G01R

MEASURING ELECTRIC VARIABLES

MEASURING MAGNETIC VARIABLES indicating correct tuning of resonant circuits H03J3/12

This subclass covers:

measuring all kinds of electric or magnetic variables directly or by derivation from other electric or magnetic variables;

measuring all kinds of electric or magnetic properties of materials;

testing electric or magnetic devices, apparatus or networks, (e.g. discharge tubes, amplifiers) or measuring their characteristics;

indicating presence or sign of current or voltage;

NMR, EPR or other spin-effect apparatus, not specially adapted for a particular application;

equipment for generating signals to be used for carrying out such tests and measurements.

In this subclass, the following terms or expressions are used with the meanings indicated :

"measuring" includes investigating;

"instruments" or "measuring instruments" means electro-mechanical measuring mechanisms;

"arrangements for measuring" means apparatus, circuits, or methods for measuring;

Attention is drawn to the Notes following the title of class G01.

In this subclass, instruments or arrangements for measuring electric variables are classified in the following way:

Electromechanical instruments where the measured electric variables directly effect the indication of the measured value, including combined effects of two or more values, are classified in groups G01R5/00 - G01R11/00.

Details common to different types of the instruments covered by groups G01R5/00 - G01R11/00 are classified in group G01R1/00.

Arrangements involving circuitry to obtain an indication of a measured value by deriving, calculating or otherwise processing electric variables, e.g. by comparison with another value, are classified in groups G01R17/00 - G01R29/00.

Details common to different types of arrangements covered by groups G01R17/00 - G01R29/00 are classified in group G01R15/00.

In this subclass, group G01R17/00 takes precedence over groups G01R19/00 - G01R31/00.

In this subclass non-limiting references (in the sense of paragraph 39 of the Guide to the IPC) may still be displayed in the scheme.

G01R1/00

Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00 constructional details particular to

electromechanical

arrangements for measuring the electric consumption G01R11/02

G01R1/02

General constructional details

G01R1/025

concerning dedicated user interfaces, e.g. GUI, or dedicated keyboards G01R31/31912 takes precedence

G01R1/04

Housings

Supporting members

Arrangements of terminals

G01R1/0408

Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets G01R1/067 takes precedence; mass production testing systems G01R31/59; testing of connections G01R31/66; for testing printed circuit boards G01R31/2808

G01R1/0416

Connectors, terminals G01R1/0425 and G01R1/0433 take precedence; with measurement function for battery poles G01R31/364

G01R1/0425

Test clips, e.g. for IC's

G01R1/0433

Sockets for IC's or transistors

G01R1/0441

Details

G01R1/045

Sockets or component fixtures for RF or HF testing

G01R1/0458

related to environmental aspects, e.g. temperature

G01R1/0466

concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding

G01R1/0475

for TAB IC's

G01R1/0483

Sockets for un-leaded IC's having matrix type contact fields, e.g. BGA or PGA devices; Sockets for unpackaged, naked chips for IC's with connecting points around the edges only G01R1/0433

G01R1/0491

for testing integrated circuits on wafers, e.g. wafer-level test cartridge

G01R1/06

Measuring leads

Measuring probes G01R19/145, G01R19/165 take precedence

G01R1/067

Measuring probes

G01R1/06705

Apparatus for holding or moving single probes for moving multiple probe heads or ICs under test G01R31/2886

G01R1/06711

Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins

G01R1/06716

Elastic

G01R1/06722

Spring-loaded

G01R1/06727

Cantilever beams

This group is not complete pending a reorganisation; see also other subgroups of G01R1/06711

G01R1/06733

Geometry aspects G01R1/06727 takes precedence

G01R1/06738

related to tip portion

G01R1/06744

Microprobes, i.e. having dimensions as IC details

G01R1/0675

Needle-like

G01R1/06755

Material aspects

G01R1/06761

related to layers

G01R1/06766

Input circuits therefor

G01R1/06772

High frequency probes

G01R1/06777

High voltage probes

G01R1/06783

containing liquids

G01R1/06788

Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments end pieces terminating in a probe H01R11/18

G01R1/06794

Devices for sensing when probes are in contact, or in position to contact, with measured object

G01R1/07

Non contact-making probes

G01R1/071

containing electro-optic elements

G01R1/072

containing ionised gas

G01R1/073

Multiple probes

G01R1/07307

with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card

G01R1/07314

the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support on an elastic support, e.g. a film, G01R1/0735

G01R1/07321

the probes being of different lengths

G01R1/07328

for testing printed circuit boards

G01R1/07335

for double-sided contacting or for testing boards with surface-mounted devices (SMD's)

G01R1/07342

the body of the probe being at an angle other than perpendicular to test object, e.g. probe card

G01R1/0735

arranged on a flexible frame or film

G01R1/07357

with flexible bodies, e.g. buckling beams

G01R1/07364

with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch

G01R1/07371

using an intermediate card or back card with apertures through which the probes pass

G01R1/07378

using an intermediate adapter, e.g. space transformers G01R1/07371 takes precedence

G01R1/07385

using switching of signals between probe tips and test bed, i.e. the standard contact matrix which in its turn connects to the tester

G01R1/07392

manipulating each probe element or tip individually

G01R1/08

Pointers

Scales

Scale illumination

G01R1/10

Arrangements of bearings

G01R1/12

of strip or wire bearings

G01R1/14

Braking arrangements

Damping arrangements

G01R1/16

Magnets

G01R1/18

Screening arrangements against electric or magnetic fields, e.g. against earth's field

G01R1/20

Modifications of basic electric elements for use in electric measuring instruments

Structural combinations of such elements with such instruments

G01R1/203

Resistors used for electric measuring, e.g. decade resistors standards, resistors for comparators, series resistors, shunts resistors in general H01C; microwave or radiowave terminations H01P1/26; coupling devices H01R

G01R1/206

Switches for connection of measuring instruments or electric motors to measuring loads switches in general H01H

G01R1/22

Tong testers acting as secondary windings of current transformers

G01R1/24

Transmission-line, e.g. waveguide, measuring sections, e.g. slotted section

G01R1/26

with linear movement of probe

G01R1/28

Provision in measuring instruments for reference values, e.g. standard voltage, standard waveform

G01R1/30

Structural combination of electric measuring instruments with basic electronic circuits, e.g. with amplifier

G01R1/36

Overload-protection arrangements or circuits for electric measuring instruments

G01R1/38

Arrangements for altering the indicating characteristic, e.g. by modifying the air gap

G01R1/40

Modifications of instruments to indicate the maximum or the minimum value reached in a time interval, e.g. by maximum indicator pointer

G01R1/42

thermally operated

G01R1/44

Modifications of instruments for temperature compensation

G01R3/00

Apparatus or processes specially adapted for the manufacture

or maintenance

of measuring instruments

, e.g. of probe tips

G01R5/00

Instruments for converting a single current or a single voltage into a mechanical displacement

G01R5/02

Moving-coil instruments

G01R5/04

with magnet external to the coil

G01R5/06

with core magnet

G01R5/08

specially adapted for wide angle deflection

with eccentrically-pivoted moving coil

G01R5/10

String galvanometers

G01R5/12

Loop galvanometers

G01R5/14

Moving-iron instruments

G01R5/16

with pivoting magnet

G01R5/18

with pivoting soft iron, e.g. needle galvanometer

G01R5/20

Induction instruments, e.g. Ferraris instruments

G01R5/22

Thermoelectric instruments

G01R5/24

operated by elongation of a strip or wire or by expansion of a gas or fluid

G01R5/26

operated by deformation of a bimetallic element

G01R5/28

Electrostatic instruments

G01R5/30

Leaf electrometers

G01R5/32

Wire electrometers

Needle electrometers

G01R5/34

Quadrant electrometers

G01R7/00

Instruments capable of converting two or more currents or voltages into a single mechanical displacement G01R9/00 takes precedence

G01R7/02

for forming a sum or a difference

G01R7/04

for forming a quotient for measuring resistance G01R27/08

G01R7/06

moving-iron type

This group covers all crossed-coil meters, i.e. logometers having a magnetic rotor

G01R7/08

moving-coil type, e.g. crossed-coil type

G01R7/10

having more than two moving coils

G01R7/12

for forming product

G01R7/14

moving-iron type

G01R7/16

having both fixed and moving coils, i.e. dynamometers

G01R7/18

with iron core magnetically coupling fixed and moving coils

G01R9/00

Instruments employing mechanical resonance

G01R9/02

Vibration galvanometers, e.g. for measuring current

G01R9/04

using vibrating reeds, e.g. for measuring frequency

G01R9/06

magnetically driven

G01R9/08

piezo-electrically driven

G01R11/00

Electromechanical arrangements for measuring time integral of electric power or current, e.g. of consumption monitoring electric consumption of electrically-propelled vehicles B60L3/00

Groups G01R11/48 - G01R11/56 take precedence over groups G01R11/30 - G01R11/46.

This Note corresponds to IPC Note (1) relating to G01R11/30 - G01R11/46.

For the definition of "arrangement" see Note (2) under G01R

G01R11/02

Constructional details

G01R11/04

Housings

Supporting racks

Arrangements of terminals

G01R11/06

Magnetic circuits of induction meters

G01R11/067

Coils therefor

G01R11/073

Armatures therefor

G01R11/09

Disc armatures

G01R11/10

Braking magnets

Damping arrangements

G01R11/12

Arrangements of bearings

G01R11/14

with magnetic relief

G01R11/16

Adaptations of counters to electricity meters

G01R11/17

Compensating for errors

Adjusting or regulating means therefor

G01R11/18

Compensating for variations in ambient conditions

G01R11/185

Temperature compensation

G01R11/19

Compensating for errors caused by disturbing torque, e.g. rotating-field errors of polyphase meters

G01R11/20

Compensating for phase errors in induction meters

G01R11/21

Compensating for errors caused by damping effects of the current, e.g. adjustment in the overload range

G01R11/22

Adjusting torque, e.g. adjusting starting torque, adjusting of polyphase meters for obtaining equal torques

G01R11/23

Compensating for errors caused by friction, e.g. adjustment in the light load range

G01R11/24

Arrangements for avoiding or indicating fraudulent use

G01R11/25

Arrangements for indicating or signalling faults

G01R11/30

Dynamo-electric motor meters

G01R11/32

Watt-hour meters

G01R11/34

Ampere-hour meters

G01R11/36

Induction meters, e.g. Ferraris meters

G01R11/38

for single-phase operation

G01R11/40

for polyphase operation

G01R11/42

Circuitry therefor

G01R11/46

Electrically-operated clockwork meters

Oscillatory meters

Pendulum meters

G01R11/465

Oscillatory meters

G01R11/48

Meters specially adapted for measuring real or reactive components

Meters specially adapted for measuring apparent energy

G01R11/50

for measuring real component

G01R11/52

for measuring reactive component

G01R11/54

for measuring simultaneously at least two of the following three variables: real component, reactive component, apparent energy

G01R11/56

Special tariff meters

G01R11/57

Multi-rate meters G01R11/63 takes precedence

G01R11/58

Tariff-switching devices therefor

G01R11/60

Subtraction meters

Meters measuring maximum or minimum load hours

G01R11/63

Over-consumption meters, e.g. measuring consumption while a predetermined level of power is exceeded

