H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS spark-gaps H01T; arc lamps with consumable electrodes H05B; particle accelerators H05H This subclass covers only devices for producing, influencing, or using a flow of electrons or ions, e.g. for controlling, indicating, or switching of electric current, counting electric pulses, producing light or other electromagnetic oscillations, such as X-rays, or for separating or analysing radiation or particles, and having a closed or substantially closed casing containing a chosen gas, vapour, or vacuum, upon the pressure and nature of which the characteristics of the device depend. Light sources using a combination (other than covered by group H01J61/96 of this subclass) of discharge and other kinds of light generation are dealt with in H05B35/00. In this subclass, groups H01J1/00 - H01J7/00 relate only to: details of an unspecified kind of discharge tube or lamp, or details mentioned in a specification as applicable to two or more kinds of tubes or lamps as defined by groups H01J11/00, H01J13/00, H01J15/00, H01J17/00, H01J21/00, H01J25/00, H01J27/00, H01J31/00, H01J33/00, H01J35/00, H01J37/00, H01J40/00, H01J41/00, H01J47/00, H01J49/00, H01J61/00, H01J63/00 or H01J65/00, hereinafter called basic kinds. A detail only described with reference to, or clearly only applicable to, tubes or lamps of a single basic kind is classified in the detail group appropriate to tubes or lamps of that basic kind, e.g. H01J17/04. In this subclass, the following term is used with the meaning indicated: "lamp" includes tubes emitting ultra-violet or infra-red light. Attention is drawn to the definition of the expression "spark gaps" given in the Note following the title of subclass H01T. Apparatus or processes specially adapted for the manufacture of electric discharge tubes, discharge lamps, or parts thereof are classified in group H01J9/00. In this subclass non-limiting references (in the sense of paragraph 39 of the Guide to the IPC) may still be displayed in the scheme. H01J1/00 H01J1/00Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps details of electron-optical arrangements or of ion traps H01J3/00 H01J1/02Main electrodes H01J1/025Hollow cathodes H01J1/04Liquid electrodes, e.g. liquid cathode H01J1/05characterised by material H01J1/06Containers for liquid-pool electrodesArrangement or mounting thereof H01J1/08Positioning or moving the cathode spot on the surface of a liquid-pool cathode H01J1/10Cooling, heating, circulating, filtering, or controlling level of liquid in a liquid-pool electrode H01J1/12Cathodes having mercury or liquid alkali metal deposited on the cathode surface during operation of the tube H01J1/13Solid thermionic cathodes H01J1/135Circuit arrangements therefor, e.g. for temperature control H01J1/14characterised by the material H01J1/142with alkaline-earth metal oxides, or such oxides used in conjunction with reducing agents, as an emissive material H01J1/144with other metal oxides as an emissive material H01J1/146with metals or alloys as an emissive material H01J1/148with compounds having metallic conductive properties, e.g. lanthanum boride, as an emissive material H01J1/15Cathodes heated directly by an electric current H01J1/16characterised by the shape H01J1/18SupportsVibration-damping arrangements H01J1/20Cathodes heated indirectly by an electric currentCathodes heated by electron or ion bombardment H01J1/22Heaters H01J1/24Insulating layer or body located between heater and emissive material H01J1/26Supports for the emissive material H01J1/28Dispenser-type cathodes, e.g. L-cathode H01J1/30Cold cathodes, e.g. field-emissive cathode H01J1/304Field-emissive cathodes H01J1/3042microengineered, e.g. Spindt-type H01J1/3044Point emitters H01J1/3046Edge emitters H01J1/3048Distributed particle emitters H01J1/308Semiconductor cathodes, e.g. cathodes with PN junction layers H01J1/312having an electric field perpendicular to the surface, e.g. tunnel-effect cathodes of Metal-Insulator-Metal [MIM] type H01J1/304 - H01J1/308 take precedence H01J1/316having an electric field parallel to the surface, e.g. thin film cathodes H01J1/32Secondary-electron-emitting electrodes H01J1/35 takes precedence H01J1/34Photo-emissive cathodes H01J1/35 takes precedence H01J1/35Electrodes exhibiting both secondary emission and photo-emission H01J1/36Solid anodesSolid auxiliary anodes for maintaining a discharge H01J1/38characterised by the material H01J1/40forming part of the envelope of the tube or lamp H01J1/42Cooling of anodes cooling rotary anodes H01J1/44Heating of anodes H01J1/44Rotary anodesArrangements for rotating anodesCooling rotary anodes H01J1/46Control electrodes, e.g. grid for igniting arrangements H01J7/30Auxiliary electrodes auxiliary anodes for maintaining a discharge H01J1/36 H01J1/48characterised by the material H01J1/50Magnetic means for controlling the discharge H01J1/52Screens for shieldingGuides for influencing the dischargeMasks interposed in the electron stream H01J1/53Electrodes intimately associated with a screen on or from which an image or pattern is formed, picked-up, converted, or stored H01J1/54Screens on or from which an image or pattern is formed, picked-up, converted, or storedLuminescent coatings on vessels H01J1/56acting as light valves by shutter operation, e.g. for eidophor H01J1/58acting by discolouration, e.g. halide screen H01J1/60Incandescent screens H01J1/62Luminescent screensSelection of materials for luminescent coatings on vessels H01J1/63characterised by the luminescent material H01J1/64characterised by the binder or adhesive for securing the luminescent material to its support H01J1/66Supports for luminescent material H01J1/68with superimposed luminescent layers H01J1/70with protective, conductive, or reflective layers H01J1/72with luminescent material discontinuously arranged, e.g. in dots or lines H01J1/74with adjacent dots or lines of different luminescent material H01J1/76provided with permanent marks or references H01J1/78Photoelectric screensCharge-storage screens H01J1/88Mounting, supporting, spacing, or insulating of electrodes or of electrode assemblies H01J1/90Insulation between electrodes or supports within the vacuum space H01J1/92Mountings for the electrode assembly as a whole H01J1/94Mountings for individual electrodes H01J1/96Spacing members extending to the envelope H01J1/98without fixed connection between spacing member and envelope H01J3/00Details of electron-optical or ion-optical arrangements or of ion traps common to two or more basic types of discharge tubes or lamps H01J3/02Electron guns H01J3/021Electron guns using a field emission, photo emission, or secondary emission electron source H01J3/022with microengineered cathode, e.g. Spindt-type H01J3/023Electron guns using electron multiplication H01J3/024Electron guns using thermionic emission of cathode heated by electron or ion bombardment or by irradiation by other energetic beams, e.g. by laser H01J3/025Electron guns using a discharge in a gas or a vapour as electron source gas-filled discharge tubes with gaseous cathodes H01J15/00 H01J3/026Eliminating deleterious effects due to thermal effects, electric or magnetic field H01J3/021 - H01J3/025 take precedence H01J3/027Construction of the gun or parts thereof H01J3/021 - H01J3/025, H01J3/026 and H01J3/028 take precedence H01J3/028Replacing parts of the gun; Relative adjustment H01J3/021 - H01J3/025 take precedence H01J3/029Schematic arrangements for beam forming H01J3/04Ion guns H01J3/06two or more guns being arranged in a single vacuum space, e.g. for plural-ray tubes H01J3/07 takes precedence H01J3/07Arrangements for controlling convergence of a plurality of beams H01J3/08Arrangements for controlling intensity of ray or beam H01J3/02, H01J3/04 take precedence H01J3/10Arrangements for centring ray or beam H01J3/02, H01J3/04 take precedence H01J3/12Arrangements for controlling cross-section of ray or beamArrangements for correcting aberration of beam, e.g. due to lenses H01J3/02, H01J3/04 take precedence H01J3/14Arrangements for focusing or reflecting ray or beam H01J3/02, H01J3/04 take precedence H01J3/16Mirrors H01J3/18Electrostatic lenses H01J3/20Magnetic lenses H01J3/22using electromagnetic means only H01J3/24using permanent magnets only H01J3/26Arrangements for deflecting ray or beam H01J3/28along one straight line or along two perpendicular straight lines H01J3/30by electric fields only H01J3/32by magnetic fields only H01J3/34along a circle, spiral, or rotating radial line H01J3/36Arrangements for controlling the ray or beam after passing the main deflection system, e.g. for post-acceleration or post-concentration H01J3/38Mounting, supporting, spacing, or insulating electron-optical or ion-optical arrangements H01J3/40Traps for removing or diverting unwanted particles, e.g. negative ions, fringing electronsArrangements for velocity or mass selection see provisionally also H01J29/46 - H01J29/84 H01J5/00Details relating to vessels or to leading-in conductors common to two or more basic types of discharge tubes or lamps H01J5/02VesselsContainersShields associated therewithVacuum locks H01J5/03Arrangements for preventing or mitigating effects of implosion of vessels or containers H01J5/04Vessels or containers characterised by the material thereof H01J5/06Vessels or containers specially adapted for operation at high tension, e.g. by improved potential distribution over surface of vessel H01J5/08provided with coatings on the walls thereofSelection of materials for the coatings luminescent coatings H01J1/62 H01J5/10on internal surfaces H01J5/12Double-wall vessels or containers H01J5/125with a gas tight space between both walls H01J5/14Dismountable vessels or containers, e.g. for replacing cathode heater H01J5/16Optical or photographic arrangements structurally combined with the vessel H01J5/18Windows permeable to X-rays, gamma-rays, or particles H01J5/20Seals between parts of vessels H01J5/22Vacuum-tight joints between parts of vessel H01J5/24between insulating parts of vessel H01J5/26between insulating and conductive parts of vessel H01J5/28between conductive parts of vessel H01J5/30using packing-material, e.g. sealing-liquid or elastic insert H01J5/32Seals for leading-in conductors H01J5/34for an individual conductor pinched-stem seals H01J5/38; end-disc seals H01J5/40; annular seals H01J5/44 H01J5/36using intermediate part H01J5/38Pinched-stem or analogous seals H01J5/40End-disc seals, e.g. flat header H01J5/42using intermediate part H01J5/44Annular seals disposed between the ends of the vessel H01J5/46Leading-in conductors H01J5/48Means forming part of the tube or lamp for the purpose of supporting it H01J5/50Means forming part of the tube or lamps for the purpose of providing electrical connection to it H01J5/52directly applied to or forming part of the vessel H01J5/54supported by a separate part, e.g. base H01J5/56Shape of the separate part H01J5/565Bases for circular lamps H01J5/58Means for fastening the separate part to the vessel, e.g. by cement H01J5/60for fastening by mechanical means H01J5/62Connection of wires protruding from the vessel to connectors carried by the separate part H01J7/00Details not provided for in the preceding groups and common to two or more basic types of discharge tubes or lamps H01J7/02Selection of substances for gas fillingsSpecified operating pressure or temperature H01J7/04having one or more carbon compounds as the principal constituent H01J7/06having helium, argon, neon, krypton, or xenon as the principal constituent H01J7/08having a metallic vapour as the principal constituent H01J7/10mercury vapour H01J7/12vapour of an alkali metal H01J7/14Means for obtaining or maintaining the desired pressure within the vessel H01J7/16Means for permitting pumping during operation of the tube or lamp H01J7/18Means for absorbing or adsorbing gas, e.g. by gettering H01J7/183Composition or manufacture of getters H01J7/186Getter supports H01J7/20Means for producing, introducing, or replenishing gas or vapour during operation of the tube or lamp H01J7/22Tubulations therefor, e.g. for exhaustingClosures therefor H01J7/24Cooling arrangementsHeating arrangementsMeans for circulating gas or vapour within the discharge space H01J7/26by flow of fluid through passages associated with tube or lamp H01J7/28by latent heat or evaporation of cooling liquid H01J7/30Igniting arrangements H01J7/32having resistive or capacitative igniter H01J7/34having resistive igniter only H01J7/36Igniting by movement of a solid electrode H01J7/38Igniting by movement of vessel as a whole, e.g. tilting H01J7/40Igniting by associated radioactive materials or fillings H01J7/42Means structurally associated with the tube or lamp for indicating defects or previous use H01J7/44One or more circuit elements structurally associated with the tube or lamp H01J7/46Structurally associated resonator having distributed inductance and capacitance H01J9/00Apparatus or processes specially adapted for the manufacture , installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereofRecovery of material from discharge tubes or lamps H01J9/003Auxiliary devices for installing or removing discharge tubes or lamps H01J9/006for fluorescent lamps H01J9/02Manufacture of electrodes or electrode systems H01J9/022of cold cathodes H01J9/025of field emission cathodes H01J9/027of thin film cathodes H01J9/04of thermionic cathodes H01J9/042Manufacture, activation of the emissive part H01J9/045Activation of assembled cathode H01J9/047Cathodes having impregnated bodies H01J9/045 takes precedence H01J9/06Machines therefor H01J9/08Manufacture of heaters for indirectly-heated cathodes H01J9/10Machines therefor H01J9/12of photo-emissive cathodesof secondary-emission electrodes H01J9/125of secondary emission electrodes H01J9/14of non-emitting electrodes H01J9/142of shadow-masks for colour television tubes H01J9/144Mask treatment related to the process of dot deposition during manufacture of luminescent screen H01J9/146Surface treatment, e.g. blackening, coating H01J9/144 takes precedence H01J9/148of electron emission flat panels, e.g. gate electrodes, focusing electrodes or anode electrodes H01J9/16Machines for making wire grids H01J9/18Assembling together the component parts of electrode systems H01J9/185of flat panel display devices, e.g. by using spacers H01J9/20Manufacture of screens on or from which an image or pattern is formed, picked up, converted or storedApplying coatings to the vessel H01J9/205Applying optical coatings or shielding coatings to the vessel of flat panel displays, e.g. applying filter layers, electromagnetic interference shielding layers, anti-reflection coatings or anti-glare coatings H01J9/22Applying luminescent coatings H01J9/221in continuous layers H01J9/222constituted by coated granules emitting light of different colour H01J9/223by uniformly dispersing of liquid H01J9/224by precipitation H01J9/225by electrostatic or electrophoretic processes H01J9/227with luminescent material discontinuously arranged, e.g. in dots or lines H01J9/2271by photographic processes final treatment of shadow-mask prior to or after dot deposition H01J9/144 H01J9/2272Devices for carrying out the processes, e.g. light houses H01J9/2273Auxiliary lenses and filters H01J9/2274Light sources particularly adapted therefor H01J9/2275including the exposition of a substance responsive to a particular radiation H01J9/2276Development of latent electrostatic images per se G03G15/06 H01J9/2277by other processes, e.g. serigraphy, decalcomania H01J9/2278Application of light absorbing material, e.g. between the luminescent areas H01J9/233Manufacture of photoelectric screens or charge-storage screens H01J9/236Manufacture of magnetic deflecting devices for cathode-ray tubes H01J9/24Manufacture or joining of vessels, leading-in conductors or bases H01J9/241the vessel being for a flat panel display H01J9/261 takes precedence; flat discharge lamps H01J9/248 H01J9/242Spacers between faceplate and backplate H01J9/244specially adapted for cathode ray tubes H01J9/241, H01J9/26 take precedence H01J9/245specially adapted for gas discharge tubes or lamps H01J9/241, H01J9/26 take precedence H01J9/247specially adapted for gas-discharge lamps H01J9/248the vessel being flat H01J9/26Sealing together parts of vessels H01J9/261the vessel being for a flat panel display for flat discharge lamps H01J9/268 H01J9/263specially adapted for cathode-ray tubes H01J9/261 takes precedence H01J9/265specially adapted for gas-discharge tubes or lamps H01J9/261 takes precedence H01J9/266specially adapted for gas-discharge lamps H01J9/268the vessel being flat H01J9/28Manufacture of leading-in conductors H01J9/30Manufacture of bases H01J9/32Sealing leading-in conductors H01J9/323Sealing leading-in conductors into a discharge lamp or a gas-filled discharge device H01J9/326making pinched-stem or analogous seals H01J9/34Joining base to vessel H01J9/36Joining connectors to internal electrode system H01J9/38Exhausting, degassing, filling, or cleaning vessels H01J9/385Exhausting vessels H01J9/39Degassing vessels H01J9/395Filling vessels H01J9/40Closing vessels H01J9/42Measurement or testing during manufacture H01J9/44Factory adjustment of completed discharge tubes or lamps to comply with desired tolerances H01J9/445Aging of tubes or lamps, e.g. by "spot knocking" cathode activation H01J9/045 H01J9/46Machines having sequentially arranged operating stations H01J9/48with automatic transfer of workpieces between operating stations H01J9/50Repairing or regenerating used or defective discharge tubes or lamps H01J9/505Regeneration of cathodes H01J9/52Recovery of material from discharge tubes or lamps H01J9/50 takes precedence H01J11/00Gas-filled discharge tubes with alternating current induction of the discharge, e.g. alternating current plasma display panels [AC-PDP] circuits or methods for driving PDPs G09G3/28Gas-filled discharge tubes without any main electrode inside the vesselGas-filled discharge tubes with at least one main electrode outside the vesselWhen classifying in this group, classification is made in all appropriate places. In this group, the following term is used with the meaning indicated: "main electrode" means any of a sustain electrode, scan electrode or address electrode. H01J11/10AC-PDPs with at least one main electrode being out of contact with the plasma H01J11/12with main electrodes provided on both sides of the discharge space H01J11/14with main electrodes provided only on one side of the discharge space H01J11/16with main electrodes provided inside or on the side face of the spacers H01J11/18containing a plurality of independent closed structures for containing the gas, e.g. plasma tube array [PTA] display panels H01J11/20Constructional details H01J11/22Electrodes, e.g. special shape, material or configuration H01J11/24Sustain electrodes or scan electrodes H01J11/26Address electrodes H01J11/28Auxiliary electrodes, e.g. priming electrodes or trigger electrodes H01J11/30Floating electrodes H01J11/32Disposition of the electrodes H01J11/34Vessels, containers or parts thereof, e.g. substrates H01J11/36Spacers, barriers, ribs, partitions or the like H01J11/38Dielectric or insulating layers H01J11/40Layers for protecting or enhancing the electron emission, e.g. MgO layers H01J11/42Fluorescent layers H01J11/44Optical arrangements or shielding arrangements, e.g. filters, black matrices, light reflecting means