="published"><classification-symbol>G01R29/033</classification-symbol><class-title date-revised="2017-08-01"><title-part><text>giving an indication of the number of times this occurs </text><CPC-specific-text><text>, i.e. multi-channel analysers (the characteristic being frequency)</text></CPC-specific-text></title-part></class-title></classification-item></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R29/04" definition-exists="true" ipc-concordant="G01R29/04" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R29/04</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Measuring form factor, i.e. quotient of root-mean-square value and arithmetic mean of instantaneous value</text></title-part><title-part><text>Measuring peak factor, i.e. quotient of maximum value and root-mean-square value</text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R29/06" definition-exists="true" ipc-concordant="G01R29/06" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R29/06</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Measuring depth of modulation</text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R29/08" definition-exists="true" ipc-concordant="G01R29/08" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R29/08</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Measuring electromagnetic field characteristics</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R29/0807" definition-exists="false" ipc-concordant="G01R29/08" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2019-05-01" status="published"><classification-symbol>G01R29/0807</classification-symbol><class-title date-revised="2019-05-01"><title-part><CPC-specific-text><text>characterised by the application</text></CPC-specific-text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R29/0814" definition-exists="true" ipc-concordant="G01R29/08" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R29/0814</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Field measurements related to measuring influence on or from apparatus, components or humans </text><reference><text>EMC, EMI and similar testing in general <class-ref scheme="cpc">G01R31/001</class-ref></text></reference><text>, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning</text></CPC-specific-text></title-part></class-title>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R29/0821" definition-exists="true" ipc-concordant="G01R29/08" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R29/0821</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>rooms and test sites therefor, e.g. anechoic chambers, open field sites or TEM cells </text><reference><text>for testing antennas <class-ref scheme="cpc">G01R29/105</class-ref></text></reference></CPC-specific-text></title-part></class-title>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R29/0828" definition-exists="false" ipc-concordant="G01R29/08" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R29/0828</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>TEM-cells</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R29/0835" definition-exists="false" ipc-concordant="G01R29/08" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R29/0835</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Testing shielding, e.g. for efficiency</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R29/0842" definition-exists="false" ipc-concordant="G01R29/08" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R29/0842</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Measurements related to lightning, e.g. measuring electric disturbances, warning systems</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R29/085" definition-exists="true" ipc-concordant="G01R29/08" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2020-01-01" status="published"><classification-symbol>G01R29/085</classification-symbol><class-title date-revised="2020-01-01"><title-part><CPC-specific-text><text>for detecting presence or location of electric lines or cables </text><reference><text>fault detection <class-ref scheme="cpc">G01R31/50</class-ref>; fault location <class-ref scheme="cpc">G01R31/08</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R29/0857" definition-exists="true" ipc-concordant="G01R29/08" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2017-08-01" status="published"><classification-symbol>G01R29/0857</classification-symbol><class-title date-revised="2017-08-01"><title-part><CPC-specific-text><text>Dosimetry, i.e. measuring the time integral of radiation intensity; Level warning devices for personal safety use </text><reference><text>nuclear radiation dosimetry <class-ref scheme="cpc">G01T</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R29/0864" definition-exists="false" ipc-concordant="G01R29/08" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2019-05-01" status="published"><classification-symbol>G01R29/0864</classification-symbol><class-title date-revised="2019-05-01"><title-part><CPC-specific-text><text>characterised by constructional or functional features</text></CPC-specific-text></title-part></class-title>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R29/0871" definition-exists="true" ipc-concordant="G01R29/08" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R29/0871</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Complete apparatus or systems; circuits, e.g. receivers or amplifiers </text><reference><text><class-ref scheme="cpc">G01R29/0878</class-ref>, <class-ref scheme="cpc">G01R29/0892</class-ref> take precedence; dosimeters, warning devices <class-ref scheme="cpc">G01R29/0857</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R29/0878" definition-exists="true" ipc-concordant="G01R29/08" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2017-08-01" status="published"><classification-symbol>G01R29/0878</classification-symbol><class-title date-revised="2017-08-01"><title-part><CPC-specific-text><text>Sensors; antennas; probes; detectors </text><reference><text>wave guide measuring sections <class-ref scheme="cpc">G01R1/24</class-ref></text></reference></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R29/0885" definition-exists="false" ipc-concordant="G01R29/08" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R29/0885</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using optical probes, e.g. electro-optical, luminiscent, glow discharge, or optical interferometers</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R29/0892" definition-exists="false" ipc-concordant="G01R29/08" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R29/0892</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Details related to signal analysis or treatment; presenting results, e.g. displays; measuring specific signal features other than field strength, e.g. polarisation, field modes, phase, envelope, maximum value</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R29/10" definition-exists="true" ipc-concordant="G01R29/10" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2018-01-01" status="published"><classification-symbol>G01R29/10</classification-symbol><class-title date-revised="2018-01-01"><title-part><text>Radiation diagrams of antennas</text></title-part></class-title>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R29/105" definition-exists="true" ipc-concordant="G01R29/10" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R29/105</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using anechoic chambers; Chambers or open field sites used therefor </text><reference><text>test sites used for measuring on other objects than aerials <class-ref scheme="cpc">G01R29/0828</class-ref>; wave absorbing devices <class-ref scheme="cpc">H01Q17/00</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R29/12" definition-exists="true" ipc-concordant="G01R29/12" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R29/12</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Measuring electrostatic fields </text><CPC-specific-text><text>or voltage-potential</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R29/14" definition-exists="true" ipc-concordant="G01R29/14" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R29/14</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Measuring field distribution</text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R29/16" definition-exists="true" ipc-concordant="G01R29/16" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R29/16</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Measuring asymmetry of polyphase networks</text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R29/18" definition-exists="true" ipc-concordant="G01R29/18" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R29/18</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Indicating phase sequence</text></title-part><title-part><text>Indicating synchronism</text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R29/20" definition-exists="true" ipc-concordant="G01R29/20" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R29/20</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Measuring number of turns</text></title-part><title-part><text>Measuring transformation ratio or coupling factor of windings</text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R29/22" definition-exists="true" ipc-concordant="G01R29/22" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R29/22</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Measuring piezo-electric properties</text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R29/24" definition-exists="true" ipc-concordant="G01R29/24" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R29/24</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Arrangements for measuring quantities of charge</text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R29/26" definition-exists="true" ipc-concordant="G01R29/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R29/26</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Measuring noise figure</text></title-part><title-part><text>Measuring signal-to-noise ratio</text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="7" additional-only="false" sort-key="G01R31/00" definition-exists="true" ipc-concordant="G01R31/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2020-01-01" status="published"><classification-symbol>G01R31/00</classification-symbol><class-title date-revised="2017-01-01"><title-part><text>Arrangements for testing electric properties</text></title-part><title-part><text>Arrangements for locating electric faults</text></title-part><title-part><text>Arrangements for electrical testing characterised by what is being tested not provided for elsewhere </text><reference><CPC-specific-text><text>measuring superconductive properties <class-ref scheme="cpc">G01R33/1238</class-ref>;</text></CPC-specific-text><text> testing or measuring semiconductors or solid state devices during manufacture </text><CPC-specific-text><text><class-ref scheme="cpc">H01L22/00</class-ref></text></CPC-specific-text><text>; testing line transmission systems <class-ref scheme="cpc">H04B3/46</class-ref></text></reference></title-part></class-title><notes-and-warnings><note type="note"><note-paragraph>Groups <class-ref scheme="cpc">G01R31/08</class-ref>, <class-ref scheme="cpc">G01R31/12</class-ref>, <class-ref scheme="cpc">G01R31/327</class-ref>, <class-ref scheme="cpc">G01R31/24</class-ref>, <class-ref scheme="cpc">G01R31/26</class-ref>, <class-ref scheme="cpc">G01R31/34</class-ref>, <class-ref scheme="cpc">G01R31/36</class-ref>, <class-ref scheme="cpc">G01R31/40</class-ref>, <class-ref scheme="cpc">G01R31/44</class-ref> take precedence over group <class-ref scheme="cpc">G01R31/50</class-ref>.</note-paragraph></note></notes-and-warnings>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R31/001" definition-exists="false" ipc-concordant="G01R31/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/001</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing </text><reference><text>measuring electromagnetic fields <class-ref scheme="cpc">G01R29/08</class-ref>; circuits for generating HV pulses in dielectric strength testing <class-ref scheme="cpc">G01R31/14</class-ref></text></reference></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/002" definition-exists="false" ipc-concordant="G01R31/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/002</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>where the device under test is an electronic circuit</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R31/003" definition-exists="true" ipc-concordant="G01R31/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/003</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Environmental or reliability tests </text><reference><text>of individual semiconductors <class-ref scheme="cpc">G01R31/2642</class-ref>; of PCB's <class-ref scheme="cpc">G01R31/2817</class-ref>; of IC's <class-ref scheme="cpc">G01R31/2855</class-ref>; of other circuits <class-ref scheme="cpc">G01R31/2849</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R31/005" definition-exists="true" ipc-concordant="G01R31/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/005</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Testing of electric installations on transport means</text></CPC-specific-text></title-part></class-title>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/006" definition-exists="false" ipc-concordant="G01R31/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/006</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>on road vehicles, e.g. automobiles or trucks </text><reference><text>testing of ignition installations peculiar to internal combustion engines <class-ref scheme="cpc">F02P17/00</class-ref></text></reference></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/007" definition-exists="false" ipc-concordant="G01R31/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/007</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using microprocessors or computers</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/008" definition-exists="true" ipc-concordant="G01R31/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/008</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>on air- or spacecraft, railway rolling stock or sea-going vessels</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R31/01" definition-exists="true" ipc-concordant="G01R31/01" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2022-01-01" status="published"><classification-symbol>G01R31/01</classification-symbol><class-title date-revised="2020-01-01"><title-part><text>Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production</text></title-part><title-part><text>Testing objects at points as they pass through a testing station </text><reference><text>testing of cables continuously passing the testing apparatus <class-ref scheme="cpc">G01R31/59</class-ref>; testing dielectric strength or breakdown voltage <class-ref scheme="cpc">G01R31/12</class-ref></text></reference></title-part></class-title>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/013" definition-exists="false" ipc-concordant="G01R31/01" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2020-01-01" status="published"><classification-symbol>G01R31/013</classification-symbol><class-title date-revised="2020-01-01"><title-part><CPC-specific-text><text>Testing passive components </text><reference><text>testing relays <class-ref scheme="cpc">G01R31/3278</class-ref>; testing electrical windings, e.g. inductors <class-ref scheme="cpc">G01R31/72</class-ref></text></reference></CPC-specific-text></title-part></class-title>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/016" definition-exists="true" ipc-concordant="G01R31/01" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/016</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Testing of capacitors </text><reference><text>measuring capacitance <class-ref scheme="cpc">G01R27/2605</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R31/08" definition-exists="true" ipc-concordant="G01R31/08" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2019-01-01" status="published"><classification-symbol>G01R31/08</classification-symbol><class-title date-revised="2019-01-01"><title-part><text>Locating faults in cables, transmission lines, or networks</text></title-part></class-title>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/081" definition-exists="false" ipc-concordant="G01R31/08" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/081</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>according to type of conductors</text></CPC-specific-text></title-part></class-title>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/083" definition-exists="false" ipc-concordant="G01R31/08" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/083</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>in cables, e.g. underground</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/085" definition-exists="false" ipc-concordant="G01R31/08" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2017-01-01" status="published"><classification-symbol>G01R31/085</classification-symbol><class-title date-revised="2017-01-01"><title-part><CPC-specific-text><text>in power transmission or distribution lines, e.g. overhead</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/086" definition-exists="false" ipc-concordant="G01R31/08" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/086</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>in power transmission or distribution networks, i.e. with interconnected conductors</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/088" definition-exists="false" ipc-concordant="G01R31/08" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/088</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Aspects of digital computing</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/10" definition-exists="false" ipc-concordant="G01R31/10" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/10</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>by increasing destruction at fault, e.g. burning-in by using a pulse generator operating a special programme</text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/11" definition-exists="true" ipc-concordant="G01R31/11" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/11</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>using pulse reflection methods</text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R31/12" definition-exists="true" ipc-concordant="G01R31/12" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2022-01-01" status="published"><classification-symbol>G01R31/12</classification-symbol><class-title date-revised="2020-01-01"><title-part><text>Testing dielectric strength or breakdown voltage </text><CPC-specific-text><text>; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing </text><reference><text><class-ref scheme="cpc">G01R31/08</class-ref>, <class-ref scheme="cpc">G01R31/327</class-ref> and <class-ref scheme="cpc">G01R31/72</class-ref> take precedence; measuring in plasmas <class-ref scheme="cpc">G01R19/0061</class-ref>; measuring dielectric constants <class-ref scheme="cpc">G01R27/2617</class-ref>; ESD, EMC or EMP testing of circuits <class-ref scheme="cpc">G01R31/002</class-ref></text></reference></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/1209" definition-exists="false" ipc-concordant="G01R31/12" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/1209</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using acoustic measurements </text><reference><text>acoustic measurements <class-ref scheme="cpc">G01H3/00</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/1218" definition-exists="false" ipc-concordant="G01R31/12" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/1218</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using optical methods; using charged particle, e.g. electron, beams or X-rays</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/1227" definition-exists="false" ipc-concordant="G01R31/12" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/1227</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>of components, parts or materials </text><reference><text><class-ref scheme="cpc">G01R31/1209</class-ref>, <class-ref scheme="cpc">G01R31/1218</class-ref>, <class-ref scheme="cpc">G01R31/18</class-ref> take precedence; circuits therefor <class-ref scheme="cpc">G01R31/14</class-ref>; testing vessels of electrodes <class-ref scheme="cpc">G01R31/16</class-ref></text></reference></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/1236" definition-exists="false" ipc-concordant="G01R31/12" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2017-08-01" status="published"><classification-symbol>G01R31/1236</classification-symbol><class-title date-revised="2017-08-01"><title-part><CPC-specific-text><text>of surge arresters </text><reference><text>monitoring overvoltage diverters or arresters <class-ref scheme="cpc">H02H3/048</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/1245" definition-exists="false" ipc-concordant="G01R31/12" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/1245</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>of line insulators or spacers, e.g. ceramic overhead line cap insulators; of insulators in HV bushings</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/1254" definition-exists="false" ipc-concordant="G01R31/12" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/1254</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>of gas-insulated power appliances or vacuum gaps </text><reference><text>testing switches <class-ref scheme="cpc">G01R31/327</class-ref>; detecting electrical or mechanical defects in encased switchgear <class-ref scheme="cpc">H02B13/065</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/1263" definition-exists="false" ipc-concordant="G01R31/12" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/1263</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation</text></CPC-specific-text></title-part></class-title>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/1272" definition-exists="false" ipc-concordant="G01R31/12" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/1272</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>of cable, line or wire insulation, e.g. using partial discharge measurements </text><reference><text>locating faults in cables <class-ref scheme="cpc">G01R31/083</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/1281" definition-exists="false" ipc-concordant="G01R31/12" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/1281</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>of liquids or gases</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/129" definition-exists="false" ipc-concordant="G01R31/12" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/129</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>of components or parts made of semiconducting materials; of LV components or parts </text><reference><text><class-ref scheme="cpc">G01R31/18</class-ref> takes precedence</text></reference></CPC-specific-text></title-part></class-title></classification-item></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/14" definition-exists="false" ipc-concordant="G01R31/14" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2017-08-01" status="published"><classification-symbol>G01R31/14</classification-symbol><class-title date-revised="2017-08-01"><title-part><text>Circuits therefor </text><CPC-specific-text><text>, e.g. for generating test voltages, sensing circuits </text><reference><text><class-ref scheme="cpc">G01R31/1209</class-ref> - <class-ref scheme="cpc">G01R31/1227</class-ref> take precedence; for testing switches <class-ref scheme="cpc">G01R31/327</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/16" definition-exists="false" ipc-concordant="G01R31/16" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/16</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Construction of testing vessels</text></title-part><title-part><text>Electrodes therefor</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/18" definition-exists="false" ipc-concordant="G01R31/18" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/18</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Subjecting similar articles in turn to test, e.g. go/no-go tests in mass production</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/20" definition-exists="false" ipc-concordant="G01R31/20" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/20</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Preparation of articles or specimens to facilitate testing</text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R31/24" definition-exists="false" ipc-concordant="G01R31/24" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/24</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Testing of discharge tubes </text><reference><text>during manufacture <class-ref scheme="cpc">H01J9/42</class-ref></text></reference></title-part></class-title>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/245" definition-exists="false" ipc-concordant="G01R31/24" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/245</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Testing of gas discharge tubes</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/25" definition-exists="false" ipc-concordant="G01R31/25" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/25</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Testing of vacuum tubes</text></title-part></class-title>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/252" definition-exists="false" ipc-concordant="G01R31/25" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/252</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Testing of electron multipliers, e.g. photo-multipliers</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/255" definition-exists="false" ipc-concordant="G01R31/25" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/255</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Testing of transit-time tubes, e.g. klystrons, magnetrons</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/257" definition-exists="false" ipc-concordant="G01R31/25" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/257</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Testing of beam-tubes, e.g. cathode-ray tubes, image pick-up tubes </text><reference><text>of channel image intensifier arrays <class-ref scheme="cpc">G01R31/252</class-ref>; of transit time tubes <class-ref