G01R11/64

Maximum meters, e.g. tariff for a period is based on maximum demand within that period

G01R11/66

Circuitry

G01R13/00

Arrangements for displaying electric variables or waveforms

G01R13/02

for displaying measured electric variables in digital form

G01R13/0209

in numerical form

G01R13/0218

Circuits therefor

G01R13/0227

Controlling the intensity or colour of the display

G01R13/0236

for presentation of more than one variable

G01R13/0245

for inserting reference markers

G01R13/0254

for triggering, synchronisation

G01R13/0263

for non-recurrent functions, e.g. transients

G01R13/0272

for sampling

G01R13/0281

using electro-optic elements

G01R13/029

Software therefor

G01R13/04

for producing permanent records

G01R13/06

Modifications for recording transient disturbances, e.g. by starting or accelerating a recording medium

G01R13/08

Electromechanical recording systems using a mechanical direct-writing method

G01R13/10

with intermittent recording by representing the variable by the length of a stroke or by the position of a dot

G01R13/12

Chemical recording, e.g. clydonographs G01R13/14 takes precedence

G01R13/14

Recording on a light-sensitive material

G01R13/16

Recording on a magnetic medium

G01R13/18

using boundary displacement

G01R13/20

Cathode-ray oscilloscopes

G01R13/202

Non-electric appliances, e.g. scales, masks luminescent screens for CRT provided with permanent marks or references H01J29/34; optical or photographic arrangements combined with CRT vessels H01J29/89

G01R13/204

Using means for generating permanent registrations, e.g. photographs optical or photographic arrangements combined with CRT vessel H01J29/89

G01R13/206

Arrangements for obtaining a 3- dimensional representation stereoscopic T.V. H04N13/00

G01R13/208

Arrangements for measuring with C.R. oscilloscopes, e.g. vectorscope

G01R13/22

Circuits therefor

G01R13/225

particularly adapted for storage oscilloscopes

G01R13/24

Time-base deflection circuits

G01R13/245

for generating more than one, not overlapping time-intervals on the screen

G01R13/26

Circuits for controlling the intensity of the electron beam

or the colour of the display

G01R13/28

Circuits for simultaneous or sequential presentation of more than one variable

G01R13/30

Circuits for inserting reference markers, e.g. for timing, for calibrating, for frequency marking

G01R13/305

for time marking

G01R13/32

Circuits for displaying non-recurrent functions such as transients

Circuits for triggering

Circuits for synchronisation

Circuits for time-base expansion

G01R13/325

for displaying non-recurrent functions such as transients

G01R13/34

Circuits for representing a single waveform by sampling, e.g. for very high frequencies

G01R13/342

for displaying periodic H.F. signals G01R13/345 takes precedence

G01R13/345

for displaying sampled signals by using digital processors by intermediate A.D. and D.A. convertors (control circuits for CRT indicators)

G01R13/347

using electro-optic elements

G01R13/36

using length of glow discharge, e.g. glowlight oscilloscopes

G01R13/38

using the steady or oscillatory displacement of a light beam by an electromechanical measuring system

G01R13/40

using modulation of a light beam otherwise than by mechanical displacement, e.g. by Kerr effect

visual indication of correct tuning H03J3/14

G01R13/401

for continuous analogue, or simulated analogue, display

G01R13/402

using active, i.e. light-emitting display devices, e.g. electroluminescent display G01R13/36 and G01R13/42 take precedence

G01R13/403

using passive display devices, e.g. liquid crystal display or Kerr effect display devices

G01R13/404

for discontinuous display, i.e. display of discrete values analogue/digital conversion H03M1/00

G01R13/405

using a plurality of active, i.e. light emitting, e.g. electro-luminescent elements, i.e. bar graphs

G01R13/406

representing measured value by a dot or a single line G01R13/408 takes precedence

G01R13/407

using a plurality of passive display elements, e.g. liquid crystal or Kerr-effect display elements G01R13/408 takes precedence

G01R13/408

Two or three dimensional representation of measured values

G01R13/42

Instruments using length of spark discharge, e.g. by measuring maximum separation of electrodes to produce spark

G01R15/00

Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00

G01R15/002

Switches for altering the measuring range or for multitesters

G01R15/005

Circuits for altering the indicating characteristic, e.g. making it non-linear

G01R15/007

by zero-suppression

G01R15/04

Voltage dividers

G01R15/06

having reactive components, e.g. capacitive transformer

G01R15/08

Circuits for altering the measuring range

G01R15/09

Autoranging circuits

G01R15/12

Circuits for multi-testers

, i.e. multimeters

, e.g. for measuring voltage, current, or impedance at will

G01R15/125

for digital multimeters

G01R15/14

Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks

G01R15/142

Arrangements for simultaneous measurements of several parameters employing techniques covered by groups G01R15/14 - G01R15/26

G01R15/144

Measuring arrangements for voltage not covered by other subgroups of G01R15/14

G01R15/146

Measuring arrangements for current not covered by other subgroups of G01R15/14, e.g. using current dividers, shunts, or measuring a voltage drop if no voltage isolation is involved G01R1/203 or G01R19/0092

G01R15/148

involving the measuring of a magnetic field or electric field G01R15/18, G01R15/20, G01R15/24, G01R15/26 take precedence

G01R15/16

using capacitive devices

G01R15/165

measuring electrostatic potential, e.g. with electrostatic voltmeters or electrometers, when the design of the sensor is essential electrometers with passively moving electrodes G01R5/28; measuring electrostatic fields G01R29/12; measuring charge G01R29/24; measuring in circuits with high internal resistance G01R19/0023

G01R15/18

using inductive devices, e.g. transformers

G01R15/181

using coils without a magnetic core, e.g. Rogowski coils

G01R15/183

using transformers with a magnetic core

G01R15/185

with compensation or feedback windings or interacting coils, e.g. 0-flux sensors using galvano-magnetic field sensors G01R15/20; conversion of DC into AC using transductors G01R19/20

G01R15/186

using current transformers with a core consisting of two or more parts, e.g. clamp-on type G01R15/142 - G01R15/16 take precedence; tong testers G01R1/22

G01R15/188

comprising rotatable parts, e.g. moving coils galvanometers G01R5/02, G01R5/14

G01R15/20

using galvano-magnetic devices, e.g. Hall-effect devices

, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices

G01R15/202

using Hall-effect devices Hall elements in arrangements for measuring electrical power G01R21/08

G01R15/205

using magneto-resistance devices, e.g. field plates

G01R15/207

Constructional details independent of the type of device used

G01R15/22

using light-emitting devices, e.g. LED, optocouplers

G01R31/31901 takes precedence

G01R15/24

using light-modulating devices

G01R15/241

using electro-optical modulators, e.g. electro-absorption probes containing electro-optic elements G01R1/071

G01R15/242

based on the Pockels effect, i.e. linear electro-optic effect

G01R15/243

based on the Kerr effect, i.e. quadratic electro-optic effect

G01R15/245

using magneto-optical modulators, e.g. based on the Faraday or Cotton-Mouton effect

G01R15/246

based on the Faraday, i.e. linear magneto-optic, effect

G01R15/247

Details of the circuitry or construction of devices covered by G01R15/241 - G01R15/246

G01R15/248

using a constant light source and electro-mechanically driven deflectors

G01R15/26

using modulation of waves other than light, e.g. radio or acoustic waves

G01R17/00

Measuring arrangements involving comparison with a reference value, e.g. bridge

G01R17/02

Arrangements in which the value to be measured is automatically compared with a reference value

G01R17/04

in which the reference value is continuously or periodically swept over the range of values to be measured

G01R17/06

Automatic balancing arrangements

G01R17/08

in which a force or torque representing the measured value is balanced by a force or torque representing the reference value

G01R17/10

AC or DC measuring bridges

G01R17/105

for measuring impedance or resistance

G01R17/12

using comparison of currents, e.g. bridges with differential current output

G01R17/14

with indication of measured value by calibrated null indicator, e.g. percent bridge, tolerance bridge G01R17/12, G01R17/16 take precedence

G01R17/16

with discharge tubes or semiconductor devices in one or more arms of the bridge, e.g. voltmeter using a difference amplifier

G01R17/18

with more than four branches

G01R17/20

AC or DC potentiometric measuring arrangements

G01R17/22

with indication of measured value by calibrated null indicator

G01R19/00

Arrangements for measuring currents or voltages or for indicating presence or sign thereof G01R5/00 takes precedence; for measuring bioelectric currents or voltages A61B5/24

Within groups G01R19/02 - G01R19/32, group G01R19/28 takes precedence. Groups G01R19/18 - G01R19/257 take precedence over groups G01R19/02 - G01R19/17 and G01R19/30.

G01R19/0007

Frequency selective voltage or current level measuring measuring frequency G01R23/00; testing attenuation in line transmission systems H04B3/48; monitoring testing in transmission systems H04B17/00

G01R19/0015

separating AC and DC

G01R19/0023

Measuring currents or voltages from sources with high internal resistance by means of measuring circuits with high input impedance, e.g. OP-amplifiers electrostatic instruments G01R5/28; measuring electrostatic potential G01R15/165; measuring electrostatic fields G01R29/12; amplifiers per se

H03F

G01R19/003

Measuring mean values of current or voltage during a given time interval

G01R19/0038

Circuits for comparing several input signals and for indicating the result of this comparison, e.g. equal, different, greater, smaller (comparing pulses or pulse trains according to amplitude)

G01R19/0046

characterised by a specific application or detail not covered by any other subgroup of G01R19/00

G01R19/0053

Noise discrimination; Analog sampling; Measuring transients measuring characteristics of individual pulses G01R29/02; digital sampling G01R19/2509; measuring noise figure G01R29/26

G01R19/0061

Measuring currents of particle-beams, currents from electron multipliers, photocurrents, ion currents; Measuring in plasmas

G01R19/0069

measuring voltage or current standards

G01R19/0076

using thermionic valves

G01R19/0084

measuring voltage only all subgroups of G01R19/00 take precedence

G01R19/0092

measuring current only all subgroups of G01R19/00 take precedence

G01R19/02

Measuring effective values, i.e. root-mean-square values

G01R19/03

using thermoconverters

G01R19/04

Measuring peak values

or amplitude or envelope

of ac or of pulses

G01R19/06

Measuring real component

Measuring reactive component

G01R19/08

Measuring current density

G01R19/10

Measuring sum, difference or ratio

G01R19/12

Measuring rate of change

G01R19/14

Indicating direction of current

Indicating polarity of voltage

G01R19/145

Indicating the presence of current or voltage

G01R19/15

Indicating the presence of current

G01R19/155

Indicating the presence of voltage

G01R19/165

Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values

G01R19/16504

characterised by the components employed

G01R19/16509

using electromagnetic relays, e.g. reed relay magnetically driven reeds G01R9/06

G01R19/16514

using electronic tubes

G01R19/16519

using FET's

G01R19/16523

using diodes, e.g. Zener diodes

G01R19/16528

using digital techniques or performing arithmetic operations using digital techniques to measure a voltage or a current, see