or electromagnetic shielding means H01J11/46Connecting or feeding means, e.g. leading-in conductors H01J11/48Sealing, e.g. seals specially adapted for leading-in conductors H01J11/50Filling, e.g. selection of gas mixture H01J11/52Means for absorbing or adsorbing the gas mixture, e.g. by gettering H01J11/54Means for exhausting the gas H01J13/00Discharge tubes with liquid-pool cathodes, e.g. metal-vapour rectifying tubes H01J13/02Details H01J13/04Main electrodesAuxiliary anodes H01J13/06Cathodes H01J13/08characterised by the material H01J13/10Containers for the liquid poolArrangements or mounting thereof H01J13/12Positioning or moving the cathode spot on the surface of the pool H01J13/14Cooling, heating, circulating, filtering, or controlling level of the liquid H01J13/16AnodesAuxiliary anodes for maintaining the discharge H01J13/18Cooling or heating of anodes H01J13/20Control electrodes, e.g. grid for igniting arrangements H01J13/34 H01J13/22Screens, e.g. for preventing or eliminating arcing-back H01J13/24VesselsContainers H01J13/242characterised by the material H01J13/244characterised by the shape H01J13/246Treatment of, or coating on interior parts of vessel H01J13/248Envelope means outside vessel, i.e. screens, reflectors, filters H01J13/26Seals between parts of vesselsSeals for leading-in conductorsLeading-in conductors H01J13/263Leading-in conductors to the liquid electrode H01J13/266Leading-in conductors to the anode H01J13/28Selection of substances for gas fillingMeans for obtaining the desired pressure within the tube H01J13/30Means for permitting pumping during operation of the tube H01J13/32Cooling arrangementsHeating arrangements for cathodes H01J13/14; for anodes H01J13/18 H01J13/34Igniting arrangements H01J13/36having resistive or capacitative igniter H01J13/38having resistive igniter only H01J13/40Igniting by movement of a solid electrode H01J13/405Interrupting contact with liquid cathode H01J13/42Igniting by movement of vessel as a whole, e.g. tilting H01J13/44Devices for preventing or eliminating arcing-back H01J13/46One or more circuit elements structurally associated with the tube H01J13/48Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for H01J13/50Tubes having a single main anode H01J13/52with control by one or more intermediate control electrodes H01J13/54with control by igniter, e.g. single-anode ignitron H01J13/56Tubes having two or more main anodes H01J13/58with control by one or more intermediate control electrodes H01J15/00Gas-filled discharge tubes with gaseous cathodes, e.g. plasma cathode H01J15/02Details, e.g. electrode, gas filling, shape of vessel H01J15/04Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for H01J17/00Gas-filled discharge tubes with solid cathode H01J25/00, H01J27/00, H01J31/00 - H01J41/00 , H01J11/00 take precedence; gas filled spark gaps H01T; Marx converters H02M7/26 H01J17/005specially adapted as noise generators electronic circuits for generation of noise currents or voltages H03B29/00 H01J17/02Details H01J17/04ElectrodesScreens H01J17/06Cathodes H01J17/063Indirectly heated cathodes, e.g. by the discharge itself H01J17/066Cold cathodes H01J17/08having mercury or liquid alkali metal deposited on the cathode surface during operation of the tube H01J17/10Anodes H01J17/12Control electrodes H01J17/14Magnetic means for controlling the discharge H01J17/16VesselsContainers H01J17/18Seals between parts of vesselsSeals for leading-in conductorsLeading-in conductors H01J17/183Seals between parts of vessel H01J17/186Seals between leading-in conductors and vessel H01J17/20Selection of substances for gas fillingsSpecified operating pressures or temperatures H01J17/22Means for obtaining or maintaining the desired pressure within the tube H01J17/24Means for absorbing or adsorbing gas, e.g. by gettering H01J17/26Means for producing, introducing, or replenishing gas or vapour during operation of the tube H01J17/28Cooling arrangements H01J17/30Igniting arrangements H01J17/32Igniting by associated radioactive materials or fillings H01J17/325Current stabilising tubes, e.g. curpistors H01J17/34One or more circuit elements structurally associated with the tube H01J17/36Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for H01J17/38Cold-cathode tubes H01J17/40with one cathode and one anode, e.g. glow tubes, tuning-indicator glow tubes, voltage-stabiliser tubes, voltage-indicator tubes, cathode-glow lamps H01J61/04 H01J17/42having one or more probe electrodes, e.g. for potential dividing H01J17/44having one or more control electrodes H01J17/46for preventing and then permitting ignition but thereafter having no control H01J17/48with more than one cathode or anode, e.g. sequence-discharge tube, counting tube, dekatron H01J17/485Plasma addressed liquid crystal displays [PALC] H01J17/49Display panels, e.g. with crossed electrodes , e.g. making use of direct current display panels making use of alternating current H01J11/00 H01J17/491with electrodes arranged side by side and substantially in the same plane, e.g. for displaying alphanumeric characters H01J17/492with crossed electrodes H01J17/494using sequential transfer of the discharges, e.g. of the self-scan type addressing circuits therefor G09G3/29 H01J17/495display panels using sequential transfer of the discharge along dielectric storage elements H01J17/497for several colours H01J17/498with a gas discharge space and a post acceleration space for electrons H01J17/50Thermionic-cathode tubes H01J17/52with one cathode and one anode H01J17/54having one or more control electrodes H01J17/56for preventing and then permitting ignition, but thereafter having no control H01J17/58with more than one cathode or anode H01J17/60the discharge paths priming each other in a predetermined sequence, e.g. counting tube H01J17/62with independent discharge paths controlled by intermediate electrodes, e.g. polyphase rectifier H01J17/64Tubes specially designed for switching or modulating in a waveguide, e.g. TR box H01J19/00Details of vacuum tubes of the types covered by group H01J21/00 H01J19/02Electron-emitting electrodesCathodes H01J19/04Thermionic cathodes H01J19/06characterised by the material H01J19/062with alkaline-earth metal oxides, or such oxides used in conjunction with reducing agents, as an emissive material H01J19/064with other metal oxides as an emissive material H01J19/066with metals or alloys as an emissive material H01J19/068with compounds having metallic conductive properties, e.g. lanthanum boride, as an emissive material H01J19/08Cathodes heated directly by an electric current H01J19/10characterised by the shape H01J19/12SupportsVibration-damping arrangements H01J19/14Cathodes heated indirectly by an electric currentCathodes heated by electron or ion bombardment H01J19/16Heaters H01J19/18Insulating layer or body located between heater and emissive material H01J19/20Supports for the emissive material H01J19/22Dispenser-type cathodes, e.g. L-cathode H01J19/24Cold cathodes, e.g. field-emissive cathode H01J19/28Non-electron-emitting electrodesScreens H01J19/30characterised by the material H01J19/32Anodes H01J19/34forming part of the envelope H01J19/36Cooling of anodes H01J19/38Control electrodes, e.g. grid H01J19/40Screens for shielding H01J19/42Mounting, supporting, spacing, or insulating of electrodes or of electrode assemblies H01J19/44Insulation between electrodes or supports within the vacuum space H01J19/46Mountings for the electrode assembly as a whole H01J19/48Mountings for individual electrodes H01J19/50Spacing members extending to the envelope H01J19/52without fixed connection between spacing member and envelope H01J19/54VesselsContainersShields associated therewith H01J19/56characterised by the material of the vessel or container H01J19/57provided with coatings on the walls thereofSelection of materials for the coatings H01J19/58Seals between parts of vessels H01J19/60Seals for leading-in conductors H01J19/62Leading-in conductors H01J19/64Means forming part of the tube for the purpose supporting it H01J19/66Means forming part of the tube for the purpose of providing electrical connection to it H01J5/46 - H01J5/62 take precedence H01J19/68Specified gas introduced into the tube at low pressure, e.g. for reducing or influencing space charge H01J19/70Means for obtaining or maintaining the vacuum, e.g. by gettering H01J19/72Tubulations therefor, e.g. for exhaustingClosures therefor H01J19/74Cooling arrangements cooling of anodes H01J19/36 H01J19/76Means structurally associated with the tube for indicating defects or previous use H01J19/78One or more circuit elements structurally associated with the tube H01J19/80Structurally associated resonator having distributed inductance and capacitance H01J19/82Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for H01J21/00Vacuum tubes H01J25/00, H01J31/00 - H01J40/00, H01J43/00, H01J47/00, H01J49/00 take precedence; details of vacuum tubes H01J19/00 H01J21/02Tubes with a single discharge path H01J21/04without control means, i.e. diodes H01J21/06having electrostatic control means only H01J21/065Devices for short wave tubes H01J21/08with movable electrode or electrodes H01J21/10with one or more immovable internal control electrodes, e.g. triode, pentode, octode H01J21/105with microengineered cathode and control electrodes, e.g. Spindt-type H01J21/12Tubes with variable amplification factor H01J21/14Tubes with means for concentrating the electron stream, e.g. beam tetrode H01J21/16with external electrostatic control means and with or without internal control electrodes H01J21/18having magnetic control meanshaving both magnetic and electrostatic control means H01J21/20Tubes with more than one discharge pathMultiple tubes, e.g. double diode, triode-hexode H01J21/22with movable electrode or electrodes H01J21/24with variable amplification factor H01J21/26with means for concentrating the electron stream H01J21/34Tubes with electrode system arranged or dimensioned so as to eliminate transit-time effect with flat electrodes H01J21/36 H01J21/36Tubes with flat electrodes, e.g. disc electrode H01J23/00Details of transit-time tubes of the types covered by group H01J25/00 H01J23/005Cooling methods or arrangements H01J23/033 takes precedence H01J23/02ElectrodesMagnetic control meansScreens associated with resonator or delay system H01J23/16 H01J23/027Collectors H01J23/0275Multistage collectors H01J23/033Collector cooling devices H01J23/04Cathodes H01J23/05having a cylindrical emissive surface, e.g. cathodes for magnetrons H01J23/06Electron or ion guns H01J23/065producing a solid cylindrical beam H01J23/075 takes precedence H01J23/07producing a hollow cylindrical beam H01J23/075 takes precedence H01J23/075Magnetron injection guns H01J23/08Focusing arrangements, e.g. for concentrating stream of electrons, for preventing spreading of stream H01J23/083Electrostatic focusing arrangements H01J23/087Magnetic focusing arrangements H01J23/0873with at least one axial-field reversal along the interaction space, e.g. P.P.M. focusing H01J23/0876with arrangements improving the linearity and homogeniety of the axial field, e.g. field straightener H01J23/09Electric systems for directing or deflecting the discharge along a desired path, e.g. E-type focusing arrangements H01J23/08 H01J23/10Magnet systems for directing or deflecting the discharge along a desired path, e.g. a spiral path magnetic focusing arrangements H01J23/08 H01J23/11Means for reducing noise in electron or ion gun H01J23/06 H01J23/12VesselsContainers H01J23/14Leading-in arrangementsSeals therefor H01J23/15Means for preventing wave energy leakage structurally associated with tube leading-in arrangements, e.g. filters, chokes, attenuating devices H01J23/16Circuit elements, having distributed capacitance and inductance, structurally associated with the tube and interacting with the discharge H01J23/165Manufacturing processes or apparatus therefore H01J23/18Resonators H01J23/20Cavity resonatorsAdjustment or tuning thereof H01J23/207Tuning of single resonator H01J23/213Simultaneous tuning of more than one resonator, e.g. resonant cavities of a magnetron H01J23/22Connections between resonators, e.g. strapping for connecting resonators of a magnetron H01J23/24Slow-wave structures , e.g. delay systems H01J23/26Helical slow-wave structuresAdjustment therefor H01J23/27Helix-derived slow-wave structures H01J23/28Interdigital slow-wave structuresAdjustment therefor H01J23/30Damping arrangements associated with slow-wave structures, e.g. for suppression of unwanted oscillations H01J23/34Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for H01J23/36Coupling devices having distributed capacitance and inductance, structurally associated with the tube, for introducing or removing wave energy H01J23/38to or from the discharge H01J23/40to or from the interaction circuit H01J23/42the interaction circuit being a helix or a helix-derived slow-wave structure H01J23/44 - H01J23/48 take precedence H01J23/44Rod-type coupling devices H01J23/46, H01J23/48, H01J23/54 take precedence H01J23/46Loop coupling devices H01J23/48for linking interaction circuit with coaxial linesDevices of the coupled helices type H01J23/46 takes precedence H01J23/50the interaction circuit being a helix or derived from a helix H01J23/52 takes precedence H01J23/52the coupled helices being disposed coaxially around one another H01J23/54Filtering devices preventing unwanted frequencies or modes to be coupled to, or out of, the interaction circuitPrevention of high frequency leakage in the environment H01J25/00Transit-time tubes, e.g. klystrons, travelling-wave tubes, magnetrons details of transit-time tubes H01J23/00; particle accelerators H05H H01J25/005Gas-filled transit-time tubes H01J25/02Tubes with electron stream modulated in velocity or density in a modulator zone and thereafter giving up energy in an inducing zone, the zones being associated with one or more resonators H01J25/025with an electron stream following a helical path H01J25/04Tubes having one or more resonators, without reflection of the electron stream, and in which the modulation produced in the modulator zone is mainly density modulation, e.g. Heaff tube H01J25/06Tubes having only one resonator, without reflection of the electron stream, and in which the modulation produced in the modulator zone is mainly velocity modulation, e.g. Lüdi-Klystron H01J25/08with electron stream perpendicular to the axis of the resonator H01J25/10Klystrons, i.e. tubes having two or more resonators, without reflection of the electron stream, and in which the stream is modulated mainly by velocity in the zone of the input resonator H01J25/11Extended interaction klystrons H01J25/12with pencil-like electron stream in the axis of the resonators H01J25/14with tube-like electron stream coaxial with the axis of the resonators H01J25/16with pencil-like electron stream perpendicular to the axis of the resonators H01J25/18with radial or disc-like electron stream perpendicular to the axis of the resonators H01J25/20having special arrangements in the space between resonators, e.g. resistive-wall amplifier tube, space-charge amplifier tube, velocity-jump tube H01J25/22Reflex klystrons, i.e. tubes having one or more resonators, with a single reflection of the electron stream, and in which the stream is modulated mainly by velocity in the modulator zone H01J25/24in which the electron stream is in the axis of the resonator or resonators and is pencil-like before reflection H01J25/26in which the electron stream is coaxial with the axis of the resonator or resonators and is tube-like before reflection H01J25/28in which the electron stream is perpendicular to the axis of the resonator or resonators and is pencil-like before reflection H01J25/30in which the electron stream is perpendicular to the axis of the resonator or resonators and is radial or disc-like before reflection H01J25/32Tubes with plural reflection, e.g. Coeterier tube H01J25/34Travelling-wave tubesTubes in which a travelling wave is simulated at spaced gaps H01J25/36Tubes in which an electron stream interacts with a wave travelling along a delay line or equivalent sequence of impedance elements, and without magnet system producing an H-field crossing the E-field H01J25/38the forward travelling wave being utilised H01J25/40the backward travelling wave being utilised H01J25/42Tubes in which an electron stream interacts with a wave travelling along a delay line or equivalent sequence of impedance elements, and with a magnet system producing an H-field crossing the E-field with travelling wave moving completely around the electron space H01J25/50 H01J25/44the forward travelling wave being utilised H01J25/46the backward travelling wave being utilised H01J25/48Tubes in which two electron streams of different velocities interact with one another, e.g. electron-wave tube H01J25/49Tubes using the parametric principle, e.g. for parametric amplification H01J25/50Magnetrons, i.e. tubes with a magnet system producing an H-field crossing the E-field with travelling wave not moving completely around the electron space H01J25/42; functioning with plural reflection or with reversed cyclotron action H01J25/62, H01J25/64 H01J25/52with an electron space having a shape that does not prevent any electron from moving completely around the cathode or guide electrode H01J25/54having only one cavity or other resonator, e.g. neutrode tubes H01J25/55Coaxial cavity magnetrons H01J25/56with interdigital arrangements of anodes, e.g. turbator tube H01J25/58having a number of resonatorshaving a composite resonator, e.g. a helix H01J25/587Multi-cavity magnetrons H01J25/593Rising-sun magnetrons H01J25/60with an electron space having a shape that prevents any electron from moving completely around the cathode or guide electrodeLinear magnetrons H01J25/61Hybrid tubes, i.e. tubes comprising a klystron section and a travelling-wave section H01J25/62Strophotrons, i.e. tubes with H-field crossing the E-field and functioning with plural reflection H01J25/64Turbine tubes, i.e. tubes with H-field crossing the E-field and functioning with reversed cyclotron action H01J25/66Tubes with electron stream crossing itself and thereby interacting or interfering with itself H01J25/68Tubes specially designed to act as oscillator with positive grid and retarding field, e.g. for Barkhausen-Kurz oscillators with secondary emission H01J25/76 H01J25/70with resonator having distributed inductance with capacitance, e.g. Pintsch tube H01J25/72in which a standing wave or a considerable part thereof is produced along an electrode, e.g. Clavier tube with resonator having distributed inductance and capacitance H01J25/70 H01J25/74Tubes specially designed to act as transit-time diode oscillators, e.g. monotrons H01J25/76Dynamic electron-multiplier tubes, e.g. Farnsworth multiplier tube, multipactor H01J25/78Tubes with electron stream modulated by deflection in a resonator H01J27/00Ion beam tubes H01J25/00, H01J33/00, H01J37/00 take precedence; particle accelerators H05H H01J27/02Ion sourcesIon guns for examination or processing discharge tubes H01J37/08; ion sources, ion guns for particle spectrometer or separator tubes H01J49/10; ion propulsion F03H1/00 H01J27/022Details H01J27/024Extraction optics, e.g. grids H01J27/026Cluster ion sources H01J27/028Negative ion sources H01J27/04using reflex discharge, e.g. Penning ion sources electron bombardment ion sources H01J27/08 H01J27/06without