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72 lines
35 KiB
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72 lines
35 KiB
XML
<?xml version="1.0" encoding="UTF-8"?>
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<class-scheme publication-date="2023-02-01" scheme-type="cpc" publication-type="official">
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<classification-item breakdown-code="false" not-allocatable="true" level="5" additional-only="false" sort-key="G01Q" definition-exists="true" date-revised="2018-05-01" status="published"><classification-symbol>G01Q</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>SCANNING-PROBE TECHNIQUES OR APPARATUS</text></title-part><title-part><text>APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]</text></title-part></class-title><notes-and-warnings date-revised="2013-01-01"><note type="note"><note-paragraph> In this subclass, the first place priority rule is applied, i.e. at each hierarchical level, in the absence of an indication to the contrary, classification is made in the first appropriate place. </note-paragraph></note></notes-and-warnings>
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<classification-item breakdown-code="false" not-allocatable="true" level="6" additional-only="false" sort-key="G01Q10/00" date-revised="2013-01-01" status="published"><classification-symbol>G01Q10/00</classification-symbol>
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<classification-item breakdown-code="false" not-allocatable="false" level="7" additional-only="false" sort-key="G01Q10/00" definition-exists="true" ipc-concordant="G01Q10/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q10/00</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe</text></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01Q10/02" definition-exists="true" ipc-concordant="G01Q10/02" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q10/02</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Coarse scanning or positioning</text></title-part></class-title></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01Q10/04" definition-exists="true" ipc-concordant="G01Q10/04" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q10/04</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Fine scanning or positioning</text></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01Q10/045" definition-exists="true" ipc-concordant="G01Q10/04" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q10/045</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Self-actuating probes, i.e. wherein the actuating means for driving are part of the probe itself, e.g. piezoelectric means on a cantilever probe</text></CPC-specific-text></title-part></class-title></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01Q10/06" definition-exists="true" ipc-concordant="G01Q10/06" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q10/06</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Circuits or algorithms therefor</text></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01Q10/065" definition-exists="true" ipc-concordant="G01Q10/06" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q10/065</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Feedback mechanisms, i.e. wherein the signal for driving the probe is modified by a signal coming from the probe itself</text></CPC-specific-text></title-part></class-title></classification-item></classification-item></classification-item></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="7" additional-only="false" sort-key="G01Q20/00" definition-exists="true" ipc-concordant="G01Q20/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q20/00</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Monitoring the movement or position of the probe</text></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01Q20/02" definition-exists="true" ipc-concordant="G01Q20/02" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q20/02</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>by optical means</text></title-part></class-title></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01Q20/04" definition-exists="true" ipc-concordant="G01Q20/04" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q20/04</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Self-detecting probes, i.e. wherein the probe itself generates a signal representative of its position, e.g. piezo-electric gauge</text></title-part></class-title></classification-item></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="7" additional-only="false" sort-key="G01Q30/00" definition-exists="true" ipc-concordant="G01Q30/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q30/00</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices</text></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01Q30/02" definition-exists="true" ipc-concordant="G01Q30/02" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q30/02</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Non-SPM analysing devices, e.g. SEM [Scanning Electron Microscope], spectrometer or optical microscope</text></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01Q30/025" definition-exists="true" ipc-concordant="G01Q30/02" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q30/025</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Optical microscopes coupled with SPM</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01Q30/04" definition-exists="true" ipc-concordant="G01Q30/04" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q30/04</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Display or data processing devices</text></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01Q30/06" definition-exists="true" ipc-concordant="G01Q30/06" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q30/06</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>for error compensation</text></title-part></class-title></classification-item></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01Q30/08" definition-exists="true" ipc-concordant="G01Q30/08" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q30/08</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Means for establishing or regulating a desired environmental condition within a sample chamber</text></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01Q30/10" definition-exists="true" ipc-concordant="G01Q30/10" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q30/10</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Thermal environment</text></title-part></class-title></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01Q30/12" definition-exists="true" ipc-concordant="G01Q30/12" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q30/12</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Fluid environment</text></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01Q30/14" definition-exists="true" ipc-concordant="G01Q30/14" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q30/14</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Liquid environment</text></title-part></class-title></classification-item></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01Q30/16" definition-exists="true" ipc-concordant="G01Q30/16" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q30/16</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Vacuum environment</text></title-part></class-title></classification-item></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01Q30/18" definition-exists="true" ipc-concordant="G01Q30/18" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q30/18</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Means for protecting or isolating the interior of a sample chamber from external environmental conditions or influences, e.g. vibrations or electromagnetic fields</text></title-part></class-title></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01Q30/20" definition-exists="true" ipc-concordant="G01Q30/20" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2017-08-01" status="published"><classification-symbol>G01Q30/20</classification-symbol><class-title