scheme="cpc">G01R31/255</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R31/26" definition-exists="true" ipc-concordant="G01R31/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2017-01-01" status="published"><classification-symbol>G01R31/26</classification-symbol><class-title date-revised="2017-01-01"><title-part><text>Testing of individual semiconductor devices </text><reference><text>testing or measuring during manufacture or treatment </text><CPC-specific-text><text><class-ref scheme="cpc">H01L22/00</class-ref></text></CPC-specific-text><text>; testing of photovoltaic devices <class-ref scheme="cpc">H02S50/10</class-ref></text></reference></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/2601" definition-exists="false" ipc-concordant="G01R31/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2601</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Apparatus or methods therefor </text><reference><text><class-ref scheme="cpc">G01R31/2607</class-ref>, <class-ref scheme="cpc">G01R31/2642</class-ref> take precedence</text></reference></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/2603" definition-exists="false" ipc-concordant="G01R31/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2603</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>for curve tracing of semiconductor characteristics, e.g. on oscilloscope</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/2607" definition-exists="false" ipc-concordant="G01R31/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2607</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Circuits therefor </text><reference><text><class-ref scheme="cpc">G01R31/2642</class-ref> takes precedence</text></reference></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/2608" definition-exists="false" ipc-concordant="G01R31/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2608</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>for testing bipolar transistors</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/261" definition-exists="false" ipc-concordant="G01R31/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/261</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>for measuring break-down voltage or punch through voltage therefor</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/2612" definition-exists="false" ipc-concordant="G01R31/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2612</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>for measuring frequency response characteristics, e.g. cut-off frequency thereof</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/2614" definition-exists="false" ipc-concordant="G01R31/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2614</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>for measuring gain factor thereof</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/2616" definition-exists="false" ipc-concordant="G01R31/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2616</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>for measuring noise </text><reference><text>measuring noise factor in general <class-ref scheme="cpc">G01R29/26</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/2617" definition-exists="false" ipc-concordant="G01R31/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2617</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>for measuring switching properties thereof</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/2619" definition-exists="false" ipc-concordant="G01R31/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2619</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>for measuring thermal properties thereof</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/2621" definition-exists="false" ipc-concordant="G01R31/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2621</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>for testing field effect transistors, i.e. FET's</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/2623" definition-exists="false" ipc-concordant="G01R31/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2623</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>for measuring break-down voltage therefor</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/2625" definition-exists="false" ipc-concordant="G01R31/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2625</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>for measuring gain factor thereof</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/2626" definition-exists="false" ipc-concordant="G01R31/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2626</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>for measuring noise </text><reference><text>measuring noise factor in general <class-ref scheme="cpc">G01R29/26</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/2628" definition-exists="false" ipc-concordant="G01R31/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2628</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>for measuring thermal properties thereof</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/263" definition-exists="false" ipc-concordant="G01R31/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/263</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>for testing thyristors</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/2632" definition-exists="false" ipc-concordant="G01R31/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2632</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>for testing diodes</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/2633" definition-exists="false" ipc-concordant="G01R31/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2633</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>for measuring switching properties thereof</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/2635" definition-exists="false" ipc-concordant="G01R31/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2635</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Testing light-emitting diodes, laser diodes or photodiodes</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/2637" definition-exists="false" ipc-concordant="G01R31/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-05-01" status="published"><classification-symbol>G01R31/2637</classification-symbol><class-title date-revised="2016-05-01"><title-part><CPC-specific-text><text>for testing other individual devices </text><reference><text><class-ref scheme="cpc">G01R31/2608</class-ref> - <class-ref scheme="cpc">G01R31/2632</class-ref>, <class-ref scheme="cpc">G01R31/27</class-ref> take precedence</text></reference></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/2639" definition-exists="false" ipc-concordant="G01R31/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2639</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>for testing field-effect devices, e.g. of MOS-capacitors </text><reference><text><class-ref scheme="cpc">G01R31/2621</class-ref> takes precedence</text></reference></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/2641" definition-exists="false" ipc-concordant="G01R31/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2641</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>for testing charge coupled devices</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/2642" definition-exists="false" ipc-concordant="G01R31/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2642</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Testing semiconductor operation lifetime or reliability, e.g. by accelerated life tests</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/2644" definition-exists="false" ipc-concordant="G01R31/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2644</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Adaptations of individual semiconductor devices to facilitate the testing thereof</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/2646" definition-exists="false" ipc-concordant="G01R31/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2646</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>for measuring noise </text><reference><text><class-ref scheme="cpc">G01R31/2616</class-ref>, <class-ref scheme="cpc">G01R31/2626</class-ref> take precedence</text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/2648" definition-exists="true" ipc-concordant="G01R31/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2648</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Characterising semiconductor materials </text><reference><text>testing of materials or semi-finished products <class-ref scheme="cpc">G01R31/2831</class-ref>; testing during manufacture <class-ref scheme="cpc">H01L22/00</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/265" definition-exists="false" ipc-concordant="G01R31/265" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/265</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Contactless testing </text><CPC-specific-text><reference><text>of circuits, also in wafer-form <class-ref scheme="cpc">G01R31/302</class-ref></text></reference></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/2653" definition-exists="false" ipc-concordant="G01R31/265" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2653</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using electron beams</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/2656" definition-exists="false" ipc-concordant="G01R31/265" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2656</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using non-ionising electromagnetic radiation, e.g. optical radiation</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/27" definition-exists="false" ipc-concordant="G01R31/27" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/27</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects surrounding elements </text><CPC-specific-text><reference><text>testing printed circuit boards <class-ref scheme="cpc">G01R31/2801</class-ref></text></reference></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/275" definition-exists="false" ipc-concordant="G01R31/27" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/275</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>for testing individual semiconductor components within integrated circuits</text></CPC-specific-text></title-part></class-title></classification-item></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R31/28" definition-exists="true" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2020-01-01" status="published"><classification-symbol>G01R31/28</classification-symbol><class-title date-revised="2020-01-01"><title-part><text>Testing of electronic circuits, e.g. by signal tracer </text><reference><CPC-specific-text><text>EMC, EMP or similar testing of electronic circuits <class-ref scheme="cpc">G01R31/002</class-ref>;</text></CPC-specific-text><text> testing for short-circuits, discontinuities, leakage or incorrect line connection <class-ref scheme="cpc">G01R31/50</class-ref>; checking computers </text><CPC-specific-text><text>or computer components</text></CPC-specific-text><text> <class-ref scheme="cpc">G06F11/00</class-ref>; checking static stores for correct operation <class-ref scheme="cpc">G11C29/00</class-ref> </text><CPC-specific-text><text>; testing receivers or transmitters of transmission systems <class-ref scheme="cpc">H04B17/00</class-ref></text></CPC-specific-text></reference></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/2801" definition-exists="true" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2020-01-01" status="published"><classification-symbol>G01R31/2801</classification-symbol><class-title date-revised="2020-01-01"><title-part><CPC-specific-text><text>Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP] </text><reference><text><class-ref scheme="cpc">G01R31/318508</class-ref> takes precedence; contactless testing <class-ref scheme="cpc">G01R31/302</class-ref>; testing contacts or connections <class-ref scheme="cpc">G01R31/66</class-ref></text></reference></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/2803" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2803</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>by means of functional tests, e.g. logic-circuit-simulation or algorithms therefor </text><reference><text>testing electronic digital computers <class-ref scheme="cpc">G06F11/00</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/2805" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2805</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Bare printed circuit boards</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/2806" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-05-01" status="published"><classification-symbol>G01R31/2806</classification-symbol><class-title date-revised="2016-05-01"><title-part><CPC-specific-text><text>Apparatus therefor, e.g. test stations, drivers, analysers, conveyors </text><reference><text><class-ref scheme="cpc">G01R31/2805</class-ref>, <class-ref scheme="cpc">G01R31/281</class-ref>, <class-ref scheme="cpc">G01R31/2818</class-ref> take precedence</text></reference></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/2808" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2808</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards </text><reference><text>probe, multiprobe, probe manipulator or probe fixture <class-ref scheme="cpc">G01R1/067</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/281" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/281</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing </text><reference><text><class-ref scheme="cpc">G01R31/2818</class-ref> takes precedence</text></reference></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/2812" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2020-01-01" status="published"><classification-symbol>G01R31/2812</classification-symbol><class-title date-revised="2020-01-01"><title-part><CPC-specific-text><text>Checking for open circuits or shorts, e.g. solder bridges; Testing conductivity, resistivity or impedance </text><reference><text>of connections <class-ref scheme="cpc">G01R31/66</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/2813" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2813</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Checking the presence, location, orientation or value, e.g. resistance, of components or conductors </text><reference><text>orientation of the DUT with respect to the test fixture <class-ref scheme="cpc">G01R1/06705</class-ref>, <class-ref scheme="cpc">G01R31/281</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/2815" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2815</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Functional tests, e.g. boundary scans, using the normal I/O contacts </text><reference><text>contacting devices <class-ref scheme="cpc">G01R31/2808</class-ref>; testing digital circuits <class-ref scheme="cpc">G01R31/317</class-ref>, <class-ref scheme="cpc">G06F11/00</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/2817" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2817</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Environmental-, stress-, or burn-in tests </text><reference><text>of IC's <class-ref scheme="cpc">G01R31/2855</class-ref>; of individual semiconductors <class-ref scheme="cpc">G01R31/2642</class-ref>; of other circuits <class-ref scheme="cpc">G01R31/2849</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/2818" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-08-01" status="published"><classification-symbol>G01R31/2818</classification-symbol><class-title date-revised="2016-08-01"><title-part><CPC-specific-text><text>using test structures on, or modifications of, the card under test, made for the purpose of testing, e.g. additional components or connectors </text><reference><text><class-ref scheme="cpc">G01R31/2805</class-ref> takes precedence; printed circuits having, e.g. symbols, test patterns or visualisation means <class-ref scheme="cpc">H05K1/0266</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/282" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/282</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Testing of electronic circuits specially adapted for particular applications not provided for elsewhere </text><reference><text><class-ref scheme="cpc">G01R31/2801</class-ref> and <class-ref scheme="cpc">G01R31/2851</class-ref> take precedence</text></reference></CPC-specific-text></title-part></class-title><notes-and-warnings date-revised="2013-01-01"><note type="note"><note-paragraph> References listed below indicate CPC places which could also be of interest when carrying out a search in respect of the subject matter covered by the preceding group: <subnote type="bullet"><note-paragraph>testing of individual LEDs <class-ref scheme="cpc">G01R31/2635</class-ref></note-paragraph><note-paragraph>testing of lamps <class-ref scheme="cpc">G01R31/44</class-ref></note-paragraph><note-paragraph>testing of displays and display drivers, e.g. LCDs <class-ref scheme="cpc">G09G3/006</class-ref></note-paragraph><note-paragraph>testing of ADCs or DACs <class-ref scheme="cpc">H03M1/1071</class-ref></note-paragraph></subnote></note-paragraph></note></notes-and-warnings>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/2822" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2822</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>of microwave or radiofrequency circuits </text><reference><text>of attenuation, gain, e.g. using network analyzers <class-ref scheme="cpc">G01R27/28</class-ref></text></reference></CPC-specific-text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/2824" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2824</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>testing of oscillators or resonators</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/2825" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2017-05-01" status="published"><classification-symbol>G01R31/2825</classification-symbol><class-title date-revised="2017-05-01"><title-part><CPC-specific-text><text>in household appliances or professional audio/video equipment </text><reference><text>testing LAN's <class-ref scheme="cpc">H04L43/50</class-ref>; testing TV systems <class-ref scheme="cpc">H04N17/00</class-ref>; testing loudspeakers <class-ref scheme="cpc">H04R29/00</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/2827" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2827</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Testing of electronic protection circuits </text><reference><text>testing switches <class-ref scheme="cpc">G01R31/327</class-ref>; checking alarm systems <class-ref scheme="cpc">G08B29/00</class-ref>; self test of summation current transformers <class-ref scheme="cpc">H02H3/335</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/2829" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2829</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Testing of circuits in sensor or actuator systems </text><reference><text>testing of apparatus for measuring electric or magnetic variables <class-ref scheme="cpc">G01R35/00</class-ref>; testing of indicating or recording apparatus <class-ref scheme="cpc">G01D</class-ref>; in airbag systems <class-ref scheme="cpc">B60R21/0173</class-ref>; checking gas analysers <class-ref scheme="cpc">G01N33/007</class-ref>; monitoring or fail-safe circuits for electromagnets <class-ref scheme="cpc">H01F7/1844</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/2831" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2831</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Testing of materials or semi-finished products, e.g. semiconductor wafers or substrates </text><reference><text><class-ref scheme="cpc">G01R31/318511</class-ref> takes precedence; testing during manufacture <class-ref scheme="cpc">H01L22/00</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/2832" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2019-05-01" status="published"><classification-symbol>G01R31/2832</classification-symbol><class-title date-revised="2019-05-01"><title-part><CPC-specific-text><text>Specific tests of electronic circuits not provided for elsewhere </text><reference><text><class-ref scheme="cpc">G01R31/2801</class-ref>, <class-ref scheme="cpc">G01R31/316</class-ref> take precedence</text></reference></CPC-specific-text></title-part></class-title>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/2834" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2834</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Automated test systems [ATE]; using microprocessors or computers </text><reference><text><class-ref scheme="cpc">G01R31/317</class-ref> takes precedence; ATE for detection of defective computer hardware <class-ref scheme="cpc">G06F11/2736</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/2836" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-05-01" status="published"><classification-symbol>G01R31/2836</classification-symbol><class-title date-revised="2016-05-01"><title-part><CPC-specific-text><text>Fault-finding or characterising </text><reference><text><class-ref scheme="cpc">G01R31/2822</class-ref> - <class-ref scheme="cpc">G01R31/2831</class-ref> take precedence</text></reference></CPC-specific-text></title-part></class-title>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/2837" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2837</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Characterising or performance testing, e.g. of frequency response </text><reference><text>transient response <class-ref scheme="cpc">G01R27/28</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/2839" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2839</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using signal generators, power supplies or circuit analysers </text><reference><text><class-ref scheme="cpc">G01R31/2879</class-ref> takes precedence; multimeters <class-ref scheme="cpc">G01R15/12</class-ref>, network analysers <class-ref scheme="cpc">G01R27/28</class-ref></text></reference></CPC-specific-text></title-part></class-title>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R31/2841" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2841</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Signal generators</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/2843" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2843</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>In-circuit-testing</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/2844" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2844</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using test interfaces, e.g. adapters, test boxes, switches, PIN drivers </text><reference><text><class-ref scheme="cpc">G01R31/2889</class-ref> takes precedence</text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/2846" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2846</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using hard- or software simulation or using knowledge-based systems, e.g. expert systems, artificial intelligence or interactive algorithms</text></CPC-specific-text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R31/2848" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2848</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using simulation</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/2849" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2849</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Environmental or reliability testing, e.g. burn-in or validation tests </text><reference><text>of individual semiconductors <class-ref scheme="cpc">G01R31/2642</class-ref>; of printed circuits boards <class-ref scheme="cpc">G01R31/2817</class-ref>; of IC's <class-ref scheme="cpc">G01R31/2855</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/2851" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2851</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Testing of integrated circuits [IC] </text><reference><text><class-ref scheme="cpc">G01R31/317</class-ref> takes precedence; testing individual devices <class-ref scheme="cpc">G01R31/26</class-ref>; testing printed circuits <class-ref scheme="cpc">G01R31/2801</class-ref></text></reference></CPC-specific-text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/2853" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2020-01-01" status="published"><classification-symbol>G01R31/2853</classification-symbol><class-title date-revised="2020-01-01"><title-part><CPC-specific-text><text>Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections </text><reference><text><class-ref scheme="cpc">G01R31/31717</class-ref> takes precedence; test of chip-to-PCB or lead-to-PCB connections <class-ref scheme="cpc">G01R31/66</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/2855" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2855</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Environmental, reliability or burn-in testing</text></CPC-specific-text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/2856" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2856</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Internal circuit aspects, e.g. built-in test features; Test chips; Measuring material aspects, e.g. electro migration [EM]</text></CPC-specific-text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R31/2858" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2858</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Measuring of material aspects, e.g. electro-migration [EM], hot carrier injection</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/286" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/286</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>External aspects, e.g. related to chambers, contacting devices or handlers</text></CPC-specific-text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R31/2862" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2862</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Chambers or ovens; Tanks</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R31/2863" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2863</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Contacting devices, e.g. sockets, burn-in boards or mounting fixtures </text><reference><text>in general <class-ref scheme="cpc">G01R1/04</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R31/2865" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2865</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Holding devices, e.g. chucks; Handlers or transport devices </text><reference><text>having contacts <class-ref scheme="cpc">G01R31/2863</class-ref></text></reference></CPC-specific-text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R31/2867" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2867</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Handlers or transport devices, e.g. loaders, carriers, trays</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R31/2868" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2868</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Complete testing stations; systems; procedures; software aspects</text></CPC-specific-text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R31/287" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/287</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Procedures; Software aspects</text></CPC-specific-text></title-part></class-title></classification-item></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/2872" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2872</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation</text></CPC-specific-text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R31/2874" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2874</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>related to temperature</text></CPC-specific-text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R31/2875" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2875</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>related to heating</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R31/2877" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2877</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>related to cooling</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R31/2879" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2879</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R31/2881" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2881</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>related to environmental aspects other than temperature, e.g. humidity or vibrations</text></CPC-specific-text></title-part></class-title></classification-item></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/2882" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2882</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Testing timing characteristics</text></CPC-specific-text></title-part></class-title></classification-item>