applied magnetic field H01J27/08using arc discharge H01J27/10Duoplasmatrons ; Duopigatrons H01J27/12provided with an expansion cup H01J27/14Other arc discharge ion sources using an applied magnetic field H01J27/143Hall-effect ion sources with closed electron drift H01J27/146End-Hall type ion sources, wherein the magnetic field confines the electrons in a central cylinder H01J27/16using high-frequency excitation, e.g. microwave excitation H01J27/18with an applied axial magnetic field H01J27/20using particle beam bombardment, e.g. ionisers H01J27/205with electrons, e.g. electron impact ionisation, electron attachment H01J27/22Metal ion sources H01J27/24using photo-ionisation, e.g. using laser beam H01J27/26using surface ionisation, e.g. field effect ion sources, thermionic ion sources H01J27/20, H01J27/24 take precedence H01J29/00Details of cathode-ray tubes or of electron-beam tubes of the types covered by group H01J31/00 H01J29/003Arrangements for eliminating unwanted electromagnetic effects, e.g. demagnetisation arrangements, shielding coils H01J29/06, H01J29/867 take precedence; demagnetisation in general H01F13/00; circuit arrangements therefor H04N9/29; screening of apparatus against electric or magnetic fields H05K9/00 H01J29/006Arrangements for eliminating unwanted temperature effects H01J29/02ElectrodesScreensMounting, supporting, spacing or insulating thereof H01J29/021arrangements for eliminating interferences in the tube H01J29/484 takes precedence H01J29/023secondary-electron emitting electrode arrangements secondary-emission tubes H01J43/00 H01J29/025Mounting or supporting arrangements for grids H01J29/028 takes precedence H01J29/026Mounting or supporting arrangements for charge storage screens not deposited on the frontplate H01J29/028Mounting or supporting arrangements for flat panel cathode ray tubes, e.g. spacers particularly relating to electrodes H01J29/04Cathodes H01J29/06Screens for shieldingMasks interposed in the electron stream H01J29/07Shadow masks for colour television tubes H01J29/073Mounting arrangements associated with shadow masks H01J29/076characterised by the shape or distribution of beam-passing apertures H01J29/08Electrodes intimately associated with a screen on or from which an image or pattern is formed, picked-up, converted or stored, e.g. backing-plates for storage tubes or collecting secondary electrons H01J29/085Anode plates, e.g. for screens of flat panel displays H01J29/10Screens on or from which an image or pattern is formed, picked up, converted or stored H01J29/12acting as light valves by shutter operation, e.g. for eidophor H01J29/14acting by discoloration, e.g. halide screen H01J29/16Incandescent screens H01J29/18Luminescent screens H01J29/182acting upon the lighting-up of the luminescent material other than by the composition of the luminescent material, e.g. by infra red or UV radiation, heating or electric fields H01J29/185measures against halo-phenomena H01J29/187screens with more than one luminescent material (as mixtures for the treatment of the screens) for several superimposed luminescent layers H01J29/26; for adjacent dots or lines of different luminescent material H01J29/32 H01J29/20characterised by the luminescent material H01J29/22characterised by the binder or adhesive for securing the luminescent material to its support, e.g. vessel H01J29/225photosensitive adhesive H01J29/24Supports for luminescent material H01J29/26with superimposed luminescent layers H01J29/28with protective, conductive or reflective layers H01J29/30with luminescent material discontinuously arranged, e.g. in dots, in lines H01J29/32with adjacent dots or lines of different luminescent material, e.g. for colour television H01J29/322with adjacent dots H01J29/325with adjacent lines H01J29/327Black matrix materials H01J29/34provided with permanent marks or references H01J29/36Photoelectric screensCharge-storage screens H01J29/38not using charge storage, e.g. photo-emissive screen, extended cathode electrodes using photo-emission in general H01J1/34 H01J29/385Photocathodes comprising a layer which modified the wave length of impinging radiation H01J29/39Charge-storage screens H01J29/395charge-storage grids exhibiting triode effect H01J29/41using secondary emission, e.g. for supericonoscope electrodes using secondary emission in general H01J1/32; secondary emission tubes H01J43/00 H01J29/413for writing and reading of charge pattern on opposite sides of the target, e.g. for superorthicon H01J29/416with a matrix of electrical conductors traversing the target H01J29/43using photo-emissive mosaic, e.g. for orthicon, for iconoscope H01J29/435with a matrix of conductors traversing the target H01J29/44exhibiting internal electric effects caused by particle radiation, e.g. bombardment-induced conductivity particle detectors exhibiting internal electric effects G01T1/26 H01J29/45exhibiting internal electric effects caused by electromagnetic radiation, e.g. photoconductive screen, photodielectric screen, photovoltaic screen photoconductive layers for electrography G03G5/00 H01J29/451with photosensitive junctions H01J29/453provided with diode arrays H01J29/455formed on a silicon substrate H01J29/456exhibiting no discontinuities, e.g. consisting of uniform layers H01J29/458pyroelectrical targets; targets for infra-red or ultra-violet or X-ray radiations H01J29/46Arrangements of electrodes and associated parts for generating or controlling the ray or beam, e.g. electron-optical arrangement transit time tubes H01J23/00, H01J25/00; X-ray tubes H01J35/00; beam tubes for examining ions, e.g. electron or ion microscopes, or processing of objects or materials, e.g. electron or ion beam tubes H01J37/04; electron multipliers H01J43/04; handling of radiation or particles, e.g. focusing, deviating, not otherwise provided for G21K1/00H01J29/48 takes precedence over groups H01J29/52 - H01J29/58. H01J29/462arrangements for interrupting the beam during inoperative periods H01J29/465for simultaneous focalisation and deflection of ray or beam H01J29/467Control electrodes for flat display tubes, e.g. of the type covered by group H01J31/123 H01J29/48Electron guns H01J29/481Electron guns using field-emission, photo-emission, or secondary-emission electron source H01J29/482Electron guns using electron multiplication H01J29/484Eliminating deleterious effects due to thermal effects, electrical or magnetic fields; Preventing unwanted emission H01J29/481 and H01J29/482 take precedence H01J29/485Construction of the gun or of parts thereof H01J29/481, H01J29/482, H01J29/484 and H01J29/487 take precedence H01J29/487Replacing parts of the gun; Relative adjustment of the electrodes H01J29/481 and H01J29/482 take precedence; vacuum locks H01J29/865 H01J29/488Schematic arrangements of the electrodes for beam forming; Place and form of the elecrodes H01J29/50two or more guns in a single vacuum space, e.g. for plural-ray tube H01J29/51 takes precedence H01J29/503Three or more guns, the axes of which lay in a common plane H01J29/506guns in delta or circular configuration H01J29/51Arrangements for controlling convergence of a plurality of beams by means of electric field only H01J29/52Arrangements for controlling intensity of ray or beam, e.g. for modulation H01J29/467 takes precedence H01J29/525Digitally controlled systems, e.g. Digisplay H01J29/54Arrangements for centring ray or beam H01J29/467 takes precedence H01J29/56Arrangements for controlling cross-section of ray or beamArrangements for correcting aberration of beam, e.g. due to lenses H01J29/467 takes precedence H01J29/563for controlling cross-section H01J29/566for correcting aberration H01J29/58Arrangements for focusing or reflecting ray or beam H01J29/585in which the transit time of the electrons has to be taken into account H01J29/60Mirrors H01J29/62Electrostatic lenses H01J29/622producing fields exhibiting symmetry of revolution H01J29/624co-operating with or closely associated to an electron gun H01J29/626producing fields exhibiting periodic axial symmetry, e.g. multipolar fields H01J29/628co-operating with or closely associated to an electron gun H01J29/64Magnetic lenses H01J29/66using electromagnetic means only H01J29/68using permanent magnets only H01J29/70Arrangements for deflecting ray or beam H01J29/467, H01J29/525 take precedence H01J29/701Systems for correcting deviation or convergence of a plurality of beams by means of magnetic fields at least H01J29/702Convergence correction arrangements therefor H01J29/703Static convergence systems H01J29/705Dynamic convergence systems H01J29/706Deviation correction devices, i.e. having the same action on each beam H01J29/707Arrangements intimately associated with parts of the gun and co-operating with external magnetic excitation devices H01J29/708in which the transit time of the electrons has to be taken into account H01J29/72along one straight line or along two perpendicular straight lines H01J29/74Deflecting by electric fields only H01J29/76Deflecting by magnetic fields only H01J29/762using saddle coils or printed windings coils per se H01F H01J29/764using toroidal windings H01J29/766using a combination of saddle coils and toroidal windings H01J29/768using printed windings printed windings in general H01F27/2804; manufacturing printed coils per se H01F41/04; printed circuits and apparatus or processes for manufacturing printed circuits in general H05K1/00, e.g. H05K1/16, and H05K3/00 H01J29/78along a circle, spiral or rotating radial line, e.g. for radar display H01J29/80Arrangements for controlling the ray or beam after passing the main deflection system, e.g. for post-acceleration or post-concentration, for colour switching H01J29/701 takes precedence H01J29/803for post-acceleration or post-deflection, e.g. for colour switching H01J29/806Electron lens mosaics, e.g. fly's eye lenses, colour selection lenses H01J29/81using shadow masks H01J29/82Mounting, supporting, spacing, or insulating electron-optical or ion-optical arrangements H01J29/823around the neck of the tube H01J29/826Deflection arrangements H01J29/84Traps for removing or diverting unwanted particles, e.g. negative ions, fringing electronsArrangements for velocity or mass selection H01J29/845by means of magnetic systems H01J29/86VesselsContainersVacuum locks H01J29/861Vessels or containers characterised by the form or the structure thereof H01J29/862of flat panel cathode ray tubes H01J29/863Vessels or containers characterised by the material thereof H01J29/864Spacers between faceplate and backplate of flat panel cathode ray tubes H01J29/865Vacuum locks H01J29/866Devices for introducing a recording support into the vessel H01J29/867Means associated with the outside of the vessel for shielding, e.g. magnetic shields screens for shielding inside the vessel H01J29/06; magnetic shielding in general H05K9/00 H01J29/868Screens covering the input or output face of the vessel, e.g. transparent anti-static coatings, X-ray absorbing layers H01J29/87Arrangements for preventing or limiting effects of implosion of vessels or containers H01J29/88provided with coatings on the walls thereofSelection of materials for the coatings H01J29/868 and H01J29/89 take precedence H01J29/89Optical or photographic arrangements structurally combined or co-operating with the vessel H01J29/866 and H01J29/868 take precedence H01J29/892using fibre optics H01J29/894Arrangements combined with the vessel for the purpose of image projection on a screen projection arrangements for image reproduction, e.g. using eidophor H04N5/74 H01J29/896Anti-reflection means, e.g. eliminating glare due to ambient light H01J29/898Spectral filters H01J29/90Leading-in arrangementsSeals therefor H01J29/92Means forming part of the tube for the purpose of providing electrical connection to it H01J29/925High voltage anode feedthrough connectors for display tubes H01J29/94Selection of substances for gas fillingsMeans for obtaining or maintaining the desired pressure within the tube, e.g. by gettering exhausting, degassing, gettering of electric discharge tubes in general H01J9/38 H01J29/96One or more circuit elements structurally associated with the tube H01J29/98Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for H01J31/00Cathode ray tubesElectron beam tubes H01J25/00, H01J33/00, H01J35/00, H01J37/00 take precedence; details of cathode ray tubes or of electron beam tubes H01J29/00 H01J31/02having one or more output electrodes which may be impacted selectively by the ray or beam, and onto, from, or over which the ray or beam may be deflected or de-focused pulse counting circuits therewith H03K29/06 H01J31/04with only one or two output electrodes with only two electrically independant groups or electrodes H01J31/06with more than two output electrodes, e.g. for multiple switching or counting H01J31/065for electrography or electrophotography, for transferring a charge pattern through the faceplate leading-in arrangements H01J29/90; Lenard tubes H01J33/00; electrography or electrophotography per se G03C H01J31/08having a screen on or from which an image or pattern is formed, picked up, converted, or stored H01J31/10Image or pattern display tubes, i.e. having electrical input and optical outputFlying-spot tubes for scanning purposes H01J31/12with luminescent screen H01J31/121tubes for oscillography colour display tubes H01J31/20; cathode ray oscillography G01R13/20 H01J31/122Direct viewing storage tubes without storage grid with storage grid H01J31/18 H01J31/123Flat display tubes H01J31/124using electron beam scanning H01J31/125provided with control means permitting the electron beam to reach selected parts of the screen, e.g. digital selection H01J31/126using line sources H01J31/127using large area or array sources, i.e. essentially a source for each pixel group H01J31/128provided with control means permitting the electron beam to reach selected parts of the screen, e.g. digitally controlled display tubes H01J31/123 takes precedence H01J31/14Magic-eye or analogous tuning indicators mounting of visual indicators in a radio set H03J1/04; circuits for timing indicators H03J3/14 H01J31/15with ray or beam selectively directed to luminescent anode segments printing by application of radiation B41J2/447 H01J31/16with mask carrying a number of selectively displayable signs, e.g. charactron, numeroscope tubes with a mask carrying a matrix of openings, a selection of which permits a sign to be displayed H01J31/128 H01J31/18with image written by a ray or beam on a grid-like charge-accumulating screen, and with a ray or beam passing through and influenced by this screen before striking the luminescent screen, e.g. direct-view storage tube charge storage grids exhibiting triode effect H01J29/395 H01J31/20for displaying images or patterns in two or more colours circuits for colour television H04N9/16 - H04N9/28 H01J31/201using a colour-selection electrode H01J31/203with more than one electron beam H01J31/205with three electron beams in delta configuration H01J31/206with three coplanar electron beams H01J31/208using variable penetration depth of the electron beam in the luminescent layer, e.g. penetrons H01J31/22for stereoscopic displays H01J31/24with screen acting as light valve by shutter operation, e.g. eidophor projection arrangements for image reproduction, e.g. using eidophor H04N5/74 H01J31/26Image pick-up tubes having an input of visible light and electric output tubes without defined electron beams and having a light ray scanning photo-emissive screen H01J40/20 H01J31/265with light spot scanning H01J31/28with electron ray scanning the image screen H01J31/283with a target comprising semiconductor junctions H01J31/286correlater tubes H01J31/30having regulation of screen potential at anode potential, e.g. iconoscope H01J31/32Tubes with image amplification section, e.g. image-iconoscope, supericonoscope H01J31/34having regulation of screen potential at cathode potential, e.g. orthicon H01J31/36Tubes with image amplification section, e.g. image-orthicon H01J31/38Tubes with photoconductive screen, e.g. vidicon H01J31/40having grid-like image screen through which the electron ray passes and by which the ray is influenced before striking the output electrode, i.e. having "triode action" H01J31/42with image screen generating a composite electron beam which is deflected as a whole past a stationary probe to simulate a scanning effect, e.g. Farnsworth pick-up tube H01J31/44Tubes with image amplification section H01J31/46Tubes in which electrical output represents both intensity and colour of image colour television cameras with only one tube H04N23/12 H01J31/48Tubes with amplification of output effected by electron multiplier arrangements within the vacuum space H01J31/49Pick-up adapted for an input of electromagnetic radiation other than visible light and having an electric output, e.g. for an input of X-rays, for an input of infra-red radiation H01J31/495Pick-up tubes adapted for an input of sonic, ultrasonic, or mechanical vibrations and having an electric output H01J31/50Image-conversion or image-amplification tubes, i.e. having optical, X-ray, or analogous input, and optical output H01J31/501with an electrostatic electron optic system H01J31/52 - H01J31/56 take precedence H01J31/502with means to interrupt the beam, e.g. shutter for high speed photography circuits using electron-beam shutters G03B27/725 H01J31/503with an electromagnetic electron-optic system H01J31/52 - H01J31/56 take precedence H01J31/505flat tubes, e.g. proximity focusing tubes H01J31/506tubes using secondary emission effect H01J31/507using a large number of channels, e.g. microchannel plates H01J31/508Multistage converters H01J31/52having grid-like image screen through which the electron ray or beam passes and by which the ray or beam is influenced before striking the luminescent output screen, i.e. having "triode action" H01J31/54in which the electron ray or beam is reflected by the image input screen on to the image output screen H01J31/56for converting or amplifying images in two or more colours H01J31/58Tubes for storage of image or information pattern or for conversion of definition of television or like images, i.e. having electrical input and electrical output electrostatic memories using electron beam tubes G11C11/23 H01J31/585Monoscopes H01J31/60 takes precedence H01J31/60having means for deflecting, either selectively or sequentially, an electron ray on to separate surface elements of the screen by circuitry alone H01J29/08 H01J31/62with separate reading and writing rays H01J31/64on opposite sides of screen, e.g. for conversion of definition H01J31/66having means for allowing all but selected cross-section elements of a homogeneous electron beam to reach corresponding elements of the screen, e.g. selectron H01J31/68in which the information pattern represents two or more colours H01J33/00Discharge tubes with provision for emergence of electrons or ions from the vessel irradiation devices G21K ; particle accelerators H05HLenard tubes H01J33/02Details vessels for operation at high tension H01J5/06 H01J33/04Windows H01J35/00X-ray tubes H01J35/02Details H01J35/025X-ray tubes with structurally associated circuit elements H01J35/04Electrodes ; Mutual position thereof; Constructional adaptations therefor H01J35/045Electrodes for controlling the current of the cathode ray, e.g. control grids H01J35/06Cathodes H01J35/064Details of the emitter, e.g. material or