date-revised="2017-08-01"><title-part><text>Sample handling devices or methods</text></title-part></class-title></classification-item></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="7" additional-only="false" sort-key="G01Q40/00" definition-exists="true" ipc-concordant="G01Q40/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q40/00</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Calibration, e.g. of probes</text></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01Q40/02" definition-exists="true" ipc-concordant="G01Q40/02" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q40/02</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Calibration standards and methods of fabrication thereof</text></title-part></class-title></classification-item></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="7" additional-only="false" sort-key="G01Q60/00" definition-exists="true" ipc-concordant="G01Q60/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2017-08-01" status="published"><classification-symbol>G01Q60/00</classification-symbol><class-title date-revised="2017-08-01"><title-part><text>Particular types of SPM [Scanning Probe Microscopy] or microscopes</text></title-part><title-part><text>Essential components thereof</text></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01Q60/02" definition-exists="true" ipc-concordant="G01Q60/02" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2017-08-01" status="published"><classification-symbol>G01Q60/02</classification-symbol><class-title date-revised="2017-08-01"><title-part><text>Multiple-type SPM, i.e. involving more than one SPM techniques</text></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01Q60/04" definition-exists="true" ipc-concordant="G01Q60/04" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q60/04</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>STM [Scanning Tunnelling Microscopy] combined with AFM [Atomic Force Microscopy]</text></title-part></class-title></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01Q60/06" definition-exists="true" ipc-concordant="G01Q60/06" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q60/06</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>SNOM [Scanning Near-field Optical Microscopy] combined with AFM [Atomic Force Microscopy]</text></title-part></class-title></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01Q60/08" definition-exists="true" ipc-concordant="G01Q60/08" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q60/08</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>MFM [Magnetic Force Microscopy] combined with AFM [Atomic Force Microscopy</text></title-part></class-title></classification-item></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01Q60/10" definition-exists="true" ipc-concordant="G01Q60/10" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q60/10</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes</text></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01Q60/12" definition-exists="true" ipc-concordant="G01Q60/12" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q60/12</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>STS [Scanning Tunnelling Spectroscopy]</text></title-part></class-title></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01Q60/14" definition-exists="true" ipc-concordant="G01Q60/14" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q60/14</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>STP [Scanning Tunnelling Potentiometry]</text></title-part></class-title></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01Q60/16" definition-exists="true" ipc-concordant="G01Q60/16" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q60/16</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Probes, their manufacture, or their related instrumentation, e.g. holders</text></title-part></class-title></classification-item></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01Q60/18" definition-exists="true" ipc-concordant="G01Q60/18" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q60/18</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes</text></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01Q60/20" definition-exists="true" ipc-concordant="G01Q60/20" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q60/20</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Fluorescence</text></title-part></class-title></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01Q60/22" definition-exists="true" ipc-concordant="G01Q60/22" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q60/22</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Probes, their manufacture, or their related instrumentation, e.g. holders</text></title-part></class-title></classification-item></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01Q60/24" definition-exists="true" ipc-concordant="G01Q60/24" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q60/24</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes</text></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01Q60/26" definition-exists="true" ipc-concordant="G01Q60/26" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q60/26</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Friction force microscopy</text></title-part></class-title></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01Q60/28" definition-exists="true" ipc-concordant="G01Q60/28" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q60/28</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Adhesion force microscopy</text></title-part></class-title></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01Q60/30" definition-exists="true" ipc-concordant="G01Q60/30" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q60/30</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Scanning potential microscopy</text></title-part></class-title></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01Q60/32" definition-exists="true" ipc-concordant="G01Q60/32" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q60/32</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>AC mode</text></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01Q60/34" definition-exists="true" ipc-concordant="G01Q60/34" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q60/34</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Tapping mode</text></title-part></class-title></classification-item></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01Q60/36" definition-exists="true" ipc-concordant="G01Q60/36" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q60/36</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>DC mode</text></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01Q60/363" definition-exists="true" ipc-concordant="G01Q60/36" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q60/363</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Contact-mode AFM</text></CPC-specific-text></title-part></class-title></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01Q60/366" definition-exists="true" ipc-concordant="G01Q60/36" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q60/366</classification-symbol><class-title date-revised="2013-01-01"><title-part><CPC-specific-text><text>Nanoindenters, i.e. wherein the indenting force is measured</text></CPC-specific-text></title-part></class-title></classification-item></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01Q60/38" definition-exists="true" ipc-concordant="G01Q60/38" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q60/38</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Probes, their manufacture, or their related instrumentation, e.g. holders</text></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01Q60/40" definition-exists="true" ipc-concordant="G01Q60/40" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q60/40</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Conductive