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||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/2884" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2884</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using dedicated test connectors, test elements or test circuits on the IC under test </text><reference><text><class-ref scheme="cpc">G01R31/2855</class-ref> takes precedence</text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/2886" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2886</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Features relating to contacting the IC under test, e.g. probe heads; chucks </text><reference><text><class-ref scheme="cpc">G01R31/2865</class-ref> takes precedence, test connections, e.g. test sockets, or probes <u>per se</u>, <class-ref scheme="cpc">G01R1/04</class-ref> or <class-ref scheme="cpc">G01R1/06</class-ref></text></reference></CPC-specific-text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/2887" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2887</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>involving moving the probe head or the IC under test; docking stations </text><reference><text>moving single probes <class-ref scheme="cpc">G01R1/06705</class-ref>; moving individual probes in multiple probes <class-ref scheme="cpc">G01R1/07392</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/2889" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2889</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Interfaces, e.g. between probe and tester </text><reference><text><class-ref scheme="cpc">G01R31/31905</class-ref> and <class-ref scheme="cpc">G01R1/07364</class-ref> take precedence</text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/2891" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2018-01-01" status="published"><classification-symbol>G01R31/2891</classification-symbol><class-title date-revised="2018-01-01"><title-part><CPC-specific-text><text>related to sensing or controlling of force, position, temperature </text><reference><text><class-ref scheme="cpc">G01R31/2874</class-ref> takes precedence; sensing of force <class-ref scheme="cpc">G01L</class-ref>; sensing of position <class-ref scheme="cpc">G01B</class-ref>, <class-ref scheme="cpc">G01D</class-ref>; sensing of temperature <class-ref scheme="cpc">G01K</class-ref>; controlling in general <class-ref scheme="cpc">G05</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/2893" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2893</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Handling, conveying or loading, e.g. belts, boats, vacuum fingers </text><reference><text><class-ref scheme="cpc">G01R31/2867</class-ref> takes precedence; handling semiconductor devices or wafers during manufacture or treatment <class-ref scheme="cpc">H01L21/67</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/2894" definition-exists="true" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2894</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Aspects of quality control [QC] </text><reference><text><class-ref scheme="cpc">G01R31/31718</class-ref> takes precedence; program control for QC <class-ref scheme="cpc">G05B19/41875</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/2896" definition-exists="true" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2896</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Testing of IC packages; Test features related to IC packages </text><reference><text>containers <u>per se</u> <class-ref scheme="cpc">H01L23/02</class-ref>, encapsulations <u>per se</u> <class-ref scheme="cpc">H01L23/28</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/2898" definition-exists="false" ipc-concordant="G01R31/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/2898</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Sample preparation, e.g. removing encapsulation, etching </text><reference><text>sample preparation in general <class-ref scheme="cpc">G01N1/00</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/30" definition-exists="true" ipc-concordant="G01R31/30" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2019-01-01" status="published"><classification-symbol>G01R31/30</classification-symbol><class-title date-revised="2019-01-01"><title-part><text>Marginal testing, e.g. by varying supply voltage </text><reference><text>testing computers during standby operation or idle time <class-ref scheme="cpc">G06F11/22</class-ref></text></reference></title-part></class-title>
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||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/3004" definition-exists="false" ipc-concordant="G01R31/30" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/3004</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Current or voltage test</text></CPC-specific-text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/3008" definition-exists="false" ipc-concordant="G01R31/30" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/3008</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Quiescent current [IDDQ] test or leakage current test</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/3012" definition-exists="false" ipc-concordant="G01R31/30" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/3012</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Built-In-Current test [BIC]</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/3016" definition-exists="false" ipc-concordant="G01R31/30" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/3016</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Delay or race condition test, e.g. race hazard test</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/302" definition-exists="true" ipc-concordant="G01R31/302" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2020-01-01" status="published"><classification-symbol>G01R31/302</classification-symbol><class-title date-revised="2020-01-01"><title-part><text>Contactless testing </text><CPC-specific-text><reference><text><class-ref scheme="cpc">G01R31/66</class-ref> takes precedence</text></reference></CPC-specific-text></title-part></class-title>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/3025" definition-exists="true" ipc-concordant="G01R31/302" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/3025</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Wireless interface with the DUT</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/303" definition-exists="false" ipc-concordant="G01R31/303" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-05-01" status="published"><classification-symbol>G01R31/303</classification-symbol><class-title date-revised="2016-05-01"><title-part><text>of integrated circuits </text><reference><text><class-ref scheme="cpc">G01R31/305</class-ref> - <class-ref scheme="cpc">G01R31/315</class-ref> take precedence</text></reference></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/304" definition-exists="false" ipc-concordant="G01R31/304" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-05-01" status="published"><classification-symbol>G01R31/304</classification-symbol><class-title date-revised="2016-05-01"><title-part><text>of printed or hybrid circuits </text><reference><text><class-ref scheme="cpc">G01R31/305</class-ref> - <class-ref scheme="cpc">G01R31/315</class-ref> take precedence</text></reference></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/305" definition-exists="false" ipc-concordant="G01R31/305" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/305</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>using electron beams </text><CPC-specific-text><reference><text>investigating or analysing materials by measuring photoelectric effect <class-ref scheme="cpc">G01N23/227</class-ref></text></reference></CPC-specific-text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/306" definition-exists="false" ipc-concordant="G01R31/306" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/306</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>of printed or hybrid circuits</text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/307" definition-exists="false" ipc-concordant="G01R31/307" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/307</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>of integrated circuits</text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/308" definition-exists="false" ipc-concordant="G01R31/308" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/308</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>using non-ionising electromagnetic radiation, e.g. optical radiation </text><CPC-specific-text><reference><text>investigating or analysing materials by the use of optical means <class-ref scheme="cpc">G01N21/00</class-ref>; image analysis <class-ref scheme="cpc">G06T7/00</class-ref></text></reference></CPC-specific-text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/309" definition-exists="false" ipc-concordant="G01R31/309" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/309</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>of printed or hybrid circuits </text><CPC-specific-text><text>or circuit substrates</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/311" definition-exists="false" ipc-concordant="G01R31/311" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/311</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>of integrated circuits </text><CPC-specific-text><reference><text><class-ref scheme="cpc">G01R31/31728</class-ref> takes precedence</text></reference></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/312" definition-exists="false" ipc-concordant="G01R31/312" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/312</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>by capacitive methods</text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/315" definition-exists="false" ipc-concordant="G01R31/315" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/315</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>by inductive methods</text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/316" definition-exists="false" ipc-concordant="G01R31/316" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/316</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Testing of analog circuits </text><CPC-specific-text><reference><text><class-ref scheme="cpc">G01R31/2851</class-ref> takes precedence</text></reference></CPC-specific-text></title-part></class-title>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/3161" definition-exists="false" ipc-concordant="G01R31/3161" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/3161</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Marginal testing</text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/3163" definition-exists="false" ipc-concordant="G01R31/3163" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/3163</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Functional testing</text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/3167" definition-exists="false" ipc-concordant="G01R31/3167" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/3167</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Testing of combined analog and digital circuits </text><CPC-specific-text><reference><text>testing ADC's <class-ref scheme="cpc">H03M1/1071</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/317" definition-exists="false" ipc-concordant="G01R31/317" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/317</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Testing of digital circuits</text></title-part></class-title><notes-and-warnings><note type="warning"><note-paragraph warning-type="reclass-destination">The following subgroups of <class-ref scheme="cpc">G01R31/317</class-ref> are not complete due to an ongoing reorganisation : <class-ref scheme="cpc">G01R31/31702</class-ref>, <class-ref scheme="cpc">G01R31/31708</class-ref>, <class-ref scheme="cpc">G01R31/31711</class-ref>, <class-ref scheme="cpc">G01R31/31717</class-ref>, <class-ref scheme="cpc">G01R31/31718</class-ref>, <class-ref scheme="cpc">G01R31/31728</class-ref>, <class-ref scheme="cpc">G01R31/31901</class-ref>. See also <class-ref scheme="cpc">G01R31/317</class-ref> and its other subgroups</note-paragraph></note></notes-and-warnings>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/31701" definition-exists="false" ipc-concordant="G01R31/317" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31701</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Arrangements for setting the Unit Under Test [UUT] in a test mode</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/31702" definition-exists="false" ipc-concordant="G01R31/317" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2017-08-01" status="published"><classification-symbol>G01R31/31702</classification-symbol><class-title date-revised="2017-08-01"><title-part><CPC-specific-text><text>Testing digital circuits including elements other than semiconductor transistors, e.g. biochips, nanofabrics, mems, chips with magnetic elements</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/31703" definition-exists="false" ipc-concordant="G01R31/317" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31703</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Comparison aspects, e.g. signature analysis, comparators </text><reference><text>concerning scan tests <class-ref scheme="cpc">G01R31/318566</class-ref>; concerning testers <class-ref scheme="cpc">G01R31/3193</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/31704" definition-exists="false" ipc-concordant="G01R31/317" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2020-01-01" status="published"><classification-symbol>G01R31/31704</classification-symbol><class-title date-revised="2020-01-01"><title-part><CPC-specific-text><text>Design for test; Design verification </text><reference><text>concerning scan tests <class-ref scheme="cpc">G01R31/318583</class-ref>; computer-aided design <class-ref scheme="cpc">G06F30/00</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/31705" definition-exists="false" ipc-concordant="G01R31/317" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31705</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Debugging aspects, e.g. using test circuits for debugging, using dedicated debugging test circuits </text><reference><text>generation of test sequences therefor <class-ref scheme="cpc">G01R31/31835</class-ref>, using scan test therefor <class-ref scheme="cpc">G01R31/318544</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/31706" definition-exists="false" ipc-concordant="G01R31/317" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31706</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>involving differential digital signals, e.g. testing differential signal circuits, using differential signals for testing</text></CPC-specific-text></title-part></class-title></classification-item>
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||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/31707" definition-exists="false" ipc-concordant="G01R31/317" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31707</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Test strategies </text><reference><text>methods for generation of test sequences <class-ref scheme="cpc">G01R31/318371</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/31708" definition-exists="false" ipc-concordant="G01R31/317" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31708</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Analysis of signal quality </text><reference><text><class-ref scheme="cpc">G01R31/31901</class-ref> takes precedence; measuring frequencies or analysing frequency spectra <u>per se</u> <class-ref scheme="cpc">G01R23/00</class-ref>; measuring non-linear distortion <u>per se</u> <class-ref scheme="cpc">G01R23/20</class-ref></text></reference></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/31709" definition-exists="false" ipc-concordant="G01R31/317" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31709</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Jitter measurements; Jitter generators </text><reference><text>measuring jitter, noise figure or signal-to-noise ratio <u>per se</u> <class-ref scheme="cpc">G01R29/26</class-ref>; analysis of tester signals <class-ref scheme="cpc">G01R31/31901</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/3171" definition-exists="false" ipc-concordant="G01R31/317" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/3171</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>BER [Bit Error Rate] test</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/31711" definition-exists="false" ipc-concordant="G01R31/317" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31711</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Evaluation methods, e.g. shmoo plots</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/31712" definition-exists="false" ipc-concordant="G01R31/317" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31712</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Input or output aspects</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/31713" definition-exists="false" ipc-concordant="G01R31/317" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31713</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Input or output interfaces for test, e.g. test pins, buffers </text><reference><text>for scan test <class-ref scheme="cpc">G01R31/318572</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/31715" definition-exists="false" ipc-concordant="G01R31/317" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31715</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Testing of input or output circuits; test of circuitry between the I/C pins and the functional core, e.g. testing of input or output driver, receiver, buffer</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/31716" definition-exists="false" ipc-concordant="G01R31/317" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31716</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Testing of input or output with loop-back</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/31717" definition-exists="false" ipc-concordant="G01R31/317" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31717</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Interconnect testing </text><reference><text>by scan techniques <u>see</u> <class-ref scheme="cpc">G01R31/31855</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/31718" definition-exists="false" ipc-concordant="G01R31/317" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31718</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Logistic aspects, e.g. binning, selection, sorting of devices under test, tester/handler interaction networks, Test management software, e.g. software for test statistics or test evaluation, yield analysis </text><reference><text>mechanical aspects <class-ref scheme="cpc">G01R31/2808</class-ref>, <class-ref scheme="cpc">G01R31/2851</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/31719" definition-exists="false" ipc-concordant="G01R31/317" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31719</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Security aspects, e.g. preventing unauthorised access during test</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/3172" definition-exists="false" ipc-concordant="G01R31/317" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/3172</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Optimisation aspects, e.g. using functional pin as test pin, pin multiplexing</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/31721" definition-exists="false" ipc-concordant="G01R31/317" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31721</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Power aspects, e.g. power supplies for test circuits, power saving during test </text><reference><text>for scan test <class-ref scheme="cpc">G01R31/318575</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/31722" definition-exists="false" ipc-concordant="G01R31/317" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31722</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Addressing or selecting of test units, e.g. transmission protocols for selecting test units </text><reference><text>for scan test <class-ref scheme="cpc">G01R31/318558</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/31723" definition-exists="false" ipc-concordant="G01R31/317" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31723</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Hardware for routing the test signal within the device under test to the circuits to be tested, e.g. multiplexer for multiple core testing, accessing internal nodes </text><reference><text>routing the test signal to or from the device under test <class-ref scheme="cpc">G01R31/31926</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/31724" definition-exists="false" ipc-concordant="G01R31/317" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31724</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Test controller, e.g. BIST state machine </text><reference><text>for scan test <class-ref scheme="cpc">G01R31/318555</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/31725" definition-exists="false" ipc-concordant="G01R31/317" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31725</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Timing aspects, e.g. clock distribution, skew, propagation delay </text><reference><text>for tester hardware <class-ref scheme="cpc">G01R31/31937</class-ref></text></reference></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/31726" definition-exists="false" ipc-concordant="G01R31/317" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31726</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Synchronization, e.g. of test, clock or strobe signals; Signals in different clock domains; Generation of Vernier signals; Comparison and adjustment of the signals</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/31727" definition-exists="false" ipc-concordant="G01R31/317" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31727</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Clock circuits aspects, e.g. test clock circuit details, timing aspects for signal generation, circuits for testing clocks </text><reference><text><class-ref scheme="cpc">G01R31/31725</class-ref> takes precedence; concerning scan test <class-ref scheme="cpc">G01R31/318552</class-ref>, for tester hardware <class-ref scheme="cpc">G01R31/31922</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/31728" definition-exists="false" ipc-concordant="G01R31/317" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31728</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Optical aspects, e.g. opto-electronics used for testing, optical signal transmission for testing electronic circuits, electro-optic components to be tested in combination with electronic circuits, measuring light emission of digital circuits </text><reference><text>probes having electro-optic elements <class-ref scheme="cpc">G01R1/071</class-ref>; electro-optic sampling for oscilloscopes <class-ref scheme="cpc">G01R13/347</class-ref>; contactless testing of individual semiconductor devices by optical means <class-ref scheme="cpc">G01R31/2656</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/3173" definition-exists="false" ipc-concordant="G01R31/3173" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/3173</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Marginal testing</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/3177" definition-exists="false" ipc-concordant="G01R31/3177" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/3177</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Testing of logic operation, e.g. by logic analysers</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/3181" definition-exists="false" ipc-concordant="G01R31/3181" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/3181</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Functional testing </text><reference><text><class-ref scheme="cpc">G01R31/3177</class-ref> takes