G01R19/25

G01R19/16533

characterised by the application

G01R19/16538

in AC or DC supplies G01R19/16519 and G01R19/16528 take precedence

G01R19/16542

for batteries charge condition monitoring in G01R31/36

G01R19/16547

voltage or current in AC supplies switching for protection H02H; circuits for emergency power supply H02J9/00

G01R19/16552

in I.C. power supplies

G01R19/16557

Logic probes, i.e. circuits indicating logic state (high, low, O); modifications of electronic switches or gates for indicating state of switch H03K17/18

G01R19/16561

in hand-held circuit testers see also G01R19/155

G01R19/16566

Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533

G01R19/16571

comparing AC or DC current with one threshold, e.g. load current, over-current, surge current or fault current G01R19/16514, G01R19/16519, G01R19/16528, G01R19/16533, G01R19/1659 take precedence; measuring currents by using elements sensitive to the magnetic field generated G01R15/14; measuring earth resistance G01R27/18; testing for leakage or short circuits in electrical apparatus G01R31/52

G01R19/16576

comparing DC or AC voltage with one threshold G01R19/16514, G01R19/16519, G01R19/16528, G01R19/16533 and G01R19/1659 take precedence

G01R19/1658

AC voltage or recurrent signals

G01R19/16585

for individual pulses, ripple or noise and other applications where timing or duration is of importance G01R19/16519, G01R19/16538 and G01R19/16595 take precedence; for pulse duration and rise time, see G01R29/02 and subgroups

G01R19/1659

to indicate that the value is within or outside a predetermined range of values (window) G01R19/16514, G01R19/16519, G01R19/16528 and G01R19/16533 take precedence

G01R19/16595

with multi level indication G01R19/16519 and G01R19/16533 take precedence

G01R19/17

giving an indication of the number of times this occurs

, i.e. multi-channel analysers

G01R19/175

Indicating the instants of passage of current or voltage through a given value, e.g. passage through zero

G01R19/18

using conversion of DC into AC, e.g. with choppers

G01R19/20

using transductors

, i.e. a magnetic core transducer the saturation of which is cyclically reversed by an AC source on the secondary side

G01R19/22

using conversion of ac into dc

G01R19/225

by means of thermocouples or other heat sensitive elements

G01R2019/24

using thermocouples

G01R19/25

using digital measurement techniques

G01R19/2503

for measuring voltage only, e.g. digital volt meters (DVM's) G01R19/2506 - G01R19/257 take precedence

G01R19/2506

Arrangements for conditioning or analysing measured signals, e.g. for indicating peak values G01R19/003 takes precedence; Details concerning sampling, digitizing or waveform capturing displaying waveforms G01R13/00; analog sampling G01R19/0053

G01R19/2509

Details concerning sampling, digitizing or waveform capturing

G01R19/2513

Arrangements for monitoring electric power systems, e.g. power lines or loads; Logging

G01R19/2516

Modular arrangements for computer based systems; using personal computers (PC's), e.g. "virtual instruments"

G01R19/252

using analogue/digital converters of the type with conversion of voltage or current into frequency and measuring of this frequency

G01R19/255

using analogue/digital converters of the type with counting of pulses during a period of time proportional to voltage or current, delivered by a pulse generator with fixed frequency

G01R19/257

using analogue/digital converters of the type with comparison of different reference values with the value of voltage or current, e.g. using step-by-step method

G01R19/28

adapted for measuring in circuits having distributed constants

G01R19/30

Measuring the maximum or the minimum value of current or voltage reached in a time interval G01R19/04 takes precedence

G01R19/32

Compensating for temperature change

G01R21/00

Arrangements for measuring electric power or power factor G01R7/12 takes precedence

G01R21/001

Measuring real or reactive component; Measuring apparent energy G01R21/01, G01R21/02, G01R21/08, G01R21/10 and G01R21/127 take precedence

G01R21/002

Measuring real component

G01R21/003

Measuring reactive component

G01R21/005

Measuring apparent power

G01R21/006

Measuring power factor

G01R21/007

Adapted for special tariff measuring G01R21/01, G01R21/02, G01R21/08, G01R21/10, G01R21/1278 and G01R21/1333 take precedence

G01R21/008

Measuring maximum demand

G01R21/01

in circuits having distributed constants G01R21/04, G01R21/07, G01R21/09, G01R21/12 take precedence

G01R21/02

by thermal methods

, e.g. calorimetric

G01R21/04

in circuits having distributed constants

G01R21/06

by measuring current and voltage G01R21/08 - G01R21/133 take precedence

G01R21/07

in circuits having distributed constants G01R21/09 takes precedence

G01R21/08

by using galvanomagnetic-effect devices, e.g. Hall-effect devices

G01R21/09

in circuits having distributed constants

G01R21/10

by using square-law characteristics of circuit elements, e.g. diodes, to measure power absorbed by loads of known impedance G01R21/02 takes precedence

G01R21/12

in circuits having distributed constants

G01R21/127

by using pulse modulation G01R21/133 takes precedence

G01R21/1271

Measuring real or reactive component, measuring apparent energy

G01R21/1273

Measuring real component

G01R21/1275

Measuring reactive component

G01R21/1276

Measuring apparent energy

G01R21/1278

Adapted for special tariff measuring

G01R21/133

by using digital technique

G01R21/1331

Measuring real or reactive component, measuring apparent energy

G01R21/1333

adapted for special tariff measuring

G01R21/1335

Tariff switching circuits

G01R21/1336

Measuring overconsumption

G01R21/1338

Measuring maximum demand

G01R21/14

Compensating for temperature change

G01R22/00

Arrangements for measuring time integral of electric power or current, e.g. electricity meters

An arrangement for measuring time integral of electric power is classified in group G01R21/00 if the essential characteristic is the measuring of electric power.

G01R22/02

by electrolytic methods

G01R22/04

by calorimetric methods

G01R22/06

by electronic methods

G01R22/061

Details of electronic electricity meters

G01R22/063

related to remote communication

G01R22/065

related to mechanical aspects

G01R22/066

Arrangements for avoiding or indicating fraudulent use

G01R22/068

Arrangements for indicating or signaling faults

G01R22/08

using analogue techniques

G01R22/10

using digital techniques

G01R23/00

Arrangements for measuring frequencies

Arrangements for analysing frequency spectra

G01R23/005

Circuits for comparing several input signals and for indicating the result of this comparison, e.g. equal, different, greater, smaller (comparing phase or frequency of 2 mutually independent oscillations in demodulators)

G01R23/02

Arrangements for measuring frequency, e.g. pulse repetition rate

Arrangements for measuring period of current or voltage

G01R23/04

adapted for measuring in circuits having distributed constants

G01R23/06

by converting frequency into an amplitude of current or voltage

G01R23/07

using response of circuits tuned on resonance, e.g. grid-drip meter

G01R23/08

using response of circuits tuned off resonance

G01R23/09

using analogue integrators, e.g. capacitors establishing a mean value by balance of input signals and defined discharge signals or leakage

G01R23/10

by converting frequency into a train of pulses, which are then counted

, i.e. converting the signal into a square wave

G01R23/12

by converting frequency into phase shift

G01R23/14

by heterodyning

by beat-frequency comparison

G01R23/145

by heterodyning or by beat-frequency comparison with the harmonic of an oscillator

G01R23/15

Indicating that frequency of pulses is either above or below a predetermined value or within or outside a predetermined range of values, by making use of non-linear or digital elements

(indicating that pulse width is above or below a certain limit)

G01R23/155

giving an indication of the number of times this occurs, i.e. multi-channel analysers (for pulse characteristics)

G01R23/16

Spectrum analysis

Fourier analysis

G01R23/163

adapted for measuring in circuits having distributed constants

G01R23/165

using filters

G01R23/167

with digital filters

G01R23/17

with optical

or acoustical

auxiliary devices

G01R23/173

Wobbulating devices similar to swept panoramic receivers

G01R23/175

by delay means, e.g. tapped delay lines

G01R23/177

Analysis of very low frequencies

G01R23/18

with provision for recording frequency spectrum

G01R23/20

Measurement of non-linear distortion

G01R25/00

Arrangements for measuring phase angle between a voltage and a current or between voltages or currents

G01R25/005

Circuits for comparing several input signals and for indicating the result of this comparison, e.g. equal, different, greater, smaller, or for passing one of the input signals as output signal

G01R25/02

in circuits having distributed constants

G01R25/04

involving adjustment of a phase shifter to produce a predetermined phase difference, e.g. zero difference

G01R25/06

employing quotient instrument

G01R25/08

by counting of standard pulses

G01R27/00

Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom

G01R27/02

Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant by measuring phase angle only G01R25/00

Groups G01R27/02 - G01R27/22 cover variables that directly or indirectly can be measured over two poles of a component or a Thevenin two-pole equivalent. Subgroup G01R27/26 also covers other techniques, e.g. using electro magnetic waves or network analyzers

G01R27/025

Measuring very high resistances, e.g. isolation resistances, i.e. megohm-meters

G01R27/04

in circuits having distributed constants

, e.g. having very long conductors or involving high frequencies

G01R27/06

Measuring reflection coefficients

Measuring standing-wave ratio

G01R27/08

Measuring resistance by measuring both voltage and current

G01R27/10

using two-coil or crossed-coil instruments forming quotient

G01R27/12

using hand generators, e.g. meggers

G01R27/14

Measuring resistance by measuring current or voltage obtained from a reference source G01R27/16, G01R27/20, G01R27/22 take precedence

G01R27/16

Measuring impedance of element or network through which a current is passing from another source, e.g. cable, power line

G01R27/18

Measuring resistance to earth

, i.e. line to ground

G01R27/20

Measuring earth resistance

Measuring contact resistance,

e.g.

of earth connections, e.g. plates

G01R27/205

Measuring contact resistance of connections, e.g. of earth connections

G01R27/22

Measuring resistance of fluids

G01R27/26

Measuring inductance or capacitance

Measuring quality factor, e.g. by using the resonance method

Measuring loss factor

Measuring dielectric constants

; Measuring impedance or related variables

G01R27/2605

Measuring capacitance capacitive sensors G01D5/24

G01R27/2611

Measuring inductance

G01R27/2617

Measuring dielectric properties, e.g. constants testing dielectric strength G01R31/12; detecting insulation faults G01R31/52; G01R27/2688 takes precedence

G01R27/2623

Measuring-systems or electronic circuits G01R27/2635, G01R27/2682 take precedence

G01R27/2629

Bridge circuits bridges for measuring loss angle G01R27/2694

G01R27/2635

Sample holders, electrodes or excitation arrangements, e.g. sensors or measuring cells

G01R27/2641

of plate type, i.e. with the sample sandwiched in the middle

G01R27/2647

of coaxial or concentric type, e.g. with the sample in a coaxial line

G01R27/2652

open-ended type, e.g. abutting against the sample

G01R27/2658

Cavities, resonators, free space arrangements, reflexion or interference arrangements G01R27/2647 takes precedence; optical methods G01R27/2682

G01R27/2664

Transmission line, wave guide (closed or open-ended) or strip - or microstrip line arrangements