structure H01J35/065 takes precedence H01J35/065Field emission, photo emission or secondary emission cathodes H01J35/066Details of electron optical components, e.g. cathode cups H01J35/08AnodesAnti cathodes H01J35/10Rotary anodesArrangements for rotating anodesCooling rotary anodes H01J35/101Arrangements for rotating anodes, e.g. supporting means, means for greasing, means for sealing the axle or means for shielding or protecting the driving H01J35/1017Bearings for rotating anodes H01J35/1024Rolling bearings H01J35/103Magnetic bearings H01J35/104Fluid bearings H01J35/105Cooling of rotating anodes, e.g. heat emitting layers or structures H01J35/106Active cooling, e.g. fluid flow, heat pipes H01J35/107Cooling of the bearing assemblies H01J35/108Substrates for and bonding of emissive target, e.g. composite structures H01J35/112Non-rotating anodes H01J35/12 takes precedence H01J35/116Transmissive anodes acting as a window H01J35/186 H01J35/12Cooling non-rotary anodes H01J35/13Active cooling, e.g. fluid flow, heat pipes H01J35/14Arrangements for concentrating, focusing, or directing the cathode ray H01J35/147Spot size control H01J35/153Spot position control H01J35/16VesselsContainersShields associated therewith H01J35/165joining connectors to the tube H01J35/18Windows H01J35/186used as targets or X-ray converters H01J35/20Selection of substances for gas fillingsMeans for obtaining or maintaining the desired pressure within the tube, e.g. by gettering H01J35/22specially designed for passing a very high current for a very short time, e.g. for flash operation H01J35/24Tubes wherein the point of impact of the cathode ray on the anode or anticathode is movable relative to the surface thereof H01J35/26by rotation of the anode or anticathode H01J35/28by vibration, oscillation, reciprocation, or swash-plate motion of the anode or anticathode H01J35/30by deflection of the cathode ray H01J35/305by using a rotating X-ray tube in conjunction therewith H01J35/32Tubes wherein the X-rays are produced at or near the end of the tube or a part thereof which tube or part has a small cross-section to facilitate introduction into a small hole or cavity H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof H01J33/00, H01J40/00, H01J41/00, H01J47/00, H01J49/00 take precedence H01J37/02Details H01J37/023Means for mechanically adjusting components not otherwise provided for mechanically adjusting from the outside of electron or ion-optical components H01J37/067; positioning the object or material H01J37/20; vacuum locks, means for obtaining or maintaining the desired pressure within the tube H01J37/18; other manipulating devices H01L21/48, G21F H01J37/026Means for avoiding or neutralising unwanted electrical charges on tube components H01J37/04Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement electron or ion-optical systems for localised treatment of materials H01J37/3007; discharge control means in gas filled discharge tubes H01J37/32009 H01J37/045Beam blanking or chopping, i.e. arrangements for momentarily interrupting exposure to the discharge H01J37/05Electron or ion-optical arrangements for separating electrons or ions according to their energy or massparticle separator tubes H01J49/00 H01J37/06Electron sourcesElectron guns electron sources in general H01J1/02, H01J19/02; electron guns in general H01J3/02 H01J37/061Electron guns using electron multiplication H01J37/063Geometrical arrangement of electrodes for beam-forming H01J37/065Construction of guns or parts thereof H01J37/067 - H01J37/077 take precedence H01J37/067Replacing parts of gunsMutual adjustment of electrodes H01J37/073 - H01J37/077 take precedence; vacuum locks H01J37/18 H01J37/07Eliminating deleterious effects due to thermal effects or electric or magnetic fields H01J37/073 - H01J37/077 take precedence H01J37/073Electron guns using field emission, photo emission, or secondary emission electron sources H01J37/075Electron guns using thermionic emission from cathodes heated by particle bombardment or by irradiation, e.g. by laser H01J37/077Electron guns using discharge in gases or vapours as electron sources H01J37/08Ion sourcesIon guns H01J37/09DiaphragmsShields associated with electron or ion-optical arrangementsCompensation of disturbing fields H01J37/10Lenses H01J37/12electrostatic H01J37/14magnetic H01J37/141Electromagnetic lenses H01J37/1413Means for interchanging parts of the lens, e.g. pole pieces, within the tube mechanically adjusting electron (ion) optical components H01J37/15 H01J37/1416with superconducting coils H01J37/143Permanent magnetic lenses H01J37/145Combinations of electrostatic and magnetic lenses H01J37/147Arrangements for directing or deflecting the discharge along a desired path H01J37/045 take precedence; lenses H01J37/10 H01J37/1471for centering, aligning or positioning of ray or beam H01J37/1472Deflecting along given lines H01J37/1474Scanning means H01J37/1475magnetic H01J37/1477electrostatic H01J37/1478Beam tilting means, i.e. for stereoscopy or for beam channelling H01J37/15External mechanical adjustment of electron or ion optical components H01J37/067, H01J37/20 take precedence H01J37/153Electron-optical or ion-optical arrangements for the correction of image defects, e.g. stigmators H01J37/16VesselsContainers H01J37/165Means associated with the vessel for preventing the generation of or for shielding unwanted radiation, e.g. X-rays H01J37/18Vacuum locks ; Means for obtaining or maintaining the desired pressure within the vessel vacuum locks for electron-beam tubes in general H01J29/865 H01J37/185Means for transferring objects between different enclosures of different pressure or atmosphere H01J37/20Means for supporting or positioning the objects or the materialMeans for adjusting diaphragms or lenses associated with the support introducing the objects H01J37/18 H01J37/21Means for adjusting the focus adjusting the focus while observing the image by photographic or optical means H01J37/22; means for observing the object or the point of impact on the object in tubes for the localised treatment of materials H01J37/3005 H01J37/22Optical or photographic arrangements associated with the tube using a CRT for the display of the image in a scanning electron microscope H01J37/28; observing the object or the point of impact on the object in tubes for the localised treatment of materials H01J37/3007 H01J37/222Image processing arrangements associated with the tube image data processing or generation, in general G06T H01J37/224Luminescent screens or photographic plates for imaging photosensitive materials for photographic purposes G03C; Apparatus specially adapted therefor, e.g. cameras, TV-cameras, photographic equipment, exposure control; Optical subsystems specially adapted therefor, e.g. microscopes for observing image on luminescent screen H01J37/226Optical arrangements for illuminating the object; optical arrangements for collecting light from the object H01J37/228whereby illumination and light collection take place in the same area of the discharge H01J37/24Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for H01J37/241High voltage power supply or regulation circuits components H01J37/248 H01J37/242Filament heating power supply or regulation circuits H01J37/241 takes precedence H01J37/243Beam current control or regulation circuits H01J37/241 takes precedence H01J37/244DetectorsAssociated components or circuits therefor H01J37/248Components associated with high voltage supply means for measuring the high voltage per se G01R15/00 H01J37/252Tubes for spot-analysing by electron or ion beamsMicroanalysers H01J37/256using scanning beams H01J37/26Electron or ion microscopesElectron or ion diffraction tubes H01J37/261Details H01J37/263Contrast, resolution or power of penetration H01J37/265Controlling the tube; circuit arrangements adapted to a particular application not otherwise provided, e.g. bright-field-dark-field illumination H01J37/266Measurement of magnetic- or electric fields in the object; Lorentzmicroscopy emission microscopes H01J37/285; reflecting microscopes H01J37/29; spot analysing H01J37/252 H01J37/268with scanning beams H01J37/27Shadow microscopy H01J37/28with scanning beams H01J37/268, H01J37/292, H01J37/2955 take precedence H01J37/285Emission microscopes, e.g. field-emission microscopes H01J37/29Reflection microscopes H01J37/292using scanning ray H01J37/295Electron or ion diffraction tubes H01J37/2955using scanning ray H01J37/30Electron-beam or ion-beam tubes for localised treatment of objects H01J37/3002Details H01J37/3005Observing the objects or the point of impact on the object H01J37/3007Electron or ion-optical systems electron or ion-optical details H01J37/06 - H01J37/153 H01J37/301Arrangements enabling beams to pass between regions of different pressure H01J37/302Controlling tubes by external information, e.g. programme control H01J37/304 takes precedence H01J37/3023Programme control H01J37/3026Patterning strategy H01J37/304Controlling tubes by information coming from the objects or from the beam, e.g. correction signals H01J37/3045Object or beam position registration H01J37/305for casting, melting, evaporating or etching methods for casting or melting of metals with electron beam or gas discharges C22B9/22 H01J37/3053for evaporating or etching H01J37/3056for microworking, e.g. etching of gratings, trimming of electrical components trimming of resistors H01C17/22 H01J37/31for cutting or drilling methods for cutting or drilling metals with electron beams B23K15/00 H01J37/315for welding methods for welding metals with electron beams B23K15/00 H01J37/317for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation H01J37/36 takes precedence H01J37/3171for ion implantation plasma immersion ion implantation H01J37/32412 H01J37/3172Maskless patterned ion implantation H01J37/3174Particle-beam lithography, e.g. electron beam lithography H01J37/3175Projection methods, i.e. transfer substantially complete pattern to substrate H01J37/3177Multi-beam, e.g. fly's eye, comb probe H01J37/3178for applying thin layers on objects H01J37/32Gas-filled discharge tubes heating by discharge H05B H01J37/32009Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources plasma generation in general H05H1/24 H01J37/32018Glow discharge H01J37/32027DC powered H01J37/32036AC powered H01J37/32045Circuits specially adapted for controlling the glow discharge H01J37/32055Arc discharge H01J37/32064Circuits specially adapted for controlling the arc discharge for plasma torches H01H1/36 H01J37/32073Corona discharge H01J37/32082Radio frequency generated discharge H01J37/32357, H01J37/32366, H01J37/32394 and H01J37/32403 take precedence H01J37/32091the radio frequency energy being capacitively coupled to the plasma H01J37/321the radio frequency energy being inductively coupled to the plasma H01J37/3211Antennas, e.g. particular shapes of coils H01J37/32119Windows H01J37/32128using particular waveforms, e.g. polarised waves H01J37/32137controlling of the discharge by modulation of energy H01J37/32146Amplitude modulation, includes pulsing H01J37/32155Frequency modulation H01J37/32165Plural frequencies H01J37/32174Circuits specially adapted for controlling the RF discharge H01J37/32183Matching circuits H01J37/32192Microwave generated discharge H01J37/32357, H01J37/32366, H01J37/32394, H01J37/32403 take precedence H01J37/32201Generating means H01J37/32211Means for coupling power to the plasma H01J37/3222Antennas H01J37/32229Waveguides H01J37/32238Windows H01J37/32247Resonators H01J37/32256Tuning means H01J37/32266Means for controlling power transmitted to the plasma H01J37/32275Microwave reflectors H01J37/32284Means for controlling or selecting resonance mode H01J37/32293using particular waveforms, e.g. polarised waves H01J37/32302Plural frequencies H01J37/32311Circuits specially adapted for controlling the microwave discharge H01J37/32321Discharge generated by other radiation H01J37/32055, H01J37/32073, H01J37/32082, H01J37/32192, H01J37/32348 take precedence H01J37/3233using charged particles H01J37/32339using electromagnetic radiation H01J37/32348Dielectric barrier discharge H01J37/32357Generation remote from the workpiece, e.g. down-stream H01J37/32366Localised processing H01J37/32376Scanning across large workpieces H01J37/32385Treating the edge of the workpieces H01J37/32394Treating interior parts of workpieces H01J37/32403Treating multiple sides of workpieces, e.g. 3D workpieces H01J37/32412Plasma immersion ion implantation H01J37/32422Arrangement for selecting ions or species in the plasma H01J37/32431Constructional details of the reactor H01J37/3244Gas supply means H01J37/32449Gas control, e.g. control of the gas flow H01J37/32458Vessel H01J37/32467Material H01J37/32477characterised by the means for protecting vessels or internal parts, e.g. coatings H01J37/32486Means for reducing recombination coefficient H01J37/32495Means for protecting the vessel against plasma H01J37/32504Means for preventing sputtering of the vessel H01J37/32513Sealing means, e.g. sealing between different parts of the vessel H01J37/32522Temperature H01J37/32532Electrodes H01J37/32541Shape H01J37/3255Material H01J37/32559Protection means, e.g. coatings H01J37/32568Relative arrangement or disposition of electrodes; moving means H01J37/32577Electrical connecting means H01J37/32587Triode systems H01J37/32596Hollow cathodes H01J37/32605Removable or replaceable electrodes or electrode systems H01J37/32614Consumable cathodes for arc discharge H01J37/32623Mechanical discharge control means H01J37/32633Baffles H01J37/32642Focus rings H01J37/32651Shields, e.g. dark space shields, Faraday shields H01J37/3266Magnetic control means H01J37/32669Particular magnets or magnet arrangements for controlling the discharge H01J37/32678Electron cyclotron resonance H01J37/32688Multi-cusp fields H01J37/32697Electrostatic control H01J37/32706Polarising the substrate H01J37/32715Workpiece holder H01J37/32724Temperature H01J37/32733Means for moving the material to be treated H01J37/32743for introducing the material into processing chamber H01J37/32752for moving the material across the discharge H01J37/32761Continuous moving H01J37/3277of continuous material H01J37/32779of batches of workpieces H01J37/32788for extracting the material from the process chamber H01J37/32798Further details of plasma apparatus not provided for in groups H01J37/3244 - H01J37/32788; special provisions for cleaning or maintenance of the apparatus H01J37/32807Construction (includes replacing parts of the apparatus) H01J37/32816Pressure H01J37/32825Working under atmospheric pressure or higher H01J37/32834Exhausting H01J37/32844Treating effluent gases H01J37/32853Hygiene H01J37/32862In situ cleaning of vessels and/or internal parts H01J37/32871Means for trapping or directing unwanted particles H01J37/3288Maintenance H01J37/32889Connection or combination with other apparatus H01J37/32899Multiple chambers, e.g. cluster tools H01J37/32908Utilities H01J37/32917Plasma diagnostics H01J37/32926Software, data control or modelling H01J37/32935Monitoring and controlling tubes by information coming from the object and/or discharge H01J37/32944Arc detection H01J37/32954Electron temperature measurement H01J37/32963End-point detection H01J37/32972Spectral analysis H01J37/32981Gas analysis H01J37/3299Feedback systems H01J37/34operating with cathodic sputtering H01J37/36 takes precedence ; methods of cathodic sputtering C23C14/34 H01J37/3402using supplementary magnetic fields H01J37/3405Magnetron sputtering H01J37/3408Planar magnetron sputtering H01J37/3411Constructional aspects of the reactor H01J37/3414Targets H01J37/3417Arrangements H01J37/342Hollow targets H01J37/3423Shape H01J37/3426Material H01J37/3429Plural materials H01J37/3432Target-material dispenser H01J37/3435Target holders (includes backing plates and endblocks) H01J37/3438Electrodes other than cathode H01J37/3441Dark space shields H01J37/3444Associated circuits H01J37/3447Collimators, shutters, apertures H01J37/345Magnet arrangements in particular for cathodic sputtering apparatus material of magnets or magnets in general H01F1/00, H01F7/00 H01J37/3452Magnet distribution H01J37/3455Movable magnets H01J37/3458Electromagnets in particular for cathodic sputtering apparatus electromagnets in general H01F7/06 H01J37/3461Means for shaping the magnetic field, e.g. magnetic shunts H01J37/3464Operating strategies H01J37/3467Pulsed operation, e.g. HIPIMS H01J37/347Thickness uniformity of coated layers or desired profile of target erosion H01J37/3473Composition uniformity or desired gradient H01J37/3476Testing and control H01J37/3479Detecting exhaustion of target material H01J37/3482Detecting or avoiding eroding through H01J37/3485Means for avoiding target poisoning H01J37/3488Constructional details of particle beam apparatus not otherwise provided for, e.g. arrangement, mounting, housing, environment; special provisions for cleaning or maintenance of the apparatus H01J37/3491Manufacturing of targets H01J37/3494Adaptation to extreme pressure conditions H01J37/3497Temperature of target H01J37/36for cleaning surfaces while plating with ions of materials introduced into the discharge, e.g. introduced by evaporation condensing of electrically charged vapour onto a surface for covering materials with metals C23C14/32 H01J40/00Photoelectric discharge tubes not involving the ionisation of a gas H01J49/00 takes precedence H01J40/02Details H01J40/04Electrodes H01J40/06Photo-emissive cathodes H01J40/08Magnetic means for controlling discharge H01J40/10Selection of substances for gas fillings H01J40/12One or more circuit elements structurally associated with the tube H01J40/14Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for H01J40/16having photo- emissive cathode, e.g. alkaline photoelectric cell operating with secondary emission H01J43/00 H01J40/18with luminescent coatings for influencing the sensitivity of the tube, e.g. by converting the input wavelength H01J40/20wherein a light-ray scans a photo-emissive screen H01J41/00Discharge tubes for measuring pressure of introduced gas or for detecting presence of gasDischarge tubes for evacuation by diffusion of ions H01J41/02Discharge tubes for measuring pressure of introduced gas or for detecting presence of gas H01J41/04with ionisation by means of thermionic cathodes H01J41/06with ionisation by means of cold cathodes H01J41/08with ionisation by means of radioactive substances, e.g. alphatrons H01J41/10of particle spectrometer type particle spectrometers per se H01J49/00 H01J41/12Discharge tubes for evacuating by diffusion of ions, e.g. ion pumps, getter ion pumps H01J41/14with ionisation by means of thermionic cathodes H01J41/16using gettering substances H01J41/18with ionisation by means of cold cathodes H01J41/20using gettering substances H01J43/00Secondary-emission tubesElectron-multiplier tubes dynamic electron-multiplier tubes H01J25/76 H01J43/02Tubes in which one or a few electrodes are secondary-electron emitting electrodes H01J43/025Circuits therefor H01J43/04Electron multipliers if forming part of electron gun H01J3/023 H01J43/045Position sensitive electron multipliers H01J43/06Electrode arrangements H01J43/08Cathode arrangements construction of photo cathodes H01J40/06, H01J40/16, H01J47/00, H01J49/08 H01J43/10Dynodes H01J43/24, H01J43/26 take precedence H01J43/12Anode arrangements H01J43/14Control of electron beam by magnetic field H01J43/16Electrode