precedence</text></reference></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/31813" definition-exists="false" ipc-concordant="G01R31/3181" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31813</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Test pattern generators</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/31816" definition-exists="false" ipc-concordant="G01R31/3181" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31816</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Soft error testing; Soft error rate evaluation; Single event testing</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/3183" definition-exists="false" ipc-concordant="G01R31/3183" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2017-08-01" status="published"><classification-symbol>G01R31/3183</classification-symbol><class-title date-revised="2017-08-01"><title-part><text>Generation of test inputs, e.g. test vectors, patterns or sequences</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R31/318307" definition-exists="false" ipc-concordant="G01R31/3183" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/318307</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>computer-aided, e.g. automatic test program generator [ATPG], program translations, test program debugging</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R31/318314" definition-exists="false" ipc-concordant="G01R31/3183" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2015-07-01" status="published"><classification-symbol>G01R31/318314</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Tools, e.g. program interfaces, test suite, test bench, simulation hardware, test compiler, test program languages </text><reference><text>simulation software <class-ref scheme="cpc">G01R31/318357</class-ref>; emulators <class-ref scheme="cpc">G06F11/261</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R31/318321" definition-exists="false" ipc-concordant="G01R31/3183" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/318321</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>for combinational circuits</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R31/318328" definition-exists="false" ipc-concordant="G01R31/3183" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/318328</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>for delay tests</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R31/318335" definition-exists="false" ipc-concordant="G01R31/3183" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/318335</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Test pattern compression or decompression </text><reference><text>compression or decompression of scan patterns <class-ref scheme="cpc">G01R31/318547</class-ref>; compression or decompression hardware <class-ref scheme="cpc">G01R31/31921</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R31/318342" definition-exists="false" ipc-concordant="G01R31/3183" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/318342</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>by preliminary fault modelling, e.g. analysis, simulation</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R31/31835" definition-exists="false" ipc-concordant="G01R31/3183" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31835</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Analysis of test coverage or failure detectability</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R31/318357" definition-exists="false" ipc-concordant="G01R31/3183" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2020-01-01" status="published"><classification-symbol>G01R31/318357</classification-symbol><class-title date-revised="2020-01-01"><title-part><CPC-specific-text><text>Simulation </text><reference><text>computer simulation of digital circuits <class-ref scheme="cpc">G06F30/3308</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R31/318364" definition-exists="false" ipc-concordant="G01R31/3183" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2020-01-01" status="published"><classification-symbol>G01R31/318364</classification-symbol><class-title date-revised="2020-01-01"><title-part><CPC-specific-text><text>as a result of hardware simulation, e.g. in an HDL environment </text><reference><text>computer-aided simulation of circuits <class-ref scheme="cpc">G06F30/3308</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R31/318371" definition-exists="false" ipc-concordant="G01R31/3183" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/318371</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Methodologies therefor, e.g. algorithms, procedures</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R31/318378" definition-exists="false" ipc-concordant="G01R31/3183" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/318378</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>of patterns for devices arranged in a network</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R31/318385" definition-exists="false" ipc-concordant="G01R31/3183" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/318385</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Random or pseudo-random test pattern</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R31/318392" definition-exists="false" ipc-concordant="G01R31/3183" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2015-09-01" status="published"><classification-symbol>G01R31/318392</classification-symbol><class-title date-revised="2015-09-01"><title-part><CPC-specific-text><text>for sequential circuits </text><reference><text><class-ref scheme="cpc">G01R31/318544</class-ref> takes precedence</text></reference></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/3185" definition-exists="false" ipc-concordant="G01R31/3185" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/3185</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Reconfiguring for testing, e.g. LSSD, partitioning</text></title-part></class-title>
|
||
|
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<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R31/318502" definition-exists="false" ipc-concordant="G01R31/3185" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/318502</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Test of Combinational circuits</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R31/318505" definition-exists="false" ipc-concordant="G01R31/3185" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/318505</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Test of Modular systems, e.g. Wafers, MCM's</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R31/318508" definition-exists="false" ipc-concordant="G01R31/3185" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/318508</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Board Level Test, e.g. P1500 Standard </text><reference><text>features related to boundary scan <class-ref scheme="cpc">G01R31/318533</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R31/318511" definition-exists="false" ipc-concordant="G01R31/3185" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/318511</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Wafer Test</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R31/318513" definition-exists="false" ipc-concordant="G01R31/3185" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/318513</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Test of Multi-Chip-Moduls</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R31/318516" definition-exists="false" ipc-concordant="G01R31/3185" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/318516</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Test of programmable logic devices [PLDs]</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R31/318519" definition-exists="false" ipc-concordant="G01R31/3185" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/318519</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Test of field programmable gate arrays [FPGA]</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R31/318522" definition-exists="false" ipc-concordant="G01R31/3185" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/318522</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Test of Sequential circuits </text><reference><text>test of microprocessors <class-ref scheme="cpc">G06F11/2236</class-ref>, test of ALU's <class-ref scheme="cpc">G06F11/2226</class-ref></text></reference></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R31/318525" definition-exists="false" ipc-concordant="G01R31/3185" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/318525</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Test of flip-flops or latches</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R31/318527" definition-exists="false" ipc-concordant="G01R31/3185" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/318527</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Test of counters</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R31/31853" definition-exists="false" ipc-concordant="G01R31/3185" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31853</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Test of registers</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R31/318533" definition-exists="false" ipc-concordant="G01R31/3185" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/318533</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using scanning techniques, e.g. LSSD, Boundary Scan, JTAG</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R31/318536" definition-exists="false" ipc-concordant="G01R31/3185" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/318536</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Scan chain arrangements, e.g. connections, test bus, analog signals</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="14" additional-only="false" sort-key="G01R31/318538" definition-exists="false" ipc-concordant="G01R31/3185" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/318538</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Topological or mechanical aspects</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R31/318541" definition-exists="false" ipc-concordant="G01R31/3185" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/318541</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Scan latches or cell details</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R31/318544" definition-exists="false" ipc-concordant="G01R31/3185" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/318544</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Scanning methods, algorithms and patterns </text><reference><text><class-ref scheme="cpc">G01R31/3183</class-ref> takes precedence</text></reference></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="14" additional-only="false" sort-key="G01R31/318547" definition-exists="false" ipc-concordant="G01R31/3185" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/318547</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Data generators or compressors</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="14" additional-only="false" sort-key="G01R31/31855" definition-exists="false" ipc-concordant="G01R31/3185" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31855</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Interconnection testing, e.g. crosstalk, shortcircuits</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R31/318552" definition-exists="false" ipc-concordant="G01R31/3185" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/318552</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Clock circuits details</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R31/318555" definition-exists="false" ipc-concordant="G01R31/3185" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/318555</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Control logic</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R31/318558" definition-exists="false" ipc-concordant="G01R31/3185" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/318558</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Addressing or selecting of subparts of the device under test</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="14" additional-only="false" sort-key="G01R31/318561" definition-exists="false" ipc-concordant="G01R31/3185" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/318561</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Identification of the subpart</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="14" additional-only="false" sort-key="G01R31/318563" definition-exists="false" ipc-concordant="G01R31/3185" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/318563</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Multiple simultaneous testing of subparts</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R31/318566" definition-exists="false" ipc-concordant="G01R31/3185" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/318566</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Comparators; Diagnosing the device under test</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R31/318569" definition-exists="false" ipc-concordant="G01R31/3185" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/318569</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Error indication, logging circuits</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R31/318572" definition-exists="false" ipc-concordant="G01R31/3185" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/318572</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Input/Output interfaces</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R31/318575" definition-exists="false" ipc-concordant="G01R31/3185" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/318575</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Power distribution; Power saving</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R31/318577" definition-exists="false" ipc-concordant="G01R31/3185" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/318577</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>AC testing, e.g. current testing, burn-in</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="14" additional-only="false" sort-key="G01R31/31858" definition-exists="false" ipc-concordant="G01R31/3185" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31858</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Delay testing</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R31/318583" definition-exists="false" ipc-concordant="G01R31/3185" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/318583</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Design for test</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="14" additional-only="false" sort-key="G01R31/318586" definition-exists="false" ipc-concordant="G01R31/3185" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/318586</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>with partial scan or non-scannable parts</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="14" additional-only="false" sort-key="G01R31/318588" definition-exists="false" ipc-concordant="G01R31/3185" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/318588</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Security aspects</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="14" additional-only="false" sort-key="G01R31/318591" definition-exists="false" ipc-concordant="G01R31/3185" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/318591</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Tools</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R31/318594" definition-exists="false" ipc-concordant="G01R31/3185" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/318594</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Timing aspects </text><reference><text>clock circuits <class-ref scheme="cpc">G01R31/318552</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R31/318597" definition-exists="false" ipc-concordant="G01R31/3185" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/318597</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>JTAG or boundary scan test of memory devices </text><reference><text>other scan testing of memories <class-ref scheme="cpc">G11C29/32</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/3187" definition-exists="false" ipc-concordant="G01R31/3187" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/3187</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Built-in tests</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/319" definition-exists="true" ipc-concordant="G01R31/319" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R31/319</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Tester hardware, i.e. output processing circuits</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R31/31901" definition-exists="false" ipc-concordant="G01R31/319" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31901</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Analysis of tester Performance; Tester characterization</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R31/31903" definition-exists="false" ipc-concordant="G01R31/319" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31903</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>tester configuration</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R31/31905" definition-exists="false" ipc-concordant="G01R31/319" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31905</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R31/31907" definition-exists="false" ipc-concordant="G01R31/319" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31907</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Modular tester, e.g. controlling and coordinating instruments in a bus based architecture</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R31/31908" definition-exists="false" ipc-concordant="G01R31/319" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31908</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="14" additional-only="false" sort-key="G01R31/3191" definition-exists="false" ipc-concordant="G01R31/319" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/3191</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Calibration</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R31/31912" definition-exists="false" ipc-concordant="G01R31/319" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31912</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Tester/user interface</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R31/31914" definition-exists="false" ipc-concordant="G01R31/319" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31914</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Portable Testers</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R31/31915" definition-exists="false" ipc-concordant="G01R31/319" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31915</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>In-circuit Testers</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R31/31917" definition-exists="false" ipc-concordant="G01R31/319" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31917</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Stimuli generation or application of test patterns to the device under test [DUT]</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R31/31919" definition-exists="false" ipc-concordant="G01R31/319" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31919</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Storing and outputting test patterns </text><reference><text><class-ref scheme="cpc">G01R31/31924</class-ref> takes precedence; arithmetic and random test patterns generator</text></reference></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="14" additional-only="false" sort-key="G01R31/31921" definition-exists="false" ipc-concordant="G01R31/319" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31921</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using compression techniques, e.g. patterns sequencer</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R31/31922" definition-exists="false" ipc-concordant="G01R31/319" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31922</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Timing generation or clock distribution </text><reference><text><class-ref scheme="cpc">G01R31/3191</class-ref> takes precedence</text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R31/31924" definition-exists="false" ipc-concordant="G01R31/319" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31924</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Voltage or current aspects, e.g. driver, receiver</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R31/31926" definition-exists="false" ipc-concordant="G01R31/319" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31926</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R31/31928" definition-exists="false" ipc-concordant="G01R31/319" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31928</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Formatter </text><reference><text>driver, receiver details <class-ref scheme="cpc">G01R31/31924</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R31/3193" definition-exists="false" ipc-concordant="G01R31/3193" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/3193</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>with comparison between actual response and known fault free response </text><CPC-specific-text><reference><text>receiver details <class-ref scheme="cpc">G01R31/31924</class-ref></text></reference></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R31/31932" definition-exists="false" ipc-concordant="G01R31/3193" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31932</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Comparators</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R31/31935" definition-exists="false" ipc-concordant="G01R31/3193" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31935</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Storing data, e.g. failure memory</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R31/31937" definition-exists="false" ipc-concordant="G01R31/3193" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/31937</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Timing aspects, e.g. measuring propagation delay </text><reference><text><class-ref scheme="cpc">G01R31/3191</class-ref> and <class-ref scheme="cpc">G01R31/31922</class-ref> take precedence; marginal testing <class-ref scheme="cpc">G06F11/24</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item></classification-item></classification-item></classification-item></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R31/327" definition-exists="true" ipc-concordant="G01R31/327" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2019-01-01" status="published"><classification-symbol>G01R31/327</classification-symbol><class-title date-revised="2019-01-01"><title-part><text>Testing of circuit interrupters, switches or circuit-breakers</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/3271" definition-exists="false" ipc-concordant="G01R31/327" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/3271</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>of high voltage or medium voltage devices </text><reference><text><class-ref scheme="cpc">G01R31/333</class-ref> takes precedence</text></reference></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/3272" definition-exists="false" ipc-concordant="G01R31/327" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/3272</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Apparatus, systems or circuits therefor </text><reference><text><class-ref scheme="cpc">G01R31/3275</class-ref> takes precedence</text></reference></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/3274" definition-exists="false" ipc-concordant="G01R31/327" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/3274</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Details related to measuring, e.g. sensing, displaying or computing; Measuring of variables related to the contact pieces, e.g. wear, position or resistance </text><reference><text>measuring contact resistance <class-ref scheme="cpc">G01R27/205</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/3275" definition-exists="false" ipc-concordant="G01R31/327" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/3275</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Fault detection or status indication</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/3277" definition-exists="false" ipc-concordant="G01R31/327" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/3277</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>of low voltage devices, e.g. domestic or industrial devices, such as motor protections, relays, rotation switches</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/3278" definition-exists="false" ipc-concordant="G01R31/327" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2020-01-01" status="published"><classification-symbol>G01R31/3278</classification-symbol><class-title date-revised="2020-01-01"><title-part><CPC-specific-text><text>of relays, solenoids or reed switches </text><reference><text>measuring contact resistance <class-ref scheme="cpc">G01R27/205</class-ref>; high voltage magnetic switches <class-ref scheme="cpc">G01R31/3271</class-ref>, <class-ref scheme="cpc">G01R31/333</class-ref>; testing electric windings <class-ref scheme="cpc">G01R31/72</class-ref>; monitoring of fail safe circuits <class-ref scheme="cpc">H01H47/002</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/333" definition-exists="false" ipc-concordant="G01R31/333" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2019-01-01" status="published"><classification-symbol>G01R31/333</classification-symbol><class-title date-revised="2019-01-01"><title-part><text>Testing of the switching capacity of high-voltage circuit-breakers </text><CPC-specific-text><text>; Testing of breaking capacity or related variables, e.g. post arc current or transient recovery voltage</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/3333" definition-exists="false" ipc-concordant="G01R31/333" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/3333</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Apparatus, systems or circuits therefor</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/3336" definition-exists="false" ipc-concordant="G01R31/333" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/3336</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Synthetic testing, i.e. with separate current and voltage generators simulating distance fault