G01R27/267

Coils or antennae arrangements, e.g. coils surrounding the sample or transmitter/receiver antennae

G01R27/2676

Probes

G01R27/2682

using optical methods or electron beams

G01R27/2688

Measuring quality factor or dielectric loss, e.g. loss angle, or power factor power factor related to power measurements G01R21/006; testing capacitors G01R31/016

G01R27/2694

Measuring dielectric loss, e.g. loss angle, loss factor or power factor

G01R27/28

Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks

Measuring transient response in line transmission systems H04B3/46

G01R27/30

with provision for recording characteristics, e.g. by plotting Nyquist diagram

G01R27/32

in circuits having distributed constants

, e.g. having very long conductors or involving high frequencies

G01R29/00

Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00

G01R29/02

Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration

G01R29/023

Measuring pulse width

G01R29/027

Indicating that a pulse characteristic is either above or below a predetermined value or within or beyond a predetermined range of values

G01R29/0273

the pulse characteristic being duration, i.e. width (indicating that frequency of pulses is above or below a certain limit)

G01R29/0276

the pulse characteristic being rise time measuring rate of change G01R19/12

G01R29/033

giving an indication of the number of times this occurs

, i.e. multi-channel analysers (the characteristic being frequency)

G01R29/04

Measuring form factor, i.e. quotient of root-mean-square value and arithmetic mean of instantaneous value

Measuring peak factor, i.e. quotient of maximum value and root-mean-square value

G01R29/06

Measuring depth of modulation

G01R29/08

Measuring electromagnetic field characteristics

G01R29/0807

characterised by the application

G01R29/0814

Field measurements related to measuring influence on or from apparatus, components or humans EMC, EMI and similar testing in general G01R31/001, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning

G01R29/0821

rooms and test sites therefor, e.g. anechoic chambers, open field sites or TEM cells for testing antennas G01R29/105

G01R29/0828

TEM-cells

G01R29/0835

Testing shielding, e.g. for efficiency

G01R29/0842

Measurements related to lightning, e.g. measuring electric disturbances, warning systems

G01R29/085

for detecting presence or location of electric lines or cables fault detection G01R31/50; fault location G01R31/08

G01R29/0857

Dosimetry, i.e. measuring the time integral of radiation intensity; Level warning devices for personal safety use nuclear radiation dosimetry G01T

G01R29/0864

characterised by constructional or functional features

G01R29/0871

Complete apparatus or systems; circuits, e.g. receivers or amplifiers G01R29/0878, G01R29/0892 take precedence; dosimeters, warning devices G01R29/0857

G01R29/0878

Sensors; antennas; probes; detectors wave guide measuring sections G01R1/24

G01R29/0885

using optical probes, e.g. electro-optical, luminiscent, glow discharge, or optical interferometers

G01R29/0892

Details related to signal analysis or treatment; presenting results, e.g. displays; measuring specific signal features other than field strength, e.g. polarisation, field modes, phase, envelope, maximum value

G01R29/10

Radiation diagrams of antennas

G01R29/105

using anechoic chambers; Chambers or open field sites used therefor test sites used for measuring on other objects than aerials G01R29/0828; wave absorbing devices H01Q17/00

G01R29/12

Measuring electrostatic fields

or voltage-potential

G01R29/14

Measuring field distribution

G01R29/16

Measuring asymmetry of polyphase networks

G01R29/18

Indicating phase sequence

Indicating synchronism

G01R29/20

Measuring number of turns

Measuring transformation ratio or coupling factor of windings

G01R29/22

Measuring piezo-electric properties

G01R29/24

Arrangements for measuring quantities of charge

G01R29/26

Measuring noise figure

Measuring signal-to-noise ratio

G01R31/00

Arrangements for testing electric properties

Arrangements for locating electric faults

Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

measuring superconductive properties G01R33/1238;

testing or measuring semiconductors or solid state devices during manufacture

H01L22/00

; testing line transmission systems H04B3/46

Groups G01R31/08, G01R31/12, G01R31/327, G01R31/24, G01R31/26, G01R31/34, G01R31/36, G01R31/40, G01R31/44 take precedence over group G01R31/50.

G01R31/001

Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing measuring electromagnetic fields G01R29/08; circuits for generating HV pulses in dielectric strength testing G01R31/14

G01R31/002

where the device under test is an electronic circuit

G01R31/003

Environmental or reliability tests of individual semiconductors G01R31/2642; of PCB's G01R31/2817; of IC's G01R31/2855; of other circuits G01R31/2849

G01R31/005

Testing of electric installations on transport means

G01R31/006

on road vehicles, e.g. automobiles or trucks testing of ignition installations peculiar to internal combustion engines F02P17/00

G01R31/007

using microprocessors or computers

G01R31/008

on air- or spacecraft, railway rolling stock or sea-going vessels

G01R31/01

Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production

Testing objects at points as they pass through a testing station testing of cables continuously passing the testing apparatus G01R31/59; testing dielectric strength or breakdown voltage G01R31/12

G01R31/013

Testing passive components testing relays G01R31/3278; testing electrical windings, e.g. inductors G01R31/72

G01R31/016

Testing of capacitors measuring capacitance G01R27/2605

G01R31/08

Locating faults in cables, transmission lines, or networks

G01R31/081

according to type of conductors

G01R31/083

in cables, e.g. underground

G01R31/085

in power transmission or distribution lines, e.g. overhead

G01R31/086

in power transmission or distribution networks, i.e. with interconnected conductors

G01R31/088

Aspects of digital computing

G01R31/10

by increasing destruction at fault, e.g. burning-in by using a pulse generator operating a special programme

G01R31/11

using pulse reflection methods

G01R31/12

Testing dielectric strength or breakdown voltage

; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing G01R31/08, G01R31/327 and G01R31/72 take precedence; measuring in plasmas G01R19/0061; measuring dielectric constants G01R27/2617; ESD, EMC or EMP testing of circuits G01R31/002

G01R31/1209

using acoustic measurements acoustic measurements G01H3/00

G01R31/1218

using optical methods; using charged particle, e.g. electron, beams or X-rays

G01R31/1227

of components, parts or materials G01R31/1209, G01R31/1218, G01R31/18 take precedence; circuits therefor G01R31/14; testing vessels of electrodes G01R31/16

G01R31/1236

of surge arresters monitoring overvoltage diverters or arresters H02H3/048

G01R31/1245

of line insulators or spacers, e.g. ceramic overhead line cap insulators; of insulators in HV bushings

G01R31/1254

of gas-insulated power appliances or vacuum gaps testing switches G01R31/327; detecting electrical or mechanical defects in encased switchgear H02B13/065

G01R31/1263

of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation

G01R31/1272

of cable, line or wire insulation, e.g. using partial discharge measurements locating faults in cables G01R31/083

G01R31/1281

of liquids or gases

G01R31/129

of components or parts made of semiconducting materials; of LV components or parts G01R31/18 takes precedence

G01R31/14

Circuits therefor

, e.g. for generating test voltages, sensing circuits G01R31/1209 - G01R31/1227 take precedence; for testing switches G01R31/327

G01R31/16

Construction of testing vessels

Electrodes therefor

G01R31/18

Subjecting similar articles in turn to test, e.g. go/no-go tests in mass production

G01R31/20

Preparation of articles or specimens to facilitate testing

G01R31/24

Testing of discharge tubes during manufacture H01J9/42

G01R31/245

Testing of gas discharge tubes

G01R31/25

Testing of vacuum tubes

G01R31/252

Testing of electron multipliers, e.g. photo-multipliers

G01R31/255

Testing of transit-time tubes, e.g. klystrons, magnetrons

G01R31/257

Testing of beam-tubes, e.g. cathode-ray tubes, image pick-up tubes of channel image intensifier arrays G01R31/252; of transit time tubes G01R31/255

G01R31/26

Testing of individual semiconductor devices testing or measuring during manufacture or treatment

H01L22/00

; testing of photovoltaic devices H02S50/10

G01R31/2601

Apparatus or methods therefor G01R31/2607, G01R31/2642 take precedence

G01R31/2603

for curve tracing of semiconductor characteristics, e.g. on oscilloscope

G01R31/2607

Circuits therefor G01R31/2642 takes precedence

G01R31/2608

for testing bipolar transistors

G01R31/261

for measuring break-down voltage or punch through voltage therefor

G01R31/2612

for measuring frequency response characteristics, e.g. cut-off frequency thereof

G01R31/2614

for measuring gain factor thereof

G01R31/2616

for measuring noise measuring noise factor in general G01R29/26

G01R31/2617

for measuring switching properties thereof

G01R31/2619

for measuring thermal properties thereof

G01R31/2621

for testing field effect transistors, i.e. FET's

G01R31/2623

for measuring break-down voltage therefor

G01R31/2625

for measuring gain factor thereof

G01R31/2626

for measuring noise measuring noise factor in general G01R29/26

G01R31/2628

for measuring thermal properties thereof

G01R31/263

for testing thyristors

G01R31/2632

for testing diodes

G01R31/2633

for measuring switching properties thereof

G01R31/2635

Testing light-emitting diodes, laser diodes or photodiodes

G01R31/2637

for testing other individual devices G01R31/2608 - G01R31/2632, G01R31/27 take precedence

G01R31/2639

for testing field-effect devices, e.g. of MOS-capacitors G01R31/2621 takes precedence

G01R31/2641

for testing charge coupled devices

G01R31/2642

Testing semiconductor operation lifetime or reliability, e.g. by accelerated life tests

G01R31/2644

Adaptations of individual semiconductor devices to facilitate the testing thereof

G01R31/2646

for measuring noise G01R31/2616, G01R31/2626 take precedence

G01R31/2648

Characterising semiconductor materials testing of materials or semi-finished products G01R31/2831; testing during manufacture H01L22/00

G01R31/265

Contactless testing

of circuits, also in wafer-form G01R31/302

G01R31/2653

using electron beams

G01R31/2656

using non-ionising electromagnetic radiation, e.g. optical radiation

G01R31/27

Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects surrounding elements

testing printed circuit boards G01R31/2801

G01R31/275

for testing individual semiconductor components within integrated circuits

G01R31/28

Testing of electronic circuits, e.g. by signal tracer

EMC, EMP or similar testing of electronic circuits G01R31/002;

testing for short-circuits, discontinuities, leakage or incorrect line connection G01R31/50; checking computers

or computer components

G06F11/00; checking static stores for correct operation G11C29/00

; testing receivers or transmitters of transmission systems H04B17/00

G01R31/2801

Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP] G01R31/318508 takes precedence; contactless testing G01R31/302; testing contacts or connections G01R31/66

G01R31/2803

by means of functional tests, e.g. logic-circuit-simulation or algorithms therefor testing electronic digital computers G06F11/00

G01R31/2805

Bare printed circuit boards

G01R31/2806

Apparatus therefor, e.g. test stations, drivers, analysers, conveyors G01R31/2805, G01R31/281, G01R31/2818 take precedence

G01R31/2808

Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards probe, multiprobe, probe manipulator or probe fixture G01R1/067

G01R31/281

Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing G01R31/2818 takes precedence