arrangements using essentially one dynode H01J43/18Electrode arrangements using essentially more than one dynode H01J43/20Dynodes consisting of sheet material, e.g. plane, bent H01J43/22Dynodes consisting of electron-permeable material, e.g. foil, grid, tube, venetian blind H01J43/24Dynodes having potential gradient along their surfaces H01J43/243Dynodes consisting of a piling-up of channel-type dynode plates H01J43/246Microchannel plates [MCP] image amplification tubes using MCP H01J31/507 H01J43/26Box dynodes H01J43/28Vessels , e.g. wall of the tubeWindowsScreensSuppressing undesired discharges or currents H01J43/30Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for H01J45/00Discharge tubes functioning as thermionic generators structural combination of fuel element with thermoelectric element G21C3/40; nuclear power plants using thermionic converters G21D7/04; structural combination of a radioactive source with a thermionic converter, e.g. radioisotope batteries G21H1/10; generators in which thermal or kinetic energy is converted into electrical energy by ionisation of a fluid and removal of the charge therefrom H02N3/00 H01J47/00Tubes for determining the presence, intensity, density or energy of radiation or particles discharge tubes using igniting by associated radioactive materials or fillings, e.g. current stabilising tubes H01J17/32 ; photoelectric discharge tubes not involving the ionisation of a gas H01J40/00 ; discharge tubes for measuring the pressure, partial pressure of introduced gas or for detecting presence of gas H01J41/02; ionisation chambers using a solid dielectric G01T3/008 H01J47/001Details H01J47/002Vessels or containers H01J47/003using tissue-equivalent materials H01J47/004Windows permeable to X-rays, gamma-rays, or particles windows for discharge tubes with provision for emergence of electrons or ions from the vessel H01J33/04; windows for X-ray tubes H01J35/18 H01J47/005Gas fillings H01J47/12 takes precedence; Maintaining the desired pressure within the tube H01J47/006Tissue equivalent gas fillings H01J47/007Flash detectors H01J47/008Drift detectors H01J47/02Ionisation chambers H01J47/022Calibration thereof H01J47/024Well-type ionisation chambers H01J47/026Gas flow ionisation chambers H01J47/028using a liquid dielectric H01J47/04Capacitive ionisation chambers, e.g. the electrodes of which are used as electrometers H01J47/06Proportional counter tubes H01J47/062Multiwire proportional counter tubes H01J47/065Well-type proportional counter tubes H01J47/067Gas flow proportional counter tubes H01J47/08Geiger-Müller counter tubes gas filling with very short deionisation times H01J17/64, H01T H01J47/10Spark counters H01J47/14 takes precedence; spark gaps H01T H01J47/12Neutron detector tubes, e.g. BF₃ tubes H01J47/1205using nuclear reactions of the type (n, alpha) in solid materials, e.g. Boron-10 (n,alpha) Lithium-7, Lithium-6 (n, alpha)Hydrogen-3 H01J47/1211Ionisation chambers H01J47/1216Gamma compensated H01J47/1222Proportional counters H01J47/1227Fission detectors H01J47/1233Ionisation chambers H01J47/1238Counters H01J47/1244Multiwire counters H01J47/125Helium ionisation detectors H01J47/1255Ionisation chambers H01J47/1261Counters H01J47/1266Multi-wire counters H01J47/1272BF₃ tubes H01J47/1277Light-nuclei-recoil ionisation detectors, e.g. using protons, alpha-particles H01J47/1283Ionisation chambers H01J47/1288Counters H01J47/1294Multi-wire counters H01J47/14Parallel electrode spark or streamer chambersWire spark or streamer chambers circuit arrangements with multi-wire or parallel-plate chambers for recording of movements or tracks of particles G01T5/12 H01J47/16characterised by readout of each individual wire H01J47/18the readout being electrical H01J47/20 takes precedence H01J47/20the readout employing electrical or mechanical delay lines, e.g. magnetostrictive delay lines H01J47/22characterised by another type of readout H01J47/24the readout being acoustical H01J47/26the readout being optical H01J49/00Particle spectrometers or separator tubesIn classifying particle separators, no distinction is made between spectrometry and spectrography, the difference being only in the manner of detection which in the first case is electrical and in the second case is by means of a photographic film. H01J49/0004Imaging particle spectrometry H01J49/0009Calibration of the apparatus H01J49/0013Miniaturised spectrometers, e.g. having smaller than usual scale, integrated conventional components H01J49/0018Microminiaturised spectrometers, e.g. chip-integrated devices, MicroElectro-Mechanical Systems [MEMS] H01J49/0022Portable spectrometers, e.g. devices comprising independent power supply, constructional details relating to portability small scale devices per se H01J49/0013 and H01J49/0018 H01J49/0027Methods for using particle spectrometers H01J49/0031Step by step routines describing the use of the apparatus H01J49/0081 takes precedence H01J49/0036Step by step routines describing the handling of the data generated during a measurement H01J49/004Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn H01J49/0045characterised by the fragmentation or other specific reaction H01J49/005by collision with gas, e.g. by introducing gas or by accelerating ions with an electric field H01J49/0054by an electron beam, e.g. electron impact dissociation, electron capture dissociation H01J49/0059by a photon beam, photo-dissociation H01J49/0063by applying a resonant excitation voltage H01J49/0068by collision with a surface, e.g. surface induced dissociation H01J49/0072by ion/ion reaction, e.g. electron transfer dissociation, proton transfer dissociation H01J49/0077specific reactions other than fragmentation H01J49/0081Tandem in time, i.e. using a single spectrometer H01J49/0086Accelerator mass spectrometers H01J49/009Spectrometers having multiple channels, parallel analysis H01J49/0095Particular arrangements for generating, introducing or analyzing both positive and negative analyte ions ion/ion reactions H01J49/0072 H01J49/02Details H01J49/022Circuit arrangements, e.g. for generating deviation currents or voltages regulating electric or magnetic variables in general, e.g. current, magnetic field G05F; Components associated with high voltage supply high voltage supply per se H02M H01J49/025Detectors specially adapted to particle spectrometers data acquisition H01J49/0036; detectors per se G01T, e.g. G01T1/28, G01T1/29 H01J49/027detecting image current induced by the movement of charged particles H01J49/38 takes precedence H01J49/04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locksArrangements for external adjustment of electron- or ion-optical components H01J49/0404Capillaries used for transferring samples or ions electrospray nozzles H01J49/167 H01J49/0409Sample holders or containers containers for retaining a material to be analyzed, B01L3/50, for DNA, C12Q1/6834, for biological materials, G01N33/543 H01J49/0413for automated handling H01J49/0418for laser desorption, e.g. matrix-assisted laser desorption/ionisation [MALDI] plates or surface enhanced laser desorption/ionisation [SELDI] plates H01J49/0422for gaseous samples interfaces to gas chromatographs G01N30/7206 H01J49/0427using a membrane permeable to gases H01J49/0431for liquid samples interfaces to liquid chromatographs G01N30/7233 H01J49/0436using a membrane permeable to liquids H01J49/044with means for preventing droplets from entering the analyzer; Desolvation of droplets H01J49/0445with means for introducing as a spray, a jet or an aerosol electrospray ion sources H01J49/165 H01J49/045with means for using a nebulising gas, i.e. pneumatically assisted H01J49/0454with means for vaporising using mechanical energy, e.g. by ultrasonic vibrations H01J49/0459for solid samples H01J49/0463Desorption by laser or particle beam, followed by ionisation as a separate step sample holder per se H01J49/0418 H01J49/0468with means for heating or cooling the sample H01J49/0472with means for pyrolysis H01J49/0477using a hot fluid H01J49/0481with means for collisional cooling H01J49/0486with means for monitoring the sample temperature H01J49/049with means for applying heat to desorb the sample; Evaporation H01J49/0495Vacuum locks; Valves valves per se F16K H01J49/06Electron- or ion-optical arrangements H01J49/061Ion deflecting means, e.g. ion gates H01J49/062Ion guides linear ion traps performing mass selection H01J49/4225, mass filters H01J49/421 H01J49/063Multipole ion guides, e.g. quadrupoles, hexapoles H01J49/065having stacked electrodes, e.g. ring stack, plate stack H01J49/066Ion funnels H01J49/067Ion lenses, apertures, skimmers H01J49/068Mounting, supporting, spacing, or insulating electrodes H01J49/08Electron sources, e.g. for generating photo-electrons, secondary electrons or Auger electrons H01J49/10Ion sourcesIon guns H01J49/102using reflex discharge, e.g. Penning ion sources H01J49/105using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP] H01J49/107Arrangements for using several ion sources H01J49/12using an arc discharge, e.g. of the duoplasmatron type H01J49/123Duoplasmatrons H01J49/126Other arc discharge ion sources using an applied magnetic field H01J49/14using particle bombardment, e.g. ionisation chambers H01J49/142using a solid target which is not previously vapourised H01J49/145using chemical ionisation H01J49/147with electrons, e.g. electron impact ionisation, electron attachment H01J49/145 takes precedence H01J49/16using surface ionisation, e.g. field-, thermionic- or photo-emission H01J49/161using photoionisation, e.g. by laser H01J49/162Direct photo-ionisation, e.g. single photon or multi-photon ionisation H01J49/164Laser desorption/ionisation, e.g. matrix-assisted laser desorption/ionisation [MALDI] sample holders H01J49/0418 H01J49/165Electrospray ionisation H01J49/167Capillaries and nozzles specially adapted therefor; electrostatic spraying per se B05B5/00 H01J49/168field ionisation, e.g. corona discharge atmospheric pressure corona discharge per se H01T19/00 H01J49/18using spark ionisation H01J49/20Magnetic deflection H01J49/22Electrostatic deflection H01J49/24Vacuum systems, e.g. maintaining desired pressures H01J49/26Mass spectrometers or separator tubes H01J49/28Static spectrometers H01J49/282using electrostatic analysers H01J49/284using electrostatic and magnetic sectors with simple focusing, e.g. with parallel fields such as Aston spectrometer H01J49/286with energy analysis, e.g. Castaing filter in cathode-ray or electron-beam tubes H01J29/84; electron- or ion-optical arrangements for separating electrons or ions from an analysing or processing beam H01J37/05; micro- or spot-analysing tubes H01J37/252 H01J49/288using crossed electric and magnetic fields perpendicular to the beam, e.g. Wien filter H01J49/30using magnetic analysers , e.g. Dempster spectrometer H01J49/305with several sectors in tandem H01J49/32using double focusing H01J49/322with a magnetic sector of 90 degrees, e.g. Mattauch-Herzog type H01J49/324with an electrostatic section of 90 degrees, e.g. Nier-Johnson type H01J49/326with magnetic and electrostatic sectors of 90 degrees H01J49/328with a cycloidal trajectory by using crossed electric and magnetic fields, e.g. trochoidal type H01J49/34Dynamic spectrometers H01J49/36Radio frequency spectrometers, e.g. Bennett-type spectrometers, Redhead-type spectrometers H01J49/38Omegatrons ; using ion cyclotron resonance H01J49/40Time-of-flight spectrometers H01J49/36 takes precedence H01J49/401characterised by orthogonal acceleration, e.g. focusing or selecting the ions, pusher electrode H01J49/403characterised by the acceleration optics and/or the extraction fields H01J49/405characterised by the reflectron, e.g. curved field, electrode shapes H01J49/406with multiple reflections H01J49/408with multiple changes of direction, e.g. by using electric or magnetic sectors, closed-loop time-of-flight H01J49/42Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons H01J49/4205Device types H01J49/421Mass filters, i.e. deviating unwanted ions without trapping H01J49/4215Quadrupole mass filters H01J49/4225 takes precedence H01J49/422Two-dimensional RF ion traps ion guides without mass selection H01J49/062 H01J49/4225Multipole linear ion traps, e.g. quadrupoles, hexapoles H01J49/423with radial ejection H01J49/4235Stacked rings or stacked plates H01J49/424Three-dimensional ion traps, i.e. comprising end-cap and ring electrodes H01J49/4245Electrostatic ion traps H01J49/422 takes precedence H01J49/425with a logarithmic radial electric potential, e.g. orbitraps H01J49/4255with particular constructional features H01J49/426Methods for controlling ions H01J49/4265Controlling the number of trapped ions; preventing space charge effects H01J49/427Ejection and selection methods H01J49/4275Applying a non-resonant auxiliary oscillating voltage, e.g. parametric excitation H01J49/428Applying a notched broadband signal H01J49/4285Applying a resonant signal, e.g. selective resonant ejection matching the secular frequency of ions H01J49/429, H01J49/428 take precedence H01J49/429Scanning an electric parameter, e.g. voltage amplitude or frequency H01J49/4295Storage methods H01J49/44Energy spectrometers, e.g. alpha-, beta-spectrometers H01J49/443Dynamic spectrometers H01J49/446Time-of-flight spectrometers H01J49/46Static spectrometers H01J49/463using static magnetic fields H01J49/466using crossed electric and magnetic fields perpendicular to the beam, e.g. Wien filter see also H01J49/288 H01J49/48using electrostatic analysers, e.g. cylindrical sector, Wien filter H01J49/482with cylindrical mirrors H01J49/484with spherical mirrors H01J49/486with plane mirrors, i.e. uniform field H01J49/488with retarding grids H01J61/00Discharge lamps H01J61/00Gas-discharge or vapour-discharge lamps arc lamps with consumable electrodes H05B; electroluminescent lamps H05B H01J61/02Details H01J61/025Associated optical elements H01J61/04Electrodes for igniting H01J61/54ScreensShields H01J61/045Thermic screens or reflectors heat-reflecting coatings on the wall of the vessel H01J61/35 H01J61/06Main electrodes H01J61/067for low-pressure discharge lamps H01J61/0672characterised by the construction of the electrode H01J61/0675characterised by the material of the electrode H01J61/0677characterised by the electron emissive material H01J61/073for high-pressure discharge lamps H01J61/0732characterised by the construction of the electrode H01J61/0735characterised by the material of the electrode H01J61/0737characterised by the electron emissive material H01J61/09Hollow cathodes H01J61/10Shields, screens, or guides for influencing the discharge H01J61/103Shields, screens or guides arranged to extend the discharge path H01J61/106 takes precedence H01J61/106using magnetic means H01J61/12Selection of substances for gas fillingsSpecified operating pressure or temperature H01J61/125having an halogenide as principal component H01J61/14having one or more carbon compounds as the principal constituents H01J61/16having helium, argon, neon, krypton, or xenon as the principle constituent H01J61/18having a metallic vapour as the principal constituent H01J61/20mercury vapour H01J61/22vapour of an alkali metal H01J61/24Means for obtaining or maintaining the desired pressure within the vessel H01J61/26Means for absorbing or adsorbing gas, e.g. by getteringMeans for preventing blackening of the envelope H01J61/28Means for producing, introducing, or replenishing gas or vapour during operation of the lamp H01J61/30VesselsContainers H01J61/302characterised by the material of the vessel H01J61/305Flat vessels or containers H01J61/307with folded elongated discharge path H01J61/32Special longitudinal shape, e.g. for advertising purposes H01J61/305 takes precedence H01J61/322Circular lamps H01J61/325U-shaped lamps H01J61/327"Compact"-lamps, i.e. lamps having a folded discharge path H01J61/33Special shape of cross-section, e.g. for producing cool spot H01J61/34Double-wall vessels or containers H01J61/35provided with coatings on the walls thereofSelection of materials for the coatings using coloured coatings H01J61/40; using luminescent coatings H01J61/42 H01J61/36Seals between parts of vesselsSeals for leading-in conductorsLeading-in conductors H01J61/361Seals between parts of vessel H01J61/363End-disc seals or plug seals H01J61/365Annular seals disposed between the ends of the vessel H01J61/363 takes precedence H01J61/366Seals for leading-in conductors H01J61/368Pinched seals or analogous seals H01J61/38Devices for influencing the colour or wavelength of the light H01J61/40by light filtersby coloured coatings in or on the envelope H01J61/42by transforming the wavelength of the light by luminescence H01J61/44Devices characterised by the luminescent material H01J61/46Devices characterised by the binder or other non-luminescent constituent of the luminescent material, e.g. for obtaining desired pouring or drying properties H01J61/48Separate coatings of different luminous materials H01J61/50Auxiliary parts or solid material within the envelope for reducing risk of explosion upon breakage of the envelope, e.g. for use in mines H01J61/52Cooling arrangementsHeating arrangementsMeans for circulating gas or vapour within the discharge space heating or cooling arrangements to promote ionisation for starting H01J61/54 H01J61/523Heating or cooling particular parts of the lamp H01J61/526heating or cooling of electrodes H01J61/54Igniting arrangements, e.g. promoting ionisation for starting H01J61/541using a bimetal switch H01J61/542and an auxiliary electrode inside the vessel H01J61/544and an auxiliary electrode outside the vessel H01J61/545using an auxiliary electrode inside the vessel H01J61/542 takes precedence H01J61/547using an auxiliary electrode outside the vessel H01J61/544 takes precedence H01J61/548using radioactive means to promote ionisation H01J61/56One or more circuit elements structurally associated with the lamp H01J61/58Lamps with both liquid anode and liquid cathode H01J61/60Lamps in which the discharge space is substantially filled with mercury before ignition H01J61/62Lamps with gaseous cathode, e.g. plasma cathode H01J61/64Cathode glow lamps H01J61/66having one or more specially shaped cathodes, e.g. for advertising purposes alphanumeric H01J61/68Lamps in which the main discharge is between parts of a current-carrying guide, e.g. halo lamp H01J61/70Lamps with low-pressure unconstricted discharge having a cold pressure < 400 Torr H01J61/72having a main light-emitting filling of easily vaporisable metal vapour, e.g. mercury H01J61/74having a main light-emitting filling of difficult vaporisable metal vapour, e.g. sodium H01J61/76having a filling of permanent gas or gases only H01J61/78with cold cathodewith cathode heated only by discharge, e.g. high-tension lamp for advertising H01J61/80Lamps suitable only for intermittent operation, e.g. flash lamp H01J61/82Lamps with high-pressure unconstricted discharge having a cold pressure > 400 Torr H01J61/822High-pressure mercury lamps H01J61/825High-pressure sodium lamps H01J61/827Metal halide arc lamps H01J61/84Lamps with discharge constricted by high pressure H01J61/86with discharge additionally constricted by close spacing of electrodes, e.g. for optical projection H01J61/88with discharge additionally constricted by envelope H01J61/90Lamps suitable only for intermittent operation, e.g. flash lamp H01J61/92Lamps with more than one main discharge path H01J61/94Paths producing