conditions</text></CPC-specific-text></title-part></class-title></classification-item></classification-item></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R31/34" definition-exists="false" ipc-concordant="G01R31/34" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/34</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Testing dynamo-electric machines</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/343" definition-exists="false" ipc-concordant="G01R31/34" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/343</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>in operation</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/346" definition-exists="false" ipc-concordant="G01R31/34" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/346</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Testing of armature or field windings</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R31/36" definition-exists="true" ipc-concordant="G01R31/36" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2019-01-01" status="published"><classification-symbol>G01R31/36</classification-symbol><class-title date-revised="2019-01-01"><title-part><text>Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]</text></title-part></class-title><notes-and-warnings date-revised="2013-01-01"><note type="note"><note-paragraph> <CPC-specific-note>This group <u>covers</u> arrangements for measuring, testing or indicating electrical conditions or variables of accumulators or electric batteries. Arrangements for monitoring, measuring, testing or indicating condition structurally associated with the battery are covered by <class-ref scheme="cpc">H01M</class-ref>, e.g. by group <class-ref scheme="cpc">H01M10/48</class-ref></CPC-specific-note> </note-paragraph></note></notes-and-warnings>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/364" definition-exists="false" ipc-concordant="G01R31/364" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2019-01-01" status="published"><classification-symbol>G01R31/364</classification-symbol><class-title date-revised="2019-01-01"><title-part><text>Battery terminal connectors with integrated measuring arrangements</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/3644" definition-exists="false" ipc-concordant="G01R31/36" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2019-01-01" status="published"><classification-symbol>G01R31/3644</classification-symbol><class-title date-revised="2019-01-01"><title-part><CPC-specific-text><text>Constructional arrangements</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/3646" definition-exists="false" ipc-concordant="G01R31/36" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2019-01-01" status="published"><classification-symbol>G01R31/3646</classification-symbol><class-title date-revised="2019-01-01"><title-part><CPC-specific-text><text>for indicating electrical conditions or variables, e.g. visual or audible indicators</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/3647" definition-exists="false" ipc-concordant="G01R31/36" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2019-01-01" status="published"><classification-symbol>G01R31/3647</classification-symbol><class-title date-revised="2019-01-01"><title-part><CPC-specific-text><text>for determining the ability of a battery to perform a critical function, e.g. cranking</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/3648" definition-exists="false" ipc-concordant="G01R31/36" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R31/3648</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>comprising digital calculation means, e.g. for performing an algorithm</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/367" definition-exists="true" ipc-concordant="G01R31/367" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2019-01-01" status="published"><classification-symbol>G01R31/367</classification-symbol><class-title date-revised="2019-01-01"><title-part><text>Software therefor, e.g. for battery testing using modelling or look-up tables</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/371" definition-exists="true" ipc-concordant="G01R31/371" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2019-01-01" status="published"><classification-symbol>G01R31/371</classification-symbol><class-title date-revised="2019-01-01"><title-part><text>with remote indication, e.g. on external chargers</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/374" definition-exists="false" ipc-concordant="G01R31/374" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2019-01-01" status="published"><classification-symbol>G01R31/374</classification-symbol><class-title date-revised="2019-01-01"><title-part><text>with means for correcting the measurement for temperature or ageing</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/378" definition-exists="false" ipc-concordant="G01R31/378" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2019-01-01" status="published"><classification-symbol>G01R31/378</classification-symbol><class-title date-revised="2019-01-01"><title-part><text>specially adapted for the type of battery or accumulator</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/379" definition-exists="false" ipc-concordant="G01R31/379" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2019-01-01" status="published"><classification-symbol>G01R31/379</classification-symbol><class-title date-revised="2019-01-01"><title-part><text>for lead-acid batteries</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/38" definition-exists="false" ipc-concordant="G01R31/378" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2019-01-01" status="published"><classification-symbol>G01R31/38</classification-symbol><class-title date-revised="2019-01-01"><title-part><CPC-specific-text><text>Primary cells, i.e. not rechargeable</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/382" definition-exists="false" ipc-concordant="G01R31/382" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2019-01-01" status="published"><classification-symbol>G01R31/382</classification-symbol><class-title date-revised="2019-01-01"><title-part><text>Arrangements for monitoring battery or accumulator variables, e.g. SoC</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/3828" definition-exists="false" ipc-concordant="G01R31/3828" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2019-01-01" status="published"><classification-symbol>G01R31/3828</classification-symbol><class-title date-revised="2019-01-01"><title-part><text>using current integration</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/3832" definition-exists="false" ipc-concordant="G01R31/3832" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2019-01-01" status="published"><classification-symbol>G01R31/3832</classification-symbol><class-title date-revised="2019-01-01"><title-part><text>without measurement of battery voltage</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R31/3833" definition-exists="false" ipc-concordant="G01R31/3832" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2019-01-01" status="published"><classification-symbol>G01R31/3833</classification-symbol><class-title date-revised="2019-01-01"><title-part><CPC-specific-text><text>using analog integrators, e.g. coulomb-meters</text></CPC-specific-text></title-part></class-title></classification-item></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/3835" definition-exists="true" ipc-concordant="G01R31/3835" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2019-01-01" status="published"><classification-symbol>G01R31/3835</classification-symbol><class-title date-revised="2019-01-01"><title-part><text>involving only voltage measurements</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/3842" definition-exists="false" ipc-concordant="G01R31/3842" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2019-01-01" status="published"><classification-symbol>G01R31/3842</classification-symbol><class-title date-revised="2019-01-01"><title-part><text>combining voltage and current measurements</text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/385" definition-exists="true" ipc-concordant="G01R31/385" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2019-01-01" status="published"><classification-symbol>G01R31/385</classification-symbol><class-title date-revised="2019-01-01"><title-part><text>Arrangements for measuring battery or accumulator variables </text><reference><text>for monitoring <class-ref scheme="cpc">G01R31/382</class-ref></text></reference></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/386" definition-exists="false" ipc-concordant="G01R31/385" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2019-01-01" status="published"><classification-symbol>G01R31/386</classification-symbol><class-title date-revised="2019-01-01"><title-part><CPC-specific-text><text>using test-loads</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/3865" definition-exists="false" ipc-concordant="G01R31/385" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2019-01-01" status="published"><classification-symbol>G01R31/3865</classification-symbol><class-title date-revised="2019-01-01"><title-part><CPC-specific-text><text>related to manufacture, e.g. testing after manufacture</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/387" definition-exists="false" ipc-concordant="G01R31/387" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2019-01-01" status="published"><classification-symbol>G01R31/387</classification-symbol><class-title date-revised="2019-01-01"><title-part><text>Determining ampere-hour charge capacity or SoC</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/388" definition-exists="false" ipc-concordant="G01R31/388" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2019-01-01" status="published"><classification-symbol>G01R31/388</classification-symbol><class-title date-revised="2019-01-01"><title-part><text>involving voltage measurements</text></title-part></class-title></classification-item></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/389" definition-exists="false" ipc-concordant="G01R31/389" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2019-01-01" status="published"><classification-symbol>G01R31/389</classification-symbol><class-title date-revised="2019-01-01"><title-part><text>Measuring internal impedance, internal conductance or related variables</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/392" definition-exists="false" ipc-concordant="G01R31/392" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2019-01-01" status="published"><classification-symbol>G01R31/392</classification-symbol><class-title date-revised="2019-01-01"><title-part><text>Determining battery ageing or deterioration, e.g. state of health</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/396" definition-exists="true" ipc-concordant="G01R31/396" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2019-01-01" status="published"><classification-symbol>G01R31/396</classification-symbol><class-title date-revised="2019-01-01"><title-part><text>Acquisition or processing of data for testing or for monitoring individual cells or groups of cells within a battery</text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R31/40" definition-exists="true" ipc-concordant="G01R31/40" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2017-01-01" status="published"><classification-symbol>G01R31/40</classification-symbol><class-title date-revised="2017-01-01"><title-part><text>Testing power supplies </text><reference><text>testing photovoltaic devices <class-ref scheme="cpc">H02S50/10</class-ref></text></reference></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/42" definition-exists="false" ipc-concordant="G01R31/42" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2019-01-01" status="published"><classification-symbol>G01R31/42</classification-symbol><class-title date-revised="2019-01-01"><title-part><text>AC power supplies</text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R31/44" definition-exists="false" ipc-concordant="G01R31/44" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2019-01-01" status="published"><classification-symbol>G01R31/44</classification-symbol><class-title date-revised="2019-01-01"><title-part><text>Testing lamps</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R31/50" definition-exists="true" ipc-concordant="G01R31/50" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2022-01-01" status="published"><classification-symbol>G01R31/50</classification-symbol><class-title date-revised="2020-01-01"><title-part><text>Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections </text><reference><text>testing of sparking plugs <class-ref scheme="cpc">H01T13/58</class-ref></text></reference></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/52" definition-exists="false" ipc-concordant="G01R31/52" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2022-01-01" status="published"><classification-symbol>G01R31/52</classification-symbol><class-title date-revised="2020-01-01"><title-part><text>Testing for short-circuits, leakage current or ground faults</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/54" definition-exists="true" ipc-concordant="G01R31/54" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2022-01-01" status="published"><classification-symbol>G01R31/54</classification-symbol><class-title date-revised="2020-01-01"><title-part><text>Testing for continuity</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/55" definition-exists="true" ipc-concordant="G01R31/55" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2022-01-01" status="published"><classification-symbol>G01R31/55</classification-symbol><class-title date-revised="2020-01-01"><title-part><text>Testing for incorrect line connections</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/56" definition-exists="false" ipc-concordant="G01R31/56" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2022-01-01" status="published"><classification-symbol>G01R31/56</classification-symbol><class-title date-revised="2020-01-01"><title-part><text>Testing of electric apparatus </text><reference><text>testing of transformers <class-ref scheme="cpc">G01R31/62</class-ref>; testing of connections <class-ref scheme="cpc">G01R31/66</class-ref></text></reference></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/58" definition-exists="true" ipc-concordant="G01R31/58" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2020-01-01" status="published"><classification-symbol>G01R31/58</classification-symbol><class-title date-revised="2020-01-01"><title-part><text>Testing of lines, cables or conductors </text><reference><text>testing of electric windings <class-ref scheme="cpc">G01R31/72</class-ref></text></reference></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/59" definition-exists="false" ipc-concordant="G01R31/59" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2022-01-01" status="published"><classification-symbol>G01R31/59</classification-symbol><class-title date-revised="2020-01-01"><title-part><text>while the cable continuously passes the testing apparatus, e.g. during manufacture</text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/60" definition-exists="false" ipc-concordant="G01R31/60" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2020-01-01" status="published"><classification-symbol>G01R31/60</classification-symbol><class-title date-revised="2020-01-01"><title-part><text>Identification of wires in a multicore cable</text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/62" definition-exists="false" ipc-concordant="G01R31/62" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2022-01-01" status="published"><classification-symbol>G01R31/62</classification-symbol><class-title date-revised="2020-01-01"><title-part><text>Testing of transformers</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/64" definition-exists="true" ipc-concordant="G01R31/64" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2020-01-01" status="published"><classification-symbol>G01R31/64</classification-symbol><class-title date-revised="2020-01-01"><title-part><text>Testing of capacitors</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/66" definition-exists="true" ipc-concordant="G01R31/66" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2020-01-01" status="published"><classification-symbol>G01R31/66</classification-symbol><class-title date-revised="2020-01-01"><title-part><text>Testing of connections, e.g. of plugs or non-disconnectable joints </text><reference><text>testing for incorrect line connections <class-ref scheme="cpc">G01R31/55</class-ref></text></reference></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/67" definition-exists="true" ipc-concordant="G01R31/67" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2020-01-01" status="published"><classification-symbol>G01R31/67</classification-symbol><class-title date-revised="2020-01-01"><title-part><text>Testing the correctness of wire connections in electric apparatus or circuits</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/68" definition-exists="false" ipc-concordant="G01R31/68" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2020-01-01" status="published"><classification-symbol>G01R31/68</classification-symbol><class-title date-revised="2020-01-01"><title-part><text>Testing of releasable connections, e.g. of terminals mounted on a printed circuit board</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/69" definition-exists="false" ipc-concordant="G01R31/69" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2020-01-01" status="published"><classification-symbol>G01R31/69</classification-symbol><class-title date-revised="2020-01-01"><title-part><text>of terminals at the end of a cable or a wire harness</text></title-part><title-part><text>of plugs</text></title-part><title-part><text>of sockets, e.g. wall sockets or power sockets in appliances</text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R31/70" definition-exists="false" ipc-concordant="G01R31/70" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2020-01-01" status="published"><classification-symbol>G01R31/70</classification-symbol><class-title date-revised="2020-01-01"><title-part><text>Testing of connections between components and printed circuit boards </text><reference><text><class-ref scheme="cpc">G01R31/68</class-ref> takes precedence</text></reference></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R31/71" definition-exists="false" ipc-concordant="G01R31/71" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2020-01-01" status="published"><classification-symbol>G01R31/71</classification-symbol><class-title date-revised="2020-01-01"><title-part><text>Testing of solder joints</text></title-part></class-title></classification-item></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/72" definition-exists="true" ipc-concordant="G01R31/72" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2022-01-01" status="published"><classification-symbol>G01R31/72</classification-symbol><class-title date-revised="2020-01-01"><title-part><text>Testing of electric windings </text><reference><text>testing of transformers <class-ref scheme="cpc">G01R31/62</class-ref></text></reference></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R31/74" definition-exists="false" ipc-concordant="G01R31/74" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2020-01-01" status="published"><classification-symbol>G01R31/74</classification-symbol><class-title date-revised="2020-01-01"><title-part><text>Testing of fuses</text></title-part></class-title></classification-item></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="7" additional-only="false" sort-key="G01R33/00" definition-exists="true" ipc-concordant="G01R33/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/00</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Arrangements or instruments for measuring magnetic variables</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R33/0005" definition-exists="false" ipc-concordant="G01R33/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/0005</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Geometrical arrangement of magnetic sensor elements; Apparatus combining different magnetic sensor types </text><reference><text><class-ref scheme="cpc">G01R33/0206</class-ref> takes precedence</text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R33/0011" definition-exists="false" ipc-concordant="G01R33/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/0011</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>comprising means, e.g. flux concentrators, flux guides, for guiding or concentrating the magnetic flux, e.g. to the magnetic sensor</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R33/0017" definition-exists="false" ipc-concordant="G01R33/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/0017</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Means for compensating offset magnetic fields or the magnetic flux to be measured; Means for generating calibration magnetic fields</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R33/0023" definition-exists="false" ipc-concordant="G01R33/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/0023</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration </text><reference><text><class-ref scheme="cpc">G01R33/0017</class-ref> takes precedence</text></reference></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R33/0029" definition-exists="false" ipc-concordant="G01R33/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/0029</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Treating the measured signals, e.g. removing offset or noise</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R33/0035" definition-exists="false" ipc-concordant="G01R33/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/0035</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Calibration of single magnetic sensors, e.g. integrated calibration</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R33/0041" definition-exists="false" ipc-concordant="G01R33/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/0041</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using feed-back or modulation techniques</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R33/0047" definition-exists="false" ipc-concordant="G01R33/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/0047</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Housings or packaging of magnetic sensors </text><reference><text>packaging of semiconductor devices <class-ref scheme="cpc">H01L23/00</class-ref></text></reference><text>; Holders</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R33/0052" definition-exists="false" ipc-concordant="G01R33/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2023-02-01" status="published"><classification-symbol>G01R33/0052</classification-symbol><class-title date-revised="2023-02-01"><title-part><CPC-specific-text><text>Manufacturing aspects; Manufacturing of single devices, i.e. of semiconductor magnetic sensor chips </text><reference><text>devices based on galvano-magnetic effect or the like <class-ref scheme="cpc">H10N50/85</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R33/0058" definition-exists="false" ipc-concordant="G01R33/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2015-10-01" status="published"><classification-symbol>G01R33/0058</classification-symbol><class-title date-revised="2015-10-01"><title-part><CPC-specific-text><text>using bistable elements, e.g. Reed switches</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R33/0064" definition-exists="false" ipc-concordant="G01R33/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/0064</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>comprising means for performing simulations, e.g. of the magnetic variable to be measured</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R33/007" definition-exists="false" ipc-concordant="G01R33/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/007</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Environmental aspects, e.g. temperature variations, radiation, stray fields </text><reference><text><class-ref scheme="cpc">G01R33/025</class-ref> takes precedence</text></reference></CPC-specific-text></title-part></class-title>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R33/0076" definition-exists="false" ipc-concordant="G01R33/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/0076</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Protection, e.g. with housings against stray fields</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R33/0082" definition-exists="false" ipc-concordant="G01R33/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/0082</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Compensation, e.g. compensating for temperature changes</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R33/0088" definition-exists="false" ipc-concordant="G01R33/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/0088</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>use of bistable or switching devices, e.g. Reed-switches</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R33/0094" definition-exists="false" ipc-concordant="G01R33/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/0094</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Sensor arrays</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R33/02" definition-exists="true" ipc-concordant="G01R33/02" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R33/02</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Measuring direction or magnitude of magnetic fields or magnetic flux </text><reference><text><class-ref scheme="cpc">G01R33/20</class-ref> takes precedence</text></reference></title-part></class-title><notes-and-warnings date-revised="2013-01-01"><note type="note"><note-paragraph> Groups <class-ref scheme="cpc">G01R33/022</class-ref>, <class-ref scheme="cpc">G01R33/10</class-ref> take precedence over groups <class-ref scheme="cpc">G01R33/025</class-ref> - <class-ref scheme="cpc">G01R33/09</class-ref>. </note-paragraph></note></notes-and-warnings>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R33/0206" definition-exists="true" ipc-concordant="G01R33/02" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/0206</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Three-component magnetometers</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R33/0213" definition-exists="true" ipc-concordant="G01R33/02" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/0213</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using deviation of charged