G01R31/2812

Checking for open circuits or shorts, e.g. solder bridges; Testing conductivity, resistivity or impedance of connections G01R31/66

G01R31/2813

Checking the presence, location, orientation or value, e.g. resistance, of components or conductors orientation of the DUT with respect to the test fixture G01R1/06705, G01R31/281

G01R31/2815

Functional tests, e.g. boundary scans, using the normal I/O contacts contacting devices G01R31/2808; testing digital circuits G01R31/317, G06F11/00

G01R31/2817

Environmental-, stress-, or burn-in tests of IC's G01R31/2855; of individual semiconductors G01R31/2642; of other circuits G01R31/2849

G01R31/2818

using test structures on, or modifications of, the card under test, made for the purpose of testing, e.g. additional components or connectors G01R31/2805 takes precedence; printed circuits having, e.g. symbols, test patterns or visualisation means H05K1/0266

G01R31/282

Testing of electronic circuits specially adapted for particular applications not provided for elsewhere G01R31/2801 and G01R31/2851 take precedence

References listed below indicate CPC places which could also be of interest when carrying out a search in respect of the subject matter covered by the preceding group:

testing of individual LEDs G01R31/2635

testing of lamps G01R31/44

testing of displays and display drivers, e.g. LCDs G09G3/006

testing of ADCs or DACs H03M1/1071

G01R31/2822

of microwave or radiofrequency circuits of attenuation, gain, e.g. using network analyzers G01R27/28

G01R31/2824

testing of oscillators or resonators

G01R31/2825

in household appliances or professional audio/video equipment testing LAN's H04L43/50; testing TV systems H04N17/00; testing loudspeakers H04R29/00

G01R31/2827

Testing of electronic protection circuits testing switches G01R31/327; checking alarm systems G08B29/00; self test of summation current transformers H02H3/335

G01R31/2829

Testing of circuits in sensor or actuator systems testing of apparatus for measuring electric or magnetic variables G01R35/00; testing of indicating or recording apparatus G01D; in airbag systems B60R21/0173; checking gas analysers G01N33/007; monitoring or fail-safe circuits for electromagnets H01F7/1844

G01R31/2831

Testing of materials or semi-finished products, e.g. semiconductor wafers or substrates G01R31/318511 takes precedence; testing during manufacture H01L22/00

G01R31/2832

Specific tests of electronic circuits not provided for elsewhere G01R31/2801, G01R31/316 take precedence

G01R31/2834

Automated test systems [ATE]; using microprocessors or computers G01R31/317 takes precedence; ATE for detection of defective computer hardware G06F11/2736

G01R31/2836

Fault-finding or characterising G01R31/2822 - G01R31/2831 take precedence

G01R31/2837

Characterising or performance testing, e.g. of frequency response transient response G01R27/28

G01R31/2839

using signal generators, power supplies or circuit analysers G01R31/2879 takes precedence; multimeters G01R15/12, network analysers G01R27/28

G01R31/2841

Signal generators

G01R31/2843

In-circuit-testing

G01R31/2844

using test interfaces, e.g. adapters, test boxes, switches, PIN drivers G01R31/2889 takes precedence

G01R31/2846

using hard- or software simulation or using knowledge-based systems, e.g. expert systems, artificial intelligence or interactive algorithms

G01R31/2848

using simulation

G01R31/2849

Environmental or reliability testing, e.g. burn-in or validation tests of individual semiconductors G01R31/2642; of printed circuits boards G01R31/2817; of IC's G01R31/2855

G01R31/2851

Testing of integrated circuits [IC] G01R31/317 takes precedence; testing individual devices G01R31/26; testing printed circuits G01R31/2801

G01R31/2853

Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections G01R31/31717 takes precedence; test of chip-to-PCB or lead-to-PCB connections G01R31/66

G01R31/2855

Environmental, reliability or burn-in testing

G01R31/2856

Internal circuit aspects, e.g. built-in test features; Test chips; Measuring material aspects, e.g. electro migration [EM]

G01R31/2858

Measuring of material aspects, e.g. electro-migration [EM], hot carrier injection

G01R31/286

External aspects, e.g. related to chambers, contacting devices or handlers

G01R31/2862

Chambers or ovens; Tanks

G01R31/2863

Contacting devices, e.g. sockets, burn-in boards or mounting fixtures in general G01R1/04

G01R31/2865

Holding devices, e.g. chucks; Handlers or transport devices having contacts G01R31/2863

G01R31/2867

Handlers or transport devices, e.g. loaders, carriers, trays

G01R31/2868

Complete testing stations; systems; procedures; software aspects

G01R31/287

Procedures; Software aspects

G01R31/2872

related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation

G01R31/2874

related to temperature

G01R31/2875

related to heating

G01R31/2877

related to cooling

G01R31/2879

related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads

G01R31/2881

related to environmental aspects other than temperature, e.g. humidity or vibrations

G01R31/2882

Testing timing characteristics

G01R31/2884

using dedicated test connectors, test elements or test circuits on the IC under test G01R31/2855 takes precedence

G01R31/2886

Features relating to contacting the IC under test, e.g. probe heads; chucks G01R31/2865 takes precedence, test connections, e.g. test sockets, or probes per se, G01R1/04 or G01R1/06

G01R31/2887

involving moving the probe head or the IC under test; docking stations moving single probes G01R1/06705; moving individual probes in multiple probes G01R1/07392

G01R31/2889

Interfaces, e.g. between probe and tester G01R31/31905 and G01R1/07364 take precedence

G01R31/2891

related to sensing or controlling of force, position, temperature G01R31/2874 takes precedence; sensing of force G01L; sensing of position G01B, G01D; sensing of temperature G01K; controlling in general G05

G01R31/2893

Handling, conveying or loading, e.g. belts, boats, vacuum fingers G01R31/2867 takes precedence; handling semiconductor devices or wafers during manufacture or treatment H01L21/67

G01R31/2894

Aspects of quality control [QC] G01R31/31718 takes precedence; program control for QC G05B19/41875

G01R31/2896

Testing of IC packages; Test features related to IC packages containers per se H01L23/02, encapsulations per se

H01L23/28

G01R31/2898

Sample preparation, e.g. removing encapsulation, etching sample preparation in general G01N1/00

G01R31/30

Marginal testing, e.g. by varying supply voltage testing computers during standby operation or idle time G06F11/22

G01R31/3004

Current or voltage test

G01R31/3008

Quiescent current [IDDQ] test or leakage current test

G01R31/3012

Built-In-Current test [BIC]

G01R31/3016

Delay or race condition test, e.g. race hazard test

G01R31/302

Contactless testing

G01R31/66 takes precedence

G01R31/3025

Wireless interface with the DUT

G01R31/303

of integrated circuits G01R31/305 - G01R31/315 take precedence

G01R31/304

of printed or hybrid circuits G01R31/305 - G01R31/315 take precedence

G01R31/305

using electron beams

investigating or analysing materials by measuring photoelectric effect G01N23/227

G01R31/306

of printed or hybrid circuits

G01R31/307

of integrated circuits

G01R31/308

using non-ionising electromagnetic radiation, e.g. optical radiation

investigating or analysing materials by the use of optical means G01N21/00; image analysis G06T7/00

G01R31/309

of printed or hybrid circuits

or circuit substrates

G01R31/311

of integrated circuits

G01R31/31728 takes precedence

G01R31/312

by capacitive methods

G01R31/315

by inductive methods

G01R31/316

Testing of analog circuits

G01R31/2851 takes precedence

G01R31/3161

Marginal testing

G01R31/3163

Functional testing

G01R31/3167

Testing of combined analog and digital circuits

testing ADC's H03M1/1071

G01R31/317

Testing of digital circuits

The following subgroups of G01R31/317 are not complete due to an ongoing reorganisation : G01R31/31702, G01R31/31708, G01R31/31711, G01R31/31717, G01R31/31718, G01R31/31728, G01R31/31901. See also G01R31/317 and its other subgroups

G01R31/31701

Arrangements for setting the Unit Under Test [UUT] in a test mode

G01R31/31702

Testing digital circuits including elements other than semiconductor transistors, e.g. biochips, nanofabrics, mems, chips with magnetic elements

G01R31/31703

Comparison aspects, e.g. signature analysis, comparators concerning scan tests G01R31/318566; concerning testers G01R31/3193

G01R31/31704

Design for test; Design verification concerning scan tests G01R31/318583; computer-aided design G06F30/00

G01R31/31705

Debugging aspects, e.g. using test circuits for debugging, using dedicated debugging test circuits generation of test sequences therefor G01R31/31835, using scan test therefor G01R31/318544

G01R31/31706

involving differential digital signals, e.g. testing differential signal circuits, using differential signals for testing

G01R31/31707

Test strategies methods for generation of test sequences G01R31/318371

G01R31/31708

Analysis of signal quality G01R31/31901 takes precedence; measuring frequencies or analysing frequency spectra per se G01R23/00; measuring non-linear distortion per se

G01R23/20

G01R31/31709

Jitter measurements; Jitter generators measuring jitter, noise figure or signal-to-noise ratio per se G01R29/26; analysis of tester signals G01R31/31901

G01R31/3171

BER [Bit Error Rate] test

G01R31/31711

Evaluation methods, e.g. shmoo plots

G01R31/31712

Input or output aspects

G01R31/31713

Input or output interfaces for test, e.g. test pins, buffers for scan test G01R31/318572

G01R31/31715

Testing of input or output circuits; test of circuitry between the I/C pins and the functional core, e.g. testing of input or output driver, receiver, buffer

G01R31/31716

Testing of input or output with loop-back

G01R31/31717

Interconnect testing by scan techniques see

G01R31/31855

G01R31/31718

Logistic aspects, e.g. binning, selection, sorting of devices under test, tester/handler interaction networks, Test management software, e.g. software for test statistics or test evaluation, yield analysis mechanical aspects G01R31/2808, G01R31/2851

G01R31/31719

Security aspects, e.g. preventing unauthorised access during test

G01R31/3172

Optimisation aspects, e.g. using functional pin as test pin, pin multiplexing

G01R31/31721

Power aspects, e.g. power supplies for test circuits, power saving during test for scan test G01R31/318575

G01R31/31722

Addressing or selecting of test units, e.g. transmission protocols for selecting test units for scan test G01R31/318558

G01R31/31723

Hardware for routing the test signal within the device under test to the circuits to be tested, e.g. multiplexer for multiple core testing, accessing internal nodes routing the test signal to or from the device under test G01R31/31926

G01R31/31724

Test controller, e.g. BIST state machine for scan test G01R31/318555

G01R31/31725

Timing aspects, e.g. clock distribution, skew, propagation delay for tester hardware G01R31/31937

G01R31/31726

Synchronization, e.g. of test, clock or strobe signals; Signals in different clock domains; Generation of Vernier signals; Comparison and adjustment of the signals

G01R31/31727

Clock circuits aspects, e.g. test clock circuit details, timing aspects for signal generation, circuits for testing clocks G01R31/31725 takes precedence; concerning scan test G01R31/318552, for tester hardware G01R31/31922