light of different wavelengths, e.g. for simulating daylight H01J61/95Lamps with control electrode for varying intensity or wavelength of the light, e.g. for producing modulated light H01J61/96Lamps with light-emitting discharge path and separately-heated incandescent body within a common envelope, e.g. for simulating daylight H01J61/98Lamps with closely spaced electrodes heated to incandescence by light-emitting discharge, e.g. tungsten arc lamp H01J63/00Cathode-ray or electron-stream lamps H01J63/02Details, e.g. electrode, gas filling, shape of vessel H01J63/04Vessels provided with luminescent coatingsSelection of materials for the coatings H01J63/06Lamps with luminescent screen excited by the ray or stream H01J63/08Lamps with gas plasma excited by the ray or stream H01J65/00Lamps without any electrode inside the vesselLamps with at least one main electrode outside the vessel H01J65/04Lamps in which a gas filling is excited to luminesce by an external electromagnetic field or by external corpuscular radiation, e.g. for indicating plasma display panels H01J65/042by an external electromagnetic field H01J65/044the field being produced by a separate microwave unit H01J65/046the field being produced by using capacitive means around the vessel H01J65/048the field being produced by using an excitation coil H01J65/06Lamps in which a gas filling is excited to luminesce by radioactive material structurally associated with the lamp, e.g. inside the vessel H01J65/08Lamps in which a screen or coating is excited to luminesce by radioactive material located inside the vessel direct conversion of radiation energy from radioactive sources into light G21H3/02 H01J99/00Subject matter not provided for in other groups of this subclass H01J2201/00 H01J2201/00Electrodes common to discharge tubes H01J2201/02Arrangements for eliminating deleterious effects H01J2201/025charging H01J2201/19Thermionic cathodes H01J2201/193Thin film cathodes H01J2201/196Emission assisted by other physical processes, e.g. field- or photo emission H01J2201/28Heaters for thermionic cathodes H01J2201/2803Characterised by the shape or size H01J2201/2807Block H01J2201/281Cage-like construction H01J2201/2814being a mesh-like network H01J2201/2817Rods H01J2201/2821Envelope or cross-section H01J2201/2825being oval or elliptic H01J2201/2828being rectangular or square H01J2201/2832being circular H01J2201/2835Folded H01J2201/2839Hair-pin or simple bend H01J2201/2842Conic H01J2201/2846Loop H01J2201/285Plurality of elements H01J2201/2853Serpentine H01J2201/2857being coiled H01J2201/286being looped H01J2201/2864Ribbon or bar H01J2201/2867Spiral or helix H01J2201/2871being flattened H01J2201/2875being double, reverse helix or interwoven H01J2201/2878Thin film or film-like H01J2201/2882Variable winding density H01J2201/2885Twisted H01J2201/2889Characterised by material H01J2201/2892Coatings H01J2201/2896Insulating layers H01J2201/30Cold cathodes H01J2201/304Field emission cathodes H01J2201/30403characterised by the emitter shape H01J2201/30407Microengineered point emitters H01J2201/30411conical shaped, e.g. Spindt type H01J2201/30415needle shaped H01J2201/30419Pillar shaped emitters H01J2201/30423Microengineered edge emitters H01J2201/30426Coatings on the emitter surface, e.g. with low work function materials H01J2201/3043Fibres H01J2201/30434Nanotubes H01J2201/30438Particles H01J2201/30442Whiskers H01J2201/30446characterised by the emitter material H01J2201/30449Metals and metal alloys H01J2201/30453Carbon types H01J2201/30457Diamond H01J2201/30461Graphite H01J2201/30465Fullerenes H01J2201/30469Carbon nanotubes (CNTs) H01J2201/30473Amorphous carbon H01J2201/30476Diamond-like carbon [DLC] H01J2201/3048Semiconductor materials H01J2201/30484Carbides H01J2201/30488Nitrides H01J2201/30492Borides H01J2201/30496Oxides H01J2201/306Ferroelectric cathodes H01J2201/308Semiconductor cathodes, e.g. having PN junction layers H01J2201/312having an electric field perpendicular to the surface thereof H01J2201/3125Metal-insulator-Metal [MIM] emission type cathodes H01J2201/316having an electric field parallel to the surface thereof, e.g. thin film cathodes H01J2201/3165Surface conduction emission type cathodes H01J2201/317combined with other synergetic effects, e.g. secondary, photo- or thermal emission H01J2201/319Circuit elements associated with the emitters by direct integration H01J2201/3195Resistive members, e.g. resistive layers H01J2201/32Secondary emission electrodes H01J2201/34Photoemissive electrodes H01J2201/342Cathodes H01J2201/3421Composition of the emitting surface H01J2201/3423Semiconductors, e.g. GaAs, NEA emitters H01J2201/3425Metals, metal alloys H01J2201/3426Alkaline metal compounds, e.g. Na-K-Sb H01J2201/3428Organo-metallic compounds, e.g. Ferrocene H01J2203/00Electron or ion optical arrangements common to discharge tubes or lamps H01J2203/02Electron guns H01J2203/0204using cold cathodes, e.g. field emission cathodes H01J2203/0208Control electrodes H01J2203/0212Gate electrodes H01J2203/0216characterised by the form or structure H01J2203/022Shapes or dimensions of gate openings H01J2203/0224Arrangement of gate openings H01J2203/0228Curved/extending upwardly H01J2203/0232characterised by the material H01J2203/0236Relative position to the emitters, cathodes or substrates H01J2203/024Focusing electrodes H01J2203/0244characterised by the form or structure H01J2203/0248Shapes or dimensions of focusing electrode openings H01J2203/0252Arrangement of focusing electrode openings H01J2203/0256characterised by the material H01J2203/026Relative position to the gateelectrodes, emitters, cathodes or substrates H01J2203/0264In the same plane as the gate electrodes or cathodes H01J2203/0268Insulation layer H01J2203/0272for gate electrodes H01J2203/0276for focusing electrodes H01J2203/028characterised by the shape H01J2203/0284Dimensions of openings H01J2203/0288characterised by the material H01J2203/0292Potentials applied to the electrodes H01J2203/0296Spin-polarised beams H01J2203/04Ion guns H01J2209/00Apparatus and processes for manufacture of discharge tubes H01J2209/01Generalised techniques H01J2209/012Coating H01J2209/015Machines therefor H01J2209/017Cleaning H01J2209/02Manufacture of cathodes H01J2209/022Cold cathodes H01J2209/0223Field emission cathodes H01J2209/0226Sharpening or resharpening of emitting point or edge H01J2209/18Assembling together the component parts of the discharge tube H01J2209/185Machines therefor, e.g. electron gun assembling devices H01J2209/236Manufacture of magnetic deflecting devices H01J2209/2363Coils H01J2209/2366Machines therefor, e.g. winding, forming, welding, or the like H01J2209/26Sealing parts of the vessel to provide a vacuum enclosure H01J2209/261Apparatus used for sealing vessels, e.g. furnaces, machines or the like H01J2209/262means for applying sealing materials, e.g. frit paste dispensers H01J2209/264Materials for sealing vessels, e.g. frit glass compounds, resins or structures H01J2209/265Surfaces for sealing vessels H01J2209/267shaped surfaces or flanges H01J2209/268treated surfaces and surface preparations, e.g. to improve adhesion H01J2209/38Control of maintenance of pressure in the vessel H01J2209/383Vacuum pumps H01J2209/385Gettering H01J2209/3855Getter materials H01J2209/387Gas filling H01J2209/389Degassing H01J2209/3893by a discharge H01J2209/3896by heating H01J2209/46Handling of tube components during manufacture H01J2209/463Identifying or selecting component pieces H01J2209/466Marking, e.g. bar-codes H01J2211/00Plasma display panels with alternate current induction of the discharge, e.g. AC-PDPs H01J2211/10AC-PDPs with at least one main electrode being out of contact with the plasma H01J2211/12with main electrodes provided on both sides of the discharge space H01J2211/14with main electrodes provided only on one side of the discharge space H01J2211/16with main electrodes provided inside or on the side face of the spacers H01J2211/18containing a plurality of independent closed structures for containing the gas, e.g. plasma tube array [PTA] display panels H01J2211/20Constructional details H01J2211/22Electrodes H01J2211/225Material of electrodes H01J2211/24Sustain electrodes or scan electrodes H01J2211/245Shape, e.g. cross section or pattern H01J2211/26Address electrodes H01J2211/265Shape, e.g. cross section or pattern H01J2211/28Auxiliary electrodes, e.g. priming electrodes or trigger electrodes H01J2211/30Floating electrodes H01J2211/32Disposition of the electrodes H01J2211/323Mutual disposition of electrodes H01J2211/326Disposition of electrodes with respect to cell parameters H01J2211/323 takes precedence, e.g. electrodes within the ribs H01J2211/34Vessels, containers or parts thereof, e.g. substrates H01J2211/36Spacers, barriers, ribs, partitions or the like H01J2211/361characterized by the shape H01J2211/363Cross section of the spacers H01J2211/365Pattern of the spacers H01J2211/366characterized by the material H01J2211/368Dummy spacers, e.g. in a non display region H01J2211/38Dielectric or insulating layers H01J2211/40Layers for protecting or enhancing the electron emission, e.g. MgO layers H01J2211/42Fluorescent layers H01J2211/44Optical arrangements or shielding arrangements, e.g. filters or lenses H01J2211/442Light reflecting meansAnti-reflection means H01J2211/444Means for improving contrast or colour purity, e.g. black matrix or light shielding means H01J2211/446Electromagnetic shielding meansAntistatic means H01J2211/448Near infrared shielding means H01J2211/46Connecting or feeding means, e.g. leading-in conductors H01J2211/48Sealing, e.g. seals specially adapted for leading-in conductors H01J2211/50Filling, e.g. selection of gas mixture H01J2211/52Means for absorbing or adsorbing the gas mixture, e.g. by gettering H01J2211/54Means for exhausting the gas H01J2211/62Circuit arrangements circuits or methods for driving PDP's G09G3/28 H01J2211/66Cooling arrangements cooling or supporting means not being part of the tube H05K H01J2217/00Gas-filled discharge tubes H01J2217/04Electrodes for display panels not making use of alternating current H01J2217/492; for discharge tubes in general H01J2201/00 H01J2217/06Cathodes H01J2217/062thermionic H01J2217/065heated by the discharge H01J2217/067Cold cathodes H01J2217/10Anodes H01J2217/12Control electrodes H01J2217/38Cold-cathode tubes H01J2217/40Gas discharge switches H01J2217/402Multiple switches H01J2217/4025for addressing electro-optical devices, i.e. LCD's H01J2217/49Display panels, e.g. not making use of alternating current H01J2211/10 takes precedence H01J2217/491characterised by problems peculiar to plasma displays H01J2217/4915Luminosity H01J2217/492Details H01J2217/49207Electrodes H01J2217/49214Shape H01J2217/49221Mutual disposition H01J2217/49228Crossed electrodes H01J2217/49235Side-by-side electrodes H01J2217/49242Auxiliary electrodes H01J2217/4925Mounting, supporting, spacing H01J2217/49257Means for isolating electrodes from the discharge, e.g. dielectric layers H01J2217/49264Vessels H01J2217/49271Spacers between front and back panels H01J2217/49278Coatings H01J2217/49292 takes precedence H01J2217/49285Associated optical means H01J2217/49292Filters H01J2217/494A.C. panels H01J2217/498Hybrid panels (AC and DC) H01J2223/00Details of transit-time tubes of the types covered by group H01J2225/00 H01J2223/005Cooling methods or arrangements H01J2223/02ElectrodesMagnetic control meansScreens H01J2223/027Collectors H01J2223/0275Multistage collectors H01J2223/033Collector cooling devices H01J2223/04Cathodes H01J2223/05having a cylindrical emissive surface, e.g. cathodes for magnetrons H01J2223/06Electron or ion guns H01J2223/065producing a solid cylindrical beam H01J2223/07producing a hollow cylindrical beam H01J2223/075Magnetron injection guns H01J2223/08Focusing arrangements, e.g. for concentrating stream of electrons, for preventing spreading of stream H01J2223/083Electrostatic focusing arrangements H01J2223/087Magnetic focusing arrangements H01J2223/0873with at least one axial- field reversal along the interaction space, e.g. P.P.M. focusing H01J2223/0876with arrangements improving the linearity and homogeniety of the axial field, e.g. field straightener H01J2223/09Electric system for directing or deflecting the discharge along a desired path, e.g. E-type H01J2223/10Magnet systems for directing or deflecting the discharge along a desired path, e.g. a spiral path H01J2223/11Means for reducing noise H01J2223/12VesselsContainers H01J2223/14Leading-in arrangementsSeals therefor H01J2223/15Means for preventing wave energy leakage structurally associated with tube leading-in arrangements, e.g. filters, chokes, attenuating devices H01J2223/16Circuit elements, having distributed capacitance and inductance, structurally associated with the tube and interacting with the discharge H01J2223/165Manufacturing processes or apparatus therefore H01J2223/18Resonators H01J2223/20Cavity resonatorsAdjustment or tuning thereof H01J2223/207Tuning of single resonator H01J2223/213Simultaneous tuning of more than one resonator, e.g. resonant cavities of a magnetron H01J2223/22Connections between resonators, e.g. strapping for connecting resonators of a magnetron H01J2223/24Slow-wave structures, e.g. delay systems H01J2223/26Helical slow-wave structuresAdjustment therefor H01J2223/27Helix-derived slow-wave structures H01J2223/28Interdigital slow-wave structuresAdjustment therefor H01J2223/30Damping arrangements associated with slow-wave structures, e.g. for suppression of unwanted oscillations H01J2223/34Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for H01J2223/36Coupling devices having distributed capacitance and inductance, structurally associated with the tube, for introducing or removing wave energy H01J2223/38to or from the discharge H01J2223/40to or from the interaction circuit H01J2223/42the interaction circuit being a helix or a helix-derived slow- wave structure H01J2223/44Rod-type coupling devices H01J2223/46Loop coupling devices H01J2223/48for linking interaction circuit with coaxial linesDevices of the coupled helices type H01J2223/50the interaction circuit being a helix or derived from a helix H01J2223/52the coupled helices being disposed coaxially around one another H01J2223/54Filtering devices preventing unwanted frequencies or modes to be coupled to, or out of, the interaction circuitPrevention of high frequency leakage in the environment H01J2225/00Transit-time tubes, e.g. Klystrons, travelling-wave tubes, magnetrons H01J2225/005Gas-filled transit-time tubes H01J2225/02Tubes with electron stream modulated in velocity or density in a modulator zone and thereafter giving up energy in an inducing zone, the zones being associated with one or more resonators H01J2225/025with an electron stream following a helical path H01J2225/04Tubes having one or more resonators, without reflection of the electron stream, and in which the modulation produced in the modulator zone is mainly density modulation, e.g. Heaff tube H01J2225/06Tubes having only one resonator, without reflection of the electron stream, and in which the modulation produced in the modulator zone is mainly velocity modulation, e.g. Lüdi-Klystron H01J2225/08with electron stream perpendicular to the axis of the resonator H01J2225/10Klystrons, i.e. tubes having two or more resonators, without reflection of the electron stream, and in which the stream is modulated mainly by velocity in the zone of the input resonator H01J2225/11Extended interaction Klystrons H01J2225/12with pencil-like electron stream in the axis of the resonators H01J2225/14with tube-like electron stream coaxial with the axis of the resonators H01J2225/16with pencil-like electron stream perpendicular to the axis of the resonators H01J2225/18with radial or disc-like electron stream perpendicular to the axis of the resonators H01J2225/20having special arrangements in the space between resonators, e.g. resistive-wall amplifier tube, space-charge amplifier tube, velocity- jump tube H01J2225/22Reflex Klystrons, i.e. tubes having one or more resonators, with a single reflection of the electron stream, and in which the stream is modulated mainly by velocity in the modulator zone H01J2225/24in which the electron stream is in the axis of the resonator or resonators and is pencil-like before reflection H01J2225/26in which the electron stream is coaxial with the axis of the resonator or resonators and is tube-like before reflection H01J2225/28in which the electron stream is perpendicular to the axis of the resonator or resonators and is pencil-like before reflection H01J2225/30in which the electron stream is perpendicular to the axis of the resonator or resonators and is radial or disc-like before reflection H01J2225/32Tubes with plural reflection, e.g. Coeterier tube H01J2225/34Travelling-wave tubesTubes in which a travelling wave is simulated at spaced gaps H01J2225/36Tubes in which an electron stream interacts with a wave travelling along a delay line or equivalent sequence of impedance elements, and without magnet system producing an H-field crossing the E-field H01J2225/38the forward travelling wave being utilised H01J2225/40the backward travelling wave being utilised H01J2225/42Tubes in which an electron stream interacts with a wave travelling along a delay line or equivalent sequence of impedance elements, and with a magnet system producing an H-field crossing the E-field H01J2225/44the forward travelling wave being utilised H01J2225/46the backward travelling wave being utilised H01J2225/48Tubes in which two electron streams of different velocities interact with one another, e.g. electron-wave tube H01J2225/49Tubes using the parametric principle, e.g. for parametric amplification H01J2225/50Magnetrons, i.e. tubes with a magnet system producing an H-field crossing the E-field H01J2225/52with an electron space having a shape that does not prevent any electron from moving completely around the cathode or guide electrode H01J2225/54having only one cavity or other resonator, e.g. neutrode tube H01J2225/55Coaxial cavity magnetrons H01J2225/56with interdigital arrangements of anodes, e.g. turbator tube H01J2225/58having a number of resonatorshaving a composite resonator, e.g. a helix H01J2225/587Multi-cavity magnetrons H01J2225/593Rising-sun magnetrons H01J2225/60with an electron space having a shape that prevents any electron from moving completely around the cathode or guide electrodeLinear magnetrons H01J2225/61Hybrid tubes, i.e. tubes comprising a klystron section and a travelling-wave section H01J2225/62Strophotrons, i.e. tubes with H-field crossing the E-field and functioning with plural reflection H01J2225/64Turbine tubes, i.e. tubes with H-field crossing the E-field and functioning with reversed cyclotron action H01J2225/66Tubes with electron stream crossing itself and thereby interacting or interfering with itself H01J2225/68Tubes specially designed to act as oscillator with positive grid and retarding field, e.g. for Barkhausen-Kurz oscillators H01J2225/70with resonator having distributed inductance with capacitance, e.g. Pintsch tube H01J2225/72in which a standing wave or a considerable part thereof is produced along an electrode, e.g. Clavier tube H01J2225/74Tubes specially designed to act as transit-time diode oscillators, e.g. monotron H01J2225/76Dynamic electron-multiplier tubes, e.g. Farnsworth multiplier tube, multipactor H01J2225/78Tubes with electron stream