particles by the magnetic field</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R33/022" definition-exists="true" ipc-concordant="G01R33/022" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/022</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Measuring gradient</text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R33/025" definition-exists="true" ipc-concordant="G01R33/025" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R33/025</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Compensating stray fields </text><CPC-specific-text><reference><text><class-ref scheme="cpc">G01R33/0017</class-ref> takes precedence</text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R33/028" definition-exists="true" ipc-concordant="G01R33/028" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/028</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Electrodynamic magnetometers</text></title-part></class-title>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R33/0283" definition-exists="false" ipc-concordant="G01R33/028" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/0283</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>in which a current or voltage is generated due to relative movement of conductor and magnetic field</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R33/0286" definition-exists="true" ipc-concordant="G01R33/028" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2017-08-01" status="published"><classification-symbol>G01R33/0286</classification-symbol><class-title date-revised="2017-08-01"><title-part><CPC-specific-text><text>comprising microelectromechanical systems [MEMS] </text><reference><text>MEMS devices in general <class-ref scheme="cpc">B81B</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R33/032" definition-exists="true" ipc-concordant="G01R33/032" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R33/032</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>using magneto-optic devices, e.g. Faraday </text><CPC-specific-text><text>or Cotton-Mouton effect</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R33/0322" definition-exists="true" ipc-concordant="G01R33/032" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/0322</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using the Faraday or Voigt effect</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R33/0325" definition-exists="true" ipc-concordant="G01R33/032" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/0325</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using the Kerr effect</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R33/0327" definition-exists="true" ipc-concordant="G01R33/032" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/0327</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>with application of magnetostriction</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R33/035" definition-exists="true" ipc-concordant="G01R33/035" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R33/035</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>using superconductive devices</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R33/0352" definition-exists="true" ipc-concordant="G01R33/035" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/0352</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Superconductive magneto-resistances</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R33/0354" definition-exists="false" ipc-concordant="G01R33/035" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/0354</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>SQUIDS</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/0356" definition-exists="false" ipc-concordant="G01R33/035" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/0356</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>with flux feedback</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/0358" definition-exists="false" ipc-concordant="G01R33/035" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/0358</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>coupling the flux to the SQUID </text><reference><text>gradiometer coils <class-ref scheme="cpc">G01R33/022</class-ref>; coils with superconductive winding <class-ref scheme="cpc">H01F6/06</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R33/038" definition-exists="true" ipc-concordant="G01R33/038" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R33/038</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>using permanent magnets, e.g. balances, torsion devices</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R33/0385" definition-exists="false" ipc-concordant="G01R33/038" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/0385</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>in relation with magnetic force measurements </text><reference><text>magnetic force microscopes <class-ref scheme="cpc">G01Q60/50</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R33/04" definition-exists="true" ipc-concordant="G01R33/04" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/04</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>using the flux-gate principle</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R33/045" definition-exists="false" ipc-concordant="G01R33/04" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/045</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>in single-, or multi-aperture elements</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R33/05" definition-exists="true" ipc-concordant="G01R33/05" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/05</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>in thin-film element</text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R33/06" definition-exists="true" ipc-concordant="G01R33/06" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R33/06</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>using galvano-magnetic devices</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R33/063" definition-exists="true" ipc-concordant="G01R33/06" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/063</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Magneto-impedance sensors; Nanocristallin sensors</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R33/066" definition-exists="false" ipc-concordant="G01R33/06" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/066</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>field-effect magnetic sensors, e.g. magnetic transistor</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R33/07" definition-exists="false" ipc-concordant="G01R33/07" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/07</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Hall effect devices</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/072" definition-exists="true" ipc-concordant="G01R33/07" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/072</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Constructional adaptation of the sensor to specific applications</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R33/075" definition-exists="false" ipc-concordant="G01R33/07" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/075</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Hall devices configured for spinning current measurements</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/077" definition-exists="false" ipc-concordant="G01R33/07" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/077</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Vertical Hall-effect devices</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R33/09" definition-exists="true" ipc-concordant="G01R33/09" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/09</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Magnetoresistive devices</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/091" definition-exists="true" ipc-concordant="G01R33/09" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/091</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Constructional adaptation of the sensor to specific applications</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/093" definition-exists="true" ipc-concordant="G01R33/09" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/093</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using multilayer structures, e.g. giant magnetoresistance sensors </text><reference><text>thin magnetic films <class-ref scheme="cpc">H01F10/00</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/095" definition-exists="false" ipc-concordant="G01R33/09" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/095</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>extraordinary magnetoresistance sensors</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/096" definition-exists="false" ipc-concordant="G01R33/09" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/096</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>anisotropic magnetoresistance sensors</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/098" definition-exists="true" ipc-concordant="G01R33/09" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/098</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>comprising tunnel junctions, e.g. tunnel magnetoresistance sensors</text></CPC-specific-text></title-part></class-title></classification-item></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R33/10" definition-exists="true" ipc-concordant="G01R33/10" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2017-08-01" status="published"><classification-symbol>G01R33/10</classification-symbol><class-title date-revised="2017-08-01"><title-part><text>Plotting field distribution </text><CPC-specific-text><text>; Measuring field distribution</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R33/12" definition-exists="true" ipc-concordant="G01R33/12" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R33/12</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Measuring magnetic properties of articles or specimens of solids or fluids </text><reference><text>involving magnetic resonance <class-ref scheme="cpc">G01R33/20</class-ref></text></reference></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R33/1207" definition-exists="true" ipc-concordant="G01R33/12" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-08-01" status="published"><classification-symbol>G01R33/1207</classification-symbol><class-title date-revised="2016-08-01"><title-part><CPC-specific-text><text>Testing individual magnetic storage devices, e.g. records carriers or digital storage elements </text><reference><text>functional testing <class-ref scheme="cpc">G06F11/00</class-ref>, <class-ref scheme="cpc">G06F11/28</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R33/1215" definition-exists="false" ipc-concordant="G01R33/12" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/1215</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Measuring magnetisation; Particular magnetometers therefor </text><reference><text><class-ref scheme="cpc">G01R33/14</class-ref> takes precedence; electrodynamic magnetometers <class-ref scheme="cpc">G01R33/028</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R33/1223" definition-exists="false" ipc-concordant="G01R33/12" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/1223</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Measuring permeability, i.e. permeameters </text><reference><text><class-ref scheme="cpc">G01R33/14</class-ref> takes precedence</text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R33/123" definition-exists="false" ipc-concordant="G01R33/12" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/123</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Measuring loss due to hysteresis </text><reference><text><class-ref scheme="cpc">G01R33/14</class-ref> takes precedence</text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R33/1238" definition-exists="false" ipc-concordant="G01R33/12" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2018-01-01" status="published"><classification-symbol>G01R33/1238</classification-symbol><class-title date-revised="2018-01-01"><title-part><CPC-specific-text><text>Measuring superconductive properties</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R33/1246" definition-exists="true" ipc-concordant="G01R33/12" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/1246</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Measuring critical current</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R33/1253" definition-exists="false" ipc-concordant="G01R33/12" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/1253</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Measuring galvano-magnetic properties</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R33/1261" definition-exists="false" ipc-concordant="G01R33/12" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/1261</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using levitation techniques</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R33/1269" definition-exists="true" ipc-concordant="G01R33/12" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/1269</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>of molecules labeled with magnetic beads </text><reference><text>magnetic particles for bio assay <class-ref scheme="cpc">G01N33/54326</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R33/1276" definition-exists="false" ipc-concordant="G01R33/12" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/1276</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>of magnetic particles, e.g. imaging of magnetic nanoparticles </text><reference><text><class-ref scheme="cpc">G01R33/1269</class-ref> takes precedence</text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R33/1284" definition-exists="true" ipc-concordant="G01R33/12" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/1284</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Spin resolved measurements; Influencing spins during measurements, e.g. in spintronics devices </text><reference><text><class-ref scheme="cpc">G01R33/093</class-ref> takes precedence; semiconductor devices using spin polarized carriers <class-ref scheme="cpc">H01L29/66984</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R33/1292" definition-exists="true" ipc-concordant="G01R33/12" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/1292</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Measuring domain wall position or domain wall motion</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R33/14" definition-exists="true" ipc-concordant="G01R33/14" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/14</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Measuring or plotting hysteresis curves </text><CPC-specific-text><reference><text><class-ref scheme="cpc">G01R33/1207</class-ref> takes precedence</text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R33/16" definition-exists="true" ipc-concordant="G01R33/16" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/16</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Measuring susceptibility </text><CPC-specific-text><reference><text><class-ref scheme="cpc">G01R33/1238</class-ref> takes precedence</text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R33/18" definition-exists="false" ipc-concordant="G01R33/18" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/18</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Measuring magnetostrictive properties</text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R33/20" definition-exists="true" ipc-concordant="G01R33/20" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R33/20</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>involving magnetic resonance </text><reference><text>medical aspects <class-ref scheme="cpc">A61B5/055</class-ref>; magnetic resonance gyrometers <class-ref scheme="cpc">G01C19/60</class-ref></text></reference></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R33/24" definition-exists="false" ipc-concordant="G01R33/24" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/24</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>for measuring direction or magnitude of magnetic fields or magnetic flux</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R33/243" definition-exists="false" ipc-concordant="G01R33/24" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-11-01" status="published"><classification-symbol>G01R33/243</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Spatial mapping of the polarizing magnetic field</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R33/246" definition-exists="false" ipc-concordant="G01R33/24" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-11-01" status="published"><classification-symbol>G01R33/246</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Spatial mapping of the RF magnetic field B1</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R33/26" definition-exists="true" ipc-concordant="G01R33/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R33/26</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>using optical pumping</text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R33/28" definition-exists="false" ipc-concordant="G01R33/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-11-01" status="published"><classification-symbol>G01R33/28</classification-symbol><class-title date-revised="2016-05-01"><title-part><text>Details of apparatus provided for in groups <class-ref scheme="cpc">G01R33/44</class-ref> - <class-ref scheme="cpc">G01R33/64</class-ref></text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R33/281" definition-exists="false" ipc-concordant="G01R33/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/281</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Means for the use of <u>in vitro</u> contrast agents </text><reference><text><class-ref scheme="cpc">G01R33/282</class-ref> takes precedence; involving use of a contrast agent in MR imaging <class-ref scheme="cpc">G01R33/5601</class-ref>; <u>in vivo</u> contrast agents <class-ref scheme="cpc">A61K49/0002</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R33/282" definition-exists="false" ipc-concordant="G01R33/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/282</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Means specially adapted for hyperpolarisation or for hyperpolarised contrast agents, e.g. for the generation of hyperpolarised gases using optical pumping cells, for storing hyperpolarised contrast agents or for the determination of the polarisation of a hyperpolarised contrast agent</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R33/283" definition-exists="false" ipc-concordant="G01R33/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/283</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Intercom or optical viewing arrangements, structurally associated with NMR apparatus</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R33/285" definition-exists="false" ipc-concordant="G01R33/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/285</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Invasive instruments, e.g. catheters or biopsy needles, specially adapted for tracking, guiding or visualization by NMR</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/286" definition-exists="false" ipc-concordant="G01R33/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/286</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>involving passive visualization of interventional instruments, i.e. making the instrument visible as part of the normal MR process</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/287" definition-exists="false" ipc-concordant="G01R33/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/287</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>involving active visualization of interventional instruments, e.g. using active tracking RF coils or coils for intentionally creating magnetic field inhomogeneities</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R33/288" definition-exists="false" ipc-concordant="G01R33/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/288</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Provisions within MR facilities for enhancing safety during MR, e.g. reduction of the specific absorption rate [SAR], detection of ferromagnetic objects in the scanner room</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R33/30" definition-exists="false" ipc-concordant="G01R33/30" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/30</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Sample handling arrangements, e.g. sample cells, spinning mechanisms</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/302" definition-exists="false" ipc-concordant="G01R33/30" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2017-08-01" status="published"><classification-symbol>G01R33/302</classification-symbol><class-title date-revised="2017-08-01"><title-part><CPC-specific-text><text>Miniaturized sample handling arrangements for sampling small quantities, e.g. flow-through microfluidic NMR chips</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/305" definition-exists="false" ipc-concordant="G01R33/30" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/305</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>specially adapted for high-pressure applications</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/307" definition-exists="false" ipc-concordant="G01R33/30" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/307</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>specially adapted for moving the sample relative to the MR system, e.g. spinning mechanisms, flow cells or means for positioning the sample inside a spectrometer</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/31" definition-exists="false" ipc-concordant="G01R33/31" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/31</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Temperature control thereof</text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R33/32" definition-exists="false" ipc-concordant="G01R33/32" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/32</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Excitation or detection systems, e.g. using radio frequency signals</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/323" definition-exists="false" ipc-concordant="G01R33/32" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-11-01" status="published"><classification-symbol>G01R33/323</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Detection of MR without the use of RF or microwaves, e.g. force-detected MR, thermally detected MR, MR detection via electrical conductivity, optically detected MR</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R33/326" definition-exists="false" ipc-concordant="G01R33/32" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/326</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>involving a SQUID</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/34" definition-exists="true" ipc-concordant="G01R33/34" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R33/34</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Constructional details, e.g. resonators </text><CPC-specific-text><text>, specially adapted to MR</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R33/34007" definition-exists="false" ipc-concordant="G01R33/34" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/34007</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Manufacture of RF coils, e.g. using printed circuit board technology; additional hardware for providing mechanical support to the RF coil assembly or to part thereof, e.g. a support for moving the coil assembly relative to the remainder of the MR system</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R33/34015" definition-exists="false" ipc-concordant="G01R33/34" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/34015</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Temperature-controlled RF coils</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R33/34023" definition-exists="false" ipc-concordant="G01R33/34" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/34023</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Superconducting RF coils</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R33/3403" definition-exists="false" ipc-concordant="G01R33/34" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/3403</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Means for cooling of the RF coils, e.g. a refrigerator or a cooling vessel specially adapted for housing an RF coil</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R33/34038" definition-exists="false" ipc-concordant="G01R33/34" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/34038</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Loopless coils, i.e. linear wire antennas</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R33/34046" definition-exists="false" ipc-concordant="G01R33/34" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/34046</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Volume type coils, e.g. bird-cage coils; Quadrature bird-cage coils; Circularly polarised coils</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R33/34053" definition-exists="false" ipc-concordant="G01R33/34" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/34053</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Solenoid coils; Toroidal coils</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R33/34061" definition-exists="false" ipc-concordant="G01R33/34" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/34061</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Helmholtz coils</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R33/34069" definition-exists="false" ipc-concordant="G01R33/34" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/34069</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Saddle coils</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R33/34076" definition-exists="false" ipc-concordant="G01R33/34" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/34076</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Birdcage coils</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R33/34084" definition-exists="false" ipc-concordant="G01R33/34" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/34084</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>implantable coils or coils being geometrically adaptable to the sample, e.g. flexible coils or coils comprising mutually movable