G01R31/31728

Optical aspects, e.g. opto-electronics used for testing, optical signal transmission for testing electronic circuits, electro-optic components to be tested in combination with electronic circuits, measuring light emission of digital circuits probes having electro-optic elements G01R1/071; electro-optic sampling for oscilloscopes G01R13/347; contactless testing of individual semiconductor devices by optical means G01R31/2656

G01R31/3173

Marginal testing

G01R31/3177

Testing of logic operation, e.g. by logic analysers

G01R31/3181

Functional testing G01R31/3177 takes precedence

G01R31/31813

Test pattern generators

G01R31/31816

Soft error testing; Soft error rate evaluation; Single event testing

G01R31/3183

Generation of test inputs, e.g. test vectors, patterns or sequences

G01R31/318307

computer-aided, e.g. automatic test program generator [ATPG], program translations, test program debugging

G01R31/318314

Tools, e.g. program interfaces, test suite, test bench, simulation hardware, test compiler, test program languages simulation software G01R31/318357; emulators G06F11/261

G01R31/318321

for combinational circuits

G01R31/318328

for delay tests

G01R31/318335

Test pattern compression or decompression compression or decompression of scan patterns G01R31/318547; compression or decompression hardware G01R31/31921

G01R31/318342

by preliminary fault modelling, e.g. analysis, simulation

G01R31/31835

Analysis of test coverage or failure detectability

G01R31/318357

Simulation computer simulation of digital circuits G06F30/3308

G01R31/318364

as a result of hardware simulation, e.g. in an HDL environment computer-aided simulation of circuits G06F30/3308

G01R31/318371

Methodologies therefor, e.g. algorithms, procedures

G01R31/318378

of patterns for devices arranged in a network

G01R31/318385

Random or pseudo-random test pattern

G01R31/318392

for sequential circuits G01R31/318544 takes precedence

G01R31/3185

Reconfiguring for testing, e.g. LSSD, partitioning

G01R31/318502

Test of Combinational circuits

G01R31/318505

Test of Modular systems, e.g. Wafers, MCM's

G01R31/318508

Board Level Test, e.g. P1500 Standard features related to boundary scan G01R31/318533

G01R31/318511

Wafer Test

G01R31/318513

Test of Multi-Chip-Moduls

G01R31/318516

Test of programmable logic devices [PLDs]

G01R31/318519

Test of field programmable gate arrays [FPGA]

G01R31/318522

Test of Sequential circuits test of microprocessors G06F11/2236, test of ALU's G06F11/2226

G01R31/318525

Test of flip-flops or latches

G01R31/318527

Test of counters

G01R31/31853

Test of registers

G01R31/318533

using scanning techniques, e.g. LSSD, Boundary Scan, JTAG

G01R31/318536

Scan chain arrangements, e.g. connections, test bus, analog signals

G01R31/318538

Topological or mechanical aspects

G01R31/318541

Scan latches or cell details

G01R31/318544

Scanning methods, algorithms and patterns G01R31/3183 takes precedence

G01R31/318547

Data generators or compressors

G01R31/31855

Interconnection testing, e.g. crosstalk, shortcircuits

G01R31/318552

Clock circuits details

G01R31/318555

Control logic

G01R31/318558

Addressing or selecting of subparts of the device under test

G01R31/318561

Identification of the subpart

G01R31/318563

Multiple simultaneous testing of subparts

G01R31/318566

Comparators; Diagnosing the device under test

G01R31/318569

Error indication, logging circuits

G01R31/318572

Input/Output interfaces

G01R31/318575

Power distribution; Power saving

G01R31/318577

AC testing, e.g. current testing, burn-in

G01R31/31858

Delay testing

G01R31/318583

Design for test

G01R31/318586

with partial scan or non-scannable parts

G01R31/318588

Security aspects

G01R31/318591

Tools

G01R31/318594

Timing aspects clock circuits G01R31/318552

G01R31/318597

JTAG or boundary scan test of memory devices other scan testing of memories G11C29/32

G01R31/3187

Built-in tests

G01R31/319

Tester hardware, i.e. output processing circuits

G01R31/31901

Analysis of tester Performance; Tester characterization

G01R31/31903

tester configuration

G01R31/31905

Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture

G01R31/31907

Modular tester, e.g. controlling and coordinating instruments in a bus based architecture

G01R31/31908

Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns

G01R31/3191

Calibration

G01R31/31912

Tester/user interface

G01R31/31914

Portable Testers

G01R31/31915

In-circuit Testers

G01R31/31917

Stimuli generation or application of test patterns to the device under test [DUT]

G01R31/31919

Storing and outputting test patterns G01R31/31924 takes precedence; arithmetic and random test patterns generator

G01R31/31921

using compression techniques, e.g. patterns sequencer

G01R31/31922

Timing generation or clock distribution G01R31/3191 takes precedence

G01R31/31924

Voltage or current aspects, e.g. driver, receiver

G01R31/31926

Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing

G01R31/31928

Formatter driver, receiver details G01R31/31924

G01R31/3193

with comparison between actual response and known fault free response

receiver details G01R31/31924

G01R31/31932

Comparators

G01R31/31935

Storing data, e.g. failure memory

G01R31/31937

Timing aspects, e.g. measuring propagation delay G01R31/3191 and G01R31/31922 take precedence; marginal testing G06F11/24

G01R31/327

Testing of circuit interrupters, switches or circuit-breakers

G01R31/3271

of high voltage or medium voltage devices G01R31/333 takes precedence

G01R31/3272

Apparatus, systems or circuits therefor G01R31/3275 takes precedence

G01R31/3274

Details related to measuring, e.g. sensing, displaying or computing; Measuring of variables related to the contact pieces, e.g. wear, position or resistance measuring contact resistance G01R27/205

G01R31/3275

Fault detection or status indication

G01R31/3277

of low voltage devices, e.g. domestic or industrial devices, such as motor protections, relays, rotation switches

G01R31/3278

of relays, solenoids or reed switches measuring contact resistance G01R27/205; high voltage magnetic switches G01R31/3271, G01R31/333; testing electric windings G01R31/72; monitoring of fail safe circuits H01H47/002

G01R31/333

Testing of the switching capacity of high-voltage circuit-breakers

; Testing of breaking capacity or related variables, e.g. post arc current or transient recovery voltage

G01R31/3333

Apparatus, systems or circuits therefor

G01R31/3336

Synthetic testing, i.e. with separate current and voltage generators simulating distance fault conditions

G01R31/34

Testing dynamo-electric machines

G01R31/343

in operation

G01R31/346

Testing of armature or field windings

G01R31/36

Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]

This group covers arrangements for measuring, testing or indicating electrical conditions or variables of accumulators or electric batteries. Arrangements for monitoring, measuring, testing or indicating condition structurally associated with the battery are covered by H01M, e.g. by group H01M10/48

G01R31/364

Battery terminal connectors with integrated measuring arrangements

G01R31/3644

Constructional arrangements

G01R31/3646

for indicating electrical conditions or variables, e.g. visual or audible indicators

G01R31/3647

for determining the ability of a battery to perform a critical function, e.g. cranking

G01R31/3648

comprising digital calculation means, e.g. for performing an algorithm

G01R31/367

Software therefor, e.g. for battery testing using modelling or look-up tables

G01R31/371

with remote indication, e.g. on external chargers

G01R31/374

with means for correcting the measurement for temperature or ageing

G01R31/378

specially adapted for the type of battery or accumulator

G01R31/379

for lead-acid batteries

G01R31/38

Primary cells, i.e. not rechargeable

G01R31/382

Arrangements for monitoring battery or accumulator variables, e.g. SoC

G01R31/3828

using current integration

G01R31/3832

without measurement of battery voltage

G01R31/3833

using analog integrators, e.g. coulomb-meters

G01R31/3835

involving only voltage measurements

G01R31/3842

combining voltage and current measurements

G01R31/385

Arrangements for measuring battery or accumulator variables for monitoring G01R31/382

G01R31/386

using test-loads

G01R31/3865

related to manufacture, e.g. testing after manufacture

G01R31/387

Determining ampere-hour charge capacity or SoC

G01R31/388

involving voltage measurements

G01R31/389

Measuring internal impedance, internal conductance or related variables

G01R31/392

Determining battery ageing or deterioration, e.g. state of health

G01R31/396

Acquisition or processing of data for testing or for monitoring individual cells or groups of cells within a battery

G01R31/40

Testing power supplies testing photovoltaic devices H02S50/10

G01R31/42

AC power supplies

G01R31/44

Testing lamps

G01R31/50

Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections testing of sparking plugs H01T13/58

G01R31/52

Testing for short-circuits, leakage current or ground faults

G01R31/54

Testing for continuity

G01R31/55

Testing for incorrect line connections

G01R31/56

Testing of electric apparatus testing of transformers G01R31/62; testing of connections G01R31/66

G01R31/58

Testing of lines, cables or conductors testing of electric windings G01R31/72

G01R31/59

while the cable continuously passes the testing apparatus, e.g. during manufacture

G01R31/60

Identification of wires in a multicore cable

G01R31/62

Testing of transformers

G01R31/64

Testing of capacitors

G01R31/66

Testing of connections, e.g. of plugs or non-disconnectable joints testing for incorrect line connections G01R31/55

G01R31/67

Testing the correctness of wire connections in electric apparatus or circuits

G01R31/68

Testing of releasable connections, e.g. of terminals mounted on a printed circuit board

G01R31/69

of terminals at the end of a cable or a wire harness

of plugs

of sockets, e.g. wall sockets or power sockets in appliances

G01R31/70

Testing of connections between components and printed circuit boards G01R31/68 takes precedence

G01R31/71

Testing of solder joints

G01R31/72

Testing of electric windings testing of transformers G01R31/62

G01R31/74

Testing of fuses

G01R33/00

Arrangements or instruments for measuring magnetic variables

G01R33/0005

Geometrical arrangement of magnetic sensor elements; Apparatus combining different magnetic sensor types G01R33/0206 takes precedence

G01R33/0011

comprising means, e.g. flux concentrators, flux guides, for guiding or concentrating the magnetic flux, e.g. to the magnetic sensor

G01R33/0017

Means for compensating offset magnetic fields or the magnetic flux to be measured; Means for generating calibration magnetic fields

G01R33/0023

Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration G01R33/0017 takes precedence

G01R33/0029

Treating the measured signals, e.g. removing offset or noise

G01R33/0035

Calibration of single magnetic sensors, e.g. integrated calibration

G01R33/0041

using feed-back or modulation techniques

G01R33/0047

Housings or packaging of magnetic sensors packaging of semiconductor devices H01L23/00; Holders

G01R33/0052

Manufacturing aspects; Manufacturing of single devices, i.e. of semiconductor magnetic sensor chips devices based on galvano-magnetic effect or the like H10N50/85

G01R33/0058

using bistable elements, e.g. Reed switches

G01R33/0064

comprising means for performing simulations, e.g. of the magnetic variable to be measured

G01R33/007

Environmental aspects, e.g. temperature variations, radiation, stray fields G01R33/025 takes precedence

G01R33/0076

Protection, e.g. with housings against stray fields

G01R33/0082

Compensation, e.g. compensating for temperature changes

G01R33/0088

use of bistable or switching devices, e.g. Reed-switches

G01R33/0094

Sensor arrays

G01R33/02

Measuring direction or magnitude of magnetic fields or magnetic flux G01R33/20 takes precedence

Groups G01R33/022, G01R33/10 take precedence over groups G01R33/025 - G01R33/09.

