G21K

TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR

IRRADIATION DEVICES

GAMMA RAY OR X-RAY MICROSCOPES

In this subclass, the following term is used with the meaning indicated:

"particle" means a molecular, atomic or subatomic particle

The following IPC groups are not in the CPC scheme. The subject matter for these IPC groups is classified in the following CPC groups:

G21K3/00

covered by

G21K1/10

In this subclass non-limiting references (in the sense of paragraph 39 of the Guide to the IPC) may still be displayed in the scheme.

G21K1/00

Arrangements for handling particles or ionising radiation, e.g. focusing or moderating production or acceleration of neutrons, electrically-charged particles, neutral molecular beams or neutral atomic beams H05H3/00 - H05H15/00

G21K1/003

Manipulation of charged particles by using radiation pressure, e.g. optical levitation acceleration of charged particles H05H5/00, H05H7/00, H05H9/00, H05H11/00, H05H13/00

G21K1/006

Manipulation of neutral particles by using radiation pressure, e.g. optical levitation production or acceleration of neutral particles H05H3/00

G21K1/02

using diaphragms, collimators

G21K1/025

using multiple collimators, e.g. Bucky screens; other devices for eliminating undesired or dispersed radiation

G21K1/04

using variable diaphragms, shutters, choppers

G21K1/043

changing time structure of beams by mechanical means, e.g. choppers, spinning filter wheels

G21K1/046

varying the contour of the field, e.g. multileaf collimators

G21K1/06

using diffraction, refraction or reflection, e.g. monochromators G21K1/10, G21K7/00 take precedence

G21K1/062

Devices having a multilayer structure

G21K1/065

using refraction, e.g. Tomie lenses

G21K1/067

using surface reflection, e.g. grazing incidence mirrors, gratings multilayer mirrors G21K1/062; crystal optics G21K1/06

G21K1/08

Deviation, concentration or focusing of the beam by electric or magnetic means electron-optical arrangements in electric discharge tubes H01J29/46;

details, e.g. electric or magnetic deviating means for direct voltage accelerators or in accelerators using single pulses H05H5/02; arrangements for injecting particles into orbits H05H7/08; arrangements for ejecting particles from orbits H05H7/10

G21K1/087

by electrical means

G21K1/093

by magnetic means

G21K1/10

Scattering devices

Absorbing devices

Ionising radiation filters

G21K1/12

Resonant absorbers or driving arrangements therefor, e.g. for Moessbauer-effect devices

motors with reciprocating, oscillating or vibrating magnet, armature or coil system in general H02K33/00

G21K1/14

using charge exchange devices, e.g. for neutralising or changing the sign of the electrical charges of beams producing or accelerating neutral particle beams H05H3/00

G21K1/16

using polarising devices, e.g. for obtaining a polarised beam

ion sources, ion guns H01J27/02; polarised targets for producing nuclear reactions H05H6/005

G21K4/00

Conversion screens for the conversion of the spatial distribution of X-rays or particle radiation into visible images, e.g. fluoroscopic screens photographic processes using X-ray intensifiers G03C5/17; discharge tubes comprising luminescent screens H01J1/62; cathode ray tubes for X-ray conversion with optical output H01J31/50

G21K2004/02

characterised by the external panel structure

G21K2004/04

with an intermediate layer

G21K2004/06

with a phosphor layer

G21K2004/08

with a binder in the phosphor layer

G21K2004/10

with a protective film

G21K2004/12

with a support

G21K5/00

Irradiation devices discharge tubes for irradiating H01J37/00

G21K5/02

having no beam-forming means

G21K5/04

with beam-forming means

G21K5/08

Holders for targets or for other objects to be irradiated

G21K5/10

with provision for relative movement of beam source and object to be irradiated

G21K7/00

Gamma- or X-ray microscopes

G21K2201/00

Arrangements for handling radiation or particles

G21K2201/06

using diffractive, refractive or reflecting elements

G21K2201/061

characterised by a multilayer structure

G21K2201/062

the element being a crystal

G21K2201/064

having a curved surface

G21K2201/065

provided with cooling means

G21K2201/067

Construction details

G21K2201/068

specially adapted for particle beams

G21K2207/00

Particular details of imaging devices or methods using ionizing electromagnetic radiation such as X-rays or gamma rays

G21K2207/005

Methods and devices obtaining contrast from non-absorbing interaction of the radiation with matter, e.g. phase contrast