parts</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R33/34092" definition-exists="false" ipc-concordant="G01R33/34" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/34092</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>RF coils specially adapted for NMR spectrometers</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R33/341" definition-exists="false" ipc-concordant="G01R33/341" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/341</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>comprising surface coils</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R33/3415" definition-exists="false" ipc-concordant="G01R33/3415" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2022-02-01" status="published"><classification-symbol>G01R33/3415</classification-symbol><class-title date-revised="2022-02-01"><title-part><text>comprising arrays of sub-coils </text><CPC-specific-text><text>, i.e. phased-array coils with flexible receiver channels</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R33/343" definition-exists="false" ipc-concordant="G01R33/343" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/343</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>of slotted-tube or loop-gap type</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R33/345" definition-exists="false" ipc-concordant="G01R33/345" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2015-11-01" status="published"><classification-symbol>G01R33/345</classification-symbol><class-title date-revised="2015-11-01"><title-part><text>of waveguide type </text><reference><text><class-ref scheme="cpc">G01R33/343</class-ref> takes precedence</text></reference></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R33/3453" definition-exists="false" ipc-concordant="G01R33/345" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/3453</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Transverse electromagnetic [TEM] coils</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="14" additional-only="false" sort-key="G01R33/3456" definition-exists="false" ipc-concordant="G01R33/345" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/3456</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Stripline resonators</text></CPC-specific-text></title-part></class-title></classification-item></classification-item></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/36" definition-exists="false" ipc-concordant="G01R33/36" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/36</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Electrical details, e.g. matching or coupling of the coil to the receiver</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R33/3607" definition-exists="false" ipc-concordant="G01R33/36" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-11-01" status="published"><classification-symbol>G01R33/3607</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>RF waveform generators, e.g. frequency generators, amplitude-, frequency- or phase modulators or shifters, pulse programmers, digital to analog converters for the RF signal, means for filtering or attenuating of the RF signal</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R33/3614" definition-exists="false" ipc-concordant="G01R33/36" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/3614</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>RF power amplifiers</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R33/3621" definition-exists="false" ipc-concordant="G01R33/36" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/3621</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>NMR receivers or demodulators, e.g. preamplifiers, means for frequency modulation of the MR signal using a digital down converter, means for analog to digital conversion [ADC] or for filtering or processing of the MR signal such as bandpass filtering, resampling, decimation or interpolation</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R33/3628" definition-exists="false" ipc-concordant="G01R33/36" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/3628</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Tuning/matching of the transmit/receive coil</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R33/3635" definition-exists="false" ipc-concordant="G01R33/36" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/3635</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Multi-frequency operation</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R33/3642" definition-exists="false" ipc-concordant="G01R33/36" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-11-01" status="published"><classification-symbol>G01R33/3642</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Mutual coupling or decoupling of multiple coils, e.g. decoupling of a receive coil from a transmission coil, or intentional coupling of RF coils, e.g. for RF magnetic field amplification</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R33/365" definition-exists="false" ipc-concordant="G01R33/36" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/365</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Decoupling of multiple RF coils wherein the multiple RF coils have the same function in MR, e.g. decoupling of a receive coil from another receive coil in a receive coil array, decoupling of a transmission coil from another transmission coil in a transmission coil array</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R33/3657" definition-exists="false" ipc-concordant="G01R33/36" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/3657</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Decoupling of multiple RF coils wherein the multiple RF coils do not have the same function in MR, e.g. decoupling of a transmission coil from a receive coil</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R33/3664" definition-exists="false" ipc-concordant="G01R33/36" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-11-01" status="published"><classification-symbol>G01R33/3664</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Switching for purposes other than coil coupling or decoupling, e.g. switching between a phased array mode and a quadrature mode, switching between surface coil modes of different geometrical shapes, switching from a whole body reception coil to a local reception coil or switching for automatic coil selection in moving table MR or for changing the field-of-view </text><reference><text><class-ref scheme="cpc">G01R33/3671</class-ref> takes precedence</text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R33/3671" definition-exists="false" ipc-concordant="G01R33/36" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/3671</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>involving modulation of the quality factor of the RF coil </text><reference><text><class-ref scheme="cpc">G01R33/3642</class-ref> takes precedence</text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R33/3678" definition-exists="false" ipc-concordant="G01R33/36" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-11-01" status="published"><classification-symbol>G01R33/3678</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>involving quadrature drive or detection, e.g. a circularly polarized RF magnetic field</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R33/3685" definition-exists="false" ipc-concordant="G01R33/36" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-11-01" status="published"><classification-symbol>G01R33/3685</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Means for reducing sheath currents, e.g. RF traps, baluns</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R33/3692" definition-exists="false" ipc-concordant="G01R33/36" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/3692</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>involving signal transmission without using electrically conductive connections, e.g. wireless communication or optical communication of the MR signal or an auxiliary signal other than the MR signal</text></CPC-specific-text></title-part></class-title></classification-item></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R33/38" definition-exists="false" ipc-concordant="G01R33/38" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/38</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Systems for generation, homogenisation or stabilisation of the main or gradient magnetic field</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/3802" definition-exists="false" ipc-concordant="G01R33/38" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/3802</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Manufacture or installation of magnet assemblies; Additional hardware for transportation or installation of the magnet assembly or for providing mechanical support to components of the magnet assembly</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/3804" definition-exists="false" ipc-concordant="G01R33/38" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/3804</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Additional hardware for cooling or heating of the magnet assembly, for housing a cooled or heated part of the magnet assembly or for temperature control of the magnet assembly</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/3806" definition-exists="false" ipc-concordant="G01R33/38" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/3806</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Open magnet assemblies for improved access to the sample, e.g. C-type or U-type magnets</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/3808" definition-exists="false" ipc-concordant="G01R33/38" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/3808</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Magnet assemblies for single-sided MR wherein the magnet assembly is located on one side of a subject only; Magnet assemblies for inside-out MR, e.g. for MR in a borehole or in a blood vessel, or magnet assemblies for fringe-field MR</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/381" definition-exists="true" ipc-concordant="G01R33/381" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R33/381</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>using electromagnets</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R33/3815" definition-exists="true" ipc-concordant="G01R33/3815" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R33/3815</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>with superconducting coils, e.g. power supply therefor</text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/383" definition-exists="true" ipc-concordant="G01R33/383" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R33/383</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>using permanent magnets</text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/385" definition-exists="false" ipc-concordant="G01R33/385" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/385</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>using gradient magnetic field coils</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R33/3852" definition-exists="false" ipc-concordant="G01R33/385" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-11-01" status="published"><classification-symbol>G01R33/3852</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Gradient amplifiers; means for controlling the application of a gradient magnetic field to the sample, e.g. a gradient signal synthesizer</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R33/3854" definition-exists="false" ipc-concordant="G01R33/385" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/3854</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>means for active and/or passive vibration damping or acoustical noise suppression in gradient magnet coil systems</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R33/3856" definition-exists="false" ipc-concordant="G01R33/385" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/3856</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Means for cooling the gradient coils or thermal shielding of the gradient coils</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R33/3858" definition-exists="false" ipc-concordant="G01R33/385" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2017-08-01" status="published"><classification-symbol>G01R33/3858</classification-symbol><class-title date-revised="2017-08-01"><title-part><CPC-specific-text><text>Manufacture and installation of gradient coils, means for providing mechanical support to parts of the gradient-coil assembly </text><reference><text>manufacture of inductances or coils in general <class-ref scheme="cpc">H01F41/00</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/387" definition-exists="true" ipc-concordant="G01R33/387" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R33/387</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Compensation of inhomogeneities</text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R33/3873" definition-exists="false" ipc-concordant="G01R33/3873" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2017-08-01" status="published"><classification-symbol>G01R33/3873</classification-symbol><class-title date-revised="2017-08-01"><title-part><text>using ferromagnetic bodies </text><CPC-specific-text><text>; Passive shimming</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R33/3875" definition-exists="false" ipc-concordant="G01R33/3875" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/3875</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>using correction coil assemblies, e.g. active shimming</text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/389" definition-exists="false" ipc-concordant="G01R33/389" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2017-08-01" status="published"><classification-symbol>G01R33/389</classification-symbol><class-title date-revised="2017-08-01"><title-part><text>Field stabilisation </text><CPC-specific-text><text>, e.g. by field measurements and control means or indirectly by current stabilisation</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R33/42" definition-exists="true" ipc-concordant="G01R33/42" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R33/42</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Screening</text></title-part></class-title>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/421" definition-exists="false" ipc-concordant="G01R33/421" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/421</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>of main or gradient magnetic field</text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R33/4215" definition-exists="false" ipc-concordant="G01R33/421" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/4215</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>of the gradient magnetic field, e.g. using passive or active shielding of the gradient magnetic field</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/422" definition-exists="false" ipc-concordant="G01R33/422" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/422</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>of the radio frequency field</text></title-part></class-title></classification-item></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R33/44" definition-exists="false" ipc-concordant="G01R33/44" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-11-01" status="published"><classification-symbol>G01R33/44</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>using nuclear magnetic resonance [NMR] </text><reference><text><class-ref scheme="cpc">G01R33/24</class-ref>, <class-ref scheme="cpc">G01R33/62</class-ref> take precedence</text></reference></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R33/441" definition-exists="false" ipc-concordant="G01R33/44" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/441</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Nuclear Quadrupole Resonance [NQR] Spectroscopy and Imaging</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R33/443" definition-exists="false" ipc-concordant="G01R33/44" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-11-01" status="published"><classification-symbol>G01R33/443</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Assessment of an electric or a magnetic field, e.g. spatial mapping, determination of a B0 drift or dosimetry</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R33/445" definition-exists="false" ipc-concordant="G01R33/44" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/445</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>MR involving a non-standard magnetic field B0, e.g. of low magnitude as in the earth's magnetic field or in nanoTesla spectroscopy, comprising a polarizing magnetic field for pre-polarisation, B0 with a temporal variation of its magnitude or direction such as field cycling of B0 or rotation of the direction of B0, or spatially inhomogeneous B0 like in fringe-field MR or in stray-field imaging</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R33/446" definition-exists="false" ipc-concordant="G01R33/44" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-11-01" status="published"><classification-symbol>G01R33/446</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Multifrequency selective RF pulses, e.g. multinuclear acquisition mode </text><reference><text>spatially selective RF pulses <class-ref scheme="cpc">G01R33/4833</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R33/448" definition-exists="false" ipc-concordant="G01R33/44" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-11-01" status="published"><classification-symbol>G01R33/448</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Relaxometry, i.e. quantification of relaxation times or spin density </text><reference><text><class-ref scheme="cpc">G01R33/50</class-ref> takes precedence</text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R33/46" definition-exists="false" ipc-concordant="G01R33/46" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/46</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>NMR spectroscopy</text></title-part></class-title>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/4608" definition-exists="false" ipc-concordant="G01R33/46" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/4608</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>RF excitation sequences for enhanced detection, e.g. NOE, polarisation transfer, selection of a coherence transfer pathway</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/4616" definition-exists="false" ipc-concordant="G01R33/46" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/4616</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using specific RF pulses or specific modulation schemes, e.g. stochastic excitation, adiabatic RF pulses, composite pulses, binomial pulses, Shinnar-le-Roux pulses, spectrally selective pulses not being used for spatial selection</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/4625" definition-exists="false" ipc-concordant="G01R33/46" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/4625</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Processing of acquired signals, e.g. elimination of phase errors, baseline fitting, chemometric analysis</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/4633" definition-exists="false" ipc-concordant="G01R33/46" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/4633</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Sequences for multi-dimensional NMR</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/4641" definition-exists="false" ipc-concordant="G01R33/46" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/4641</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Sequences for NMR spectroscopy of samples with ultrashort relaxation times such as solid samples</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/465" definition-exists="false" ipc-concordant="G01R33/465" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/465</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>applied to biological material, e.g. <u>in vitro</u> testing</text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01R33/48" definition-exists="false" ipc-concordant="G01R33/48" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/48</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>NMR imaging systems</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/4802" definition-exists="false" ipc-concordant="G01R33/48" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/4802</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Travelling-wave MR</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/4804" definition-exists="false" ipc-concordant="G01R33/48" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/4804</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Spatially selective measurement of temperature or pH</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/4806" definition-exists="false" ipc-concordant="G01R33/48" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/4806</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Functional imaging of brain activation</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/4808" definition-exists="false" ipc-concordant="G01R33/48" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/4808</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Multimodal MR, e.g. MR combined with positron emission tomography [PET], MR combined with ultrasound or MR combined with computed tomography [CT]</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R33/481" definition-exists="false" ipc-concordant="G01R33/48" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-11-01" status="published"><classification-symbol>G01R33/481</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>MR combined with positron emission tomography [PET] or single photon emission computed tomography [SPECT]</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R33/4812" definition-exists="false" ipc-concordant="G01R33/48" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-11-01" status="published"><classification-symbol>G01R33/4812</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>MR combined with X-ray or computed tomography [CT]</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R33/4814" definition-exists="false" ipc-concordant="G01R33/48" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-11-01" status="published"><classification-symbol>G01R33/4814</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>MR combined with ultrasound</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/4816" definition-exists="false" ipc-concordant="G01R33/48" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/4816</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>NMR imaging of samples with ultrashort relaxation times such as solid samples, e.g. MRI using ultrashort TE [UTE], single point imaging, constant time imaging</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/4818" definition-exists="false" ipc-concordant="G01R33/48" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/4818</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>MR characterised by data acquisition along a specific k-space trajectory or by the temporal order of k-space coverage, e.g. centric or segmented coverage of k-space</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R33/482" definition-exists="false" ipc-concordant="G01R33/48" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/482</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using a Cartesian trajectory</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R33/4822" definition-exists="false" ipc-concordant="G01R33/48" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/4822</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>in three dimensions</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R33/4824" definition-exists="false" ipc-concordant="G01R33/48" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/4824</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using a non-Cartesian trajectory</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R33/4826" definition-exists="false" ipc-concordant="G01R33/48" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-11-01" status="published"><classification-symbol>G01R33/4826</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>in three dimensions</text></CPC-specific-text></title-part></class-title></classification-item></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/4828" definition-exists="false" ipc-concordant="G01R33/48" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/4828</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Resolving the MR signals of different chemical species, e.g. water-fat imaging</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/483" definition-exists="false" ipc-concordant="G01R33/483" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/483</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>with selection of signals or spectra from particular regions of the volume, e.g. <u>in vivo</u> spectroscopy</text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R33/4831" definition-exists="false" ipc-concordant="G01R33/483" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/4831</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using B1 gradients, e.g. rotating frame techniques, use of surface coils</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R33/4833" definition-exists="false" ipc-concordant="G01R33/483" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/4833</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using spatially selective excitation of the volume of interest, e.g. selecting non-orthogonal or inclined slices</text></CPC-specific-text></title-part></class-title>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R33/4835" definition-exists="false" ipc-concordant="G01R33/483" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/4835</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>of multiple slices</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R33/4836" definition-exists="false" ipc-concordant="G01R33/483" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-11-01" status="published"><classification-symbol>G01R33/4836</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using an RF pulse being spatially selective in more than one spatial dimension, e.g. a 2D pencil-beam excitation pulse</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
|