G01R33/0206

Three-component magnetometers

G01R33/0213

using deviation of charged particles by the magnetic field

G01R33/022

Measuring gradient

G01R33/025

Compensating stray fields

G01R33/0017 takes precedence

G01R33/028

Electrodynamic magnetometers

G01R33/0283

in which a current or voltage is generated due to relative movement of conductor and magnetic field

G01R33/0286

comprising microelectromechanical systems [MEMS] MEMS devices in general B81B

G01R33/032

using magneto-optic devices, e.g. Faraday

or Cotton-Mouton effect

G01R33/0322

using the Faraday or Voigt effect

G01R33/0325

using the Kerr effect

G01R33/0327

with application of magnetostriction

G01R33/035

using superconductive devices

G01R33/0352

Superconductive magneto-resistances

G01R33/0354

SQUIDS

G01R33/0356

with flux feedback

G01R33/0358

coupling the flux to the SQUID gradiometer coils G01R33/022; coils with superconductive winding H01F6/06

G01R33/038

using permanent magnets, e.g. balances, torsion devices

G01R33/0385

in relation with magnetic force measurements magnetic force microscopes G01Q60/50

G01R33/04

using the flux-gate principle

G01R33/045

in single-, or multi-aperture elements

G01R33/05

in thin-film element

G01R33/06

using galvano-magnetic devices

G01R33/063

Magneto-impedance sensors; Nanocristallin sensors

G01R33/066

field-effect magnetic sensors, e.g. magnetic transistor

G01R33/07

Hall effect devices

G01R33/072

Constructional adaptation of the sensor to specific applications

G01R33/075

Hall devices configured for spinning current measurements

G01R33/077

Vertical Hall-effect devices

G01R33/09

Magnetoresistive devices

G01R33/091

Constructional adaptation of the sensor to specific applications

G01R33/093

using multilayer structures, e.g. giant magnetoresistance sensors thin magnetic films H01F10/00

G01R33/095

extraordinary magnetoresistance sensors

G01R33/096

anisotropic magnetoresistance sensors

G01R33/098

comprising tunnel junctions, e.g. tunnel magnetoresistance sensors

G01R33/10

Plotting field distribution

; Measuring field distribution

G01R33/12

Measuring magnetic properties of articles or specimens of solids or fluids involving magnetic resonance G01R33/20

G01R33/1207

Testing individual magnetic storage devices, e.g. records carriers or digital storage elements functional testing G06F11/00, G06F11/28

G01R33/1215

Measuring magnetisation; Particular magnetometers therefor G01R33/14 takes precedence; electrodynamic magnetometers G01R33/028

G01R33/1223

Measuring permeability, i.e. permeameters G01R33/14 takes precedence

G01R33/123

Measuring loss due to hysteresis G01R33/14 takes precedence

G01R33/1238

Measuring superconductive properties

G01R33/1246

Measuring critical current

G01R33/1253

Measuring galvano-magnetic properties

G01R33/1261

using levitation techniques

G01R33/1269

of molecules labeled with magnetic beads magnetic particles for bio assay G01N33/54326

G01R33/1276

of magnetic particles, e.g. imaging of magnetic nanoparticles G01R33/1269 takes precedence

G01R33/1284

Spin resolved measurements; Influencing spins during measurements, e.g. in spintronics devices G01R33/093 takes precedence; semiconductor devices using spin polarized carriers H01L29/66984

G01R33/1292

Measuring domain wall position or domain wall motion

G01R33/14

Measuring or plotting hysteresis curves

G01R33/1207 takes precedence

G01R33/16

Measuring susceptibility

G01R33/1238 takes precedence

G01R33/18

Measuring magnetostrictive properties

G01R33/20

involving magnetic resonance medical aspects A61B5/055; magnetic resonance gyrometers G01C19/60

G01R33/24

for measuring direction or magnitude of magnetic fields or magnetic flux

G01R33/243

Spatial mapping of the polarizing magnetic field

G01R33/246

Spatial mapping of the RF magnetic field B1

G01R33/26

using optical pumping

G01R33/28

Details of apparatus provided for in groups G01R33/44 - G01R33/64

G01R33/281

Means for the use of in vitro contrast agents G01R33/282 takes precedence; involving use of a contrast agent in MR imaging G01R33/5601; in vivo contrast agents A61K49/0002

G01R33/282

Means specially adapted for hyperpolarisation or for hyperpolarised contrast agents, e.g. for the generation of hyperpolarised gases using optical pumping cells, for storing hyperpolarised contrast agents or for the determination of the polarisation of a hyperpolarised contrast agent

G01R33/283

Intercom or optical viewing arrangements, structurally associated with NMR apparatus

G01R33/285

Invasive instruments, e.g. catheters or biopsy needles, specially adapted for tracking, guiding or visualization by NMR

G01R33/286

involving passive visualization of interventional instruments, i.e. making the instrument visible as part of the normal MR process

G01R33/287

involving active visualization of interventional instruments, e.g. using active tracking RF coils or coils for intentionally creating magnetic field inhomogeneities

G01R33/288

Provisions within MR facilities for enhancing safety during MR, e.g. reduction of the specific absorption rate [SAR], detection of ferromagnetic objects in the scanner room

G01R33/30

Sample handling arrangements, e.g. sample cells, spinning mechanisms

G01R33/302

Miniaturized sample handling arrangements for sampling small quantities, e.g. flow-through microfluidic NMR chips

G01R33/305

specially adapted for high-pressure applications

G01R33/307

specially adapted for moving the sample relative to the MR system, e.g. spinning mechanisms, flow cells or means for positioning the sample inside a spectrometer

G01R33/31

Temperature control thereof

G01R33/32

Excitation or detection systems, e.g. using radio frequency signals

G01R33/323

Detection of MR without the use of RF or microwaves, e.g. force-detected MR, thermally detected MR, MR detection via electrical conductivity, optically detected MR

G01R33/326

involving a SQUID

G01R33/34

Constructional details, e.g. resonators

, specially adapted to MR

G01R33/34007

Manufacture of RF coils, e.g. using printed circuit board technology; additional hardware for providing mechanical support to the RF coil assembly or to part thereof, e.g. a support for moving the coil assembly relative to the remainder of the MR system

G01R33/34015

Temperature-controlled RF coils

G01R33/34023

Superconducting RF coils

G01R33/3403

Means for cooling of the RF coils, e.g. a refrigerator or a cooling vessel specially adapted for housing an RF coil

G01R33/34038

Loopless coils, i.e. linear wire antennas

G01R33/34046

Volume type coils, e.g. bird-cage coils; Quadrature bird-cage coils; Circularly polarised coils

G01R33/34053

Solenoid coils; Toroidal coils

G01R33/34061

Helmholtz coils

G01R33/34069

Saddle coils

G01R33/34076

Birdcage coils

G01R33/34084

implantable coils or coils being geometrically adaptable to the sample, e.g. flexible coils or coils comprising mutually movable parts

G01R33/34092

RF coils specially adapted for NMR spectrometers

G01R33/341

comprising surface coils

G01R33/3415

comprising arrays of sub-coils

, i.e. phased-array coils with flexible receiver channels

G01R33/343

of slotted-tube or loop-gap type

G01R33/345

of waveguide type G01R33/343 takes precedence

G01R33/3453

Transverse electromagnetic [TEM] coils

G01R33/3456

Stripline resonators

G01R33/36

Electrical details, e.g. matching or coupling of the coil to the receiver

G01R33/3607

RF waveform generators, e.g. frequency generators, amplitude-, frequency- or phase modulators or shifters, pulse programmers, digital to analog converters for the RF signal, means for filtering or attenuating of the RF signal

G01R33/3614

RF power amplifiers

G01R33/3621

NMR receivers or demodulators, e.g. preamplifiers, means for frequency modulation of the MR signal using a digital down converter, means for analog to digital conversion [ADC] or for filtering or processing of the MR signal such as bandpass filtering, resampling, decimation or interpolation

G01R33/3628

Tuning/matching of the transmit/receive coil

G01R33/3635

Multi-frequency operation

G01R33/3642

Mutual coupling or decoupling of multiple coils, e.g. decoupling of a receive coil from a transmission coil, or intentional coupling of RF coils, e.g. for RF magnetic field amplification

G01R33/365

Decoupling of multiple RF coils wherein the multiple RF coils have the same function in MR, e.g. decoupling of a receive coil from another receive coil in a receive coil array, decoupling of a transmission coil from another transmission coil in a transmission coil array

G01R33/3657

Decoupling of multiple RF coils wherein the multiple RF coils do not have the same function in MR, e.g. decoupling of a transmission coil from a receive coil

G01R33/3664

Switching for purposes other than coil coupling or decoupling, e.g. switching between a phased array mode and a quadrature mode, switching between surface coil modes of different geometrical shapes, switching from a whole body reception coil to a local reception coil or switching for automatic coil selection in moving table MR or for changing the field-of-view G01R33/3671 takes precedence

G01R33/3671

involving modulation of the quality factor of the RF coil G01R33/3642 takes precedence

G01R33/3678

involving quadrature drive or detection, e.g. a circularly polarized RF magnetic field

G01R33/3685

Means for reducing sheath currents, e.g. RF traps, baluns

G01R33/3692

involving signal transmission without using electrically conductive connections, e.g. wireless communication or optical communication of the MR signal or an auxiliary signal other than the MR signal

G01R33/38

Systems for generation, homogenisation or stabilisation of the main or gradient magnetic field

G01R33/3802

Manufacture or installation of magnet assemblies; Additional hardware for transportation or installation of the magnet assembly or for providing mechanical support to components of the magnet assembly

G01R33/3804

Additional hardware for cooling or heating of the magnet assembly, for housing a cooled or heated part of the magnet assembly or for temperature control of the magnet assembly

G01R33/3806

Open magnet assemblies for improved access to the sample, e.g. C-type or U-type magnets

G01R33/3808

Magnet assemblies for single-sided MR wherein the magnet assembly is located on one side of a subject only; Magnet assemblies for inside-out MR, e.g. for MR in a borehole or in a blood vessel, or magnet assemblies for fringe-field MR

G01R33/381

using electromagnets

G01R33/3815

with superconducting coils, e.g. power supply therefor

G01R33/383

using permanent magnets

G01R33/385

using gradient magnetic field coils

G01R33/3852

Gradient amplifiers; means for controlling the application of a gradient magnetic field to the sample, e.g. a gradient signal synthesizer

G01R33/3854

means for active and/or passive vibration damping or acoustical noise suppression in gradient magnet coil systems

G01R33/3856

Means for cooling the gradient coils or thermal shielding of the gradient coils

G01R33/3858

Manufacture and installation of gradient coils, means for providing mechanical support to parts of the gradient-coil assembly manufacture of inductances or coils in general H01F41/00