modulated by deflection in a resonator H01J2229/00Details of cathode ray tubes or electron beam tubes H01J2329/00 takes precedence H01J2229/0007Elimination of unwanted or stray electromagnetic effects H01J2229/0015Preventing or cancelling fields leaving the enclosure H01J2229/0023Passive means H01J2229/003Preventing or cancelling fields entering the enclosure H01J2229/0038Active means H01J2229/0046Preventing or cancelling fields within the enclosure H01J2229/0053Demagnetisation H01J2229/0061Cooling arrangements H01J2229/0069Active means, e.g. fluid flow H01J2229/0076applied to the faceplate H01J2229/0084Translucent coolant, e.g. flowing across faceplate H01J2229/0092Passive means, e.g. fins, heat conductors H01J2229/07Shadow masks H01J2229/0705Mounting arrangement of assembly to vessel H01J2229/0711Spring and plate (clip) type H01J2229/0716Mounting arrangements of aperture plate to frame or vessel H01J2229/0722Frame H01J2229/0727Aperture plate H01J2229/0733characterised by the material H01J2229/0738Mitigating undesirable mechanical effects H01J2229/0744Vibrations H01J2229/075Beam passing apertures, e.g. geometrical arrangements H01J2229/0755characterised by aperture shape H01J2229/0761Uniaxial masks having parallel slit apertures, i.e. Trinitron type H01J2229/0766Details of skirt or border H01J2229/0772Apertures, cut-outs, depressions, or the like H01J2229/0777Coatings H01J2229/0783improving thermal radiation properties H01J2229/0788Parameterised dimensions of aperture plate, e.g. relationships, polynomial expressions H01J2229/0794Geometrical arrangements, e.g. curvature H01J2229/18Phosphor screens H01J2229/183multi-layer H01J2229/186Geometrical arrangement of phosphors H01J2229/48Electron guns H01J2229/4803Electrodes H01J2229/4806Shield centering cups H01J2229/481Focusing electrodes H01J2229/4813Pre-focusing H01J2229/4817Accelerating electrodes H01J2229/482Extraction grids H01J2229/4824Constructional arrangements of electrodes H01J2229/4827Electrodes formed on surface of common cylindrical support H01J2229/4831Electrode supports H01J2229/4834Electrical arrangements coupled to electrodes, e.g. potentials H01J2229/4837characterised by the potentials applied H01J2229/4841Dynamic potentials H01J2229/4844characterised by beam passing apertures or combinations H01J2229/4848Aperture shape as viewed along beam axis H01J2229/4851trapezoidal H01J2229/4855with rounded end or ends H01J2229/4858parallelogram H01J2229/4862square H01J2229/4865rectangle H01J2229/4868with rounded end or ends H01J2229/4872circular H01J2229/4875oval H01J2229/4879non-symmetric about field scanning axis H01J2229/4882non-symmetric about line scanning axis H01J2229/4886polygonal H01J2229/4889cross shaped H01J2229/4893Interconnected apertures H01J2229/4896complex and not provided for H01J2229/50Plurality of guns or beams H01J2229/502Three beam guns, e.g. for colour CRTs H01J2229/505Arrays H01J2229/507Multi-beam groups, e.g. number of beams greater than number of cathodes H01J2229/56Correction of beam optics H01J2229/563Aberrations by type H01J2229/5632Spherical H01J2229/5635Astigmatism H01J2229/5637Colour purity H01J2229/568using supplementary correction devices H01J2229/5681magnetic H01J2229/5682Permanently magnetised materials, e.g. permanent magnets H01J2229/5684Magnetic materials, e.g. soft iron H01J2229/5685Cross-arms field shaper H01J2229/5687Auxiliary coils H01J2229/5688Velocity modulation H01J2229/58Electron beam control inside the vessel H01J2229/581by magnetic means H01J2229/582by electrostatic means H01J2229/583at the source H01J2229/5835cooperating with the electron gun H01J2229/585at the screen H01J2229/587between the source and the screen H01J2229/70Electron beam control outside the vessel H01J2229/703by magnetic fields H01J2229/7031Cores for field producing elements, e.g. ferrite H01J2229/7032Conductor design and distribution H01J2229/7033Winding H01J2229/7035Wires and conductors H01J2229/7036Form of conductor H01J2229/7037flat, e.g. foil, or ribbon type H01J2229/7038Coil separators and formers H01J2229/86Vessels and containers H01J2229/8603Neck or cone portions of the CRT vessel H01J2229/8606characterised by the shape H01J2229/8609Non circular cross-sections H01J2229/8613Faceplates H01J2229/8616characterised by shape H01J2229/862Parameterised shape, e.g. expression, relationship or equation H01J2229/8623Substrates H01J2229/8626Frames H01J2229/863Passive shielding means associated with the vessel H01J2229/8631Coatings H01J2229/8632characterised by the material H01J2229/8633Meshes and patterns H01J2229/8634Magnetic shielding H01J2229/8635Antistatic shielding H01J2229/8636Electromagnetic shielding H01J2229/8637Mechanical shielding, e.g. against water or abrasion H01J2229/8638Ionising radiation shielding, e.g. X-rays H01J2229/87Means for avoiding vessel implosion H01J2229/875Means substantially covering the output face, e.g. resin layers, protective panels H01J2229/88Coatings H01J2229/882having particular electrical resistive or conductive properties H01J2229/885having particular electrical insulation properties H01J2229/887having particular X-ray shielding properties H01J2229/89Optical components associated with the vessel H01J2229/8901Fixing of optical components to the vessel H01J2229/8903Fibre optic components H01J2229/8905Direction sensitive devices for controlled viewing angle H01J2229/8907Image projection devices H01J2229/8909Baffles, shutters, apertures or the like against external light H01J2229/8911Large-scale devices, e.g. foldable screens H01J2229/8913Anti-reflection, anti-glare, viewing angle and contrast improving treatments or devices H01J2229/8915Surface treatment of vessel or device, e.g. controlled surface roughness H01J2229/8916inside the vessel H01J2229/8918by using interference effects H01J2229/892Effect varying over surface H01J2229/8922Apparatus attached to vessel and not integral therewith H01J2229/8924having particular properties for protecting the vessel, e.g. against abrasion, water or shock H01J2229/8926Active components, e.g. LCD's, indicators, illuminators and moving devices H01J2229/8928Laser CRTs H01J2229/893using lenses H01J2229/899Photographic devices (permanent recording of images) H01J2229/92Means providing or assisting electrical connection with or within the tube H01J2229/922within the tube H01J2229/925associated with the high tension [HT], e.g. anode potentials H01J2229/927associated with digital scanning H01J2229/94Means for obtaining or maintaining the desired pressure within the tube H01J2229/96Circuit elements other than coils, reactors or the like, associated with the tube H01J2229/962associated with the HT H01J2229/964associated with the deflection system H01J2229/966associated with the gun structure H01J2229/968Resistors H01J2231/00Cathode ray tubes or electron beam tubes H01J2329/00 takes precedence H01J2231/12CRTs having luminescent screens H01J2231/121Means for indicating the position of the beam, e.g. beam indexing H01J2231/123by direct current detection, e.g. collecting electrodes H01J2231/125with a plurality of electron guns within the tube envelope H01J2231/1255two or more neck portions containing one or more guns H01J2231/50Imaging and conversion tubes H01J2231/50005characterised by form of illumination H01J2231/5001Photons H01J2231/50015Light H01J2231/50021Ultra-violet H01J2231/50026Infra-red H01J2231/50031High energy photons H01J2231/50036X-rays H01J2231/50042Particles H01J2231/50047Charged particles H01J2231/50052Mechanical vibrations, e.g. sound H01J2231/50057characterised by form of output stage H01J2231/50063Optical H01J2231/50068Electrical H01J2231/50073Charge coupled device [CCD] H01J2231/50078Resistive anode H01J2231/50084using light or electron beam scanning H01J2231/50089Having optical stage before electrical conversion H01J2231/50094Charge coupled device [CCD] H01J2231/501including multiplication stage H01J2231/5013with secondary emission electrodes H01J2231/5016Michrochannel plates [MCP] H01J2231/503with scanning or gating optics H01J2231/5033electrostatic H01J2231/5036magnetic H01J2231/505with non-scanning optics H01J2231/5053electrostatic H01J2231/5056magnetic H01J2235/00X-ray tubes H01J2235/02Electrical arrangements H01J2235/023Connecting of signals or tensions to or through the vessel H01J2235/0233High tension H01J2235/0236Indirect coupling, e.g. capacitive or inductive H01J2235/06Cathode assembly H01J2235/062Cold cathodes H01J2235/064Movement of cathode H01J2235/066Rotation H01J2235/068Multi-cathode assembly H01J2235/08Targets (anodes) and X-ray converters H01J2235/081Target material H01J2235/082Fluids, e.g. liquids, gases H01J2235/083Bonding or fixing with the support or substrate H01J2235/084Target-substrate interlayers or structures, e.g. to control or prevent diffusion or improve adhesion H01J2235/085Target treatment, e.g. ageing, heating H01J2235/086Target geometry H01J2235/088Laminated targets, e.g. plurality of emitting layers of unique or differing materials H01J2235/10Drive means for anode (target) substrate H01J2235/1006Supports or shafts for target or substrate H01J2235/1013Fixing to the target or substrate H01J2235/102Materials for the shaft H01J2235/1026Means (motors) for driving the target (anode) H01J2235/1033mounted within the vacuum vessel H01J2235/104characterised by the shape H01J2235/1046Bearings and bearing contact surfaces H01J2235/1053Retainers or races H01J2235/106Dynamic pressure bearings, e.g. helical groove type H01J2235/1066Treated contact surfaces, e.g. coatings H01J2235/1073Magnetic bearings H01J2235/108Lubricants H01J2235/1086liquid metals H01J2235/1093Measures for preventing vibration H01J2235/12Cooling H01J2235/1204of the anode H01J2235/1208of the bearing assembly H01J2235/1212of the cathode H01J2235/1216of the vessel H01J2235/122of the window H01J2235/1225characterised by method H01J2235/1229employing layers with high emissivity H01J2235/1233characterised by the material H01J2235/1237Oxides H01J2235/1241Bonding layer to substrate H01J2235/1245Increasing emissive surface area H01J2235/125with interdigitated fins or slots H01J2235/1254with microscopic surface features H01J2235/1258Placing objects in close proximity H01J2235/1262Circulating fluids H01J2235/1266flow being via moving conduit or shaft H01J2235/127Control of flow H01J2235/1275characterised by the fluid H01J2235/1279Liquid metals H01J2235/1283in conjunction with extended surfaces (e.g. fins or ridges) H01J2235/1287Heat pipes H01J2235/1291Thermal conductivity H01J2235/1295Contact between conducting bodies H01J2235/16Vessels H01J2235/161Non-stationary vessels H01J2235/162Rotation H01J2235/163shaped for a particular application H01J2235/164Small cross-section, e.g. for entering in a body cavity H01J2235/165Shielding arrangements H01J2235/166against electromagnetic radiation H01J2235/167against thermal (heat) energy H01J2235/168against charged particles H01J2235/18Windows, e.g. for X-ray transmission H01J2235/183Multi-layer structures H01J2235/20Arrangements for controlling gases within the X-ray tube H01J2235/205Gettering H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imagingFor features of general interest which may be found in other types of discharge tubes, an indexing code corresponding to general schemes H01J2201/00 - H01J2203/00 is given, e.g. for cathodes, vessels, cooling means or the likeSame rules apply for manufacturing procedures (H01J2209/00), unless really specific to the tube concerned. The codes in this main group are grouped according to the following principle: details common to gas or plasma discharge of the above mentioned tubes: H01J2237/00 - H01J2237/2487Imaging or analysing: H01J2237/25 - H01J2237/2857 particle beam processing: H01J2237/30 - H01J2237/31798 plasma processing: H01J2237/32 - H01J2237/339 H01J2237/002Cooling arrangements of objects being observed or treated H01J2237/2001 H01J2237/004Charge control of objects or beams H01J2237/0041Neutralising arrangements H01J2237/0042Deflection of neutralising particles H01J2237/0044of objects being observed or treated H01J2237/0045using secondary electrons H01J2237/0047using electromagnetic radiations, e.g. UV, X-rays, light H01J2237/0048Charging arrangements H01J2237/006Details of gas supplies, e.g. in an ion source, to a beam line, to a specimen or to a workpiece, H01J37/3244 takes precedence; environmental cells for electron microscopes H01J2237/2003; microscopes with environmental specimen chamber H01J2237/2608 H01J2237/02Details H01J2237/0203Protection arrangements H01J2237/0206Extinguishing, preventing or controlling unwanted discharges H01J2237/0209Avoiding or diminishing effects of eddy currents H01J2237/0213Avoiding deleterious effects due to interactions between particles and tube elements H01J2237/0216Means for avoiding or correcting vibration effects H01J2237/022Avoiding or removing foreign or contaminating particles, debris or deposits on sample or tube H01J2237/0225Detecting or monitoring foreign particles H01J2237/024Moving components not otherwise provided for diaphragms H01J2237/0458; objects H01J2237/202 H01J2237/0245Moving whole optical system relatively to object H01J2237/026Shields H01J2237/0262electrostatic H01J2237/0264magnetic H01J2237/0266electromagnetic H01J2237/0268Liner tubes H01J2237/028Particle traps H01J2237/03Mounting, supporting, spacing or insulating electrodes H01J2237/032Mounting or supporting H01J2237/036Spacing H01J2237/038Insulating H01J2237/04Means for controlling the discharge H01J2237/041Beam polarising means H01J2237/043Beam blanking H01J2237/0432High speed and short duration H01J2237/0435Multi-aperture H01J2237/0437Semiconductor substrate H01J2237/045Diaphragms H01J2237/0451with fixed aperture H01J2237/0453multiple apertures H01J2237/0455with variable aperture H01J2237/0456Supports H01J2237/0458movable, i.e. for changing between differently sized apertures H01J2237/047Changing particle velocity H01J2237/0473accelerating H01J2237/04732with magnetic means H01J2237/04735with electrostatic means H01J2237/04737radio-frequency quadrupole [RFQ] H01J2237/0475decelerating H01J2237/04753with magnetic means H01J2237/04756with electrostatic means H01J2237/049Focusing means H01J2237/0492Lens systems individual lenses H01J2237/10 H01J2237/04922electromagnetic H01J2237/04924electrostatic H01J2237/04926combined H01J2237/04928Telecentric systems H01J2237/05Arrangements for energy or mass analysis H01J2237/053electrostatic H01J2237/0535Mirror analyser H01J2237/055magnetic H01J2237/057Energy or mass filtering H01J2237/06Sources H01J2237/061Construction H01J2237/062Reducing size of gun H01J2237/063Electron sources H01J2237/06308Thermionic sources H01J2237/06316Schottky emission H01J2237/06325Cold-cathode sources H01J2237/06333Photo emission H01J2237/06341Field emission H01J2237/0635Multiple source, e.g. comb or array H01J2237/06358Secondary emission H01J2237/06366Gas discharge electron sources H01J2237/06375Arrangement of electrodes H01J2237/06383Spin polarised electron sources H01J2237/06391Positron sources H01J2237/065Source emittance characteristics H01J2237/0653Intensity H01J2237/0656Density H01J2237/08Ion sources H01J2237/0802Field ionization sources H01J2237/0805Liquid metal sources H01J2237/0807Gas field ion sources [GFIS] H01J2237/081Sputtering sources H01J2237/0812Ionized cluster beam [ICB] sources H01J2237/0815Methods of ionisation H01J2237/0817Microwaves H01J2237/082Electron beam H01J2237/0822Multiple sources H01J2237/0825for producing different ions simultaneously H01J2237/0827for producing different ions sequentially H01J2237/083Beam forming H01J2237/0835Variable cross-section or shape H01J2237/10Lenses H01J2237/103characterised by lens type H01J2237/1035Immersion lens H01J2237/12electrostatic H01J2237/1202Associated circuits H01J2237/1205Microlenses H01J2237/1207Einzel lenses H01J2237/121characterised by shape H01J2237/1215Annular electrodes H01J2237/14magnetic H01J2237/1405Constructional details H01J2237/141Coils superconducting H01J2237/142 H01J2237/1415Bores or yokes, i.e. magnetic circuit in general H01J2237/142with superconducting coils H01J2237/15Means for deflecting or directing discharge H01J2237/1501Beam alignment means or procedures H01J2237/1502Mechanical adjustments H01J2237/1503Mechanical scanning H01J2237/1504Associated circuits H01J2237/1505Rotating beam around optical axis H01J2237/1506Tilting or rocking beam around an axis substantially at an angle to optical axis H01J2237/1507dynamically, e.g. to obtain same impinging angle on whole area H01J2237/1508Combined electrostatic-electromagnetic means H01J2237/151Electrostatic means H01J2237/1512Travelling wave deflectors H01J2237/1514Prisms H01J2237/1516Multipoles H01J2237/1518for X-Y scanning H01J2237/152Magnetic means H01J2237/1523Prisms H01J2237/1526For X-Y scanning H01J2237/153Correcting image defects, e.g. stigmators H01J2237/1532Astigmatism H01J2237/1534Aberrations H01J2237/1536Image distortions due to scanning H01J2237/1538Space charge (Boersch) effect compensation neutralising means H01J2237/0041 H01J2237/16Vessels liner tubes H01J2237/0268 H01J2237/162Open vessel, i.e. one end sealed by object or workpiece H01J2237/164Particle-permeable windows H01J2237/166Sealing means H01J2237/18Vacuum control means H01J2237/182Obtaining or maintaining desired pressure H01J2237/1825Evacuating means H01J2237/184Vacuum locks H01J2237/186Valves H01J2237/188Differential pressure H01J2237/20Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated H01J2237/2001Maintaining constant desired temperature H01J2237/2002Controlling environment of sample H01J2237/2003Environmental cells H01J2237/2004Biological samples H01J2237/2005Seal mechanisms H01J2237/2006Vacuum seals H01J2237/2007Holding mechanisms H01J2237/2008specially adapted for studying electrical or magnetical properties of objects H01J2237/201for mounting multiple objects H01J2237/202Movement H01J2237/20207Tilt H01J2237/20214Rotation H01J2237/20221Translation H01J2237/20228Mechanical X-Y scanning H01J2237/20235Z movement or adjustment H01J2237/20242Eucentric movement H01J2237/2025Sensing velocity of translation or rotation H01J2237/20257Magnetic coupling H01J2237/20264Piezoelectric devices H01J2237/20271Temperature responsive devices H01J2237/20278Motorised movement H01J2237/20285computer-controlled H01J2237/20292Means for position and/or orientation registration H01J2237/204Means for introducing and/or outputting objects locks H01J2237/184 H01J2237/206Modifying objects while observing H01J2237/2062Mechanical constraints H01J2237/2065Temperature variations maintaining constant desired temperature H01J2237/2001 H01J2237/2067Surface alteration H01J2237/208Elements or methods for movement independent of sample stage for influencing or moving or contacting or transferring the sample or parts thereof, e.g. prober needles or transfer needles in FIB/SEM systems H01J2237/21Focus adjustment lenses H01J2237/10 H01J2237/213during electron or ion beam welding or cutting H01J2237/216Automatic focusing methods H01J2237/22Treatment of data mixing signals H01J2237/24495 H01J2237/221Image processing H01J2237/223Fourier techniques H01J2237/225Displaying image using synthesised colours H01J2237/226Image reconstruction H01J2237/228Charged particle holography H01J2237/244Detection characterized by the detecting means H01J2237/24405Faraday cages H01J2237/2441Semiconductor detectors, e.g. diodes H01J2237/24415X-ray H01J2237/2442Energy-dispersive (Si-Li type) spectrometer