probes</text></title-part></class-title></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01Q60/42" definition-exists="true" ipc-concordant="G01Q60/42" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2017-08-01" status="published"><classification-symbol>G01Q60/42</classification-symbol><class-title date-revised="2017-08-01"><title-part><text>Functionalisation</text></title-part></class-title></classification-item></classification-item></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01Q60/44" definition-exists="true" ipc-concordant="G01Q60/44" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q60/44</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>SICM [Scanning Ion-Conductance Microscopy] or apparatus therefor, e.g. SICM probes</text></title-part></class-title></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01Q60/46" definition-exists="true" ipc-concordant="G01Q60/46" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q60/46</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>SCM [Scanning Capacitance Microscopy] or apparatus therefor, e.g. SCM probes</text></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01Q60/48" definition-exists="true" ipc-concordant="G01Q60/48" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q60/48</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Probes, their manufacture, or their related instrumentation, e.g. holders</text></title-part></class-title></classification-item></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01Q60/50" definition-exists="true" ipc-concordant="G01Q60/50" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q60/50</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>MFM [Magnetic Force Microscopy] or apparatus therefor, e.g. MFM probes</text></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01Q60/52" definition-exists="true" ipc-concordant="G01Q60/52" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q60/52</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Resonance</text></title-part></class-title></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01Q60/54" definition-exists="true" ipc-concordant="G01Q60/54" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q60/54</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Probes, their manufacture, or their related instrumentation, e.g. holders</text></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01Q60/56" definition-exists="true" ipc-concordant="G01Q60/56" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q60/56</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Probes with magnetic coating</text></title-part></class-title></classification-item></classification-item></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01Q60/58" definition-exists="true" ipc-concordant="G01Q60/58" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q60/58</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>SThM [Scanning Thermal Microscopy] or apparatus therefor, e.g. SThM probes</text></title-part></class-title></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01Q60/60" definition-exists="true" ipc-concordant="G01Q60/60" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q60/60</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>SECM [Scanning Electro-Chemical Microscopy] or apparatus therefor, e.g. SECM probes</text></title-part></class-title></classification-item></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="7" additional-only="false" sort-key="G01Q70/00" definition-exists="true" ipc-concordant="G01Q70/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q70/00</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group <class-ref scheme="cpc">G01Q60/00</class-ref></text></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01Q70/02" definition-exists="true" ipc-concordant="G01Q70/02" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q70/02</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Probe holders</text></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01Q70/04" definition-exists="true" ipc-concordant="G01Q70/04" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q70/04</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>with compensation for temperature or vibration induced errors</text></title-part></class-title></classification-item></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01Q70/06" definition-exists="true" ipc-concordant="G01Q70/06" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q70/06</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Probe tip arrays</text></title-part></class-title></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01Q70/08" definition-exists="true" ipc-concordant="G01Q70/08" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q70/08</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Probe characteristics</text></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01Q70/10" definition-exists="true" ipc-concordant="G01Q70/10" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q70/10</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Shape or taper</text></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="10" additional-only="false" sort-key="G01Q70/12" definition-exists="true" ipc-concordant="G01Q70/12" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2017-08-01" status="published"><classification-symbol>G01Q70/12</classification-symbol><class-title date-revised="2017-08-01"><title-part><text>Nanotube tips</text></title-part></class-title></classification-item></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01Q70/14" definition-exists="true" ipc-concordant="G01Q70/14" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q70/14</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Particular materials</text></title-part></class-title></classification-item></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="8" additional-only="false" sort-key="G01Q70/16" definition-exists="true" ipc-concordant="G01Q70/16" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q70/16</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Probe manufacture</text></title-part></class-title>
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<classification-item breakdown-code="false" not-allocatable="false" level="9" additional-only="false" sort-key="G01Q70/18" definition-exists="true" ipc-concordant="G01Q70/18" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2017-08-01" status="published"><classification-symbol>G01Q70/18</classification-symbol><class-title date-revised="2017-08-01"><title-part><text>Functionalisation</text></title-part></class-title></classification-item></classification-item></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="7" additional-only="false" sort-key="G01Q80/00" definition-exists="true" ipc-concordant="G01Q80/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2017-08-01" status="published"><classification-symbol>G01Q80/00</classification-symbol><class-title date-revised="2017-08-01"><title-part><text>Applications, other than SPM, of scanning-probe techniques </text><reference><text>manufacture or treatment of nanostructures <class-ref scheme="cpc">B82B3/00</class-ref>; recording or reproducing information using near-field interaction <class-ref scheme="cpc">G11B9/12</class-ref>, <class-ref scheme="cpc">G11B11/24</class-ref>, <class-ref scheme="cpc">G11B13/08</class-ref></text></reference></title-part></class-title></classification-item>
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<classification-item breakdown-code="false" not-allocatable="false" level="7" additional-only="false" sort-key="G01Q90/00" definition-exists="false" ipc-concordant="G01Q90/00" c-set-base-allowed="false" c-set-subsequent-allowed="true" date-revised="2013-01-01" status="published"><classification-symbol>G01Q90/00</classification-symbol><class-title date-revised="2013-01-01"><title-part><text>Scanning-probe techniques or apparatus not otherwise provided for</text></title-part></class-title></classification-item></classification-item></classification-item></class-scheme> |