G01R33/387

Compensation of inhomogeneities

G01R33/3873

using ferromagnetic bodies

; Passive shimming

G01R33/3875

using correction coil assemblies, e.g. active shimming

G01R33/389

Field stabilisation

, e.g. by field measurements and control means or indirectly by current stabilisation

G01R33/42

Screening

G01R33/421

of main or gradient magnetic field

G01R33/4215

of the gradient magnetic field, e.g. using passive or active shielding of the gradient magnetic field

G01R33/422

of the radio frequency field

G01R33/44

using nuclear magnetic resonance [NMR] G01R33/24, G01R33/62 take precedence

G01R33/441

Nuclear Quadrupole Resonance [NQR] Spectroscopy and Imaging

G01R33/443

Assessment of an electric or a magnetic field, e.g. spatial mapping, determination of a B0 drift or dosimetry

G01R33/445

MR involving a non-standard magnetic field B0, e.g. of low magnitude as in the earth's magnetic field or in nanoTesla spectroscopy, comprising a polarizing magnetic field for pre-polarisation, B0 with a temporal variation of its magnitude or direction such as field cycling of B0 or rotation of the direction of B0, or spatially inhomogeneous B0 like in fringe-field MR or in stray-field imaging

G01R33/446

Multifrequency selective RF pulses, e.g. multinuclear acquisition mode spatially selective RF pulses G01R33/4833

G01R33/448

Relaxometry, i.e. quantification of relaxation times or spin density G01R33/50 takes precedence

G01R33/46

NMR spectroscopy

G01R33/4608

RF excitation sequences for enhanced detection, e.g. NOE, polarisation transfer, selection of a coherence transfer pathway

G01R33/4616

using specific RF pulses or specific modulation schemes, e.g. stochastic excitation, adiabatic RF pulses, composite pulses, binomial pulses, Shinnar-le-Roux pulses, spectrally selective pulses not being used for spatial selection

G01R33/4625

Processing of acquired signals, e.g. elimination of phase errors, baseline fitting, chemometric analysis

G01R33/4633

Sequences for multi-dimensional NMR

G01R33/4641

Sequences for NMR spectroscopy of samples with ultrashort relaxation times such as solid samples

G01R33/465

applied to biological material, e.g. in vitro testing

G01R33/48

NMR imaging systems

G01R33/4802

Travelling-wave MR

G01R33/4804

Spatially selective measurement of temperature or pH

G01R33/4806

Functional imaging of brain activation

G01R33/4808

Multimodal MR, e.g. MR combined with positron emission tomography [PET], MR combined with ultrasound or MR combined with computed tomography [CT]

G01R33/481

MR combined with positron emission tomography [PET] or single photon emission computed tomography [SPECT]

G01R33/4812

MR combined with X-ray or computed tomography [CT]

G01R33/4814

MR combined with ultrasound

G01R33/4816

NMR imaging of samples with ultrashort relaxation times such as solid samples, e.g. MRI using ultrashort TE [UTE], single point imaging, constant time imaging

G01R33/4818

MR characterised by data acquisition along a specific k-space trajectory or by the temporal order of k-space coverage, e.g. centric or segmented coverage of k-space

G01R33/482

using a Cartesian trajectory

G01R33/4822

in three dimensions

G01R33/4824

using a non-Cartesian trajectory

G01R33/4826

in three dimensions

G01R33/4828

Resolving the MR signals of different chemical species, e.g. water-fat imaging

G01R33/483

with selection of signals or spectra from particular regions of the volume, e.g. in vivo spectroscopy

G01R33/4831

using B1 gradients, e.g. rotating frame techniques, use of surface coils

G01R33/4833

using spatially selective excitation of the volume of interest, e.g. selecting non-orthogonal or inclined slices

G01R33/4835

of multiple slices

G01R33/4836

using an RF pulse being spatially selective in more than one spatial dimension, e.g. a 2D pencil-beam excitation pulse

G01R33/4838

using spatially selective suppression or saturation of MR signals

G01R33/485

based on chemical shift information

[CSI] or spectroscopic imaging, e.g. to acquire the spatial distributions of metabolites

G01R33/50

based on the determination of relaxation times

, e.g. T1 measurement by IR sequences; T2 measurement by multiple-echo sequences

G01R33/54

Signal processing systems, e.g. using pulse sequences

; Generation or control of pulse sequences; Operator console

G01R33/543

Control of the operation of the MR system, e.g. setting of acquisition parameters prior to or during MR data acquisition, dynamic shimming, use of one or more scout images for scan plane prescription G01R33/546 takes precedence

G01R33/546

Interface between the MR system and the user, e.g. for controlling the operation of the MR system or for the design of pulse sequences

G01R33/56

Image enhancement or correction, e.g. subtraction or averaging techniques

, e.g. improvement of signal-to-noise ratio and resolution

G01R33/5601

involving use of a contrast agent for contrast manipulation, e.g. a paramagnetic, super-paramagnetic, ferromagnetic or hyperpolarised contrast agent

G01R33/5602

by filtering or weighting based on different relaxation times within the sample, e.g. T1 weighting using an inversion pulse

G01R33/5604

Microscopy; Zooming

G01R33/5605

by transferring coherence or polarization from a spin species to another, e.g. creating magnetization transfer contrast [MTC], polarization transfer using nuclear Overhauser enhancement [NOE]

G01R33/5607

by reducing the NMR signal of a particular spin species, e.g. of a chemical species for fat suppression, or of a moving spin species for black-blood imaging

G01R33/5608

Data processing and visualization specially adapted for MR, e.g. for feature analysis and pattern recognition on the basis of measured MR data, segmentation of measured MR data, edge contour detection on the basis of measured MR data, for enhancing measured MR data in terms of signal-to-noise ratio by means of noise filtering or apodization, for enhancing measured MR data in terms of resolution by means for deblurring, windowing, zero filling, or generation of gray-scaled images, colour-coded images or images displaying vectors instead of pixels image data processing or generation, in general G06T

G01R33/561

by reduction of the scanning time, i.e. fast acquiring systems, e.g. using echo-planar pulse sequences

G01R33/5611

Parallel magnetic resonance imaging, e.g. sensitivity encoding [SENSE], simultaneous acquisition of spatial harmonics [SMASH], unaliasing by Fourier encoding of the overlaps using the temporal dimension [UNFOLD], k-t-broad-use linear acquisition speed-up technique [k-t-BLAST], k-t-SENSE structural details of arrays of sub-coils G01R33/3415

G01R33/5612

Parallel RF transmission, i.e. RF pulse transmission using a plurality of independent transmission channels

G01R33/5613

Generating steady state signals, e.g. low flip angle sequences [FLASH]

G01R33/5614

using a fully balanced steady-state free precession [bSSFP] pulse sequence, e.g. trueFISP

G01R33/5615

Echo train techniques involving acquiring plural, differently encoded, echo signals after one RF excitation, e.g. using gradient refocusing in echo planar imaging [EPI], RF refocusing in rapid acquisition with relaxation enhancement [RARE] or using both RF and gradient refocusing in gradient and spin echo imaging [GRASE]

G01R33/5616

using gradient refocusing, e.g. EPI

G01R33/5617

using RF refocusing, e.g. RARE

G01R33/5618

using both RF and gradient refocusing, e.g. GRASE

G01R33/5619

by temporal sharing of data, e.g. keyhole, block regional interpolation scheme for k-Space [BRISK]

G01R33/563

of moving material, e.g. flow contrast angiography

G01R33/56308

Characterization of motion or flow; Dynamic imaging

G01R33/56316

involving phase contrast techniques

G01R33/56325

Cine imaging

G01R33/56333

Involving spatial modulation of the magnetization within an imaged region, e.g. spatial modulation of magnetization [SPAMM] tagging perfusion imaging based on arterial spin tagging G01R33/56366

G01R33/56341

Diffusion imaging

G01R33/5635

Angiography, e.g. contrast-enhanced angiography [CE-MRA] or time-of-flight angiography [TOF-MRA]

G01R33/56358

Elastography

G01R33/56366

Perfusion imaging

G01R33/56375

Intentional motion of the sample during MR, e.g. moving table imaging

G01R33/56383

involving motion of the sample as a whole, e.g. multistation MR or MR with continuous table motion

G01R33/56391

involving motion of a part of the sample with respect to another part of the sample, e.g. MRI of active joint motion

G01R33/565

Correction of image distortions, e.g. due to magnetic field inhomogeneities

G01R33/56509

due to motion, displacement or flow, e.g. gradient moment nulling G01R33/567 takes precedence

G01R33/56518

due to eddy currents, e.g. caused by switching of the gradient magnetic field

This group only covers correction of artifacts caused by gradient-non-linearity

G01R33/56527

due to chemical shift effects

G01R33/56536

due to magnetic susceptibility variations

G01R33/56545

caused by finite or discrete sampling, e.g. Gibbs ringing, truncation artefacts, phase aliasing artefacts

G01R33/56554

caused by acquiring plural, differently encoded echo signals after one RF excitation, e.g. correction for readout gradients of alternating polarity in EPI

G01R33/56563

caused by a distortion of the main magnetic field B0, e.g. temporal variation of the magnitude or spatial inhomogeneity of B0 G01R33/56509, G01R33/56518, G01R33/56536 take precedence

G01R33/56572

caused by a distortion of a gradient magnetic field, e.g. non-linearity of a gradient magnetic field G01R33/56509, G01R33/56518, G01R33/56536 take precedence

G01R33/56581

due to Maxwell fields, i.e. concomitant fields

G01R33/5659

caused by a distortion of the RF magnetic field, e.g. spatial inhomogeneities of the RF magnetic field G01R33/56509, G01R33/56518, G01R33/56536 take precedence

G01R33/567

gated by physiological signals

, i.e. synchronization of acquired MR data with periodical motion of an object of interest, e.g. monitoring or triggering system for cardiac or respiratory gating

G01R33/5673

Gating or triggering based on a physiological signal other than an MR signal, e.g. ECG gating or motion monitoring using optical systems for monitoring the motion of a fiducial marker

G01R33/5676

Gating or triggering based on an MR signal, e.g. involving one or more navigator echoes for motion monitoring and correction

G01R33/58

Calibration of imaging systems, e.g. using test probes

, Phantoms; Calibration objects or fiducial markers such as active or passive RF coils surrounding an MR active material

G01R33/583

Calibration of signal excitation or detection systems, e.g. for optimal RF excitation power or frequency G01R33/246 takes precedence

G01R33/586

for optimal flip angle of RF pulses

G01R33/60

using electron paramagnetic resonance G01R33/24, G01R33/62 take precedence

G01R33/62

using double resonance G01R33/24 takes precedence

G01R33/64

using cyclotron resonance G01R33/24 takes precedence

G01R35/00

Testing or calibrating of apparatus covered by the other groups of this subclass

G01R35/002

of cathode ray oscilloscopes

G01R35/005

Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references G01R33/0035, G01R35/002 take precedence

G01R35/007

Standards or reference devices, e.g. voltage or resistance standards, "golden references"

G01R35/02

of auxiliary devices, e.g. of instrument transformers according to prescribed transformation ratio, phase angle, or wattage rating

G01R35/04

of instruments for measuring time integral of power or current

G01R35/06

by stroboscopic methods