H01J2237/24425Wavelength-dispersive spectrometer H01J2237/2443Scintillation detectors H01J2237/24435Microchannel plates H01J2237/2444Electron Multiplier H01J2237/24445using avalanche in a gas H01J2237/2445Photon detectors for X-rays, light, e.g. photomultipliers H01J2237/24455Transmitted particle detectors H01J2237/2446Position sensitive detectors H01J2237/24465Sectored detectors, e.g. quadrants H01J2237/2447Imaging plates H01J2237/24475Scattered electron detectors H01J2237/2448Secondary particle detectors H01J2237/24485Energy spectrometers H01J2237/2449Detector devices with moving charges in electric or magnetic fields H01J2237/24495Signal processing, e.g. mixing of two or more signals H01J2237/245Detection characterised by the variable being measured H01J2237/24507Intensity, dose or other characteristics of particle beams or electromagnetic radiation H01J2237/24514Beam diagnostics including control of the parameter or property diagnosed H01J2237/30472 takes precedence H01J2237/24521Beam diameter H01J2237/24528Direction of beam or parts thereof in view of the optical axis, e.g. beam angle, angular distribution, beam divergence, beam convergence or beam landing angle on sample or workpiece means for deflecting or directing discharge H01J2237/15 H01J2237/24535Beam current H01J2237/24542Beam profile H01J2237/2455Polarisation (electromagnetic beams) H01J2237/24557Spin polarisation (particles) H01J2237/24564Measurements of electric or magnetic variables, e.g. voltage, current, frequency H01J2237/24571Measurements of non-electric or non-magnetic variables H01J2237/24578Spatial variables, e.g. position, distance H01J2237/24585Other variables, e.g. energy, mass, velocity, time, temperature H01J2237/24592Inspection and quality control of devices H01J2237/248Components associated with the control of the tube H01J2237/2482Optical means H01J2237/2485Electric or electronic means H01J2237/2487using digital signal processors H01J2237/25Tubes for localised analysis using electron or ion beams H01J2237/2505characterised by their application H01J2237/2511Auger spectrometers H01J2237/2516Secondary particles mass or energy spectrometry H01J2237/2522of electrons (ESCA, XPS) H01J2237/2527Ions [SIMS] H01J2237/2533Neutrals [SNMS] H01J2237/2538Low energy electron microscopy [LEEM] H01J2237/2544Diffraction [LEED] H01J2237/255Reflection diffraction [RHEED] H01J2237/2555Microprobes, i.e. particle-induced X-ray spectrometry H01J2237/2561electron H01J2237/2566ion H01J2237/2572proton H01J2237/2577atomic H01J2237/2583using tunnel effects, e.g. STM, AFM H01J2237/2588Lorenz microscopy (magnetic field measurement) H01J2237/2594Measuring electric fields or potentials H01J2237/26Electron or ion microscopes H01J2237/2602Details H01J2237/2605operating at elevated pressures, e.g. atmosphere H01J2237/2608with environmental specimen chamber environmental cells H01J2237/2003 H01J2237/2611Stereoscopic measurements and/or imaging H01J2237/2614Holography or phase contrast, phase related imaging in general, e.g. phase plates H01J2237/2617Comparison or superposition of transmission imagesMoiré H01J2237/262Non-scanning techniques H01J2237/2623Field-emission microscopes H01J2237/2626Pulsed source H01J2237/28Scanning microscopes H01J2237/2801Details H01J2237/2802Transmission microscopes H01J2237/2803characterised by the imaging method H01J2237/2804Scattered primary beam H01J2237/2805Elastic scattering H01J2237/2806Secondary charged particle H01J2237/2807X-rays H01J2237/2808Cathodoluminescence H01J2237/2809characterised by the imaging problems involved H01J2237/281Bottom of trenches or holes H01J2237/2811Large objects H01J2237/2812Emission microscopes H01J2237/2813characterised by the application H01J2237/2814Measurement of surface topography H01J2237/2815Depth profile H01J2237/2816Length H01J2237/2817Pattern inspection H01J2237/2818Scanning tunnelling microscopes H01J2237/282Determination of microscope properties H01J2237/2823Resolution H01J2237/2826Calibration for object processing apparatus H01J2237/30433 H01J2237/285Emission microscopes H01J2237/2852Auto-emission (i.e. field-emission) H01J2237/2855Photo-emission H01J2237/2857Particle bombardment induced emission H01J2237/30Electron or ion beam tubes for processing objects H01J2237/303Electron or ion optical systems H01J2237/304Controlling tubes H01J2237/30405Details H01J2237/30411using digital signal processors [DSP] H01J2237/30416Handling of data for lithography H01J37/3174 H01J2237/30422Data compression H01J2237/30427using neural networks or fuzzy logic H01J2237/30433System calibration for microscopes H01J2237/2826 H01J2237/30438Registration H01J2237/30444Calibration grids H01J2237/3045Deflection calibration deflecting in general H01J2237/15; specific to material treating H01J2237/30483 H01J2237/30455Correction during exposure H01J2237/30461pre-calculated H01J2237/30466Detecting endpoint of process for plasma apparatus H01J37/32963, for sputtering apparatus H01J37/3479 H01J2237/30472Controlling the beam H01J2237/30477Beam diameter H01J2237/30483Scanning H01J2237/30488Raster scan H01J2237/30494Vector scan H01J2237/31Processing objects on a macro-scale H01J2237/3104Welding H01J2237/3109Cutting H01J2237/3114Machining H01J2237/3118Drilling H01J2237/3123Casting H01J2237/3128Melting H01J2237/3132Evaporating H01J2237/3137Plasma-assisted co-operation H01J2237/3142Ion plating H01J2237/3146Ion beam bombardment sputtering H01J2237/3151Etching H01J2237/3156Curing H01J2237/316Changing physical properties H01J2237/3165Changing chemical properties H01J2237/317Processing objects on a microscale H01J2237/31701Ion implantation H01J2237/31703Dosimetry H01J2237/31705Impurity or contaminant control H01J2237/31706characterised by the area treated H01J2237/31708unpatterned H01J2237/3171patterned H01J2237/31711using mask H01J2237/31713Focused ion beam H01J2237/31732Depositing thin layers on selected microareas ion plating H01J2237/3142 H01J2237/31733using STM H01J2237/31735Direct-write microstructures H01J2237/31737using ions H01J2237/31738using STM H01J2237/3174Etching microareas H01J2237/31742for repairing masks H01J2237/31744introducing gas in vicinity of workpiece H01J2237/31745for preparing specimen to be viewed in microscopes or analyzed in microanalysers H01J2237/31747using STM H01J2237/31749Focused ion beam H01J2237/3175Lithography H01J2237/31752using particular beams or near-field effects, e.g. STM-like techniques H01J2237/31754using electron beams H01J2237/31755using ion beams H01J2237/31757hybrid, i.e. charged particles and light, X-rays, plasma H01J2237/31759using near-field effects, e.g. STM H01J2237/31761Patterning strategy H01J2237/31762Computer and memory organisation H01J2237/31764Dividing into sub-patterns H01J2237/31766Continuous moving of wafer H01J2237/31767Step and repeat H01J2237/31769Proximity effect correction H01J2237/31771using multiple exposure H01J2237/31772Flood beam H01J2237/31774Multi-beam H01J2237/31776Shaped beam H01J2237/31777by projection H01J2237/31779from patterned photocathode H01J2237/31781from patterned cold cathode H01J2237/31783M-I-M cathode H01J2237/31784Semiconductor cathode H01J2237/31786Field-emitting cathode H01J2237/31788through mask H01J2237/31789Reflection mask H01J2237/31791Scattering mask H01J2237/31793Problems associated with lithography H01J2237/31794affecting masks H01J2237/31796affecting resists H01J2237/31798detecting pattern defects with SEM H01J2237/2817; correcting H01J2237/31735, H01J2237/3174 H01J2237/32Processing objects by plasma generation H01J2237/327Arrangements for generating the plasma H01J2237/33characterised by the type of processing H01J2237/332Coating H01J2237/3321CVD [Chemical Vapor Deposition] H01J2237/3322Problems associated with coating H01J2237/3323uniformity H01J2237/3325large area H01J2237/3326high speed H01J2237/3327Coating high aspect ratio workpieces H01J2237/3328adhesion, stress, lift-off of deposited films H01J2237/334Etching H01J2237/3341Reactive etching H01J2237/3342Resist stripping H01J2237/3343Problems associated with etching H01J2237/3344isotropy H01J2237/3345anisotropy H01J2237/3346Selectivity H01J2237/3347bottom of holes or trenches H01J2237/3348control of ion bombardment energy H01J2237/335Cleaning H01J2237/3355Holes or apertures, i.e. inprinted circuit boards H01J2237/336Changing physical properties of treated surfaces H01J2237/3365Plasma source implantation H01J2237/338Changing chemical properties of treated surfaces H01J2237/3382Polymerising H01J2237/3385Carburising H01J2237/3387Nitriding H01J2237/339Synthesising components H01J2261/00Details H01J2261/00Gas- or vapour-discharge lamps H01J2261/02Details H01J2261/38Devices for influencing the colour or wavelength of the light H01J2261/385Non-chemical aspects of luminescent layers, e.g. thickness profile, shape and distribution of luminescent coatings H01J2329/00Electron emission display panels, e.g. field emission display panels H01J2329/002Cooling means H01J2329/005Multi-directional displaying, i.e. with multiple display faces facing in different directions H01J2329/007Vacuumless display panels, i.e. with phosphor directly applied to emitter without intermediate vacuum space H01J2329/02Electrodes other than control electrodes H01J2329/04Cathode electrodes H01J2329/0402Thermionic cathodes H01J2329/0405Cold cathodes other than those covered by H01J2329/0407 - H01J2329/0492 H01J2329/0407Field emission cathodes H01J2329/041characterised by the emitter shape H01J2329/0413Microengineered point emitters H01J2329/0415conical shaped, e.g. Spindt type H01J2329/0418needle shaped H01J2329/0421Pillar shaped emitters H01J2329/0423Microengineered edge emitters H01J2329/0426Coatings on the emitter surface, e.g. with low work function materials H01J2329/0428Fibres H01J2329/0431Nanotubes H01J2329/0434Particles H01J2329/0436Whiskers H01J2329/0439characterised by the emitter material H01J2329/0442Metals or metal alloys H01J2329/0444Carbon types H01J2329/0447Diamond H01J2329/0449Graphite H01J2329/0452Fullerenes H01J2329/0455Carbon nanotubes (CNTs) H01J2329/0457Amorphous carbon H01J2329/046Diamond-like carbon [DLC] H01J2329/0463Semiconductor materials H01J2329/0465Carbides H01J2329/0468Nitrides H01J2329/0471Borides H01J2329/0473Oxides H01J2329/0476Ferroelectric cathodes H01J2329/0478Semiconductor cathodes, e.g. having PN junction layers H01J2329/0481Cold cathodes having an electric field perpendicular to the surface thereof H01J2329/0407 - H01J2329/0478 take precedence H01J2329/0484Metal-Insulator-Metal [MIM] emission type cathodes H01J2329/0486Cold cathodes having an electric field parallel to the surface thereof, e.g. thin film cathodes H01J2329/0489Surface conduction emission type cathodes H01J2329/0492Cold cathodes combined with other synergetic effects, e.g. secondary, photo- or thermal emission H01J2329/0494Circuit elements associated with the emitters by direct integration H01J2329/0497Resistive members, e.g. resistive layers H01J2329/08Anode electrodes H01J2329/18Luminescent screens H01J2329/20characterised by the luminescent material H01J2329/22characterised by the binder or adhesive for securing the luminescent material to its support, e.g. substrate H01J2329/28with protective, conductive or reflective layers H01J2329/30Shape or geometrical arrangement of the luminescent material H01J2329/32Means associated with discontinuous arrangements of the luminescent material H01J2329/323Black matrix H01J2329/326Color filters structurally combined with the luminescent material H01J2329/46Arrangements of electrodes and associated parts for generating or controlling the electron beams H01J2329/4604Control electrodes H01J2329/4608Gate electrodes H01J2329/4613characterised by the form or structure H01J2329/4617Shapes or dimensions of gate openings H01J2329/4621Arrangement of gate openings H01J2329/4626Curved or extending upwardly H01J2329/463characterised by the material H01J2329/4634Relative position to the emitters, cathodes or substrates H01J2329/4639Focusing electrodes H01J2329/4643characterised by the form or structure H01J2329/4647Shapes or dimensions of focusing electrode openings H01J2329/4652Arrangement of focusing electrode openings H01J2329/4656characterised by the material H01J2329/466Relative position to the gate electrodes, emitters, cathodes or substrates H01J2329/4665In the same plane as the gate electrodes or cathodes H01J2329/4669Insulation layers H01J2329/4673for gate electrodes H01J2329/4678for focusing electrodes H01J2329/4682characterised by the shape H01J2329/4686Dimensions of openings H01J2329/4691characterised by the material H01J2329/4695Potentials applied to the electrodes H01J2329/86Vessels H01J2329/8605Front or back plates H01J2329/861characterised by the shape H01J2329/8615characterised by the material H01J2329/862Frames H01J2329/8625Spacing members H01J2329/863characterised by the form or structure H01J2329/8635having a corrugated lateral surface H01J2329/864characterised by the material H01J2329/8645with coatings on the lateral surfaces thereof H01J2329/865Connection of the spacing members to the substrates or electrodes H01J2329/8655Conductive or resistive layers H01J2329/866Adhesives H01J2329/8665Spacer holding means H01J2329/867Seals between parts of vessels H01J2329/8675Seals between the frame and the front and/or back plate H01J2329/868Passive shielding means of vessels H01J2329/8685Antistatic shielding H01J2329/869Electromagnetic shielding H01J2329/8695Mechanical shielding, e.g. against water or abrasion H01J2329/88Coatings on walls of the vessels H01J2329/18, H01J2329/868, H01J2329/89 take precedence H01J2329/89Optical components structurally combined with the vessel H01J2329/892Anti-reflection, anti-glare, viewing angle and contrast improving means H01J2329/895Spectral filters H01J2329/897Lenses H01J2329/90Leading-in arrangementsseals therefor H01J2329/92Means forming part of the display panel for the purpose of providing electrical connection to it H01J2329/94Means for exhausting the vessel or maintaining vacuum within the vessel H01J2329/941Means for exhausting the vessel H01J2329/943Means for maintaining vacuum within the vessel H01J2329/945by gettering H01J2329/946characterised by the position or form of the getter H01J2329/948characterised by the material of the getter H01J2329/96Circuit elements structurally associated with the display panels H01J2329/0494 takes precedence H01J2893/00Discharge tubes and lamps H01J2893/0001Electrodes and electrode systems suitable for discharge tubes or lamps H01J2893/0002Construction arrangements of electrode systems H01J2893/0003Anodes forming part of vessel walls H01J2893/0004Anodes formed in central part H01J2893/0005Fixing of electrodes H01J2893/0006Mounting H01J2893/0007Machines for assembly H01J2893/0008Supply leadsElectrode supports via rigid connection to vessel H01J2893/0009Electrode system pressing against vessel wall H01J2893/001Non-constructive schematic arrangements H01J2893/0011Non-emitting electrodes H01J2893/0012Constructional arrangements H01J2893/0013Sealed electrodes H01J2893/0015Non-sealed electrodes H01J2893/0016Planar grids H01J2893/0017Cylindrical, helical or annular grids H01J2893/0018Bar or cage-like grids H01J2893/0019Chemical composition and manufacture H01J2893/002chemical H01J2893/0021carbon H01J2893/0022Manufacture H01J2893/0023carbonising and other surface treatments H01J2893/0024Planar grids H01J2893/0025by winding wire upon a support H01J2893/0026Machines for manufacture of grids or anodes H01J2893/0027Mitigation of temperature effects H01J2893/0029Electron beam tubes H01J2893/003Tubes with plural electrode systems H01J2893/0031Tubes with material luminescing under electron bombardment H01J2893/0032Tubes with variable amplification factor H01J2893/0033Vacuum connection techniques applicable to discharge tubes and lamps H01J2893/0034Lamp bases H01J2893/0035shaped as flat plates, in particular metallic H01J2893/0036having wires, ribbons or tubes placed between two vessel walls and being perpendicular to at least one of said walls H01J2893/0037Solid sealing members other than lamp bases H01J2893/0038Direct connection between two insulating elements, in particular via glass material H01J2893/0039Glass-to-glass connection, e.g. by soldering H01J2893/004Quartz-to-quartz connection H01J2893/0041Direct connection between insulating and metal elements, in particular via glass material H01J2893/0043Glass-to-metal or quartz-to-metal, e.g. by soldering H01J2893/0044Direct connection between two metal elements, in particular via material a connecting material H01J2893/0045Non-solid connections, e.g. liquid or rubber H01J2893/0046Lamp base with closure H01J2893/0047Closure other than lamp base H01J2893/0048Tubes with a main cathode H01J2893/0049Internal parts H01J2893/005Cathodes H01J2893/0051Anode assembliesscreens for influencing the discharge H01J2893/0052Anode supporting means H01J2893/0053Leading in for anodesProtecting means for anode supports H01J2893/0054Cooling means H01J2893/0055Movable screens H01J2893/0056Parts inside tubes brought to incandescence by the discharge H01J2893/0058GridsAuxiliary internal or external electrodes H01J2893/0059Arc discharge tubes H01J2893/006Tubes with electron bombarded gas (e.g. with plasma filter) H01J2893/0061Tubes with discharge used as electron source H01J2893/0062Tubes with temperature ionized gas as electron source H01J2893/0063Plasma light sources H01J2893/0064Tubes with cold main electrodes (including cold cathodes) H01J2893/0065Electrode systems H01J2893/0066Construction, material, support, protection and temperature regulation of electrodesElectrode cups H01J2893/0067Electrode assembly without control electrodes, e.g. including a screen H01J2893/0068electrode assembly with control electrodes, e.g. including a screen H01J2893/0069Tubes for displaying characters H01J2893/007Sequential discharge tubes H01J2893/0072Disassembly or repair of discharge tubes H01J2893/0073Discharge tubes with liquid poolcathodesconstructional details H01J2893/0074Cathodic cupsScreensReflectorsFiltersWindowsProtection against mercury depositionReturning condensed electrode material to the cathodic cupLiquid electrode level control H01J2893/0075Cathodic cups H01J2893/0076Liquid electrode materials H01J2893/0077Cathodic cup constructionCathodic spot control H01J2893/0078Mounting cathodic cups in the discharge tube H01J2893/0079Means for limiting the cathodic spot movement H01J2893/008Means for stabilising the cathodic spot H01J2893/0081Cooling means H01J2893/0082Returning condensed electrode material to the cathodic cup, e.g. including cleaning H01J2893/0083Liquid electrode level control H01J2893/0084Protection against mercury deposition H01J2893/0086Gas fillMaintaining or maintaining desired pressureProducing, introducing or replenishing gas or vapour during operation of the tubeGettersGas cleaningElectrode cleaning H01J2893/0087Igniting meansCathode spot maintaining or extinguishing means H01J2893/0088Tubes with at least a solid principal cathode and solid anodes H01J2893/0089Electrode systems H01J2893/009Anode systemsScreens H01J2893/0091Anode supporting means H01J2893/0092Anodic screens or grids H01J2893/0093Anodic arms H01J2893/0094Electrode arrangementsAuxiliary electrodes H01J2893/0095Tubes with exclusively liquid main electrodes H01J2893/0096Transport of discharge tube components during manufacture, e.g. wires, coils, lamps, contacts, etc. H01J2893/0097Incandescent wires of coils H01J2893/0098Vessels