|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R33/4838" definition-exists="false" ipc-concordant="G01R33/483" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/4838</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using spatially selective suppression or saturation of MR signals</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R33/485" definition-exists="false" ipc-concordant="G01R33/485" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R33/485</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>based on chemical shift information </text><CPC-specific-text><text>[CSI] or spectroscopic imaging, e.g. to acquire the spatial distributions of metabolites</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/50" definition-exists="false" ipc-concordant="G01R33/50" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2017-08-01" status="published"><classification-symbol>G01R33/50</classification-symbol><class-title date-revised="2017-08-01"><title-part><text>based on the determination of relaxation times </text><CPC-specific-text><text>, e.g. T1 measurement by IR sequences; T2 measurement by multiple-echo sequences</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/54" definition-exists="false" ipc-concordant="G01R33/54" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R33/54</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Signal processing systems, e.g. using pulse sequences </text><CPC-specific-text><text>; Generation or control of pulse sequences; Operator console</text></CPC-specific-text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R33/543" definition-exists="false" ipc-concordant="G01R33/54" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-11-01" status="published"><classification-symbol>G01R33/543</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Control of the operation of the MR system, e.g. setting of acquisition parameters prior to or during MR data acquisition, dynamic shimming, use of one or more scout images for scan plane prescription </text><reference><text><class-ref scheme="cpc">G01R33/546</class-ref> takes precedence</text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R33/546" definition-exists="false" ipc-concordant="G01R33/54" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/546</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Interface between the MR system and the user, e.g. for controlling the operation of the MR system or for the design of pulse sequences</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R33/56" definition-exists="true" ipc-concordant="G01R33/56" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R33/56</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Image enhancement or correction, e.g. subtraction or averaging techniques </text><CPC-specific-text><text>, e.g. improvement of signal-to-noise ratio and resolution</text></CPC-specific-text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R33/5601" definition-exists="false" ipc-concordant="G01R33/56" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/5601</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>involving use of a contrast agent for contrast manipulation, e.g. a paramagnetic, super-paramagnetic, ferromagnetic or hyperpolarised contrast agent</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R33/5602" definition-exists="false" ipc-concordant="G01R33/56" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/5602</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>by filtering or weighting based on different relaxation times within the sample, e.g. T1 weighting using an inversion pulse</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R33/5604" definition-exists="false" ipc-concordant="G01R33/56" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/5604</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Microscopy; Zooming</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R33/5605" definition-exists="false" ipc-concordant="G01R33/56" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/5605</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>by transferring coherence or polarization from a spin species to another, e.g. creating magnetization transfer contrast [MTC], polarization transfer using nuclear Overhauser enhancement [NOE]</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R33/5607" definition-exists="false" ipc-concordant="G01R33/56" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-11-01" status="published"><classification-symbol>G01R33/5607</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>by reducing the NMR signal of a particular spin species, e.g. of a chemical species for fat suppression, or of a moving spin species for black-blood imaging</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R33/5608" definition-exists="false" ipc-concordant="G01R33/56" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-11-01" status="published"><classification-symbol>G01R33/5608</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Data processing and visualization specially adapted for MR, e.g. for feature analysis and pattern recognition on the basis of measured MR data, segmentation of measured MR data, edge contour detection on the basis of measured MR data, for enhancing measured MR data in terms of signal-to-noise ratio by means of noise filtering or apodization, for enhancing measured MR data in terms of resolution by means for deblurring, windowing, zero filling, or generation of gray-scaled images, colour-coded images or images displaying vectors instead of pixels </text><reference><text>image data processing or generation, in general <class-ref scheme="cpc">G06T</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R33/561" definition-exists="false" ipc-concordant="G01R33/561" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/561</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>by reduction of the scanning time, i.e. fast acquiring systems, e.g. using echo-planar pulse sequences</text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="14" additional-only="false" sort-key="G01R33/5611" definition-exists="false" ipc-concordant="G01R33/561" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/5611</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Parallel magnetic resonance imaging, e.g. sensitivity encoding [SENSE], simultaneous acquisition of spatial harmonics [SMASH], unaliasing by Fourier encoding of the overlaps using the temporal dimension [UNFOLD], k-t-broad-use linear acquisition speed-up technique [k-t-BLAST], k-t-SENSE </text><reference><text>structural details of arrays of sub-coils <class-ref scheme="cpc">G01R33/3415</class-ref></text></reference></CPC-specific-text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="15" additional-only="false" sort-key="G01R33/5612" definition-exists="false" ipc-concordant="G01R33/561" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/5612</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Parallel RF transmission, i.e. RF pulse transmission using a plurality of independent transmission channels</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="14" additional-only="false" sort-key="G01R33/5613" definition-exists="false" ipc-concordant="G01R33/561" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/5613</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Generating steady state signals, e.g. low flip angle sequences [FLASH]</text></CPC-specific-text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="15" additional-only="false" sort-key="G01R33/5614" definition-exists="false" ipc-concordant="G01R33/561" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/5614</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using a fully balanced steady-state free precession [bSSFP] pulse sequence, e.g. trueFISP</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="14" additional-only="false" sort-key="G01R33/5615" definition-exists="false" ipc-concordant="G01R33/561" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/5615</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Echo train techniques involving acquiring plural, differently encoded, echo signals after one RF excitation, e.g. using gradient refocusing in echo planar imaging [EPI], RF refocusing in rapid acquisition with relaxation enhancement [RARE] or using both RF and gradient refocusing in gradient and spin echo imaging [GRASE]</text></CPC-specific-text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="15" additional-only="false" sort-key="G01R33/5616" definition-exists="false" ipc-concordant="G01R33/561" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/5616</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using gradient refocusing, e.g. EPI</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="15" additional-only="false" sort-key="G01R33/5617" definition-exists="false" ipc-concordant="G01R33/561" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/5617</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using RF refocusing, e.g. RARE</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="15" additional-only="false" sort-key="G01R33/5618" definition-exists="false" ipc-concordant="G01R33/561" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/5618</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>using both RF and gradient refocusing, e.g. GRASE</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="14" additional-only="false" sort-key="G01R33/5619" definition-exists="false" ipc-concordant="G01R33/561" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/5619</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>by temporal sharing of data, e.g. keyhole, block regional interpolation scheme for k-Space [BRISK]</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R33/563" definition-exists="false" ipc-concordant="G01R33/563" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/563</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>of moving material, e.g. flow contrast angiography</text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="14" additional-only="false" sort-key="G01R33/56308" definition-exists="false" ipc-concordant="G01R33/563" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/56308</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Characterization of motion or flow; Dynamic imaging</text></CPC-specific-text></title-part></class-title>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="15" additional-only="false" sort-key="G01R33/56316" definition-exists="false" ipc-concordant="G01R33/563" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/56316</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>involving phase contrast techniques</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="15" additional-only="false" sort-key="G01R33/56325" definition-exists="false" ipc-concordant="G01R33/563" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2015-10-01" status="published"><classification-symbol>G01R33/56325</classification-symbol><class-title date-revised="2015-10-01"><title-part><CPC-specific-text><text>Cine imaging</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="15" additional-only="false" sort-key="G01R33/56333" definition-exists="false" ipc-concordant="G01R33/563" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/56333</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Involving spatial modulation of the magnetization within an imaged region, e.g. spatial modulation of magnetization [SPAMM] tagging </text><reference><text>perfusion imaging based on arterial spin tagging <class-ref scheme="cpc">G01R33/56366</class-ref></text></reference></CPC-specific-text></title-part></class-title></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="14" additional-only="false" sort-key="G01R33/56341" definition-exists="false" ipc-concordant="G01R33/563" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/56341</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Diffusion imaging</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="14" additional-only="false" sort-key="G01R33/5635" definition-exists="false" ipc-concordant="G01R33/563" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/5635</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Angiography, e.g. contrast-enhanced angiography [CE-MRA] or time-of-flight angiography [TOF-MRA]</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="14" additional-only="false" sort-key="G01R33/56358" definition-exists="false" ipc-concordant="G01R33/563" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/56358</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Elastography</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="14" additional-only="false" sort-key="G01R33/56366" definition-exists="false" ipc-concordant="G01R33/563" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/56366</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Perfusion imaging</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="14" additional-only="false" sort-key="G01R33/56375" definition-exists="false" ipc-concordant="G01R33/563" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/56375</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Intentional motion of the sample during MR, e.g. moving table imaging</text></CPC-specific-text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="15" additional-only="false" sort-key="G01R33/56383" definition-exists="false" ipc-concordant="G01R33/563" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-11-01" status="published"><classification-symbol>G01R33/56383</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>involving motion of the sample as a whole, e.g. multistation MR or MR with continuous table motion</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="15" additional-only="false" sort-key="G01R33/56391" definition-exists="false" ipc-concordant="G01R33/563" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-11-01" status="published"><classification-symbol>G01R33/56391</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>involving motion of a part of the sample with respect to another part of the sample, e.g. MRI of active joint motion</text></CPC-specific-text></title-part></class-title></classification-item></classification-item></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R33/565" definition-exists="false" ipc-concordant="G01R33/565" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/565</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Correction of image distortions, e.g. due to magnetic field inhomogeneities</text></title-part></class-title>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="14" additional-only="false" sort-key="G01R33/56509" definition-exists="false" ipc-concordant="G01R33/565" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/56509</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>due to motion, displacement or flow, e.g. gradient moment nulling </text><reference><text><class-ref scheme="cpc">G01R33/567</class-ref> takes precedence</text></reference></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="14" additional-only="false" sort-key="G01R33/56518" definition-exists="false" ipc-concordant="G01R33/565" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/56518</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>due to eddy currents, e.g. caused by switching of the gradient magnetic field</text></CPC-specific-text></title-part></class-title><notes-and-warnings date-revised="2013-01-01"><note type="note"><note-paragraph>This group only covers correction of artifacts caused by gradient-non-linearity</note-paragraph></note></notes-and-warnings></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="14" additional-only="false" sort-key="G01R33/56527" definition-exists="false" ipc-concordant="G01R33/565" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/56527</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>due to chemical shift effects</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="14" additional-only="false" sort-key="G01R33/56536" definition-exists="false" ipc-concordant="G01R33/565" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/56536</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>due to magnetic susceptibility variations</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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|
<classification-item breakdown-code="false" not-allocatable="false" level="14" additional-only="false" sort-key="G01R33/56545" definition-exists="false" ipc-concordant="G01R33/565" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-11-01" status="published"><classification-symbol>G01R33/56545</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>caused by finite or discrete sampling, e.g. Gibbs ringing, truncation artefacts, phase aliasing artefacts</text></CPC-specific-text></title-part></class-title></classification-item>
|
||
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<classification-item breakdown-code="false" not-allocatable="false" level="14" additional-only="false" sort-key="G01R33/56554" definition-exists="false" ipc-concordant="G01R33/565" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/56554</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>caused by acquiring plural, differently encoded echo signals after one RF excitation, e.g. correction for readout gradients of alternating polarity in EPI</text></CPC-specific-text></title-part></class-title></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="14" additional-only="false" sort-key="G01R33/56563" definition-exists="false" ipc-concordant="G01R33/565" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/56563</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>caused by a distortion of the main magnetic field B0, e.g. temporal variation of the magnitude or spatial inhomogeneity of B0 </text><reference><text><class-ref scheme="cpc">G01R33/56509</class-ref>, <class-ref scheme="cpc">G01R33/56518</class-ref>, <class-ref scheme="cpc">G01R33/56536</class-ref> take precedence</text></reference></CPC-specific-text></title-part></class-title></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="14" additional-only="false" sort-key="G01R33/56572" definition-exists="false" ipc-concordant="G01R33/565" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/56572</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>caused by a distortion of a gradient magnetic field, e.g. non-linearity of a gradient magnetic field </text><reference><text><class-ref scheme="cpc">G01R33/56509</class-ref>, <class-ref scheme="cpc">G01R33/56518</class-ref>, <class-ref scheme="cpc">G01R33/56536</class-ref> take precedence</text></reference></CPC-specific-text></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="15" additional-only="false" sort-key="G01R33/56581" definition-exists="false" ipc-concordant="G01R33/565" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/56581</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>due to Maxwell fields, i.e. concomitant fields</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="14" additional-only="false" sort-key="G01R33/5659" definition-exists="false" ipc-concordant="G01R33/565" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-11-01" status="published"><classification-symbol>G01R33/5659</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>caused by a distortion of the RF magnetic field, e.g. spatial inhomogeneities of the RF magnetic field </text><reference><text><class-ref scheme="cpc">G01R33/56509</class-ref>, <class-ref scheme="cpc">G01R33/56518</class-ref>, <class-ref scheme="cpc">G01R33/56536</class-ref> take precedence</text></reference></CPC-specific-text></title-part></class-title></classification-item></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R33/567" definition-exists="false" ipc-concordant="G01R33/567" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-08-01" status="published"><classification-symbol>G01R33/567</classification-symbol><class-title date-revised="2016-08-01"><title-part><text>gated by physiological signals </text><CPC-specific-text><text>, i.e. synchronization of acquired MR data with periodical motion of an object of interest, e.g. monitoring or triggering system for cardiac or respiratory gating</text></CPC-specific-text></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="14" additional-only="false" sort-key="G01R33/5673" definition-exists="false" ipc-concordant="G01R33/567" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/5673</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Gating or triggering based on a physiological signal other than an MR signal, e.g. ECG gating or motion monitoring using optical systems for monitoring the motion of a fiducial marker</text></CPC-specific-text></title-part></class-title></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="14" additional-only="false" sort-key="G01R33/5676" definition-exists="false" ipc-concordant="G01R33/567" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/5676</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Gating or triggering based on an MR signal, e.g. involving one or more navigator echoes for motion monitoring and correction</text></CPC-specific-text></title-part></class-title></classification-item></classification-item></classification-item></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="11" additional-only="false" sort-key="G01R33/58" definition-exists="false" ipc-concordant="G01R33/58" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/58</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Calibration of imaging systems, e.g. using test probes </text><CPC-specific-text><text>, Phantoms; Calibration objects or fiducial markers such as active or passive RF coils surrounding an MR active material</text></CPC-specific-text></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="12" additional-only="false" sort-key="G01R33/583" definition-exists="false" ipc-concordant="G01R33/58" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-11-01" status="published"><classification-symbol>G01R33/583</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Calibration of signal excitation or detection systems, e.g. for optimal RF excitation power or frequency </text><reference><text><class-ref scheme="cpc">G01R33/246</class-ref> takes precedence</text></reference></CPC-specific-text></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="13" additional-only="false" sort-key="G01R33/586" definition-exists="false" ipc-concordant="G01R33/58" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2016-11-01" status="published"><classification-symbol>G01R33/586</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>for optimal flip angle of RF pulses</text></CPC-specific-text></title-part></class-title></classification-item></classification-item></classification-item></classification-item></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R33/60" definition-exists="false" ipc-concordant="G01R33/60" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/60</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>using electron paramagnetic resonance </text><reference><text><class-ref scheme="cpc">G01R33/24</class-ref>, <class-ref scheme="cpc">G01R33/62</class-ref> take precedence</text></reference></title-part></class-title></classification-item>
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||
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R33/62" definition-exists="false" ipc-concordant="G01R33/62" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R33/62</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>using double resonance </text><reference><text><class-ref scheme="cpc">G01R33/24</class-ref> takes precedence</text></reference></title-part></class-title></classification-item>
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||
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R33/64" definition-exists="true" ipc-concordant="G01R33/64" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R33/64</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>using cyclotron resonance </text><reference><text><class-ref scheme="cpc">G01R33/24</class-ref> takes precedence</text></reference></title-part></class-title></classification-item></classification-item></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="7" additional-only="false" sort-key="G01R35/00" definition-exists="true" ipc-concordant="G01R35/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2021-05-01" status="published"><classification-symbol>G01R35/00</classification-symbol><class-title date-revised="2021-05-01"><title-part><text>Testing or calibrating of apparatus covered by the other groups of this subclass</text></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R35/002" definition-exists="false" ipc-concordant="G01R35/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R35/002</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>of cathode ray oscilloscopes</text></CPC-specific-text></title-part></class-title></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R35/005" definition-exists="true" ipc-concordant="G01R35/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R35/005</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references </text><reference><text><class-ref scheme="cpc">G01R33/0035</class-ref>, <class-ref scheme="cpc">G01R35/002</class-ref> take precedence</text></reference></CPC-specific-text></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R35/007" definition-exists="true" ipc-concordant="G01R35/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R35/007</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Standards or reference devices, e.g. voltage or resistance standards, "golden references"</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R35/02" definition-exists="true" ipc-concordant="G01R35/02" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2017-08-01" status="published"><classification-symbol>G01R35/02</classification-symbol><class-title date-revised="2017-08-01"><title-part><text>of auxiliary devices, e.g. of instrument transformers according to prescribed transformation ratio, phase angle, or wattage rating</text></title-part></class-title></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01R35/04" definition-exists="true" ipc-concordant="G01R35/04" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R35/04</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>of instruments for measuring time integral of power or current</text></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01R35/06" definition-exists="false" ipc-concordant="G01R35/06" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01R35/06</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>by stroboscopic methods</text></title-part></class-title></classification-item></classification-item></classification-item></classification-item></classification-item></class-scheme>
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